Pete Sarson, PH.D

4 Followers

I love managing the process of making IC automated test programs delivering UPH and yield outside of the customers expectations in the shortest time possible hence at the lowest cost. Extensive knowledge of the different ATE brands and the advantages of each system. In-depth knowledge of semiconductor test houses both in USA and Asia Highly-motivated, efficient, results-oriented. Entertaining verbal and written communications skills. Lively technical writer. Infectious enthusiasm. Solid leader.

ate automotive analog test engineering phase switching awg group delay test development 1687 chirp rf eeprom academia semi itc ijtag intermodulation distortion dynamic range filter characterization discrete chirp academia in lsi testing area. semiconductor manufacturer automotive manufacturer consumer electronics manufacturer and eda vendor ate vendor non-volatile memory (nvm) quality assurance one time programmable (otp) resistive bridge temperature screening oxide breakdown reliability digitizer harmonic content reduction european test symposium filter testing mixed signal vts digital ber acr vhf rx internation mixed signal test workshop analogue scan industry elevator talks defects quality filters high reliability non volatile memnory test consumer

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Aktuellste Beliebteste SlideShares

A Technique for Dynamic Range Improvement of Intermodulation Distortion Products for an Interpolating DAC-based Arbitrary Waveform Generator Using a Phase Switching Algorithm

Vor 7 Jahren • 280 Aufrufe

Pete Sarson, PH.D

Politecnico di Torino Test Engineering Lecture

Arizona State University Test Lecture

Use Models for Extending IEEE 1687 to Analog Test

A Technique for Dynamic Range Improvement of Intermodulation Distortion Products for an Interpolating DAC-based Arbitrary Waveform Generator Using a Phase Switching Algorithm

Test time efficient group delay filter characterization technique using a discrete chirped excitation signal

Low supply voltage test to screen resistive bridges in OTPs with dppm data

Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs

Yield improvement of an eeprom for automotive applications

Getting to 0ppm - Automotive Session

ACR BER Correlation to ATE for a COFDM VHF RX

An example transition to 1687-based mixed-signal DFT

The future of Analogue Test - NMI DFT event

IDT2014 Chirp Presentation

Asian Test Symposium 2013 eeprom qualification

Idt2014 panel