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Device Modeling Report



COMPONENTS: Power MOSFET (Standard)
PART NUMBER: TPCF8302
MANUFACTURER: TOSHIBA
Body Diode (Standard) / ESD Protection Diode




                  Bee Technologies Inc.


    All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Circuit Configuration



                TPCF8302




MOSFET MODEL
 PSpice model
                                          Model description
  parameter
    LEVEL
       L           Channel Length
      W            Channel Width
      KP           Transconductance
      RS           Source Ohmic Resistance
      RD           Ohmic Drain Resistance
     VTO           Zero-bias Threshold Voltage
     RDS           Drain-Source Shunt Resistance
     TOX           Gate Oxide Thickness
    CGSO           Zero-bias Gate-Source Capacitance
    CGDO           Zero-bias Gate-Drain Capacitance
     CBD           Zero-bias Bulk-Drain Junction Capacitance
      MJ           Bulk Junction Grading Coefficient
      PB           Bulk Junction Potential
      FC           Bulk Junction Forward-bias Capacitance Coefficient
      RG           Gate Ohmic Resistance
      IS           Bulk Junction Saturation Current
       N           Bulk Junction Emission Coefficient
      RB           Bulk Series Resistance
     PHI           Surface Inversion Potential
   GAMMA           Body-effect Parameter
    DELTA          Width effect on Threshold Voltage
     ETA           Static Feedback on Threshold Voltage
    THETA          Mobility Modulation
    KAPPA          Saturation Field Factor
    VMAX           Maximum Drift Velocity of Carriers
      XJ           Metallurgical Junction Depth
      UO           Surface Mobility




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Transconductance Characteristic

Circuit Simulation Result




Simulation Result

                                       VGS(V)
       ID(A)                                                              Error (%)
                     Measurement                  Simulation
         -0.200                    3.170                      3.017            -4.826
         -0.500                    4.600                      4.717             2.543
         -1.000                    6.250                      6.519             4.304
         -2.000                    9.090                      8.980            -1.210




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Vgs-Id Characteristic

Circuit Simulation result



     -5.0A




     -4.0A




     -3.0A




     -2.0A




     -1.0A




        0A
             0V                     -1.0V                      -2.0V               -3.0V
                  I(V3)
                                                     V_V1




Evaluation circuit



                                    OPEN                    OPEN

                                    OPEN                    OPEN



                                                             V3
                                                             0Vdc
                                               TPCF8302


                                                                       V2
                             V1                                        -10Vdc
                          -2.5Vdc



                                           0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                                       VGS(V)
       ID(A)                                                              Error (%)
                     Measurement                  Simulation
         -0.200                   -1.100                     -1.105             0.427
         -0.500                   -1.188                     -1.184            -0.320
         -1.000                   -1.313                     -1.275            -2.895
         -2.000                   -1.438                     -1.406            -2.191
         -5.000                   -1.688                     -1.678            -0.575




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Id-Rds(on) Characteristic

Circuit Simulation result


        -2.0A




        -1.5A




        -1.0A




        -0.5A




            0A
                 0V     -50mV     -125mV       -200mV         -275mV      -350mV       -425mV
                      I(V3)
                                                         V_V2


Evaluation circuit


                                        OPEN                      OPEN

                                        OPEN                      OPEN



                                                                   V3
                                                                   0Vdc
                                                   TPCF8302


                                                                              V2
                               V1                                             -10Vdc
                            -2.5Vdc



                                               0



Simulation Result

     ID=-1.5, VGS=-2.5V               Measurement                  Simulation               Error (%)
          R DS (on)                            68 m                         68 m                 0



                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Gate Charge Characteristic
Circuit Simulation result

             -10V




              -8V




              -6V



                                                             VDD=-8V
              -4V




              -2V




               0V
                    0              4n                   8n               12n              16n
                         V(W1:4)
                                                  Time*1mA



Evaluation circuit


                                                                        V2


                                                                       0Vdc

                                                 OPEN             OPEN

                                                 OPEN             OPEN
                                                                                D1

                                                                                          I2
                                                                               Dbreak
                                    ION = 0uA
                                    IOFF = 10m                                            -3Adc
                I1 = 0              W
                              I1         -
                I2 = 10m                +                                                 V1
                TD = 0                                                                    -16Vdc
                TR = 10n            W1
                TF = 10n
                PW = 600u
                PER = 1000u


                                                                    0


Simulation Result

        VDD=-8V,ID=-3A             Measurement                Simulation                Error (%)
           ,VGS=-5V
             Qgs                             1.30 nC            1.313 nC                            1.00
             Qgd                             2.60 nC            2.602 nC                            0.08
              Qg                             9.50 nC            7.930 nC                          -16.53



                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Capacitance Characteristic


                                                                Measurement
                                                                 Simulation




Simulation Result


                                       Cbd(pF)
          VDS(V)                                                      Error(%)
                         Measurement            Simulation
               0.100              200.000              194.000                -3.000
               0.200              120.000              117.000                -2.500
               0.500               44.000               42.000                -4.545
               1.000               16.000               16.000                 0.000
               2.000                5.000                5.200                 4.000




