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29/09/2005 EE6471 (KR) 121
– Digital Logic Voltage and Current Parameters
• Fan-out, Noise Margin, Propagation Delay
– TTL Logic Family
– TTL Logic Family Evolution
– ECL
– CMOS Logic Families and Evolution
– Logic Family Overview
Logic Families/Objectives
29/09/2005 EE6471 (KR) 122
– SSI <12 gates/chip
– MSI 12..99 gates/chip
– LSI ..1000 gates/chip
– VLSI …10k gates/chip
– ULSI …100k gates/chip
– GSI …1Meg gates/chip
Level of integration ever
increasing, because of
•cost
•speed
•size
•power
•reliability
Limits of integration:
•packaging
•power dissipation
•inductive and capacitive
components
•flexibility
•critical quantity
Logic Families/Level of Integration
Note: Ratio gate count/transistor count
is roughly 1/10
29/09/2005 EE6471 (KR) 123
Logic Families/Level of Integration
– Remember: Gordon Moore, 1975. Predictions:
• Mosfet device dimensions scale down by a factor of 2 every 3 years
• #transistors/chip double every 1-2 years.
Source: G. Sery, Intel
29/09/2005 EE6471 (KR) 124
Vcc Vcc
Ioh Iih
Voh Vih
Vcc
Iol Iil
Vol Vil
Parameter Comment
Voh(min) High-Level Output Voltage. The minimum voltage level at a logic
circuit output in the logical 1 state under defined load conditions.
Vol(max) Low-Level Output Voltage. The maximum voltage level at a logic
circuit output in the logical 0 state under defined load conditions.
Logic Families/Static VI Parameters
29/09/2005 EE6471 (KR) 125
Vcc Vcc
Ioh Iih
Voh Vih
Vcc
Iol Iil
Vol Vil
Parameter Comment
Vih(min) High-Level Input Voltage. The minimum voltage level required for
a logical 1 at an input. Any voltage below this level may not be
recognized as a logical 1 by the logic circuit.
Vil(max) Low-Level Input Voltage. The maximum voltage level required for
a logical 0 at an input. Any voltage above this level may not be
recognized as a logical 0 by the logic circuit.
Logic Families/Static VI Parameters
29/09/2005 EE6471 (KR) 126
Vcc Vcc
Ioh Iih
Voh Vih
Vcc
Iol Iil
Vol Vil
Parameter Comment
Ioh High-Level Output Current. Current flowing into an output in the
logical 1 state under specified load conditions.
Iol Low-Level Output Current. Current flowing into an output in the
logical 0 state under specified load conditions.
Logic Families/Static VI Parameters
29/09/2005 EE6471 (KR) 127
Vcc Vcc
Ioh Iih
Voh Vih
Vcc
Iol Iil
Vol Vil
Parameter Comment
Iih High-Level Input Current. Current flowing into an input when a
specified high-level voltage is applied to that input.
Iil Low-Level Input Current. Current flowing into an input when a
specified low-level voltage is applied to that input.
Logic Families/Static VI Parameters
29/09/2005 EE6471 (KR) 128
– Fan-out: The maximum number of
logic inputs that an output can drive
reliably.
Beware:
Modern mixed-technology digital systems often employ logic from different logic families. In
this case Fan-out is meaningless, unless the operating condition is specified exactly.
Unless otherwise specified, fan-out is always assumed to refer to load devices of the same
family as the driving output.
Logic Families/Fan-Out
29/09/2005 EE6471 (KR) 129
Vih(min)Voh(min)Vnh −=
:marginnoisestateHigh
Vol(max)Vil(max)Vnl −=
:marginnoisestateLow
Noise margin required for reliable operation
of digital systems in the presence of noise,
crosscoupling, and ground-bounce.
l)min(Vnh,VnVn =
:marginNoise
Sometimes quoted: Percentage noise
margin… bears little practical value.
Output Input
Indetermined
Range
Abnormal
Operation
Voh(min)
Vih(min)
Vil(max)
Vol(max)
Vcc Vcc
Vnh
Vnl
Logic 1 Logic 1
Logic 0 Logic 0
Logic Families/Noise (Voltage) Margin
29/09/2005 EE6471 (KR) 130
avgavg Pdisstp ⋅
:ProductPowerSpeedGate(Vague) comparison between logic families:
(e.g. for 74HC00: 25ns*100µW=2.5pJ)
Parameter Comment
tphl Input-to-output propagation delay time for output going from high
to low.
tplh Input-to-output propagation delay time for output going from low
to high.
vi
vo
t
t
tphl tplh
Input
Output
50%
vi
vo
50%
Logic Families/Propagation Delay
29/09/2005 EE6471 (KR) 131
A
B
Inputs
Output
Q1
Q2
Q3
Q4
D1
R1
4k
R2
1.6k
R4
130
R3
1k
A
B
Inputs
Output
Vcc
5V
Standard TTL Logic:
•Bipolar Transistor-Transistor Logic
•Introduced in 1964 (Texas Instruments)
•Tremendous influence on the characteristics
of all logic devices today
•Standard TTL shaped digital technology
•Standard TTL Logic (e.g. 7400) practically
obsolete (i.e. replaced by more advanced
logic families, e.g. 74ALS00)
•A large variety of logic functions available
•Single- or multi-emitter input transistor Q1
(up to eight emitters)
•Totem-pole output arrangement (Q3, Q4)
A B Y
0 0 1
0 1 1
1 0 1
1 1 0
Logic Families/TTL Logic
29/09/2005 EE6471 (KR) 140
Q1
Q2
Q3
Q4
D1
R1
4k
R2
1.6k
R4
130
R3
1k
A
B
Y
Vcc
Q1
Q2
Q3
Q4
D1
R1
4k
R2
1.6k
R4
130
R3
1k
A
B
Y
Vcc
BJT (Bipolar Junction Transistor) storage time
reduction by using a BC Schottky diode.
