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Future Prospects for Moore’s Law Eighth Annual High Performance Embedded Computing Workshop Lincoln Laboratory September 28, 2004 Robert Doering Texas Instruments, Inc.
Generalizations of  Moore’s Law ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Source: DataQuest, Intel 10 -2 10 -4 1 Price per Transistor in MPU ($) Dollars to Microcents: 10 -6
High-Level CMOS Technology Metrics – What are the Limits ? ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
State-of-the-Art CMOS in 2004 ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
Scaling -- Traditional Enabler of Moore’s Law * 500 350 250 180 130 90 65 45 32 22 Feature Size [nm] Year of Production ITRS Gate Length 9 return  to 0.7x/3-yr ? 13 * For Speed, Low-Cost, Low-Power, etc. ITRS Lithography Half-Pitch (DRAM) 95 97 99 01 04 07 10 13 16 95 97 99 01 04 07 10 13 16
Can We Extend the Recent 0.7x/2-year Litho Scaling Trend ? 3000 2000 1500 1000 400 350 250 180 130 90 65 45 500 600 10 1 10 2 10 3 10 4 1980 1990 2000 2010 Year of Production Above wavelength Near wavelength Below wavelength g-line  =436nm i-line  =365nm DUV  =248nm 193  =193nm 157  =157nm 32    =EUV 13.5nm Half-Pitch  / Wavelength (nm) i-193  ‘=133nm For lithography, it’s a question of cost and control/parametric-yield !
A “Bag of Tricks” for Optical-Extension Complexity (mask, use) Strength of enhancement Illumination mode Other (Tool) Mask Mask OPC Resist k 1 0.25 0.5 Conventional Annular Dipole Soft Quasar Custom Scattering bars Quasar Binary Intensity Mask Attenuated PSM 6% Attenuated PSM 18% Alternating PSM  Source: ASML Serifs Hammerheads Line Biasing Thick resist Thin  resist Focus drilling Phase filters Double  Exposures Wavelength NA Of course : increasing complexity     increasing cost !
Amortization of Mask Cost @ 130nm ~ 1 million units required to get within 10% of asymptotic cost ! (and getting worse with continued scaling) Significant motivation for some form of “mask-less lithography” !
Of course, overall scaling is limited by more than just lithography ! ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
ITRS Tries to Address Top-Down Goals MPU Clock (GHz) 2001 2003
ITRS Highlights Scaling Barriers, e.g.: Production Year: 2001 2004 2007 2010 2013 2016 Litho Half-Pitch [nm]: 130 90 65 45 32 22 Overlay Control [nm]: 45 32 23 18 13 9 Gate Length [nm]: 65 37 25 18 13 9 CD Control [nm]: 6.3 3.3* 2.2 1.6 1.2 0.8 T OX  (equivalent) [nm]: 1.3-1.6 1.2 0.9 0.7 0.6 0.5 I GATE  (L MIN ) [µA/µm]: - 0.17 0.23 0.33 1 1.67 I ON  (NMOS) [µA/µm]: 900 1110 1510 1900 2050 2400 I OFF  (NMOS) [µA/µm]: 0.01 0.05 0.07 0.1 0.3 0.5 Interconnect   EFF  - 3.1-3.6 2.7-3.0 2.3-2.6 2.0-2.4 <2.0
Another Interconnect-Scaling Issue Surface scattering becomes dominant p=0 (diffuse scattering) p=1 (specular scattering) 0 1 2 3 4 5 0 100 200 300 400 500 Metal Line Width (nm) Resistivity (μΩcm) p=0 p=0.5 Wire width < mean-free-path of electrons
2004  L G  = 37-nm  Transistor T OX (equiv.) = 1.2 nm
Can Some Hi-K Dielectric Replace SiON ?  Source: Intel ,[object Object],[object Object],[object Object],[object Object]
In general, continued transistor scaling requires new materials, processes, … Selective-epi raised source/drain for shallow junctions & reduced short-channel effects P-WELL STI STI SOURCE DRAIN GATE Si-Substrate Halo I2 Etches for new materials that achieve  profile, CD control, and selectivity Metal gate electrode to  reduce gate depletion High-   gate dielectric for reducing gate current with thin Tox Strained channel for improved mobility Doping and annealing techniques for shallow abrupt junctions Ni-silicide process for low resistance at short gate lengths (near term)
…  and, eventually new structures Steps toward ideal “coax gate”   Fin BOx Tri-Gate FET 3 Gates Fin BOx ,[object Object],[object Object],Fin BOx FinFET 2 Gates Thick Dielectric Active Gate   Buried Oxide Silicon   Si Si Gate  Buried Oxide Silicon
Potential FET Enhancements ? Calculations by T. Skotnicki
At PQE 2004, Professor Mark Lundstrom expressed the outlook: “Sub-10nm MOSFETs will operate, but … - on-currents will be ~0.5xI ballistic , off-currents high, - 2D electrostatics will be hard to control, - parasitic resistance will degrade performance, - device to device variations will be large, and - ultra-thin bodies and hyper-abrupt junctions will be essential”
ITRS Assessment of Some Current Ideas for Successors to CMOS Transistors  No obvious candidates yet for a CMOS replacement !
SRC Research Gap Analysis (for <50nm) Worldwide Funding ~ $1,386 M Government  Funding Asia-Pacific  $103 M Ongoing Tasks $2,169M New Tasks $372M WW Research Gap ~ $1,155M Industry Funding (Semiconductors + Suppliers) U.S.   $313 M Japan   $142 M Europe   $ 74 M ~ $580 M Asia-Pac   $ 51 M U.S.   $329 M Europe   $249 M Japan   $125 M ~ $806 M Worldwide Needs ~ $2,541 M
   Extending Moore’s Law via Integrating New Functions onto CMOS ITRS Emerging Technologies ? “ Another Dimension”
Why “Moore’s Law” Is Still a Fun Topic ! What makes us think that we can forecast more than ~5 years of future IC technology any better today ?!! A 1975 IC Technology Roadmap

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Doering

  • 1. Future Prospects for Moore’s Law Eighth Annual High Performance Embedded Computing Workshop Lincoln Laboratory September 28, 2004 Robert Doering Texas Instruments, Inc.
