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Device Modeling Report



COMPONENTS: Power MOSFET (Model Parameters)
PART NUMBER: 2SJ656
MANUFACTURER: SANYO
Body Diode (Model Parameters) / ESD Protection Diode




                   Bee Technologies Inc.




     All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                    1
MOSFET MODEL
 PSpice model
                                         Model description
  parameter
    LEVEL
       L        Channel Length
      W         Channel Width
      KP        Transconductance
      RS        Source Ohmic Resistance
      RD        Ohmic Drain Resistance
     VTO        Zero-bias Threshold Voltage
     RDS        Drain-Source Shunt Resistance
     TOX        Gate Oxide Thickness
    CGSO        Zero-bias Gate-Source Capacitance
    CGDO        Zero-bias Gate-Drain Capacitance
     CBD        Zero-bias Bulk-Drain Junction Capacitance
      MJ        Bulk Junction Grading Coefficient
      PB        Bulk Junction Potential
      FC        Bulk Junction Forward-bias Capacitance Coefficient
      RG        Gate Ohmic Resistance
      IS        Bulk Junction Saturation Current
       N        Bulk Junction Emission Coefficient
      RB        Bulk Series Resistance
     PHI        Surface Inversion Potential
   GAMMA        Body-effect Parameter
    DELTA       Width effect on Threshold Voltage
     ETA        Static Feedback on Threshold Voltage
    THETA       Mobility Modulation
    KAPPA       Saturation Field Factor
    VMAX        Maximum Drift Velocity of Carriers
      XJ        Metallurgical Junction Depth
      UO        Surface Mobility




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                          2
Transconductance Characteristic

Circuit Simulation Result

                  40
                               Measurement

                               Simulation
                  30




                  20
         gfs(S)




                  10




                   0
                       0.0     5.0          10.0        15.0      20.0      25.0     30.0

                                               Drain Current ID (-A)

Comparison table


                                                   gfs(S)
      -Id(A)                                                                       Error (%)
                             Measurement                       Simulation
                  1                      7.500                            7.721             2.94
                  2                     10.400                           10.580             1.73
                  5                     15.500                           15.757             1.66
                  10                    21.000                           20.925             -0.36
                  20                    27.500                           27.236             -0.96
                  30                    31.600                           31.417             -0.58




                   All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                    3
Vgs-Id Characteristic

Circuit Simulation result

         -40A




         -30A




         -20A




         -10A




           0A
                0V                -1.0V     -2.0V               -3.0V    -4.0V      -5.0V
                     I(V3)
                                                        V_V1

Evaluation circuit

                                                           V3


                                                                  0Vdc



                                                 U1                       V2
                                               2SJ656
                                                                          -10
                             V1



                          0Vdc




                                           0




                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                            4
Comparison Graph

Circuit Simulation Result

                                  40.00
                                                       Measurement


                                                       Simulation
                                  30.00
          Drain Current ID (-A)




                                  20.00




                                  10.00




                                   0.00
                                          0.0    0.5    1.0   1.5    2.0   2.5     3.0   3.5    4.0    4.5   5.0

                                                          Gate - Source Voltage VGS (-V)

Simulation Result


                                                                    -VGS(V)
        -ID(A)                                                                                           Error (%)
                                                Measurement                      Simulation
                                   1                          2.550                            2.539               -0.42
                                   2                          2.650                            2.648               -0.06
                                   5                          2.900                            2.875               -0.87
                                  10                          3.150                            3.146               -0.12
                                  20                          3.550                            3.559                0.26
                                  30                          3.900                            3.900               -0.01
                                  40                          4.200                            4.202               0.05




                                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                                           5
Rds(on) Characteristic

Circuit Simulation result

         -9.0A


         -8.0A


         -7.0A


         -6.0A


         -5.0A


         -4.0A


         -3.0A


         -2.0A


         -1.0A


            0A
                 0V           -90mV   -180mV        -270mV          -360mV    -450mV -540mV
                      I(V3)
                                                     V_VDS

Evaluation circuit
                                                             V3



                                                             0Vdc


                                                                                VDS

                                                     U1
                                                   2SJ656                       0Vdc

                              V1


                              -10




                                               0


Simulation Result

      ID=--9A, VGS=-10V               Measurement                   Simulation         Error (%)
        R DS (on)               mΩ                 58.000                    58.000           0.00




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                     6
Gate Charge Characteristic
Circuit Simulation result

          -10V

           -9V

           -8V

           -7V

           -6V

           -5V

           -4V

           -3V

           -2V

           -1V

            0V
                 0        10n       20n            30n      40n       50n        60n       70n    80n
                      V(W1:4)
                                                         Time*1mA

Evaluation circuit



                                                                        U1
                                                                      2SJ656
                                          ION = 0uA                                        I2
                 I1 = 0                   IOFF = 1mA                              D2       18
                 I2 = 1m                  W                                       Dbreak
                 TD = 0        I1              -
                 TR = 5n                    +
                 TF = 5n                                                                   VDD
                 PW = 600u                W1
                 PER = 1000u
                                                                                           -50



