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半導體原理及應用   (II)
Outline ,[object Object],[object Object],[object Object],[object Object]
[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],ULSI  簡介與應用
Semiconductor ,[object Object],[object Object],[object Object],[object Object],[object Object]
Market Share in Semiconductor Devices ,[object Object]
MOSFET M: Metal (or n + -poly, p + -poly) O: Oxide (gate oxide) S: Semiconductor (p-Si or n-Si) FET: Field effect transistor (E y , E x )
CMOS ,[object Object]
IC ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
 
Application of ULSI
ULSI  製程簡介 ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
IC Fabrication Flow ,[object Object]
 
Crystal Growth
Wafer Size ,[object Object]
單晶體  vs.  多晶體
多晶矽原料 SiO 2  + 2C    Si + 2CO ( 純度 98%) Si + 3HCl    SiHCl 3  + H 2 ( 蒸餾去除不純物 ) SiHCl 3  + H 2     Si + 3HCl   ( 純度 99.999999999%) “11 個 9”
 
長晶爐 ( 固定液面高度 ) ( 上升 : 0.3~10mm/min 旋轉 : 2~20rpm) ( 控制 : 晶棒直徑 上升速率 液面溫度 ) ( 避免 Si 在 高溫氧化 ) SiO 2     SiO + O ( 脫氧 ) ( 熱場 ) ( 液態表面溫度 )
晶圓成形
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
RTP ,[object Object]
Diffusion
 
 
 
Ion Implantation
 
 
 
 
 
Etching
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
ULSI  之未來趨勢 ,[object Object],[object Object],[object Object],[object Object],[object Object]
 
Challenges in IC ,[object Object]
Technology Roadmap ,[object Object]
Recent Trend of MOSFET ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]

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