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Switching Time Characteristic

Circuit Simulation result


        -12V



                              VDS = -10V                                                                 VGS = 0/-5V

         -8V




         -4V




           0V
          4.901us             4.950us                        5.000us              5.050us                     5.100us        5.146us
               V(2)*2          V(3)
                                                                           Time




Evaluation circuit

                                                                                                 3
                                                                                            V3
                                                                                   0Vdc

                                                                                                                  L1
                                                                                                                   30nH
                                                                  OPEN                    OPEN

                                                                  OPEN                    OPEN

                                    R1                  L2                                                        RL
                                          2
                                                                                                                   6.7
                                    4.7                  30nH
                  V1 = 0
                               V1
                  V2 = -10                                                                                     VDD
                  TD = 5u                         R2
                  TR = 6n
                  TF = 6n                         4.7
                  PW = 5u
                  PER = 10u                                                                          -10.15
                               0              0                        0                                      0



Simulation Result

       ID=-1.5A, VDD=-10V
                                              Measurement                          Simulation                             Error(%)
            VGS=0/-5V
               ton                                      15.000 ns                  15.012             ns                      0.080




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Output Characteristic

Circuit Simulation result


                -10A
                          -10V
                                       -2.5V
                 -9A
                                     -3V
                 -8A                                                  -2.0V

                 -7A
                                     -6V
                 -6A

                 -5A
                                                                      --1.8V
                 -4A

                 -3A
                                                                      -1.6V
                 -2A

                 -1A
                                                                  VGS=-1.4V
                     0A
                          0V -0.5V         -1.5V   -2.5V   -3.5V       -4.5V
                             I(V3)
                                                   V_V2




Evaluation circuit




                                           OPEN            OPEN

                                           OPEN            OPEN

                                                                         V3


                                                                        0Vdc




                        V1                                              V2
                     -2.5Vdc                                            -10Vdc



                                                     0




                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Forward Current Characteristic
Circuit Simulation Result



         -10A




       -100mA
                0V    0.1V 0.2V 0.3V 0.4V 0.5V 0.6V 0.7V 0.8V 0.9V 1.0V 1.1V
                     I(V2)
                                               V_V3




Evaluation Circuit


                                      R1
                                                        OPEN
                                                           OPEN
                                      0.01m

                           V2
                           0Vdc

                                                                  TPCF8302
                                                                  U1
                           V3
                           0Vdc
                                                        OPEN
                                                           OPEN



                                           0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Comparison Graph

Circuit Simulation Result




Simulation Result

                            Vfwd(V)                   Vfwd(V)
       Ifwd(A)                                                              %Error
                          Measurement                Simulation
            0.100                   0.570                     0.568             -0.439
            0.200                   0.600                     0.600              0.050
            0.500                   0.650                     0.654              0.569
            1.000                   0.705                     0.707              0.270
            2.000                   0.780                     0.775             -0.641
            5.000                   0.900                     0.901              0.133




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Reverse Recovery Characteristic

Circuit Simulation Result

            400mA


            300mA


            200mA


            100mA


                -0mA


           -100mA


           -200mA


           -300mA


           -400mA
              15.52us    15.56us           15.60us          15.64us    15.68us 15.72us
                   I(R1)
                                                     Time


Evaluation Circuit


                                             R1


                                             50
                                                                 OPEN
                                                                    OPEN

                       V1 = -9.7v
                       V2 = 10.6v     V1                                   U1
                       TD = 0.576us                                        TPCF8302
                       TR = 10ns
                       TF = 10ns
                       PW = 15us
                       PER = 100us


                                                                 OPEN
                                                                    OPEN
                                      0
                                                                 0



Compare Measurement vs. Simulation

                        Measurement                  Simulation                       Error(%)
          trj                  4.500 ns                    4.677 ns                         3.93




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Reverse Recovery Characteristic                                              Reference




Trj=4.0(ns)
Trb=19.6(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic

Circuit Simulation Result

                -10mA

                 -9mA

                 -8mA

                 -7mA

                 -6mA

                 -5mA

                 -4mA

                 -3mA

                 -2mA

                 -1mA

                     0A
                          0V     -2V     -4V    -6V    -8V   -10V -12V -14V -16V -18V
                               I(V2)
                                                             V_V3


Evaluation Circuit


                                                                 OPEN        OPEN

                                                                 OPEN        OPEN
                                               R1
                                                                             OPEN
                                               0.01m
                                                                             OPEN
                                       V2


                                       0Vdc

                               0Vdc


                               V3




                                                             0




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Zener Voltage Characteristic                                               Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

