Excessive power loss is a major concern in high voltage and high power applications and is considered one of the main drawbacks of VSC-HVDC system when compared with traditional HVDC system based on thyristor technology. This is primarily caused by high switching loss associated with switching devices used in the VSC-HVDC. This issue can be largely addressed by using the emerging MMC-HVDC topology, which requires much lower switching frequency than traditional VSC-HVDC. Emitter turn-off thyristor (ETO) is one of the best high power switching devices packed with many advanced features. ETO thyristor based MMC-HVDC system is therefore an extremely attractive choice for ultra-high voltage and high power HVDCs. This paper discusses the operation principle of ETO based MMC-HVDC as well as its design and loss comparison with other solutions.
2. Figure 1. Principal circuit and picture of Gen-4 ET
III. ETO BASED MMC STRUCTURE A
PRINCIPAL
The equivalent circuit of a three-phase MM
the ETO based sub-module is shown in
based sub-module is basically a half bridge
ETO switches and a clamp circuit. Equatio
arm voltage of MMC based of sub-modu
and their switching states.
The arm current in MMC is derived from
DC current and the AC current. Also the re
arm voltage is derived from (3) assu
modulation [2, 3].
Figure 2. Modular multilevel converter, ETO
Where is the current phase angle. Switch
module depends by the arm current and
TO 4.5KV/4KA
AND OPERATION
MC converter and
Figure 2. ETO
e converter using
on (1) defines the
ules DC voltages
(1)
(2) based on the
ference value for
uming a cosine
(2)
(3)
sub-modules
hing state of sub-
d reference arm
voltage. The upper arm current d
points of zero crossing in one cycle
t3
. When the arm current is positive
diode D2
can conduct and when the
t2
to t1
, switch S2
or diode D1
can con
voltage will define the active device
If arm current is positive and refere
is decreasing, t3
to 0, sub-module
conducts and when the reference ar
0 to t2
, sub-module is inserted
Similarly when the arm current is
inserted when the reference arm vo
(t1
+t2
)/2, so diode D1
conducts and
when the reference arm voltage is d
so switch S2
conducts. The s
conduction intervals change fo
modulation index (m) and angle ( ).
IV. MODULATION AND C
BALANCING
A modified nearest level modulatio
to operate ETO based MMC. To i
of fundamental frequency base
calculation of switching angels h
method. The algorithm inputs th
waveform from the system contr
switching angels such that the g
MMC is very close to the reference
Figure 3 shows a zoomed in p
waveform and discrete steps gen
modules. Real-time modulation has
is the generation of the switching an
is the capacitor voltage balancin
capacitor voltage balancing, indiv
are measured at each controller ti
controller. The measured voltages
switching instant ( i) and the swi
with respect to the index of sorted c
Sub-modules are inserted or b
switching state of two switching dev
Two switches are complementary a
each device depends on the directio
reference modulation waveform.
diode (S1 or D1) conduct the s
defined by (2) has three
e referred to as t1
, t2
, and
, t3
to t2
, only switch S1
or
e arm current is negative,
nduct. The reference arm
e in each interval.
ence value of arm voltage
is bypassed so diode D2
rm voltage is increasing,
so switch S1
conducts.
negative, sub-module is
oltage is increasing, t2
to
sub-module is bypassed
decreasing, (t1
+t2
)/2 to t1
,
switching instants and
or different values of
(4)
CAPACITOR VOLTAGE
G
n (NLM) method is used
mprove the performance
ed NLM, a real-time
has been added to the
he reference modulation
oller and calculates the
generated waveform by
waveform.
ortion of the reference
nerated by MMC sub-
s two parts; the first part
ngels and the second part
ng. In order to achieve
vidual capacitor voltages
ime-step and sent to the
are sorted and at each
tching decision is made
capacitor voltage matrix.
ypassed based on the
vices in each half bridge.
and the switching state of
on of the arm current and
When upper switch or
sub-module capacitor is
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3. inserted in the arm and conduction of the l
or D2) results in bypassing the sub-module c
The sub-modules are in charging or d
according to the direction of current flow
sub-module. When the upper device is con
module capacitor is inserted into the arm
Figure 4 when D1 is conducting the sub-m
will be in charging state. The sub-modul
discharge when S1 conducts. Thus to ac
when the sub-modules are in charging sta
lowest capacitor voltages have to turn
discharging condition the capacitors with
have higher priority.
Figure 5 summarizes the operation of the pr
modulation technique. In the proposed co
remaining sub-modules are considered at e
to reduce the equivalent switching frequ
excessive switching losses. The circulating
also added to the modulation reference sig
capacitor balancing faster.
Number of active sub-modules is calcu
average measured capacitor voltages inst
constant value to increase accuracy.
