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Low cost                          New technology                                   High performance




Cogent ATE                                                                                ™
        A 100
                              Analog and Mixed-Signal Test System
                             Easy and Affordable Multi-Site Testing
                             Cogent ATE’s Leopard A Series Analog and Mixed-Signal Test System represents a
                             transformational change in the testing of analog and mixed-signal ICs, a high-volume and
                             cost-sensitive segment of semiconductor market where the test cost has become a
                             growing percentage and sometimes the most significant part of the overall cost of
                             manufacturing the device. Cogent ATE’s Leopard A Series Power Management Test
                             System will give our customers, Integrated Device Manufacturers (IDM), fables
                             semiconductor companies and Outsourced Assembly and Test (OSAT) significant cost
                             advantage over their competitions.

                             Cogent ATE’s strategy to reduce the cost-of-test is simple; higher throughput at a lower
                             price. We achieved higher throughputs with practical quad-site wafer and final testing
                             using Cogent ATE’s Floating Test Sites™ System Architecture. We designed our test
                             system for low cost by using the latest electronics and by incorporating our proprietary
                             embedded IP core technology, Tester-on-a-chip™, in our hardware.
Target Devices

    Power MOSFET             Floating Quad-Site Testing™ is Real and Guaranteed
    Operational Amplifiers   True parallel testing of up to 4 device-under-test (DUT) sites is not only real but also
    Linear Regulators        affordable with Cogent ATE’s Leopard Series Analog and Mixed-Signal Test System. For
    LDO Regulators           our targeted device markets, quad-sites parallel testing is most economical and practical
                             solution for both wafer and final tests. Turret based handlers, a popular choice for
    Voltage Reference
                             discrete and power management devices are capable of quad-site testing. “Massive Parallel
    Battery Charger
                             wafer testing is often unrealistic given the cost and technical issues in the interface
    PWM
                             technology, i.e. probe card.
    DC-DC
    Audio CODEC
                             We have achieved the lowest cost-of-test to date for the Discrete Power Semiconductor
    Audio DACs
                             and Power Management IC markets by making Floating Quad-Site Testing™ a compelling
    Audio ADCs
                             alternative to the non-floating single or dual site testers from our competitions. We intend
    Analog Switches
                             to maintain this leadership by continuously improving test performance and lowering
                             hardware cost.
Cogent ATE Series
                    Leopard
                                                            Summary
Features
                                                            Reliable and Repeatable Test Results by Design
                                                            Reliable and repeatable multi-site testing requires floating resources with independent ground
    True parallel multi-site testing
                                                            connections to avoid interference commonly associated with a common ground pathway.
    with Floating Quad-Site Testing
    architecture                                            Cogent ATE’s Floating Test Sites™ (FTS) System Architecture provides electrical separation
                                                            between individual test sites in automatic test equipment (ATE) by providing floating resources with
    Scale from Single to Multi-Site                         independent ground connections for each individual device under test (DUT) sites. This feature allows
    Testing automatically with Auto                         each device’s test results to remain isolated from the test results of other adjacent sites. This leads to
    Test Replication                                        better test accuracies and fewer false rejects due to device-to-device interference errors.
    48 Analog Channels and 32                               In Automatic Test Equipment (ATE), the best path is the shortest path. All resources reside in the
    Digital Channels in a single test                       test head. An included full-featured manipulator then that brings the test head as close to the
    head                                                    Device-Under-Test (DUT)as possible for both wafer level and final test configurations.
    Standard full feature                                   Guaranteed Multi-Site Testing
    manipulator for wafer level and                         Cogent ATE’s Automatic Test Replication™ (ATR) Technology allows a test solution to be scaled
    final test                                              from single to multi-site with ease, i.e. with a click of button and without any risk. This technology
                                                            eliminates the long and tedious routine of copying a single site test program, modifying it for
    SBC Industrial PC, Telescope                            multi-site testing and then debugging the new test program. Since all of our analog and digital
    mounting for Monitor and                                resource boards are Floating Quad-Site Testing™ ready, which means that the success of
                                                            conversion from single to multi-site testing will not be left to chance, i.e. the skills of the test
    Keyboard on the manipulator
                                                            engineer or the availability of floating resources. Our multi-site test solution are guaranteed to work
    for a compact and ergonomic
                                                            since each individual test sites are running on identical sets of hardware that are electrically isolated
    test cell                                               from each other.