                                                                  0




Simulation Result

     VDD=-50V,ID=-18A
                                    Measurement                   Simulation               Error (%)
        ,VGS=-10V
        Qgs        nC                              12.800                      12.797             -0.02
        Qgd        nC                              14.700                      14.755              0.37
         Qg        nC                              74.000                      54.341            -26.57


                     All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                          7
Capacitance Characteristic



                                                         Measurement
                                                         Simulation




Simulation Result


                                      Cbd(pF)
           VSD(V)                                                     Error(%)
                         Measurement           Simulation
                     0           420.000              420.000              0.000
                     5           132.000              131.750             -0.189
                    10            89.000               89.765              0.860
                    15            71.000               70.860             -0.197
                    20            60.000               59.700             -0.500
                    25            53.000               52.185             -1.538
                    30            46.000               46.716              1.557




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                   8
Switching Time Characteristic

Circuit Simulation result

           -14V


           -12V


           -10V


            -8V


            -6V


            -4V


            -2V


              0V
              0.6us 0.7us        0.8us 0.9us    1.0us       1.1us     1.2us     1.3us
                  V(U1:G)        V(U1:D)/5
                                                Time

Evaluation circuit

                                                              L2         RL


                                                              50nH       5.56




                            R1          L1                     U1
                                                             2SJ656
           PER = 20u                                                                    VDD
           PW = 10u                     30nH                                            -50.6Vdc
           TF = 5n          50     R2
           TR = 5n                 50
           TD = 1u
           V2 = 20     V2
           V1 = 0


                                                        0




Simulation Result

        ID=-9A, VDD=-50V
                                    Measurement              Simulation                 Error(%)
           VGS=0/-10V
           td(on)       ns                     30.000                  30.013                      0.04




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                          9
Output Characteristic

Circuit Simulation result

       -40A

                                              -10       -6
                                                                                            -4

       -30A




       -20A




       -10A
                                                                                    VGS=-3V



         0A
              0V     -0.5V   -1.0V    -1.5V   -2.0V     -2.5V       -3.0V   -3.5V   -4.0V    -4.5V
                   I(V3)
                                                        V_V2

Evaluation circuit


                                                               V3


                                                               0Vdc




                                                 U1                                  V2
                                               2SJ656

                                                                                     -5

                                 V1


                             0



                                         0




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                     10
BODY DIODE SPICE MODEL
Forward Current Characteristic

Circuit Simulation Result
            100A




             10A




            1.0A




           100mA




            10mA




           1.0mA
                   0V          0.3V          0.6V           0.9V     1.2V   1.5V
                        I(Vsense)
                                                    V_VDS
Evaluation Circuit


                                      Vsense


                                      0Vdc


                                                                     U1
                              VDS                                  2SJ656




                                                    0




               All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                   11
Comparison Graph

Circuit Simulation Result


                                                           Measurement

                                                           Simulation
                                            10.00
          Drain reverse current IDR (-A)




                                             1.00




                                             0.10




                                             0.01




                                             0.00
                                                    0       0.3          0.6        0.9          1.2         1.5

                                                               Source - Drain voltage VSD (-V)
Simulation Result


                                                                  VSD(-V)
                                           IDR(-A)                                                     %Error
                                                        Measurement     Simulation
                                              0.001            0.5050         0.5055                        0.10
                                               0.01            0.5650         0.5641                       -0.16
                                                0.1            0.6250         0.6246                       -0.07
                                                  1            0.7050         0.7025                       -0.36
                                                  2            0.7350         0.7372                        0.29
                                                  5            0.7950         0.7952                        0.02
                                                 10            0.8550         0.8527                       -0.27
                                                 20            0.9300         0.9331                        0.33
                                                 40            1.0600         1.0590                       -0.09




                                             All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                                                   12
Reverse Recovery Characteristic

Circuit Simulation Result

           400mA


           300mA


           200mA


           100mA


            -0mA


          -100mA


          -200mA


          -300mA


          -400mA
              0.2us            0.6us         1.0us           1.4us      1.8us   2.2us
                  I(R1)
                                                      Time

Evaluation Circuit

                                                R1


                                                 50




                          V1 = -9.4v    V1                             U1
                          V2 = 10.6v                                 2SJ656
                          TD = 90ns
                          TR = 10ns
                          TF = 10ns
                          PW = 1us
                          PER = 100us



                                                      0




Compare Measurement vs. Simulation

                                    Measurement               Simulation        Error (%)
            trj           ns                  40.000                 40.135             0.34




                  All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                               13
Reverse Recovery Characteristic                                        Reference




                                                 Measurement




Trj=40.00(ns)
Trb=60.00(ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50




                                                     Example




                               Relation between trj and trb




              All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                   14
ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic

Circuit Simulation Result

        -10mA




         -8mA




         -6mA




         -4mA




         -2mA




           0A
                0V                -10V    -20V           -30V        -40V       -50V
                     I(R1)
                                                  V_V1