Schottky diode has a Vfw=0.25V. When BC
junction becomes forward biased Schottky diode
will bypass base current.
Logic Families/TTL/Logic Evolution
29/09/2005 EE6471 (KR) 141
74 Series
Bipolar. Saturated BJTs. Practically
obsolete. Don't use in new designs!
74S Series
Bipolar. Deep saturation prevented by
BC Schottky Diode. Reduced storage-
time delay. Practically obsolete.
74LS Series
Bipolar. Lower-power slower-speed
version of the 74S Series.
74AS Series
Innovations in IC design and
fabrication. Improvement in speed and
power dissipation. Relatively popular.
Fastest TTL available.
74ALS Series
Innovations in IC design and
fabrication. Improvement in speed and
power dissipation. Popular.
74F Series
Innovations in IC design and
fabrication. Popular.
Logic Families/TTL/Logic Evolution
29/09/2005 EE6471 (KR) 142
Advantages of ECL
•fastest logic family available
TTL
•BJTs operating in saturated mode
•Limited switching speed (storage time)
Disadvantages of ECL
•negative supply (awkward)
•high static power dissipation
•limited choice of manufacturers and devices
•low noise margin
ECL (Emitter-Coupled Logic)
•BJTs operating in unsaturated mode (i.e.
emitter-follower mode)
•Principle: Current switching (ECL is also
sometimes called Current-Mode-Logic CML)Vee
-5.2V
Vss
A
Logic Families/ECL
29/09/2005 EE6471 (KR) 145
MOS Logic:
MOS: Metal-Oxide-Semiconductor (Metal-
Oxide-Silicon
Advantages of MOS
•inexpensive and simple to fabricate
•high speed
•low static power consumption
•scaling of mosfets: higher integration possible
•rail-to-rail outputs
MOS Logic Categories:
•NMOS (obsolete)
•PMOS (obsolete)
•CMOS: complementary MOS
Disadvantages of MOS
•susceptibility to electro-static damage, ESD
•susceptibility to latch-up
Because of their advantages CMOS devices
have become dominant in the IC market
First CMOS logic family CD4000 introduced in
1968.
Logic Families/CMOS
29/09/2005 EE6471 (KR) 146
CMOS Gate Characteristics:
•No resistive elements (resistors elements
require large chip areas in bipolar ICs)
•Extremely low static power consumption
(Roff > 1010Ω)
•Extremely low static input currents
•Cross-conduction and charge/discharge of
internal capacitances lead to dynamic power
dissipation
•Output Y swings rail-to-rail (low Ron)
•Supply voltage can be reduced to 1V and
below
DO NOT leave CMOS inputs floating !
Unused CMOS inputs must be tied to a fixed voltage level (or to another input).
A
B
Y
Logic Families/CMOS
29/09/2005 EE6471 (KR) 147
CMOS Logic Trend:
Reduction of dynamic losses (cross-conduction,
capacitive charge/discharge cycles) by decreasing
supply voltages
(12V→5V → 3.3V → 2.5V → 1.8V → 1.5V…).
Reduction of IC power dissipation is the key to:
•lower cost (packaging)
•higher integration
•improved reliability
4000 Series
CMOS. Wide supplyvoltage range.
High noisemargin. Low speed. Weak
output drive. Practically obsolete.
74C Series
CMOS. Pin-compatible with TTL
devices. Low speed. Obsolete.
Replaced by HC/HCT family.
74HC/HCT Series
CMOS. Drastic increase in speed.
Higher output drive capability. HCT
input voltage levels compatible with
TTL.
74AC/ACT Series
CMOS. Functionally compatible, but
not pin-compatible to TTL. Improved
noise immunity and speed. ACT inputs
are TTL compatible.
74AHC/AHCT Series
CMOS. Improved speed, lower power,
lower drive capability.
BiCMOS Logic
CMOS/Bipolar. Combine the best
features of CMOS and bipolar. Low
power high speed. Bus interfacing
applications (74BCT, 74ABT)
74LVC/ALVC/LV/AVC
CMOS. Reduced supply voltage.
LVC: 5V/3.3V translation
ALVC: Fast 3.3V only
AVC: Optimised for 2.5V, down to 1.2V
Logic Families/CMOS/Logic Evolution
29/09/2005 EE6471 (KR) 148
Care is needed when driving inputs of one logic family by outputs of a different family !
Watch voltage levels and fan-out !
Logic
Family
Prop.