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SPICE MODEL of TPCF8302 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Standard) PART NUMBER: TPCF8302 MANUFACTURER: TOSHIBA Body Diode (Standard) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 2. Circuit Configuration TPCF8302 MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 3. Transconductance Characteristic Circuit Simulation Result Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation -0.200 3.170 3.017 -4.826 -0.500 4.600 4.717 2.543 -1.000 6.250 6.519 4.304 -2.000 9.090 8.980 -1.210 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 4. Vgs-Id Characteristic Circuit Simulation result -5.0A -4.0A -3.0A -2.0A -1.0A 0A 0V -1.0V -2.0V -3.0V I(V3) V_V1 Evaluation circuit OPEN OPEN OPEN OPEN V3 0Vdc TPCF8302 V2 V1 -10Vdc -2.5Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 5. Comparison Graph Circuit Simulation Result Simulation Result VGS(V) ID(A) Error (%) Measurement Simulation -0.200 -1.100 -1.105 0.427 -0.500 -1.188 -1.184 -0.320 -1.000 -1.313 -1.275 -2.895 -2.000 -1.438 -1.406 -2.191 -5.000 -1.688 -1.678 -0.575 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 6. Id-Rds(on) Characteristic Circuit Simulation result -2.0A -1.5A -1.0A -0.5A 0A 0V -50mV -125mV -200mV -275mV -350mV -425mV I(V3) V_V2 Evaluation circuit OPEN OPEN OPEN OPEN V3 0Vdc TPCF8302 V2 V1 -10Vdc -2.5Vdc 0 Simulation Result ID=-1.5, VGS=-2.5V Measurement Simulation Error (%) R DS (on) 68 m 68 m 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 7. Gate Charge Characteristic Circuit Simulation result -10V -8V -6V VDD=-8V -4V -2V 0V 0 4n 8n 12n 16n V(W1:4) Time*1mA Evaluation circuit V2 0Vdc OPEN OPEN OPEN OPEN D1 I2 Dbreak ION = 0uA IOFF = 10m -3Adc I1 = 0 W I1 - I2 = 10m + V1 TD = 0 -16Vdc TR = 10n W1 TF = 10n PW = 600u PER = 1000u 0 Simulation Result VDD=-8V,ID=-3A Measurement Simulation Error (%) ,VGS=-5V Qgs 1.30 nC 1.313 nC 1.00 Qgd 2.60 nC 2.602 nC 0.08 Qg 9.50 nC 7.930 nC -16.53 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VDS(V) Error(%) Measurement Simulation 0.100 200.000 194.000 -3.000 0.200 120.000 117.000 -2.500 0.500 44.000 42.000 -4.545 1.000 16.000 16.000 0.000 2.000 5.000 5.200 4.000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 9. Switching Time Characteristic Circuit Simulation result -12V VDS = -10V VGS = 0/-5V -8V -4V 0V 4.901us 4.950us 5.000us 5.050us 5.100us 5.146us V(2)*2 V(3) Time Evaluation circuit 3 V3 0Vdc L1 30nH OPEN OPEN OPEN OPEN R1 L2 RL 2 6.7 4.7 30nH V1 = 0 V1 V2 = -10 VDD TD = 5u R2 TR = 6n TF = 6n 4.7 PW = 5u PER = 10u -10.15 0 0 0 0 Simulation Result ID=-1.5A, VDD=-10V Measurement Simulation Error(%) VGS=0/-5V ton 15.000 ns 15.012 ns 0.080 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 10. Output Characteristic Circuit Simulation result -10A -10V -2.5V -9A -3V -8A -2.0V -7A -6V -6A -5A --1.8V -4A -3A -1.6V -2A -1A VGS=-1.4V 0A 0V -0.5V -1.5V -2.5V -3.5V -4.5V I(V3) V_V2 Evaluation circuit OPEN OPEN OPEN OPEN V3 0Vdc V1 V2 -2.5Vdc -10Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 11. Forward Current Characteristic Circuit Simulation Result -10A -100mA 0V 0.1V 0.2V 0.3V 0.4V 0.5V 0.6V 0.7V 0.8V 0.9V 1.0V 1.1V I(V2) V_V3 Evaluation Circuit R1 OPEN OPEN 0.01m V2 0Vdc TPCF8302 U1 V3 0Vdc OPEN OPEN 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 12. Comparison Graph Circuit Simulation Result Simulation Result Vfwd(V) Vfwd(V) Ifwd(A) %Error Measurement Simulation 0.100 0.570 0.568 -0.439 0.200 0.600 0.600 0.050 0.500 0.650 0.654 0.569 1.000 0.705 0.707 0.270 2.000 0.780 0.775 -0.641 5.000 0.900 0.901 0.133 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 15.52us 15.56us 15.60us 15.64us 15.68us 15.72us I(R1) Time Evaluation Circuit R1 50 OPEN OPEN V1 = -9.7v V2 = 10.6v V1 U1 TD = 0.576us TPCF8302 TR = 10ns TF = 10ns PW = 15us PER = 100us OPEN OPEN 0 0 Compare Measurement vs. Simulation Measurement Simulation Error(%) trj 4.500 ns 4.677 ns 3.93 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 14. Reverse Recovery Characteristic Reference Trj=4.0(ns) Trb=19.6(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result -10mA -9mA -8mA -7mA -6mA -5mA -4mA -3mA -2mA -1mA 0A 0V -2V -4V -6V -8V -10V -12V -14V -16V -18V I(V2) V_V3 Evaluation Circuit OPEN OPEN OPEN OPEN R1 OPEN 0.01m OPEN V2 0Vdc 0Vdc V3 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2005