The document announces summer open houses hosted by the Materials Characterization Lab to showcase various materials characterization techniques. It provides a schedule listing the technique demonstrated, time, date and location for each open house from June to August. Locations include buildings like the MRL, MRI, Deike. Techniques include thermal analysis, transmission electron microscopy, scanning electron microscopy, x-ray diffraction, atomic force microscopy and more. The note provides locations for the MRI and MRL buildings. More information is available on the listed website.

1. Materials Characterization Lab
www.mri.psu.edu/mcl
Summer Characterization Open Houses
Technique Time Date Location
Thermal analysis (TGA, DTA, DSC) 9:45 AM June 8 250 MRL Bldg.
Transmission Electron Microscopy (TEM/STEM) 9:45 AM June 15 114 MRI Bldg
Scanning electron microscopy (SEM) 9:45 AM June 22 541 Deike Bldg.
Analytical SEM 11:00 AM June 22 541 Deike Bldg.
X-ray Diffraction (XRD) 9:45 AM June 29 250 MRL Bldg.
Dielectric Characterization (25 min lecture only) 9:45 AM July 6 250 MRL bldg.
High temperature sintering lab (20 min lecture only) 10:15 AM July 6 250 MRL Bldg.
Focused Ion Beam (FIB) 9:45 AM July 13 114 MRI Bldg
TEM sample preparation 11:00 AM July 13 114 MRI Bldg
Orientation imaging microscopy (OIM/EBSD) 9:45 AM July 20 250 MRL Bldg.
Chemical analysis (ICP, ICP-MS) 9:45 AM July 27 541 Deike Bldg.
Atomic Force Microscopy (AFM) 9:45 AM August 3 114 MRI Bldg
Small angle x-ray scattering (SAXS) 9:45 AM August 10 541 Deike Bldg.
Particle Characterization 9:45 AM August 17 250 MRL
X-ray photoelectron spectroscopy (XPS/ESCA) 9:45 AM August 24 114 MRI Bldg
Auger Electron Spectroscopy (AES) 11:00 AM August 24 114 MRI Bldg
NOTE LOCATIONS: The MRI Bldg is in the Innovation Park near the Penn Stater Hotel; MRL Bldg. is on Hastings Road.
More information: www.mri.psu.edu/mcl

2. Materials Characterization Lab
www.mri.psu.edu/mcl
Materials Characterization Lab Locations
Bldg Telephone
MRL 863-7844
MRI 865-0337 MRI Bldg:
Hosler 865-1981 XPS/ESCA, SIMS,
E&ES 863-4225
TEM, HR-TEM, FE-
Auger, AFM, XRD
MRL Bldg:
Hosler Bldg:
SEM, XRD, OIM, DTA,
SEM, ESEM, FE-
DSC, TGA, FTIR, Penn Stater
SEM, EPMA, ICP,
Hotel
Raman, AFM, Powder,
E&ES Bldg: ICP-MS,BET, SAXS
dielectric, prep, shop,
SEM
IC, UV-Vis
Route 322
Steidle Bldg:
Atherton Street
Nanoindenter
(322 Business)
I-99
Park Ave.
0
0 0
0 0 0 0
Ave. 0
0 0 0 0
Park 0
Beaver
0
0
Stadium
0
0
0
Centre
0
0
Porter Road
Community
Univ
Shortlidg
Hospital
0
0
Burrowes Road
ersi
ty D
e
Pollock Road
Road
rive
North
Hastin
Deike Bldg: gs Ro
ad
College Ave.

3. Materials Characterization Lab
www.mri.psu.edu/mcl
Atomic Force Microscopy
Vince Bojan
AFM / XPS / Auger / SIMS Analyst
August 3, 2005

4. Materials Characterization Lab
www.mri.psu.edu/mcl
ACKNOWLEDGEMENTS
Jeff Shallenberger
Raafat Malek
Evangelos Manias

5. Materials Characterization Lab
www.mri.psu.edu/mcl
OUTLINE
― an overview of the technique
―discussion of MCL instrument capabilities
― applications
― AFM vs. SEM
― how to get started
― resources
― a brief lab tour / instrument demonstration