Delay
Rise/Fall
Time
Vihmin Vilmax Vohmin Volmax Noise
Margin
74 22ns 2.0V 0.8V 2.4V 0.4V 0.4V
74LS 15ns 2.0V 0.8V 2.7V 0.5V 0.3V
74F 5ns 2.3ns 2.0V 0.8V 2.7V 0.5V 0.3V
74AS 4.5ns 1.5ns 2.0V 0.8V 2.7V 0.5V 0.3V
74ALS 11ns 2.3ns 2.0V 0.8V 2.5V 0.5V 0.3V
ECL 1.45ns 0.35ns -1.165V -1.475V -1.025V -1.610V 0.135V
4000 250ns 90ns 3.5V 1.5V 4.95V 0.05V 1.45V
74C 90ns 3.5V 1.5V 4.5V 0.5V 1V
74HC 18ns 3.6ns 3.5V 1.0V 4.9V 0.1V 0.9V
74HCT 23ns 3.9ns 2.0V 0.8V 4.9V 0.1V 0.7V
74AC 9ns 1.5ns 3.5V 1.5V 4.9V 0.1V 1.4V
74ACT 9ns 1.5ns 2.0V 0.8V 4.9V 0.1V 0.7V
74AHC 3.7ns 3.85V 1.65V 4.4V 0.44V 0.55V
(Typical values for rough comparison only. Refer to datasheet. Values valid for Vcc=5V)
Logic Families/Overview
Welcome to the World of TI Logic
1.8 V Logic
LVC
ALVC
2.5 V Logic
LV LVC
ALVC
LV
AC
ALB
LVC
LVT
AHC
ALVC
3.3 V Logic
CBT
AHC
AHCT
HC/HCT
AC/ACT
BCT
F
ALS
AS
TTL LS
S
ABT
LV
5+ V Logic
CD4000 FCT
Harris now TI
ETL
BTL
GTL
HSTL
SSTL
Specialty
1.5 V Logic 1.2 V Logic
Cypress now TI
TVC
AVC
AUC
AUC
AVC
ALVT
ALVT
AVC
CBTLV
AUC
0.8 V Logic
AUC
GTLP
SSTV
LV-A CBTLV
AUC
VME
AUP AUP
AUP
AUP
AUP
AUP
LV-A
LV-A
11––55
AVC AVC
TI remains committed to be the last supplier in the older families.
Bipolar
CMOS
BiCMOS
Introduction Growth Maturity Decline Obsolescence
ALVC
LV
HC/HCT
AS
ALS
F
S
TTL
BCT
LS
CD4000
LVT-A
ABT
AC/ACT
FCT
AHC/AHCT
ALVT
LVC
CBT
CBTLV
AVC
GTLP
Little Logic
SSTV
AUC
TVC
VME
CB3T/Q
SSTU
AUP
Product Life Cycle
CBT-C
11––66
ABTABT
HC/HCTHC/HCT
LVTLVT
64
24
12
8
5 10 15 20
Speed - max tpd (ns)
BCTBCT
IOLDrive(mA)
AC/ACTAC/ACT
AHC/AHCTAHC/AHCT
ALVTALVT
5 V
3.3 V
2.5 V
1.8 V
100
GTLPGTLP
FCTFCT
LVLV
AUPAUP
LVCLVCALVCALVC
AUCAUC
AVCAVC
Optimized Vcc
ABT Advanced BiCMOS Technology
AC/T Advanced CMOS
AHC/T Advanced High Speed CMOS
ALVC Advanced Low Voltage CMOS
ALVT Advanced Low Voltage BiCMOS
AUC Advanced Ultra Low Voltage CMOS
AUP Advanced Ultra Low Power CMOS
AVC Advanced Very Low Voltage CMOS
BCT BiCMOS Technology
FCT Fast CMOS Technology
GTLP Gunning Transceiver Logic Plus
HC/T High Speed CMOS
LV Low Voltage HCMOS
LVC Low Voltage CMOS
LVT Low Voltage BiCMOS Technology
Family Performance Positioning
11––1010
CMOS Voltage Roadmap
Optimized
Voltage
Data Sheet
Limits
Functional
Voltage
Tolerance
CD4K HCT
AHCT
ACT
AHC AC LV-A LVC ALVC AVC AUP AUC
5
4
3
2
1
Voltage
6
15
18
HC
11––1111
CMOS Voltage vs. Speed
Comparison of 16245 functions with 500 ohm/30pF load. (AUC not yet tested)
0
5
10
15
20
25
0 1 2 3 4 5 6
VCC (V)
HC
AHC
LV-A
AC
LVC
ALVC
AVC
AUC
TypicalPropagationDelayTime(ns)
11––1212
5-V TTL
Standard TTL: ABT,
AHCT, HCT, ACT, Bipolar
1.5
0 GND
2.4
2.0
0.4 VOL
0.8
5 V VCC
VOH
VIH
Vt
VIL
VOH
GND
VIH
5-V CMOS
Rail-to-Rail 5 V
HC, AHC, AC, LV-A
4.44
3.5
2.5
1.5
0.5
0
5 V VCC
Vt
VIL
VOL
3.3-V LVTTL
LVT, LVC, ALVC
AUP, LV-A, ALVT
1.5
0 GND
2.4
0.4
3.3 V
0.8
2.0
VCC
VOH
VIH
Vt
VIL
VOL
VIH
VOH
2.5-V CMOS
AUC, AUP, AVC,
ALVC, LVC, ALVT
2.3
1.7
1.2
0.7
0.2
0
2.5 V VCC
GND
Vt
VIL
VOL
1.8 V VCC
VIH
VOH1.2
1.17
0.9
0.7
0.45
0 GND
Vt
VIL
VOL
1.8-V CMOS
AUC, AUP, AVC,
ALVC, LVC
IsIs VOH higher than VIH?
D RD R
5TTL 5CMOS 3LVTTL 2.5CMOS 1.85TTL 5CMOS 3LVTTL 2.5CMOS 1.8CMOSCMOS
5TTL Yes No Yes * Yes5TTL Yes No Yes * Yes** Yes*Yes*
5 CMOS Yes Yes Yes* Yes*5 CMOS Yes Yes Yes* Yes* Yes*Yes*
3 LVTTL Yes No Yes Yes3 LVTTL Yes No Yes Yes** Yes*Yes*
2.5 CMOS Yes No Yes Yes2.5 CMOS Yes No Yes Yes Yes*Yes*
1.8 CMOS No1.8 CMOS No NoNo No No YesNo No Yes
* Requires V* Requires VIH ToleranceTolerance
DD
RR
IsIs VOL less than VIL?