                                                            Wide Range of Target Devices
                                                            By choosing from a wide range of resources, the Leopard A Series can test devices from several
                                                            high-volume IC markets, such op-amps, MOSFETs, Power Management Devices, ADC, DAC and
                                                            Audio CODEC.




   page 2   Cogent ATE Systems Corporation   |   Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China   |   Tel: +86(10)59000102   |   Fax:+86(10)58850677   |   www.CogentATE.com
Cogent ATE Series
           
                                                             
                  Leopard
     Higher Throughputs and Lower Capital Cost                                              Templates for individual devices test are created
     We have achieved significant cost advantages over the                                  automatically, allowing the user to focus on high-level
     traditional ATE vendors by using the latest electronics                                function calls to program devices and provide a
     and by incorporating our proprietary embedded IP core                                  means to build family generic templates without
     technology, Tester-on-a-chip™, in our hardware.                                        subsequent code changes .This environment
     Cogent ATE’s Tester-on-a-chip™ (ToC) is a collection                                   provides the best features of template-driven
     of intellectual property (IP) cores that have been adapted                             programming and the fine control of procedural
     by Cogent ATE to add Automatic Test Equipment                                          compiled commands.
     (ATE) related functions such as timing accuracy,                                        
     Arbitrary Waveform Generator (AWG), memory control,
     Digital Signal Processing (DSP) analysis, high-speed I/O
     capability, and jitter compliance.

     With the inclusion of a full-feature manipulator, Leopard
     A Series achieves close to zero footprint with most
     handlers and probers. Our choice of a Single Board
                                                                                            Easy ATE™ to provide a graphical representation of
     Computer (SBC) based Industrial PC and the inclusion
                                                                                            the hardware and give the user full control over
     of Monitor and Keyboard mounts on the manipulator
                                                                                            device and instrument conditions.
     creates a compact and ergonomic test cell friendly to
     both engineers and operators.




                                                                                            Powerful program editor.
                                                                                             


     Friendly Software for both IC design and Production
     environment

     Leopard A Series test system software Easy ATE™ has
     several industry-first features that are very useful for the
     debug and characterization of power ICs. In most ATEs
     a simple voltage force and current sense scenario may
     damage the ATE if the sensed current is large. Some
     ATEs try to dissipate the sense current with large heat
     sink. Cogent ATE’s patented technology allows the
                                                                                            Data analysis and map-making.
     Power IC designer to observe a static sense a current as
     large as 2 Amp and 50 Volt.




page 3   Cogent ATE Systems Corporation   |   Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China   |   Tel: +86(10)59000102   |   Fax:+86(10)58850677   |   www.CogentATE.com
Specifications
  
  
              Instruments                                                        Description
  
 Base         MUX               Multiplexer Relay Control                        MUX to control 96 relays on DUT board,
                                Unit                                             100 mA
 Base         QVM*              Quad Voltage Measurement                         4 channels, 16 bits ADC Converters
                                Unit
 Base         QTMU              Quad Time Measurement                            Provides a wide range of interval and
                                Unit                                             frequency measurement, 5ns~200ms /
                                                                                 20Hz~10MHz (125ps resolution)
 Analog       MVI*              Medium Power V/I Source                          4 channels, ± 20 V, ± 400 mA
                                                                                 2 channels, ± 20 V, ± 20 mA
 Analog       DPVI*             Dual Power V/I Source                            2 channels, ± 50 V, ± 10A pulsed
 Analog       QVI               Quad V/I Source                                  4 channels, ± 40 V, ± 400 mA
 Analog       MVB               Multi Voltage Bias                               8 channels, ± 20 V, ± 20 mA
 Digital      DSS               Digital Subsystem                                32 channels, 10 MHz data rate, 512K
                                                                                 Logic Vector Memory
 Mixed        ACSM              Alternating Current                              ACS, 4 channels, ± 10 V (p-p), 20 Hz – 2
                                Source/Measure Unit                              MHz
                                                                                 ACM, 4 channels, ± 100 V measure unit
                                                                                 with 400Ksps or 10 Msps
  
  
  