  • 2.
  • 3.
  • 4.
  • 5. Scaling -- Traditional Enabler of Moore’s Law * 500 350 250 180 130 90 65 45 32 22 Feature Size [nm] Year of Production ITRS Gate Length 9 return to 0.7x/3-yr ? 13 * For Speed, Low-Cost, Low-Power, etc. ITRS Lithography Half-Pitch (DRAM) 95 97 99 01 04 07 10 13 16 95 97 99 01 04 07 10 13 16
  • 6. Can We Extend the Recent 0.7x/2-year Litho Scaling Trend ? 3000 2000 1500 1000 400 350 250 180 130 90 65 45 500 600 10 1 10 2 10 3 10 4 1980 1990 2000 2010 Year of Production Above wavelength Near wavelength Below wavelength g-line  =436nm i-line  =365nm DUV  =248nm 193  =193nm 157  =157nm 32  =EUV 13.5nm Half-Pitch / Wavelength (nm) i-193  ‘=133nm For lithography, it’s a question of cost and control/parametric-yield !
  • 7. A “Bag of Tricks” for Optical-Extension Complexity (mask, use) Strength of enhancement Illumination mode Other (Tool) Mask Mask OPC Resist k 1 0.25 0.5 Conventional Annular Dipole Soft Quasar Custom Scattering bars Quasar Binary Intensity Mask Attenuated PSM 6% Attenuated PSM 18% Alternating PSM Source: ASML Serifs Hammerheads Line Biasing Thick resist Thin resist Focus drilling Phase filters Double Exposures Wavelength NA Of course : increasing complexity  increasing cost !
  • 8. Amortization of Mask Cost @ 130nm ~ 1 million units required to get within 10% of asymptotic cost ! (and getting worse with continued scaling) Significant motivation for some form of “mask-less lithography” !
  • 9.
  • 10. ITRS Tries to Address Top-Down Goals MPU Clock (GHz) 2001 2003
  • 11. ITRS Highlights Scaling Barriers, e.g.: Production Year: 2001 2004 2007 2010 2013 2016 Litho Half-Pitch [nm]: 130 90 65 45 32 22 Overlay Control [nm]: 45 32 23 18 13 9 Gate Length [nm]: 65 37 25 18 13 9 CD Control [nm]: 6.3 3.3* 2.2 1.6 1.2 0.8 T OX (equivalent) [nm]: 1.3-1.6 1.2 0.9 0.7 0.6 0.5 I GATE (L MIN ) [µA/µm]: - 0.17 0.23 0.33 1 1.67 I ON (NMOS) [µA/µm]: 900 1110 1510 1900 2050 2400 I OFF (NMOS) [µA/µm]: 0.01 0.05 0.07 0.1 0.3 0.5 Interconnect  EFF  - 3.1-3.6 2.7-3.0 2.3-2.6 2.0-2.4 <2.0
  • 12. Another Interconnect-Scaling Issue Surface scattering becomes dominant p=0 (diffuse scattering) p=1 (specular scattering) 0 1 2 3 4 5 0 100 200 300 400 500 Metal Line Width (nm) Resistivity (μΩcm) p=0 p=0.5 Wire width < mean-free-path of electrons
  • 13. 2004 L G = 37-nm Transistor T OX (equiv.) = 1.2 nm
  • 14.
  • 15. In general, continued transistor scaling requires new materials, processes, … Selective-epi raised source/drain for shallow junctions & reduced short-channel effects P-WELL STI STI SOURCE DRAIN GATE Si-Substrate Halo I2 Etches for new materials that achieve profile, CD control, and selectivity Metal gate electrode to reduce gate depletion High-  gate dielectric for reducing gate current with thin Tox Strained channel for improved mobility Doping and annealing techniques for shallow abrupt junctions Ni-silicide process for low resistance at short gate lengths (near term)
  • 16.
  • 17. Potential FET Enhancements ? Calculations by T. Skotnicki
  • 18. At PQE 2004, Professor Mark Lundstrom expressed the outlook: “Sub-10nm MOSFETs will operate, but … - on-currents will be ~0.5xI ballistic , off-currents high, - 2D electrostatics will be hard to control, - parasitic resistance will degrade performance, - device to device variations will be large, and - ultra-thin bodies and hyper-abrupt junctions will be essential”
  • 19. ITRS Assessment of Some Current Ideas for Successors to CMOS Transistors No obvious candidates yet for a CMOS replacement !
  • 20. SRC Research Gap Analysis (for <50nm) Worldwide Funding ~ $1,386 M Government Funding Asia-Pacific $103 M Ongoing Tasks $2,169M New Tasks $372M WW Research Gap ~ $1,155M Industry Funding (Semiconductors + Suppliers) U.S. $313 M Japan $142 M Europe $ 74 M ~ $580 M Asia-Pac $ 51 M U.S. $329 M Europe $249 M Japan $125 M ~ $806 M Worldwide Needs ~ $2,541 M
  • 21. Extending Moore’s Law via Integrating New Functions onto CMOS ITRS Emerging Technologies ? “ Another Dimension”
  • 22. Why “Moore’s Law” Is Still a Fun Topic ! What makes us think that we can forecast more than ~5 years of future IC technology any better today ?!! A 1975 IC Technology Roadmap