Weitere ähnliche Inhalte Ähnlich wie SPICE MODEL of TPCP8401 (Professional+BDP N&P Model) in SPICE PARK (20) Mehr von Tsuyoshi Horigome (20) Kürzlich hochgeladen (20) SPICE MODEL of TPCP8401 (Professional+BDP N&P Model) in SPICE PARK1. Device Modeling Report
COMPONENTS: Power MOSFET (Professional)
PART NUMBER: TPCP8401
MANUFACTURER: TOSHIBA
Body Diode (Professional) / ESD Protection Diode
REMARK: Silicon N&P Channel MOS Type
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
2. MOSFET MODEL
PSpice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
3. N-Channel Model
Transconductance Characteristic
Circuit Simulation Result
0.26
0.21
0.16
gfs
0.11
0.06
Measurement
Simulation
0.01
0 20 40 60 80 100
ID(mA)
Comparison table
gfs
Id(mA) Error (%)
Measurement Simulation
1 0.030 0.029 -3.333
2 0.040 0.040 0
5 0.063 0.064 1.587
10 0.090 0.091 1.111
20 0.133 0.128 -3.759
50 0.200 0.203 1.500
100 0.294 0.287 -2.381
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
4. Vgs-Id Characteristic
Circuit Simulation result
1.0A
100mA
10mA
1.0mA
0V 1.0V 2.0V 3.0V
I(V3)
V_V1
Evaluation circuit
V3
0Vdc
OPEN
OPEN
U1 V2
TPCP8401 R1
5
V1 1G
2
0
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
5. Comparison Graph
Circuit Simulation Result
100
Measurement
Simulation
ID - Drain Current (mA)
10
1
0 1 2 3
VGS - Gate to Source Voltage - V
Simulation Result
VGS(V)
ID(mA) Error (%)
Measurement Simulation
1 1 1.0373 3.730
2 1.05 1.0668 1.600
5 1.15 1.1254 -2.139
10 1.22 1.1914 -2.344
20 1.32 1.2847 -2.674
50 1.5 1.47 -2.000
100 1.7 1.6790 -1.235
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
6. Rds(on) Characteristic
Circuit Simulation result
10mA
5mA
0A
0V 10mV 20mV 30mV
I(V2)
V_V3
Evaluation circuit
V2
0Vdc
OPEN
V3 OPEN
U1
TPCP8401 0Vdc
V1 R1
4 1G
0 0
Simulation Result
ID=10mA, VGS=4V Measurement Simulation Error (%)
R DS (on) 1.5 1.5577 3.847
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
7. Gate Charge Characteristic
Circuit Simulation result
5.0V
4.0V
3.0V
2.0V
1.0V
0V
0 0.4n 0.8n 1.2n 1.6n 2.0n
V(W1:3)
Time*1mA
Evaluation circuit
RON = 1.0
ROFF = 1e6
ION = 0
IOFF = 100u D1
Dbreak
W1 OPEN
+ I2
-
W 0.1
I1 R1
I1 = 0
I2 = 1m V1 1G
TD = 0
TR = 10n 15
OPEN
TF = 10n U1
PW = 300u
PER = 500u TPCP8401
0
0
Simulation Result
VDD=15V,ID=0.1A Measurement Simulation Error (%)
Qgs 0.12 nC 0.1196 nC -0.333
Qgd 0.304 nC 0.299 nC -1.645
Qg 0.8 nC 0.816 nC 2.000
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
8. Reference
5
VDD=15V
4
GATE VOLTAGE Vg
3
2
1
0
0 0.4 0.8 1.2 1.6 2
GATE CHARGE Qg(nc)
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
9. Capacitance Characteristic
Measurement
Simulation
Simulation Result
Cbd(pF)
VDS(V) Error(%)
Measurement Simulation
0.1 7.2 7.19 -0.139
0.2 7 7 0
0.5 6.5 6.53 0.462
1 6 6 0.000
2 5.4 5.37 -0.556
5 4.5 4.51 0.222
10 3.9 3.88 -0.513
20 3.3 3.32 0.606
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
10. Switching Time Characteristic
Circuit Simulation result
4.0V
3.0V
2.0V
1.0V
0V
9.697us 10.000us 10.400us 10.700us
V(VOUT)/1.2 V(VGS)
Time
Evaluation circuit
VOUT
Vsense L3 RL
3 OPEN
30nH 300
OPEN
L4
VGS
U1 C1 R6
30nH
VD
