ate automotive analog test engineering phase switching awg group delay test development 1687 chirp rf eeprom academia semi itc ijtag intermodulation distortion dynamic range filter characterization discrete chirp academia in lsi testing area. semiconductor manufacturer automotive manufacturer consumer electronics manufacturer and eda vendor ate vendor non-volatile memory (nvm) quality assurance one time programmable (otp) resistive bridge temperature screening oxide breakdown reliability digitizer harmonic content reduction european test symposium filter testing mixed signal vts digital ber acr vhf rx internation mixed signal test workshop analogue scan industry elevator talks defects quality filters high reliability non volatile memnory test consumer
Mehr anzeigen