Configuration Restrictions                                             .Operational Dimensions
must contains one MUX
Slot contains one QTMU                                    Width inches (cm)                       Depth inches (cm)                     Height inches (cm)
                                                             24.5(62)                                 20.5(50)                               42(102)
Power Requirements

AC single phase, 110 V, 20 A or 220 V, 10A




                                             Cogent ATE Systems Corporation
                                             Room 705,SOHO Shangdu North Tower B
                                             No.8 Dongdaqiao Road,Chaoyang District
                                             Beijing 100020, P.R.China
                                             Tel: +86(10)59000102            |    Fax: +86(10)58850677


                                             World Wide Web                  |      www.CogentATE.com

                                             Cogent ATE is a registered trademark; the Cogent ATE logo and Leopard Series are trademarks of Cogent ATE Systems Corporation.
                                             All other trademarks are the property of their respective owners.
                                             © 2008 Cogent ATE Systems Corporation. All rights reserved.

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A100

  • 1. Low cost  New technology High performance Cogent ATE ™ A 100 Analog and Mixed-Signal Test System Easy and Affordable Multi-Site Testing Cogent ATE’s Leopard A Series Analog and Mixed-Signal Test System represents a transformational change in the testing of analog and mixed-signal ICs, a high-volume and cost-sensitive segment of semiconductor market where the test cost has become a growing percentage and sometimes the most significant part of the overall cost of manufacturing the device. Cogent ATE’s Leopard A Series Power Management Test System will give our customers, Integrated Device Manufacturers (IDM), fables semiconductor companies and Outsourced Assembly and Test (OSAT) significant cost advantage over their competitions. Cogent ATE’s strategy to reduce the cost-of-test is simple; higher throughput at a lower price. We achieved higher throughputs with practical quad-site wafer and final testing using Cogent ATE’s Floating Test Sites™ System Architecture. We designed our test system for low cost by using the latest electronics and by incorporating our proprietary embedded IP core technology, Tester-on-a-chip™, in our hardware. Target Devices Power MOSFET Floating Quad-Site Testing™ is Real and Guaranteed Operational Amplifiers True parallel testing of up to 4 device-under-test (DUT) sites is not only real but also Linear Regulators affordable with Cogent ATE’s Leopard Series Analog and Mixed-Signal Test System. For LDO Regulators our targeted device markets, quad-sites parallel testing is most economical and practical solution for both wafer and final tests. Turret based handlers, a popular choice for Voltage Reference discrete and power management devices are capable of quad-site testing. “Massive Parallel Battery Charger wafer testing is often unrealistic given the cost and technical issues in the interface PWM technology, i.e. probe card. DC-DC Audio CODEC We have achieved the lowest cost-of-test to date for the Discrete Power Semiconductor Audio DACs and Power Management IC markets by making Floating Quad-Site Testing™ a compelling Audio ADCs alternative to the non-floating single or dual site testers from our competitions. We intend Analog Switches to maintain this leadership by continuously improving test performance and lowering hardware cost.
  • 2. Cogent ATE Series Leopard Summary Features Reliable and Repeatable Test Results by Design Reliable and repeatable multi-site testing requires floating resources with independent ground True parallel multi-site testing connections to avoid interference commonly associated with a common ground pathway. with Floating Quad-Site Testing architecture Cogent ATE’s Floating Test Sites™ (FTS) System Architecture provides electrical separation between individual test sites in automatic test equipment (ATE) by providing floating resources with Scale from Single to Multi-Site independent ground connections for each individual device under test (DUT) sites. This feature allows Testing automatically with Auto each device’s test results to remain isolated from the test results of other adjacent sites. This leads to Test Replication better test accuracies and fewer false rejects due to device-to-device interference errors. 