6. Materials Characterization Lab
www.mri.psu.edu/mcl
Atomic Force Microscopy (AFM)
is a subset of
“Scanning Probe Microscopies” (SPM)
The radius of this tip can
vary from 1 angstrom (STM) to
1 micron
For AFM, tip radii range from
1-20 nm.
A Practical Guide to Scanning Probe Microscopy, Howland & Benatar

7. Materials Characterization Lab
www.mri.psu.edu/mcl
OTHER SCANNING PROBE
MICROSCOPIES
• SCANNING TUNNELING MICROSCOPY (STM)
• LATERAL FORCE MICROSCOPY (LFM)
• MAGNETIC FORCE MICROSCOPY (MFM)
• ELECTRIC FORCE MICROSCOPY (EFM)
• CHEMICAL FORCE MICROSCOPY (CFM)
• NEAR-FIELD SCANNING OPTICAL MICROSCOPY (SNOM OR
NSOM)
• SCANNING CAPACITANCE MICROSCOPY (SCM)
• BALLISTIC ELECTRON EMISSION MICROSCOPY (BEEM)
• SCANNING THERMAL MICROSCOPY
• PHOTON SCANNING TUNNELING MICROSCOPY
• ELECTROCHEMICAL STM AND AFM
• FORCE MODULATION MICROSCOPY
• SURFACE POTENTIAL MICROSCOPY

8. Materials Characterization Lab
www.mri.psu.edu/mcl
HISTORY
• SCANNING TUNNELING MICROSCOPE DEVELOPED BY
BINNIG, ROHRER, GERBER AND WEIBEL AT IBM IN ZURICH
• 1982 NOBEL PRIZE IN PHYSICS FOR THE STM
• AFM DEVELOPED IN 1986 BY BINNIG, QUATE AND GERBER
IN AN IBM / STANFORD COLLABORATION

9. Materials Characterization Lab
www.mri.psu.edu/mcl
Scanning Tunneling Microscopy (STM) - G. Binnig, H. Rohrer, C. Gerber,
E. Weibel, Phys. Rev. Lett. 1982, 49, 57.
COURTESY R. MALEK, MCL

10. Materials Characterization Lab
www.mri.psu.edu/mcl
TYPICAL AFM LAYOUT
or
mirr PSD
las
er
A
B
C
D
DI MULTIMODE
cantile
v er
(A+B) - (C+D)
(kept constant during scanning)
sample
scanner scanner
x,y-
z-
Drive voltage gives
height information
(constant deflection)
COURTESY R. MALEK

11. Materials Characterization Lab
www.mri.psu.edu/mcl
MCL MICROSCOPES
DIGITAL INSTRUMENTS DIGITAL INSTRUMENTS
DIMENSION 3100 (MRI BLDG.) MULTIMODE (MRL BLDG.)
BETTER HI-MAGNIFICATION
LARGE SAMPLE CAPABILITY IMAGING

12. Materials Characterization Lab
www.mri.psu.edu/mcl
DIMENSION 3100 MULTIMODE
(MRI) (MRL)
HEIGHT 11 mm 5mm
WIDTH 100 mm 12mm
VERTICAL
6.4 MICRONS 5.5 MICRONS
FEATURE SIZE
250nm – 100 10nm – 160
SCAN SIZE
MICRONS MICRONS
SAMPLE
AIR & LIQUID AIR & LIQUID
ENVIRONMENT

13. Materials Characterization Lab
www.mri.psu.edu/mcl
SAMPLE PREPARATION
CONDUCTIVE AND NON-CONDUCTIVE SAMPLES
SURFACE CLEANING SOMETIMES NECESSARY
SAMPLE MOUNTING MAY REQUIRE SOME EFFORT
VERTICAL RESOLUTION:
DEPENDS ON INHERENT SCANNER RESOLUTION, ELECTRONIC
RESOLUTION, COMBINED EFFECTS OF ELECTRICAL, MECHANICAL
& ACOUSTIC NOISE…..TYPICALLY SUB ANGSTROM TO SEVERAL
ANGSTROMS
LATERAL RESOLUTION:
DEPENDS ON TIP RADIUS AND GEOMETRY, PIXEL DENSITY,
TIP/SAMPLE INTERACTION FORCES, COMBINED ELECTRONIC,
MECHANICAL, AND ACOUSTIC NOISE SOURCES, AND THE
DEFINITION OF LATERAL RESOLUTION…..TYPICALLY A FEW TO
10S OF nm

