Platform for Advanced Characterisation Grenoble (PAC-G)

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The Platform for Advanced Characterisation Grenoble is the single entry point for commercial services of material characterisation, dedicated to micro- and nano-electronics industry, offered by the European Synchrotron (ESRF) the Institut Laue-Langevin (ILL) the Laboratory of Subatomic Physics & Cosmology (LPSC) and the Laboratory of Electronics and Information Technologies (CEA-Leti). Equipped with industry-tailored dedicated equipment and staff, and a world leading expertise, PAC-G is your ideal partner to characterise micro or nano-electronic samples and offers: • Non-destructive and Operando and in-situ analysis • 2D or 3D imaging • Dynamic and longitudinal studies

semiconductors microelectronics material characterization electronics pac-g grenoble silicon nanoelectronics wafer industry device industrial case study irt nanoelec the european synchrotron x-ray synchrotron compound semiconductor process esrf nanotech non-destructive mems nanotomography high resolution cea-leti 3d integration 3d imaging 2d imaging neutron radiation neutrons ill diffraction characterization crystal defects soi neutron imaging packaging tomography stmicroelectronics nano-characterization integrated circuit copper pillar hardness testing thermal neutrons airbus xrd leti cea nano-diffraction gaas material gan xray science

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Platform for Advanced Characterisation Grenoble (PAC-G)

Strain analysis for advanced semiconductor devices

Characterisation of salicides for microelectronics

Wafer bonding characterisation using XRR in transmission mode

Organic solar cells probed in situ

X-ray nanoprobe aids 3D chip integration