Figure 3. Output and reference voltage of the propo
Figure 4. Switching state of sub-modu
D1
D2
S1
S2
ipa
Vc
S1
S2
Vc
D1
D2
S1
S2
ipa
Vc
S1
S2
Vc
ower devices (S2
capacitor.
discharging state
wing through the
nducting the sub-
and as shown in
module capacitor
le capacitor will
chieve balancing
ate the ones with
on first and in
highest voltage
roposed real-time
onfiguration only
each discrete step
uency and avoid
g current error is
gnal to make the
ulated by using
tead of using a
osed NLM method
ules
Figure 5. Real-time NLM with capa
V. DETAILED LOSS
The main part of power device l
MMC-HVDC system is conductio
losses. The conduction loss mainly
diode conduction losses. Accordi
results of Gen-4 ETO, the turn-off
temperature under 2.5kV dc-bus vo
which yields the turn-off energy in
Ampere. The ETO on-state voltag
temperature is expressed by (6) whe
in Volts and current I is in Ampe
losses are given by (7).
Conduction losses of four devices
calculated during four intervals d
explained before. The magnitude o
change with time hence the accurat
and modulation is required to c
losses precisely. During each in
conduction loss of the active device
First the conduction interval is
intervals. Number of small interv
defined by changes in the number
interval by (8).
D1
D2
ipa
D1
D2
ipa
Vdc1
Vdc2
.
.
.
Vdcn
Sorting
Vdcmax
.
.
.
Vdcmin
+
(Index)
1
2
.
.
.
n
+
Nactive
(number of
active SMs)
NLM criteria
Varm,ref
1Vdc
2Vdc
.
.
.
nVdc
( Discrete
Voltage
Steps)
Vdcmin
.
.
.
Vdcmax
+
(Index)
citor voltage balancing
CALCULATIONS
losses in an ETO based
on losses and switching
y includes the ETO and
ng to experimental test
ff loss at 125°C junction
oltage is expressed by (5)
n Joule and current is in
ge under 125°C junction
ere the on-state voltage is
eres [7]. The conduction
(5)
(6)
(7)
in each sub-module are
defined in Figure 6 and
of current and modulation
te information of current
calculate the conduction
nterval in Figure 6 the
e is calculated as follows:
s divided into smaller
vals or discrete levels is
of active devices in each
S1
S2
.
.
.
Sn
(Switching
signals)
x
)
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4. Where tup
is the upper time limit of the inter
lower time limit. The conduction loss is th
small intervals and added together for the n
cells in to find the total conduction loss o
MMC arm. Losses are calculated usin
modulation for MMC. The arms of MMC
the losses are calculated for one arm and
Reduced switching frequency nearest le
(NLM) is used in this design, which is base
the required number of the sub-modules
output waveform that follows the refere
waveform.
As mentioned before, the sub-modules are o
once during each switching cycle and switc
each discrete step is made by considerin
sub-modules to avoid excessive switchi
switching loss is calculated for ETO and
the four regions with respect to switchin
devices. To calculate the number of device
or off during each interval nactive
must be c
beginning and end of the time interval.
equation as an example shows the numb
during (t3
, 0) time interval.
Where nSW
is the total number of devices t
off that occur during each region assumin
status of only one of the sub-modules cha
discrete step. Similarly, nSW
and switch
calculated for D2
, S2
, S1
during the time int
(t1
+t2
)/2) and ((t1
+t2
)/2, t1
).
Adding the calculated losses for four re
switching losses for reduced switching
modulation used in this design. The devic
includes turn-on loss and turn-off loss. Due
di/dt inductor, ETO turn-on loss is sm
neglected. Therefore the switching losses p
ETO and diode turn-off losses.
Figure 8 shows the overall diagram
Reference modulation waveform genera
controller is the input to capacitor voltag
loss calculation systems. Loss calculation
the individual device losses for all sub-modu
(8)
rval and tlow
is the
hen calculated for
number of active
of each device in
ng nearest level
C are identical so
multiplied by 6.
evel modulation
ed on calculating
s to generate an
ence modulation
only switched on
ching decision at
ng the remaining
ing losses. The
diode in each of
ng status of the
es that switch on
calculated at the
. The following
ber of switching
(9)
that switch on or
ng that switching
ange during each
hing losses are
tervals (0, t2
), (t2
,
egions results in
frequency NLM
ce switching loss
e to the use of the
mall and can be
primarily include
(10)
of the system.
ated by system
ge balancing and
n system outputs
ules.
Figure. 6 Proposed loss estimation metho
switching state
Accurate individual device losses a
using the proposed loss calculatio
shows the power losses of S1, D1,
module in the upper arm for mor
example and the same waveforms c
devices in other sub-modules.
technique swaps sub-modules and
losses amongst sub-modules.