IC Basics
Comparison of Switching Standards
11––1616
Open-Drain Outputs 05/06/07 Functions
Functions Available
VCC2
Required Input level
depends on VCC1
RPULLUP
T1
VCC1
Output level
depends on VCC2
Also Possible
Wired-Function Technique
Phantom links on output side
can reduce component count.
07
07
RPULLUP
Vcc
05 -
06 -
07 -
S, LS, ALS, AC, HC,
AHC, LV, LVC
TTL, LS, LV, LVC,
LVC1G/3G, AUC1G
TTL, LS, LV, LVC,
LVC1G/3G, AUC1G
NOTE: Over voltage tolerance is
required to support UP translation.
Mixed-Voltage Interfacing
11––2323
• ICs are at the core of a modern digital system
• Many systems fit entirely on a single IC (SOC)
– a single (15-mm)2 chip can hold several million gates
(1997)
– a simple 32-bit CPU can be realised in an area of 1mm2
• Biggest limitation of a modern digital IC: Large
reduction in signal count between on-chip wires and
package pins. Typical IC
– 104 wiring tracks on each of four metal layers
– 103 signals can leave the chip (for cheaper packages: 40..200)
– Chips are often “pad-limited”. Peripheral-bonded chips. Chip area increases
as the square of the number of pads
IC Packaging/Intro
• Most ICs are bonded to small IC packages
Although it is possible to attach chips directly to boards. Method used
extensively in low-cost consumer electronics. Placing chips in packages
enables independent testing of packaged parts, and eases requirements on
board pitch and P&P (pick-and-place) equipment.
• IC Packages
– inexpensive plastic packages: <200 pins
– packages with >1000 pins available
(e.g. Xilinx FF1704: 1704-ball flip-chip BGA)
• IC Packaging Materials
– Plastic, ceramic, laminates (fiberglass, epoxy resin), metal
IC Packaging/Intro
• IC package categories:
– PTH (pin-through-hole)
Pins are inserted into through-holes in the circuit
board and soldered in place from the opposite side of
the board
» Sockets available
» Manual P&P possible
– SMT (surface-mount-technology)
SMT packages have leads that are soldered directly to
corresponding exposed metal lands on the surface of
the circuit board
» Elimination of holes
» Ease of manufacturing (high-speed P&P)
» Components on both sides of the PCB
» Smaller dimensions
» Improved package parasitic components
» Increased circuit-board wiring density
SMT packages offer many benefits and are generally preferred.
IC Packaging/Categories
• IC packaging material: Plastic
– die-bonding and wire-bonding
the chip to a metal lead frame
– encapsulation in injection-molded plastic
– inexpensive but high thermal resistance
– Warning: Plastic molds are hygroscopic
» Absorb moisture
Storage in low-humidity environment. Observation of factory floor-life
» Stored moisture can vapourise during rapid heating
can lead to hydrostatic pressure during reflow process. Consequences
can be: Delamination within the package, and package cracking. Early
device failure.
IC Packaging/Materials
• IC packaging materials: Ceramic
» consists of several layers of conductors separated by
layers of ceramic (Al2O3 “Alumina”)
» chip placed in a cavity and bonded to the conductors
Note: no lead-frame
» metal lid soldered on to the package
» sealed against the environment
» ground layers and direct bypass capacitors possible
within a ceramic package
» high permittivity of alumina (εr=10)
Note: High permittivity leads to higher propagation delay!
» expensive
IC Packaging/Materials
Plastic Dual-In-Line
(PDIP)
here: PDIP14
Small Outline
Integrated Circuit
(SOIC)
here: SO14
SC70
here: SC70-5
Plastic Lead Chip Carrier (PLCC)
here: PLCC28
Thin Shrink Small Outline
(TSSOP)
here: TSSOP14
Thin Quad Flat Package
(TQFP)
here: TQFP32
IC Packaging/Popular IC Packages
Small Outline Integrated Circuit
(SOIC)
•Shown: SO14, but available from SO8..SO28
•Gull-wing leads
•Popular, cost effective, and widely available IC
package for low-pin-count ICs
•Dimensions: 8.6mm x 3.9mm x 1.75mm
•Pin-to-pin: 1.27mm (50mil)
IC Packaging/Popular IC Packages
Thin Shrink Small Outline (TSSOP)
•Shown: TSSOP14, but available up to TSSOP64
•Popular, cost effective, and widely available IC
package for low-profile applications
•Dimensions: 5.0mm x 4.4mm x 1.2mm
•Pin-to-pin: 0.65mm (25mil)
IC Packaging/Popular IC Packages
Ball Grid Arrays (BGA)
•Shown: BGA54
•Available pin count >1700
•Advanced IC package for high-density
low-profile applications
•Chip-scale package (CSP)
•Dimensions: 8.0mm x 5.5mm x 1.4mm
•Pin-to-pin: 0.8mm
•Low lead inductance
Challenges:
•Integrity of solder joints
•Solder joint inspection (X-ray)
•Availability of 2nd source
•Routing
Altera Ultra-Fine-Line
BGA
•Pin-Count: 169
•Dimensions 11mm x 11mm
•Profile: 1.2mm
IC Packaging/Popular IC Packages
die
bond wire
land
package trace
via and ball
metal substrate
Physical construction of a BGA
•Shown: Type-II BGA (cavity-down design)
•Interconnect: multi-layer laminated construction
•Die bonded onto a metal heat slug
•Solder balls make connection to a PC board
•50µm bond wires
•Copper conductor thickness 20µm
•Layer separation 150µm
IC Packaging/BGA Physical Construction
IC Packaging/Electronic Assembly (1981)
IBM PC 1981
•IC packaging:
DIL only!
