Platform for Advanced Characterisation Grenoble (PAC-G)

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The Platform for Advanced Characterisation Grenoble is the single entry point for commercial services of material characterisation, dedicated to micro- and nano-electronics industry, offered by the European Synchrotron (ESRF) the Institut Laue-Langevin (ILL) the Laboratory of Subatomic Physics & Cosmology (LPSC) and the Laboratory of Electronics and Information Technologies (CEA-Leti). Equipped with industry-tailored dedicated equipment and staff, and a world leading expertise, PAC-G is your ideal partner to characterise micro or nano-electronic samples and offers: • Non-destructive and Operando and in-situ analysis • 2D or 3D imaging • Dynamic and longitudinal studies

semiconductors microelectronics material characterization electronics pac-g grenoble silicon nanoelectronics wafer industry device industrial case study irt nanoelec the european synchrotron x-ray synchrotron compound semiconductor process esrf nanotech non-destructive mems nanotomography high resolution cea-leti 3d integration 3d imaging 2d imaging neutron radiation neutrons ill diffraction characterization crystal defects soi neutron imaging packaging tomography stmicroelectronics nano-characterization integrated circuit copper pillar hardness testing thermal neutrons airbus xrd leti cea nano-diffraction gaas material gan xray science

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Platform for Advanced Characterisation Grenoble (PAC-G)

Präsentationen

PAC-Grenoble: Radiation hardness testing, Industry Case Study: Airbus

Industrial Application note: Copper pillar characterisation, STmicroelectronics worked with PAC-G

RadHard 2.pdf

Dokumente

X-ray nanoprobe aids 3D chip integration

Organic solar cells probed in situ

Wafer bonding characterisation using XRR in transmission mode

Characterisation of salicides for microelectronics

Strain analysis for advanced semiconductor devices