The document reports on various characterization techniques used to analyze the material properties of perovskite thin films and solar cells, including X-ray diffraction, scanning electron microscopy, atomic force microscopy, absorption spectroscopy, photoluminescence spectroscopy, X-ray photoelectron spectroscopy, current density-voltage measurements, and external quantum efficiency measurements.
14. 3D structure and device fabrication processes of planar perovskite solar cell with
mixed cation solution processing
15. Current density vs voltage (J–V) curves from forward and reverse scans of mixed-
cation planar PSCs based on (a) spin-coated TiO2 with a thickness of 60–65 nm
and (b) spin-coated SnO2 as an electron-transport layer
17. Current density vs voltage (J–V) curves in the dark for different thicknesses of
blocking layer with (a) semi logarithmic scale to identify the recombination
mechanism and (b) natural-log scale to calculate the diode ideality factors (n)
(the lines are fitted to the Shockley diode equation)
18. Histogram of PCE measured from 30 mixed cation based devices, which shows
an average PCE of a) 13.5% with TiO2 and b) 15.7% with SnO2