•Processor: 8088
•Memory: 256kB
Low-density
electronic
assembly
with various
IC packages
•SO
•TSSOP
•QFP
•BGA
IC Packaging/Electronic Assembly (2000)

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Logic families 1

  • 1. 29/09/2005 EE6471 (KR) 121 – Digital Logic Voltage and Current Parameters • Fan-out, Noise Margin, Propagation Delay – TTL Logic Family – TTL Logic Family Evolution – ECL – CMOS Logic Families and Evolution – Logic Family Overview Logic Families/Objectives
  • 2. 29/09/2005 EE6471 (KR) 122 – SSI <12 gates/chip – MSI 12..99 gates/chip – LSI ..1000 gates/chip – VLSI …10k gates/chip – ULSI …100k gates/chip – GSI …1Meg gates/chip Level of integration ever increasing, because of •cost •speed •size •power •reliability Limits of integration: •packaging •power dissipation •inductive and capacitive components •flexibility •critical quantity Logic Families/Level of Integration Note: Ratio gate count/transistor count is roughly 1/10
  • 3. 29/09/2005 EE6471 (KR) 123 Logic Families/Level of Integration – Remember: Gordon Moore, 1975. Predictions: • Mosfet device dimensions scale down by a factor of 2 every 3 years • #transistors/chip double every 1-2 years. Source: G. Sery, Intel
  • 4. 29/09/2005 EE6471 (KR) 124 Vcc Vcc Ioh Iih Voh Vih Vcc Iol Iil Vol Vil Parameter Comment Voh(min) High-Level Output Voltage. The minimum voltage level at a logic circuit output in the logical 1 state under defined load conditions. Vol(max) Low-Level Output Voltage. The maximum voltage level at a logic circuit output in the logical 0 state under defined load conditions. Logic Families/Static VI Parameters
  • 5. 29/09/2005 EE6471 (KR) 125 Vcc Vcc Ioh Iih Voh Vih Vcc Iol Iil Vol Vil Parameter Comment Vih(min) High-Level Input Voltage. The minimum voltage level required for a logical 1 at an input. Any voltage below this level may not be recognized as a logical 1 by the logic circuit. Vil(max) Low-Level Input Voltage. The maximum voltage level required for a logical 0 at an input. Any voltage above this level may not be recognized as a logical 0 by the logic circuit. Logic Families/Static VI Parameters
  • 6. 29/09/2005 EE6471 (KR) 126 Vcc Vcc Ioh Iih Voh Vih Vcc Iol Iil Vol Vil Parameter Comment Ioh High-Level Output Current. Current flowing into an output in the logical 1 state under specified load conditions. Iol Low-Level Output Current. Current flowing into an output in the logical 0 state under specified load conditions. Logic Families/Static VI Parameters
  • 7. 29/09/2005 EE6471 (KR) 127 Vcc Vcc Ioh Iih Voh Vih Vcc Iol Iil Vol Vil Parameter Comment Iih High-Level Input Current. Current flowing into an input when a specified high-level voltage is applied to that input. Iil Low-Level Input Current. Current flowing into an input when a specified low-level voltage is applied to that input. Logic Families/Static VI Parameters
  • 8. 29/09/2005 EE6471 (KR) 128 – Fan-out: The maximum number of logic inputs that an output can drive reliably. Beware: Modern mixed-technology digital systems often employ logic from different logic families. In this case Fan-out is meaningless, unless the operating condition is specified exactly. Unless otherwise specified, fan-out is always assumed to refer to load devices of the same family as the driving output. Logic Families/Fan-Out
  • 9. 29/09/2005 EE6471 (KR) 129 Vih(min)Voh(min)Vnh −= :marginnoisestateHigh Vol(max)Vil(max)Vnl −= :marginnoisestateLow Noise margin required for reliable operation of digital systems in the presence of noise, crosscoupling, and ground-bounce. l)min(Vnh,VnVn = :marginNoise Sometimes quoted: Percentage noise margin… bears little practical value. Output Input Indetermined Range Abnormal Operation Voh(min) Vih(min) Vil(max) Vol(max) Vcc Vcc Vnh Vnl Logic 1 Logic 1 Logic 0 Logic 0 Logic Families/Noise (Voltage) Margin
  • 10. 29/09/2005 EE6471 (KR) 130 avgavg Pdisstp ⋅ :ProductPowerSpeedGate(Vague) comparison between logic families: (e.g. for 74HC00: 25ns*100µW=2.5pJ) Parameter Comment tphl Input-to-output propagation delay time for output going from high to low. tplh Input-to-output propagation delay time for output going from low to high. vi vo t t tphl tplh Input Output 50% vi vo 50% Logic Families/Propagation Delay