Table 1 summarizes the device and
500MW ETO based MMC-HVD
operating conditions. The DC link
system is 320KV and there are 1
arm of the converter. Conventiona
have around 1% semiconductor lo
total semiconductor loss of the pro
16% less than conventional MMC-H
Figure 7. Proposed modulation and re
od, arm voltage, current and
es
are calculated and plotted
on technique. Figures 8
S2 and D2 the first sub-
e than 100 cycles as an
can be plotted for all four
. Capacitor balancing
will eventually balance
d sub-module losses of a
DC system for different
k voltage of the modeled
28 sub-modules in each
al MMC-HVDC systems
sses per station [1]. The
oposed system is around
HVDC systems.
eal time loss calculation
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5. Figure 8. Real time loss of the four devices in the first sub-module
I. THERMAL ANALYSIS
Each sub-module of MMC has two ETOs and two diodes
and the losses of the switching components need to be
removed out by a cooling system. The heat pipe based air
cooling system can be used to remove the heat from ETO
stacks. Use of heat pipe helps with cost, reliability and
comact structure and allows us to avoid the drawbacks of
conventional water cooling systems such as the need of
good electrical isolation. A basic pricipal in optimal design
of ETO stacks is to use the stray inductance to limit the turn
on current.
Figure 10 shows heat pipe based cooling and ETO based
MMC sub-module structure. The cooling system of half-
bridge MMC sub-module is first designed for the MMC-
HVDC system at 500MW operation and the junction
temperatures are still much lower than 100°C.
Table II shows the individual device losses for designed
500MW operation. Since the junction temperature of all
sub-module devices is well below 125°C the ETO based
system is capable to operate at higher powers. The
possibility of 1000MW operation is examined and losses are
calculated, table III shows the junction temperature of four
devices. Device temperatures are still lower than 125°C
which indicates that the proposed system has potential to
reach 1000MW which is much higher than IGBT based
MMC-HVDC systems.
TABLE I. LOSS CALCULATION FOR A 500MW ETO BASED MMC-
HVDC SYSTEM
Figure 9. Average device losses over 200 cycles
Figure 10. Heat pipe based cooling (left), MMC sub-module (right)
0 10 20 30 40 50 60 70 80 90 100 110
0
50
100
150
200
250
300
Number of cycles (N)
DiodeD1(SM1)losses(Watt)
0 10 20 30 40 50 60 70 80 90 100 110
0
200
400
600
800
Number of cycles (N)
SwitchS1(SM1)losses(Watt)
0 10 20 30 40 50 60 70 80 90 100 110
0
200
400
600
800
1000
1200
Number of cycle (N)
DiodeD2(SM1)losses(Watt)
0 10 20 30 40 50 60 70 80 90 100 110
0
50
100
150
200
250
300
Number of cycles (N)
SwitchS2(SM1)losses(Watt)
Device Loss (PF= -0.95) Loss (PF= 1) Loss(PF=+0.95)
D1 155 132 181
D2 310 705 632
S2 446 167 162
S1 816 596 719
Each sub-module losses 1727 1600 1694
Each sub-module losses [1]
design with IGBT
(400 MW, Vdc=200KV, nsm=200)
2330 1850 2167
0
500
1000
1500
2000
D1 D2 S2 S1 SM loss
PF=-0.95
PF=+0.95
PF=1
c
D1c
c
c
S1
S2
D2
ETO
Heat pipe
Antiparallel
diode
cc
cc
S1
S2
D1
D2
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6. TABLE II. DEVICE TEMPERATURE FOR DESIGNED 500MW MMC-
HVDC
Device Junction temperature (°C)
D
2
61.9
S
2
67.4
S
1
81.6
D
1
54.4
TABLE III. DEVICE TEMPERATURE FOR A POTENTIAL 1000MW MMC-
HVDC
Device Junction temperature (°C)
D
2
82.9
S
2
90.6
S
1
109.2
D
1
70.1
II. CONCLUSION
This paper proposed a new ETO based MMC-HVDC
system and discussed modulation, capacitor voltage
balancing and detailed valve loss calculation based on
reduced switching frequency NLM for the proposed system.
The MMC-HVDC system loss is more than 1% per station
[1], yet proposed MMC-HVDC system based on the
4500V/4000A ETO thyristor has higher capacity and more
than 16% lower losses per station compared to IGBT based
MMC-HVDC. Besides, the system has the controllability of
the VSC based HVDC systems.
Thermal analysis shows that power capacity of ETO based
MMC-HVDC can reach higher than 1000MW which is
more than power capacity of conventional MMC-HVDC
systems.
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