This presentation was delivered at the Environmental Mass Spectrometry Special Interest Group (EMSSIG) at BAT’s R&D facility in Southampton, UK. The meeting drew attention to the methodology employed to analyse complex matrices containing target (or non-target) compounds with a range of physico-chemical properties. The full presentation can be downloaded from the Markes website: http://www.markes.com/Resources/Scientific- publications/Conference-presentations.aspx

1. Select-eV: Increasing dimensionality in
GC××××GC–TOF MS of environmental
contaminants
Laura McGregor
lmcgregor@markes.com
EMSSIG 2014, 9th July; BAT, Southampton

2. Outline
• Select-eV: novel ion-source technology
– What, why and how?
• Select-eV for environmental analyses
– GC×GC–TOF MS

3. What is the BenchTOF?
• A reflectron time-of-flight mass spectrometer
• Platform-neutral
• Innovative design
Mass spectrometry at Markes

4. Historically…
Variable-energy electron ionisation
70 eV mass spectrum of p-cymene 14 eV mass spectrum of p-cymene

5. Variable-energy ionisation
Transition of fragmentation pattern aids structural elucidation
70 eV
16 eV
12 eV

6. Case study
GC×GC–TOF MS of environmental matrices

7. Water Framework Directive (WFD)
• Lower detection limits
• New monitoring methods and analytical
techniques are now necessary
• Focus is on “priority” substances, but what
about those of emerging concern?

8. Emerging contaminants
O
O
O
O
O
P
O
O
O
CH3
CH3

9. Summary
• Hassle-free soft ionisation
• Improved sensitivity and selectivity
• Reduced matrix impact
• Lower detection limits

10. Acknowledgements
• Anthony Gravell, Natural Resources Wales (NRW)
• Graham Mills, University of Portsmouth
• Ian Allan, Norwegian Institute for Water Research NIVA
• Helge E. Roald, Colosseum Clinic (Oslo, Norway)

11. This is an excerpt from the original presentation.
The full presentation can be downloaded from the
Markes website:
http://www.markes.com/Resources/Scientific-
publications/Conference-presentations.aspx

12. Contact Markes
www.markes.com
enquiries@markes.com