TPCP8401 100u 3Vdc 1G
R5
50
0
0 0
Simulation Result
ID=10m A, VDD=3V
Measurement Simulation Error(%)
VGS=0/2.5V
ton 70.000 ns 72.416 ns 3.451
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
11. Output Characteristic
Circuit Simulation result
250mA
200mA
6.8
1.9 V
150mA
1.7 V
100mA
1.5 V
50mA
VGS=1.3 V
0A
0V 0.5V 1.0V 1.5V 2.0V
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
OPEN
OPEN
U1 V2
TPCP8401
V1 2 R1
1G
1.3
0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
12. Forward Current Characteristic
Circuit Simulation Result
250mA
200mA
150mA
100mA
50mA
0A
0V 0.2V 0.4V 0.6V 0.8V 1.0V 1.2V 1.4V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
OPEN
V1 U1
0Vdc TPCP8401
R2
1G
OPEN
0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
13. Comparison Graph
Circuit Simulation Result
100
Measurement
Simulation
Drain reverse current IDR(mA)
50
0
0 0.2 0.4 0.6 0.8 1 1.2 1.4
Source-Drain voltage VSD(V)
Simulation Result
VSD(V)
Ifwd(mA) Measurement Simulation %Error
5 0.6 0.601 0.167
10 0.65 0.646 -0.615
20 0.69 0.694 0.580
50 0.765 0.763 -0.261
100 0.825 0.826 0.121
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
14. Reverse Recovery Characteristic
Circuit Simulation Result
400mA
200mA
0A
-200mA
-400mA
14.96us 15.00us 15.04us 15.08us 15.12us 15.16us
I(RL)
Time
Evaluation Circuit
RL
50
U1
V1 = -9.2 V1
V2 = 10.9 D8401_N
TD = 0
TR = 10n
TF = 10n
PW = 15u
PER = 100u
0
Compare Measurement vs. Simulation
Measurement Simulation Error (%)
Trj(ns) 14 14.001 0.007
Trb(ns) 25.6 25.594 -0.023
Trr(ns) 39.6 39.595 -0.013
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
15. Reverse Recovery Characteristic Reference
Trj=14(ns)
Trb=25.6(ns)
Conditions:Ifwd=lrev=0.02(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
16. ESD PROTECTION DIODE
Zener Voltage Characteristic
Circuit Simulation Result
10mA
5mA
0A
0V 25V 50V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
OPEN
U1
TPCP8401
R2 R3
V1
0Vdc 1G 1G
OPEN
0
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
18. P-Channel Model
Transconductance Characteristic
Circuit Simulation Result
9.5
8.5
7.5
6.5
gfs
5.5
4.5
3.5
Measurement
Simulation
2.5
0 0.4 0.8 1.2 1.6 2
ID(A)
Comparison table
gfs
- Id(mA) Error(%)
Measurement Simulation
0.2 2.857 2.985 4.480
0.5 4.717 4.505 -4.494
1 6.173 6.452 4.520
2 8.696 8.969 3.139
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
19. Vgs-Id Characteristic
Circuit Simulation result
-10A
-8A
-6A
-4A
-2A
0A
0V -0.5V -1.0V -1.5V -2.0V -2.5V
I(V3)
V_V1
Evaluation circuit
V3
0Vdc
U1
OPEN
V2
OPEN
R1
-5
OPEN OPEN 1G
V1
TPCP8401
-3
0
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
20. Comparison Graph
Circuit Simulation Result
Measurement
Simulation
1.8
1.4
ID - Drain Current (A)
1
0.6
0.2
0 1 2 3
VGS - Gate to Source Voltage - V
Simulation Result
- VGS(V)
- ID(mA) Error (%)
Measurement Simulation
0.2 1.1 1.1027 0.245
0.5 1.17 1.1857 1.342
1 1.25 1.28 2.400
2 1.35 1.4131 4.674
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
21. Rds(on) Characteristic
Circuit Simulation result
-2.8A
-2.0A
-1.0A
0A
0V -50mV -100mV -150mV -200mV
I(V2)
V_V3
Evaluation circuit
V2