14. Materials Characterization Lab
www.mri.psu.edu/mcl
CONTACT VS. TAPPING MODE
DIMENSION 3100 MICROSCOPE
BOTH METHODS SCAN THE SURFACE WITH A CONSTANT FORCE

15. Materials Characterization Lab
www.mri.psu.edu/mcl
ADVANTAGES AND DISADVANTAGES OF CONTACT AND TAPPING
MODES
CONTACT
ADVANTAGES
•HIGH SCAN SPEEDS
•VERY ROUGH SAMPLES CAN SOMETIMES BE SCANNED MORE EASILY
DISADVANTAGES
•LATERAL FORCE DISTORTION
•CAPILLARY FORCES FROM ADSORBED WATER CAN BE HIGH
•HIGH LATERAL AND NORMAL FORCES CAN DAMAGE SOFT SAMPLES
TAPPING
ADVANTAGES
•HIGHER LATERAL RESOLUTION ON MOST SAMPLES
•LOWER FORCES AND LESS DAMAGE TO SOFT SAMPLES IMAGED IN AIR
•LATERAL FORCES VIRTUALLY ELIMINATED
DISADVANTAGES
•SLOWER SCAN SPEEDS THAN CONTACT MODE

16. Materials Characterization Lab
www.mri.psu.edu/mcl
Contact Mode Cantilever (Si3N4)
0.32 0.12
CANTILEVERS NOT DRAWN TO SCALE
0.06 0.58
COURTESY R. MALEK, MCL

17. Materials Characterization Lab
www.mri.psu.edu/mcl
TAPPING MODE CANTILEVER

18. Materials Characterization Lab
www.mri.psu.edu/mcl
TEMPERED GLASS TOPOGRAPHIC IMAGE

19. Materials Characterization Lab
www.mri.psu.edu/mcl
MEASUREMENT OF LATERAL AND VERTICAL FEATURES

20. Materials Characterization Lab
www.mri.psu.edu/mcl
AVERAGE ROUGHNESS CALCULATION

21. Materials Characterization Lab
www.mri.psu.edu/mcl
PIXEL HEIGHT DISTRIBUTION ANALYSIS
HIGHEST (YELLOW)
4.1 nm
7.5 nm
10 nm
LOWEST (MAROON)

22. Materials Characterization Lab
www.mri.psu.edu/mcl
NANOWIRE UNIFORMITY

23. Materials Characterization Lab
www.mri.psu.edu/mcl
HOT-END SnO2 COATING ON A GLASS BEER BOTTLE
10 CTU 20 CTU 30 CTU

24. Materials Characterization Lab
www.mri.psu.edu/mcl
CARBON NANOTUBES

25. Materials Characterization Lab
www.mri.psu.edu/mcl
PHASE IMAGING IN TAPPING MODE
amplitude
Extender
phase
Electronics
phase

26. Materials Characterization Lab
www.mri.psu.edu/mcl
K. E. Strawhecker and E. Manias, AFM of Poly(vinyl alcohol) Crystals Next to an Inorganic Surface
8475 Macromolecules 2001, 34, 8475-8482

27. Materials Characterization Lab
www.mri.psu.edu/mcl
MEASUREMENT OF INTERMOLECULAR FORCES
VIA FORCE-DISTANCE CURVES

28. Materials Characterization Lab
www.mri.psu.edu/mcl
CHEMICAL FORCE MICROSCOPY
F-D curve for
a Si3N4 cantilever
and mica
surface as a
function of pH
C.B. Prater, P.G. Maivald, K.J. Kjoller, M.G. Heaton,
“Probing Nano-Scale Forces with the Atomic Force Microscope”
DI application note

29. Materials Characterization Lab
www.mri.psu.edu/mcl
TIP SHAPE ISSUES
TIP RADIUS AND GEOMETRY INFLUENCE LATERAL RESOLUTION,
AND THE ABILITY TO FOLLOW SURFACE TOPOGRAPHY