48 Analog Channels and 32 In Automatic Test Equipment (ATE), the best path is the shortest path. All resources reside in the Digital Channels in a single test test head. An included full-featured manipulator then that brings the test head as close to the head Device-Under-Test (DUT)as possible for both wafer level and final test configurations. Standard full feature Guaranteed Multi-Site Testing manipulator for wafer level and Cogent ATE’s Automatic Test Replication™ (ATR) Technology allows a test solution to be scaled final test from single to multi-site with ease, i.e. with a click of button and without any risk. This technology eliminates the long and tedious routine of copying a single site test program, modifying it for SBC Industrial PC, Telescope multi-site testing and then debugging the new test program. Since all of our analog and digital mounting for Monitor and resource boards are Floating Quad-Site Testing™ ready, which means that the success of conversion from single to multi-site testing will not be left to chance, i.e. the skills of the test Keyboard on the manipulator engineer or the availability of floating resources. Our multi-site test solution are guaranteed to work for a compact and ergonomic since each individual test sites are running on identical sets of hardware that are electrically isolated test cell from each other. Wide Range of Target Devices By choosing from a wide range of resources, the Leopard A Series can test devices from several high-volume IC markets, such op-amps, MOSFETs, Power Management Devices, ADC, DAC and Audio CODEC. page 2 Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.com
  • 3. Cogent ATE Series       Leopard Higher Throughputs and Lower Capital Cost Templates for individual devices test are created We have achieved significant cost advantages over the automatically, allowing the user to focus on high-level traditional ATE vendors by using the latest electronics function calls to program devices and provide a and by incorporating our proprietary embedded IP core means to build family generic templates without technology, Tester-on-a-chip™, in our hardware. subsequent code changes .This environment Cogent ATE’s Tester-on-a-chip™ (ToC) is a collection provides the best features of template-driven of intellectual property (IP) cores that have been adapted programming and the fine control of procedural by Cogent ATE to add Automatic Test Equipment compiled commands. (ATE) related functions such as timing accuracy,   Arbitrary Waveform Generator (AWG), memory control, Digital Signal Processing (DSP) analysis, high-speed I/O capability, and jitter compliance. With the inclusion of a full-feature manipulator, Leopard A Series achieves close to zero footprint with most handlers and probers. Our choice of a Single Board Easy ATE™ to provide a graphical representation of Computer (SBC) based Industrial PC and the inclusion the hardware and give the user full control over of Monitor and Keyboard mounts on the manipulator device and instrument conditions. creates a compact and ergonomic test cell friendly to both engineers and operators. Powerful program editor.   Friendly Software for both IC design and Production environment Leopard A Series test system software Easy ATE™ has several industry-first features that are very useful for the debug and characterization of power ICs. In most ATEs a simple voltage force and current sense scenario may damage the ATE if the sensed current is large. Some ATEs try to dissipate the sense current with large heat sink. Cogent ATE’s patented technology allows the Data analysis and map-making. Power IC designer to observe a static sense a current as large as 2 Amp and 50 Volt. page 3 Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.com
  • 4. Specifications     Instruments Description   Base MUX Multiplexer Relay Control MUX to control 96 relays on DUT board, Unit 100 mA Base QVM* Quad Voltage Measurement 4 channels, 16 bits ADC Converters Unit Base QTMU Quad Time Measurement Provides a wide range of interval and Unit frequency measurement, 5ns~200ms / 20Hz~10MHz (125ps resolution) Analog MVI* Medium Power V/I Source 4 channels, ± 20 V, ± 400 mA 2 channels, ± 20 V, ± 20 mA Analog DPVI* Dual Power V/I Source 2 channels, ± 50 V, ± 10A pulsed Analog QVI Quad V/I Source 4 channels, ± 40 V, ± 400 mA Analog MVB Multi Voltage Bias 8 channels, ± 20 V, ± 20 mA Digital DSS Digital Subsystem 32 channels, 10 MHz data rate, 512K Logic Vector Memory Mixed ACSM Alternating Current ACS, 4 channels, ± 10 V (p-p), 20 Hz – 2 Source/Measure Unit MHz ACM, 4 channels, ± 100 V measure unit with 400Ksps or 10 Msps       Configuration Restrictions .Operational Dimensions must contains one MUX Slot contains one QTMU Width inches (cm) Depth inches (cm) Height inches (cm) 24.5(62) 20.5(50) 42(102) Power Requirements AC single phase, 110 V, 20 A or 220 V, 10A Cogent ATE Systems Corporation Room 705,SOHO Shangdu North Tower B No.8 Dongdaqiao Road,Chaoyang District Beijing 100020, P.R.China Tel: +86(10)59000102 | Fax: +86(10)58850677 World Wide Web | www.CogentATE.com Cogent ATE is a registered trademark; the Cogent ATE logo and Leopard Series are trademarks of Cogent ATE Systems Corporation. All other trademarks are the property of their respective owners. © 2008 Cogent ATE Systems Corporation. All rights reserved.