0Vdc
U1
V3 OPEN
0Vdc
V1 R1
-4.5 1G
TPCP8401
OPEN
0 0
Simulation Result
ID=-2.8A, VGS=-4.5V Measurement Simulation Error (%)
R DS (on) 31.000 m 31.761 m 2.455
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
22. Gate Charge Characteristic
Circuit Simulation result
-5.0V
-4.0V
-3.0V
-2.0V
-1.0V
0V
0 8n 16n 24n 32n 40n
V(W1:4)
Time*1mA
Evaluation circuit
U1
W OPEN
-
+ I2
D1
W1 Dbreak -5.5
IOFF = 100uA R1
I1 TD = 0 ION = 0
TF = 10n ROFF = 1e6 TPCP8401 1G
PW = 200u RON = 1.0 V1
OPEN
PER = 500u
I1 = 0
I2 = 1m -10
TR = 10n
0
0
Simulation Result
VDD=-10V,ID=-5.5A
Measurement Simulation Error (%)
,VGS=-5V
Qgs(nC) 5.5 5.4732 -0.487
Qgd(nC) 4.5 4.6618 3.596
Qg(nC) 20.5 20.547 0.229
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
23. Capacitance Characteristic
Measurement
Simulation
Simulation Result
Cbd(pF)
- VDS(V) Error(%)
Measurement Simulation
0.1 300 298 -0.667
0.2 270 273 1.111
0.5 220 218 -0.909
1 170 173 1.765
2 130 127 -2.308
5 80 81 1.250
10 55 56 1.818
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
24. Switching Time Characteristic
Circuit Simulation result
-10V
-8V
-6V
-4V
-2V
0V
1.9us 2.0us 2.1us 2.2us
V(U1:5) V(U1:2)/1.2
Time
Evaluation circuit
L1 R2
50nH
2.1
OPEN
L2 U1
30nH V1
V1 = 0 V2 R1
V2 = -5 R4
TD = 2u -6 1G
TR = 4n 4.7
OPEN
TF = 4n
PW = 10u
PER = 30u TPCP8401
0
0
Simulation Result
ID=-2.8 A, VDD=-6V
Measurement Simulation Error(%)
VGS=0/-5V
Ton(ns) 16 16.039 0.244
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
25. Output Characteristic
Circuit Simulation result
-10A
-1.9V
-8A
-1.8V
-6A -1.7V
-1.6V
-4A
VGS=-1.4V
-2A
0A
0V -2.0V -4.0V -5.0V
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
U1
OPEN
V2
OPEN
V1 -5 R1
OPEN OPEN
1G
-1.4 TPCP8401
0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
26. Forward Current Characteristic
Circuit Simulation Result
100A
10A
1.0A
0V 0.4V 0.8V 1.2V 1.6V 2.0V
I(R1)
V_V1
Evaluation Circuit
R1
0.01m
U1
OPEN
V1
0Vdc
R2
1G
TPCP8401
OPEN
0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
27. Comparison Graph
Circuit Simulation Result
100
Measurement
Simulation
Drain reverse current IDR(A)
10
1
0 0.4 0.8 1.2 1.6 2
Source-Drain voltage VSD(V)
Simulation Result
VSD(V)
IDR(A) Measuremen Simulation %Error
1 0.67 0.675 0.746
2 0.73 0.727 -0.411
5 0.82 0.818 -0.244
10 0.92 0.922 0.217
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
28. Reverse Recovery Characteristic
Circuit Simulation Result
400mA
0A
-400mA
14.90us 15.04us 15.20us 15.30us
I(RL)
Time
Evaluation Circuit
RL
50
U1
D8401_P
V1 = -9.45 V1
V2 = 10.6
TD = 0
TR = 10n
TF = 10n
PW = 15u
PER = 100u
0
Compare Measurement vs. Simulation
Measurement Simulation Error (%)
Trj(ns) 15.2 15.2 0
Trb(ns) 72.8 72.842 0.058
Trr(ns) 88 88.042 0.048
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
29. Reverse Recovery Characteristic Reference
Trj=15.2(ns)
Trb=72.8(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006
30. Zener Voltage Characteristic
Circuit Simulation Result
10mA
5mA
0A
0V 25V 50V
I(R1)
V_V1
Evaluation Circuit
R1 U1
0.01m
OPEN
R2 R3
V1
0Vdc TPCP8401 1G 1G
OPEN
0
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2006