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All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: SiC Schottky Barrier Diode
PART NUMBER: SCS230AE2
MANUFACTURER: ROHM
REAMARK: POFESSIONAL MODEL
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
2
Circuit Configuration
DIODE MODEL PARAMETERS
PSpice
model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
3
R1
0.01m
V1
0Vdc
0
R2
100MEG
NC
U1
SCS230AE2_P
V_V1
0V 0.5V 1.0V 1.5V 2.0V 2.5V
I(R1)
1.0mA
10mA
100mA
1.0A
10A
100A
Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
4
Comparison Graph
Circuit Simulation result
Comparison table
IF (A)
VF (V)
%Error
Measurement Simulation
0.001 0.700 0.680 -2.86
0.01 0.750 0.740 -1.33
0.1 0.810 0.802 -0.99
1 0.900 0.889 -1.22
2 0.950 0.939 -1.16
5 1.040 1.055 1.44
10 1.200 1.227 2.25
20 1.500 1.554 3.60
50 2.500 2.500 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
5
0
V1
TD = 0
TF = 500ns
PW = 100us
PER = 500us
V1 = 0
TR = 10us
V2 = 650
V2
0Vdc
R1
100MEG
NC
U1
SCS230AE2_P
V(N16650)
10mV 100mV 1.0V 10V 100V 1.0KV
I(V2)/(650V/10us)
1.0pF
10pF
100pF
1.0nF
Junction Capacitance Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
6
Comparison Graph
Circuit Simulation result
Comparison table
VR (V)
CT (pF)
%Error
Measurement Simulation
0.01 760.000 747.1 -1.70
0.1 730.000 724.8 -0.71
1 550.000 551.2 0.22
10 230.000 221.6 -3.65
100 83.000 83.2 0.24
200 66.000 68.9 4.39
500 57.000 58.1 1.93
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
7
V1
0Vdc
R1
100m
0
R2
100MEG
NC
U1
SCS230AE2_P
V_V1
0V 200V 400V 600V
I(R1)
10nA
100nA
1.0uA
10uA
Reverse Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
8
Comparison Graph
Circuit Simulation result
Comparison table
IR (uA)
VR (V)
%Error
Measurement Simulation
0.01 400 386.9 -3.28
0.1 483 478.5 -0.93
2 600 601.8 0.30

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SPICE MODEL of SCS230AE2 (Professional Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: SCS230AE2 MANUFACTURER: ROHM REAMARK: POFESSIONAL MODEL
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 2 Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 3 R1 0.01m V1 0Vdc 0 R2 100MEG NC U1 SCS230AE2_P V_V1 0V 0.5V 1.0V 1.5V 2.0V 2.5V I(R1) 1.0mA 10mA 100mA 1.0A 10A 100A Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 4 Comparison Graph Circuit Simulation result Comparison table IF (A) VF (V) %Error Measurement Simulation 0.001 0.700 0.680 -2.86 0.01 0.750 0.740 -1.33 0.1 0.810 0.802 -0.99 1 0.900 0.889 -1.22 2 0.950 0.939 -1.16 5 1.040 1.055 1.44 10 1.200 1.227 2.25 20 1.500 1.554 3.60 50 2.500 2.500 0.00
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 5 0 V1 TD = 0 TF = 500ns PW = 100us PER = 500us V1 = 0 TR = 10us V2 = 650 V2 0Vdc R1 100MEG NC U1 SCS230AE2_P V(N16650) 10mV 100mV 1.0V 10V 100V 1.0KV I(V2)/(650V/10us) 1.0pF 10pF 100pF 1.0nF Junction Capacitance Characteristic Circuit Simulation result Evaluation circuit
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 6 Comparison Graph Circuit Simulation result Comparison table VR (V) CT (pF) %Error Measurement Simulation 0.01 760.000 747.1 -1.70 0.1 730.000 724.8 -0.71 1 550.000 551.2 0.22 10 230.000 221.6 -3.65 100 83.000 83.2 0.24 200 66.000 68.9 4.39 500 57.000 58.1 1.93
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 7 V1 0Vdc R1 100m 0 R2 100MEG NC U1 SCS230AE2_P V_V1 0V 200V 400V 600V I(R1) 10nA 100nA 1.0uA 10uA Reverse Characteristic Circuit Simulation result Evaluation circuit
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 8 Comparison Graph Circuit Simulation result Comparison table IR (uA) VR (V) %Error Measurement Simulation 0.01 400 386.9 -3.28 0.1 483 478.5 -0.93 2 600 601.8 0.30