  • 11. 29/09/2005 EE6471 (KR) 131 A B Inputs Output Q1 Q2 Q3 Q4 D1 R1 4k R2 1.6k R4 130 R3 1k A B Inputs Output Vcc 5V Standard TTL Logic: •Bipolar Transistor-Transistor Logic •Introduced in 1964 (Texas Instruments) •Tremendous influence on the characteristics of all logic devices today •Standard TTL shaped digital technology •Standard TTL Logic (e.g. 7400) practically obsolete (i.e. replaced by more advanced logic families, e.g. 74ALS00) •A large variety of logic functions available •Single- or multi-emitter input transistor Q1 (up to eight emitters) •Totem-pole output arrangement (Q3, Q4) A B Y 0 0 1 0 1 1 1 0 1 1 1 0 Logic Families/TTL Logic
  • 12. 29/09/2005 EE6471 (KR) 140 Q1 Q2 Q3 Q4 D1 R1 4k R2 1.6k R4 130 R3 1k A B Y Vcc Q1 Q2 Q3 Q4 D1 R1 4k R2 1.6k R4 130 R3 1k A B Y Vcc BJT (Bipolar Junction Transistor) storage time reduction by using a BC Schottky diode. Schottky diode has a Vfw=0.25V. When BC junction becomes forward biased Schottky diode will bypass base current. Logic Families/TTL/Logic Evolution
  • 13. 29/09/2005 EE6471 (KR) 141 74 Series Bipolar. Saturated BJTs. Practically obsolete. Don't use in new designs! 74S Series Bipolar. Deep saturation prevented by BC Schottky Diode. Reduced storage- time delay. Practically obsolete. 74LS Series Bipolar. Lower-power slower-speed version of the 74S Series. 74AS Series Innovations in IC design and fabrication. Improvement in speed and power dissipation. Relatively popular. Fastest TTL available. 74ALS Series Innovations in IC design and fabrication. Improvement in speed and power dissipation. Popular. 74F Series Innovations in IC design and fabrication. Popular. Logic Families/TTL/Logic Evolution
  • 14. 29/09/2005 EE6471 (KR) 142 Advantages of ECL •fastest logic family available TTL •BJTs operating in saturated mode •Limited switching speed (storage time) Disadvantages of ECL •negative supply (awkward) •high static power dissipation •limited choice of manufacturers and devices •low noise margin ECL (Emitter-Coupled Logic) •BJTs operating in unsaturated mode (i.e. emitter-follower mode) •Principle: Current switching (ECL is also sometimes called Current-Mode-Logic CML)Vee -5.2V Vss A Logic Families/ECL
  • 15. 29/09/2005 EE6471 (KR) 145 MOS Logic: MOS: Metal-Oxide-Semiconductor (Metal- Oxide-Silicon Advantages of MOS •inexpensive and simple to fabricate •high speed •low static power consumption •scaling of mosfets: higher integration possible •rail-to-rail outputs MOS Logic Categories: •NMOS (obsolete) •PMOS (obsolete) •CMOS: complementary MOS Disadvantages of MOS •susceptibility to electro-static damage, ESD •susceptibility to latch-up Because of their advantages CMOS devices have become dominant in the IC market First CMOS logic family CD4000 introduced in 1968. Logic Families/CMOS
  • 16. 29/09/2005 EE6471 (KR) 146 CMOS Gate Characteristics: •No resistive elements (resistors elements require large chip areas in bipolar ICs) •Extremely low static power consumption (Roff > 1010Ω) •Extremely low static input currents •Cross-conduction and charge/discharge of internal capacitances lead to dynamic power dissipation •Output Y swings rail-to-rail (low Ron) •Supply voltage can be reduced to 1V and below DO NOT leave CMOS inputs floating ! Unused CMOS inputs must be tied to a fixed voltage level (or to another input). A B Y Logic Families/CMOS
  • 17. 29/09/2005 EE6471 (KR) 147 CMOS Logic Trend: Reduction of dynamic losses (cross-conduction, capacitive charge/discharge cycles) by decreasing supply voltages (12V→5V → 3.3V → 2.5V → 1.8V → 1.5V…). Reduction of IC power dissipation is the key to: •lower cost (packaging) •higher integration •improved reliability 4000 Series CMOS. Wide supplyvoltage range. High noisemargin. Low speed. Weak output drive. Practically obsolete. 74C Series CMOS. Pin-compatible with TTL devices. Low speed. Obsolete. Replaced by HC/HCT family. 74HC/HCT Series CMOS. Drastic increase in speed. Higher output drive capability. HCT input voltage levels compatible with TTL. 74AC/ACT Series CMOS. Functionally compatible, but not pin-compatible to TTL. Improved noise immunity and speed. ACT inputs are TTL compatible. 74AHC/AHCT Series CMOS. Improved speed, lower power, lower drive capability. BiCMOS Logic CMOS/Bipolar. Combine the best features of CMOS and bipolar. Low power high speed. Bus interfacing applications (74BCT, 74ABT) 74LVC/ALVC/LV/AVC CMOS. Reduced supply voltage. LVC: 5V/3.3V translation ALVC: Fast 3.3V only AVC: Optimised for 2.5V, down to 1.2V Logic Families/CMOS/Logic Evolution