30. Materials Characterization Lab
www.mri.psu.edu/mcl
TIP IMAGING
COURTESY E. MANIAS

31. Materials Characterization Lab
www.mri.psu.edu/mcl
AFM VS. SEM
AFM ADVANTAGES
• QUANTITATIVE LATERAL AND VERTICAL MEASUREMENTS
• NO NEED FOR SHARP EDGES OR SPECIAL SURFACE CHARACTERICTERISTICS TO
GENERATE GOOD TOPOGRAPHIC CONTRAST IN IMAGES
• MEASUREMENTS PERFORMED IN AMBIENT AIR, LIQUID, VACUUM, OR OTHER
CONTROLLED ENVIRONMENTS
• ELEVATIONS AND DEPRESSIONS ARE EASILY DISTINGUISHED
• SAMPLE PREP CAN OFTEN BE NON-DESTRUCTIVE
• ABILITY TO DISTINGUISH MATERIAL PROPERTY DIFFERENCES SUCH AS
STIFFNESS, ELASTICITY, COMPLIANCE, FRICTION, ADHESION, MAGNETIC FIELDS,
CARRIER CONCENTRATION, TEMPERATURE DISTRIBUTION, SPREADING
RESISTANCE, AND CONDUCTIVITY
SEM ADVANTAGES
• QUALITATIVE ELEMENTAL INFORMATION VIA X-RAYS & BACKSCATTERED
ELECTRONS
• ABILITY TO IMAGE UNDERCUTS OR CONVOLUTED STRUCTURES
• LARGER DEPTH OF FIELD AND LATERAL SCAN RANGE
• RELATIVELY FAST ACQUISITION OF IMAGES

32. Materials Characterization Lab
www.mri.psu.edu/mcl
Images from DI Veeco Metrology application note “SEM and AFM: Complementary Techniques for High Resolution Surface Investigations”, by Russell, Batchelor, and Thornton.

33. Materials Characterization Lab
www.mri.psu.edu/mcl
DATA PROCESSING
TYPICAL OPERATIONS INVOLVE:
• Removing tilt, drift, scanner offsets and distortions
• Altering contrast, brightness, colors
• Magnify or reduce the vertical scale
• Curvature or edge enhancement algorithms
• Retouch areas of bad data
• Filtering “environmental noise”
• Introduce artificial light sources
• Fourier Transform
• 3-dimensional rendering
• Low-Pass/High-Pass Filtering
• Surface parameters such as roughness, skewness, or kurtosis
• Cross sectional analyses
• Bearing analyses

34. Materials Characterization Lab
www.mri.psu.edu/mcl
COMMON IMAGE PROCESSING ALGORITHIMS CAN
INTRODUCE SIGNIFICANT DISTORTIONS INTO THE DATA

35. Materials Characterization Lab
www.mri.psu.edu/mcl
RESOURCES
Veeco metrology
http://www.veeco.com/
MatSE 597D
http://zeus.plmsc.psu.edu/~manias/MatSc597/
Do a GOOGLE search on “scanning probe microscopy”

36. Materials Characterization Lab
www.mri.psu.edu/mcl
SO HOW DO I GET AFM MEASUREMENTS
MADE???
• CONTACT VINCE BOJAN (vjb2@psu.edu) OR BOB HENGSTEBECK
(bhengstebeck@mri.psu.edu AT THE MRI BLDG. FOR THE DIMENSION 3100
LARGE-SAMPLE AFM.
• CONTACT DR. RAAFAT MALEK (rqm@psu.edu) FOR THE MULTIMODE AFM AT
THE MRL BLDG.
• IF YOU HAVE JUST A FEW MEASUREMENTS, MCL STAFF MEMBERS CAN
MAKE THE MEASUREMENTS FOR YOU, AND ALSO HELP YOU INTERPRET
THE DATA
• IF YOU HAVE LOTS OF SAMPLES, YOU CAN BE TRAINED TO RUN THE
MICROSCOPE YOURSELF
• AFTER TRAINING, RESERVE TIME ON THE AFM CALENDAR
TRAINED, COMPETENT USERS GET ACCESS ON EVENINGS & WEEKENDS
•

37. Materials Characterization Lab
www.mri.psu.edu/mcl
MCL WEB PAGE
http://www.mri.psu.edu/mcl/index.asp
MCL ONLINE RESERVATION SYSTEM
http://www.mri.psu.edu/mcl/online.asp