  • 18. 29/09/2005 EE6471 (KR) 148 Care is needed when driving inputs of one logic family by outputs of a different family ! Watch voltage levels and fan-out ! Logic Family Prop. Delay Rise/Fall Time Vihmin Vilmax Vohmin Volmax Noise Margin 74 22ns 2.0V 0.8V 2.4V 0.4V 0.4V 74LS 15ns 2.0V 0.8V 2.7V 0.5V 0.3V 74F 5ns 2.3ns 2.0V 0.8V 2.7V 0.5V 0.3V 74AS 4.5ns 1.5ns 2.0V 0.8V 2.7V 0.5V 0.3V 74ALS 11ns 2.3ns 2.0V 0.8V 2.5V 0.5V 0.3V ECL 1.45ns 0.35ns -1.165V -1.475V -1.025V -1.610V 0.135V 4000 250ns 90ns 3.5V 1.5V 4.95V 0.05V 1.45V 74C 90ns 3.5V 1.5V 4.5V 0.5V 1V 74HC 18ns 3.6ns 3.5V 1.0V 4.9V 0.1V 0.9V 74HCT 23ns 3.9ns 2.0V 0.8V 4.9V 0.1V 0.7V 74AC 9ns 1.5ns 3.5V 1.5V 4.9V 0.1V 1.4V 74ACT 9ns 1.5ns 2.0V 0.8V 4.9V 0.1V 0.7V 74AHC 3.7ns 3.85V 1.65V 4.4V 0.44V 0.55V (Typical values for rough comparison only. Refer to datasheet. Values valid for Vcc=5V) Logic Families/Overview
  • 19. Welcome to the World of TI Logic 1.8 V Logic LVC ALVC 2.5 V Logic LV LVC ALVC LV AC ALB LVC LVT AHC ALVC 3.3 V Logic CBT AHC AHCT HC/HCT AC/ACT BCT F ALS AS TTL LS S ABT LV 5+ V Logic CD4000 FCT Harris now TI ETL BTL GTL HSTL SSTL Specialty 1.5 V Logic 1.2 V Logic Cypress now TI TVC AVC AUC AUC AVC ALVT ALVT AVC CBTLV AUC 0.8 V Logic AUC GTLP SSTV LV-A CBTLV AUC VME AUP AUP AUP AUP AUP AUP LV-A LV-A 11––55 AVC AVC
  • 20. TI remains committed to be the last supplier in the older families. Bipolar CMOS BiCMOS Introduction Growth Maturity Decline Obsolescence ALVC LV HC/HCT AS ALS F S TTL BCT LS CD4000 LVT-A ABT AC/ACT FCT AHC/AHCT ALVT LVC CBT CBTLV AVC GTLP Little Logic SSTV AUC TVC VME CB3T/Q SSTU AUP Product Life Cycle CBT-C 11––66
  • 21. ABTABT HC/HCTHC/HCT LVTLVT 64 24 12 8 5 10 15 20 Speed - max tpd (ns) BCTBCT IOLDrive(mA) AC/ACTAC/ACT AHC/AHCTAHC/AHCT ALVTALVT 5 V 3.3 V 2.5 V 1.8 V 100 GTLPGTLP FCTFCT LVLV AUPAUP LVCLVCALVCALVC AUCAUC AVCAVC Optimized Vcc ABT Advanced BiCMOS Technology AC/T Advanced CMOS AHC/T Advanced High Speed CMOS ALVC Advanced Low Voltage CMOS ALVT Advanced Low Voltage BiCMOS AUC Advanced Ultra Low Voltage CMOS AUP Advanced Ultra Low Power CMOS AVC Advanced Very Low Voltage CMOS BCT BiCMOS Technology FCT Fast CMOS Technology GTLP Gunning Transceiver Logic Plus HC/T High Speed CMOS LV Low Voltage HCMOS LVC Low Voltage CMOS LVT Low Voltage BiCMOS Technology Family Performance Positioning 11––1010
  • 22. CMOS Voltage Roadmap Optimized Voltage Data Sheet Limits Functional Voltage Tolerance CD4K HCT AHCT ACT AHC AC LV-A LVC ALVC AVC AUP AUC 5 4 3 2 1 Voltage 6 15 18 HC 11––1111
  • 23. CMOS Voltage vs. Speed Comparison of 16245 functions with 500 ohm/30pF load. (AUC not yet tested) 0 5 10 15 20 25 0 1 2 3 4 5 6 VCC (V) HC AHC LV-A AC LVC ALVC AVC AUC TypicalPropagationDelayTime(ns) 11––1212
  • 24. 5-V TTL Standard TTL: ABT, AHCT, HCT, ACT, Bipolar 1.5 0 GND 2.4 2.0 0.4 VOL 0.8 5 V VCC VOH VIH Vt VIL VOH GND VIH 5-V CMOS Rail-to-Rail 5 V HC, AHC, AC, LV-A 4.44 3.5 2.5 1.5 0.5 0 5 V VCC Vt VIL VOL 3.3-V LVTTL LVT, LVC, ALVC AUP, LV-A, ALVT 1.5 0 GND 2.4 0.4 3.3 V 0.8 2.0 VCC VOH VIH Vt VIL VOL VIH VOH 2.5-V CMOS AUC, AUP, AVC, ALVC, LVC, ALVT 2.3 1.7 1.2 0.7 0.2 0 2.5 V VCC GND Vt VIL VOL 1.8 V VCC VIH VOH1.2 1.17 0.9 0.7 0.45 0 GND Vt VIL VOL 1.8-V CMOS AUC, AUP, AVC, ALVC, LVC IsIs VOH higher than VIH? D RD R 5TTL 5CMOS 3LVTTL 2.5CMOS 1.85TTL 5CMOS 3LVTTL 2.5CMOS 1.8CMOSCMOS 5TTL Yes No Yes * Yes5TTL Yes No Yes * Yes** Yes*Yes* 5 CMOS Yes Yes Yes* Yes*5 CMOS Yes Yes Yes* Yes* Yes*Yes* 3 LVTTL Yes No Yes Yes3 LVTTL Yes No Yes Yes** Yes*Yes* 2.5 CMOS Yes No Yes Yes2.5 CMOS Yes No Yes Yes Yes*Yes* 1.8 CMOS No1.8 CMOS No NoNo No No YesNo No Yes * Requires V* Requires VIH ToleranceTolerance DD RR IsIs VOL less than VIL? IC Basics Comparison of Switching Standards 11––1616
  • 25. Open-Drain Outputs 05/06/07 Functions Functions Available VCC2 Required Input level depends on VCC1 RPULLUP T1 VCC1 Output level depends on VCC2 Also Possible Wired-Function Technique Phantom links on output side can reduce component count. 07 07 RPULLUP Vcc 05 - 06 - 07 - S, LS, ALS, AC, HC, AHC, LV, LVC TTL, LS, LV, LVC, LVC1G/3G, AUC1G TTL, LS, LV, LVC, LVC1G/3G, AUC1G NOTE: Over voltage tolerance is required to support UP translation. Mixed-Voltage Interfacing 11––2323
  • 26. • ICs are at the core of a modern digital system • Many systems fit entirely on a single IC (SOC) – a single (15-mm)2 chip can hold several million gates (1997) – a simple 32-bit CPU can be realised in an area of 1mm2 • Biggest limitation of a modern digital IC: Large reduction in signal count between on-chip wires and package pins. Typical IC – 104 wiring tracks on each of four metal layers – 103 signals can leave the chip (for cheaper packages: 40..200) – Chips are often “pad-limited”. Peripheral-bonded chips. Chip area increases as the square of the number of pads IC Packaging/Intro
  • 27. • Most ICs are bonded to small IC packages Although it is possible to attach chips directly to boards. Method used extensively in low-cost consumer electronics. Placing chips in packages enables independent testing of packaged parts, and eases requirements on board pitch and P&P (pick-and-place) equipment. • IC Packages – inexpensive plastic packages: <200 pins – packages with >1000 pins available (e.g. Xilinx FF1704: 1704-ball flip-chip BGA) • IC Packaging Materials – Plastic, ceramic, laminates (fiberglass, epoxy resin), metal IC Packaging/Intro
  • 28. • IC package categories: – PTH (pin-through-hole) Pins are inserted into through-holes in the circuit board and soldered in place from the opposite side of the board » Sockets available » Manual P&P possible – SMT (surface-mount-technology) SMT packages have leads that are soldered directly to corresponding exposed metal lands on the surface of the circuit board » Elimination of holes » Ease of manufacturing (high-speed P&P) » Components on both sides of the PCB » Smaller dimensions » Improved package parasitic components » Increased circuit-board wiring density SMT packages offer many benefits and are generally preferred. IC Packaging/Categories
  • 29. • IC packaging material: Plastic – die-bonding and wire-bonding the chip to a metal lead frame – encapsulation in injection-molded plastic – inexpensive but high thermal resistance – Warning: Plastic molds are hygroscopic » Absorb moisture Storage in low-humidity environment. Observation of factory floor-life » Stored moisture can vapourise during rapid heating can lead to hydrostatic pressure during reflow process. Consequences can be: Delamination within the package, and package cracking. Early device failure. IC Packaging/Materials
  • 30. • IC packaging materials: Ceramic » consists of several layers of conductors separated by layers of ceramic (Al2O3 “Alumina”) » chip placed in a cavity and bonded to the conductors Note: no lead-frame » metal lid soldered on to the package » sealed against the environment » ground layers and direct bypass capacitors possible within a ceramic package » high permittivity of alumina (εr=10) Note: High permittivity leads to higher propagation delay! » expensive IC Packaging/Materials
  • 31. Plastic Dual-In-Line (PDIP) here: PDIP14 Small Outline Integrated Circuit (SOIC) here: SO14 SC70 here: SC70-5 Plastic Lead Chip Carrier (PLCC) here: PLCC28 Thin Shrink Small Outline (TSSOP) here: TSSOP14 Thin Quad Flat Package (TQFP) here: TQFP32 IC Packaging/Popular IC Packages
  • 32. Small Outline Integrated Circuit (SOIC) •Shown: SO14, but available from SO8..SO28 •Gull-wing leads •Popular, cost effective, and widely available IC package for low-pin-count ICs •Dimensions: 8.6mm x 3.9mm x 1.75mm •Pin-to-pin: 1.27mm (50mil) IC Packaging/Popular IC Packages
  • 33. Thin Shrink Small Outline (TSSOP) •Shown: TSSOP14, but available up to TSSOP64 •Popular, cost effective, and widely available IC package for low-profile applications •Dimensions: 5.0mm x 4.4mm x 1.2mm •Pin-to-pin: 0.65mm (25mil) IC Packaging/Popular IC Packages
  • 34. Ball Grid Arrays (BGA) •Shown: BGA54 •Available pin count >1700 •Advanced IC package for high-density low-profile applications •Chip-scale package (CSP) •Dimensions: 8.0mm x 5.5mm x 1.4mm •Pin-to-pin: 0.8mm •Low lead inductance Challenges: •Integrity of solder joints •Solder joint inspection (X-ray) •Availability of 2nd source •Routing Altera Ultra-Fine-Line BGA •Pin-Count: 169 •Dimensions 11mm x 11mm •Profile: 1.2mm IC Packaging/Popular IC Packages
  • 35. die bond wire land package trace via and ball metal substrate Physical construction of a BGA •Shown: Type-II BGA (cavity-down design) •Interconnect: multi-layer laminated construction •Die bonded onto a metal heat slug •Solder balls make connection to a PC board •50µm bond wires •Copper conductor thickness 20µm •Layer separation 150µm IC Packaging/BGA Physical Construction
  • 36. IC Packaging/Electronic Assembly (1981) IBM PC 1981 •IC packaging: DIL only! •Processor: 8088 •Memory: 256kB