Evaluation Circuit


                                         R1


                                         0.001m



                             V1

                                                   U1
                                                   2SJ656
                         0Vdc
                                                                R2

                                                            100MEG


                                                   0




                 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                       15
Zener Voltage Characteristic                                         Reference




            All Rights Reserved Copyright (c) Bee Technologies Inc. 2009
                                                                                 16

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SPICE MODEL of 2SJ656 (Standard+BDS Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Power MOSFET (Model Parameters) PART NUMBER: 2SJ656 MANUFACTURER: SANYO Body Diode (Model Parameters) / ESD Protection Diode Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 1
  • 2. MOSFET MODEL PSpice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Mobility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 2
  • 3. Transconductance Characteristic Circuit Simulation Result 40 Measurement Simulation 30 20 gfs(S) 10 0 0.0 5.0 10.0 15.0 20.0 25.0 30.0 Drain Current ID (-A) Comparison table gfs(S) -Id(A) Error (%) Measurement Simulation 1 7.500 7.721 2.94 2 10.400 10.580 1.73 5 15.500 15.757 1.66 10 21.000 20.925 -0.36 20 27.500 27.236 -0.96 30 31.600 31.417 -0.58 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 3
  • 4. Vgs-Id Characteristic Circuit Simulation result -40A -30A -20A -10A 0A 0V -1.0V -2.0V -3.0V -4.0V -5.0V I(V3) V_V1 Evaluation circuit V3 0Vdc U1 V2 2SJ656 -10 V1 0Vdc 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 4
  • 5. Comparison Graph Circuit Simulation Result 40.00 Measurement Simulation 30.00 Drain Current ID (-A) 20.00 10.00 0.00 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 Gate - Source Voltage VGS (-V) Simulation Result -VGS(V) -ID(A) Error (%) Measurement Simulation 1 2.550 2.539 -0.42 2 2.650 2.648 -0.06 5 2.900 2.875 -0.87 10 3.150 3.146 -0.12 20 3.550 3.559 0.26 30 3.900 3.900 -0.01 40 4.200 4.202 0.05 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 5
  • 6. Rds(on) Characteristic Circuit Simulation result -9.0A -8.0A -7.0A -6.0A -5.0A -4.0A -3.0A -2.0A -1.0A 0A 0V -90mV -180mV -270mV -360mV -450mV -540mV I(V3) V_VDS Evaluation circuit V3 0Vdc VDS U1 2SJ656 0Vdc V1 -10 0 Simulation Result ID=--9A, VGS=-10V Measurement Simulation Error (%) R DS (on) mΩ 58.000 58.000 0.00 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 6
  • 7. Gate Charge Characteristic Circuit Simulation result -10V -9V -8V -7V -6V -5V -4V -3V -2V -1V 0V 0 10n 20n 30n 40n 50n 60n 70n 80n V(W1:4) Time*1mA Evaluation circuit U1 2SJ656 ION = 0uA I2 I1 = 0 IOFF = 1mA D2 18 I2 = 1m W Dbreak TD = 0 I1 - TR = 5n + TF = 5n VDD PW = 600u W1 PER = 1000u -50 0 Simulation Result VDD=-50V,ID=-18A Measurement Simulation Error (%) ,VGS=-10V Qgs nC 12.800 12.797 -0.02 Qgd nC 14.700 14.755 0.37 Qg nC 74.000 54.341 -26.57 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 7
  • 8. Capacitance Characteristic Measurement Simulation Simulation Result Cbd(pF) VSD(V) Error(%) Measurement Simulation 0 420.000 420.000 0.000 5 132.000 131.750 -0.189 10 89.000 89.765 0.860 15 71.000 70.860 -0.197 20 60.000 59.700 -0.500 25 53.000 52.185 -1.538 30 46.000 46.716 1.557 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 8
  • 9. Switching Time Characteristic Circuit Simulation result -14V -12V -10V -8V -6V -4V -2V 0V 0.6us 0.7us 0.8us 0.9us 1.0us 1.1us 1.2us 1.3us V(U1:G) V(U1:D)/5 Time Evaluation circuit L2 RL 50nH 5.56 R1 L1 U1 2SJ656 PER = 20u VDD PW = 10u 30nH -50.6Vdc TF = 5n 50 R2 TR = 5n 50 TD = 1u V2 = 20 V2 V1 = 0 0 Simulation Result ID=-9A, VDD=-50V Measurement Simulation Error(%) VGS=0/-10V td(on) ns 30.000 30.013 0.04 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 9
  • 10. Output Characteristic Circuit Simulation result -40A -10 -6 -4 -30A -20A -10A VGS=-3V 0A 0V -0.5V -1.0V -1.5V -2.0V -2.5V -3.0V -3.5V -4.0V -4.5V I(V3) V_V2 Evaluation circuit V3 0Vdc U1 V2 2SJ656 -5 V1 0 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 10
  • 11. BODY DIODE SPICE MODEL Forward Current Characteristic Circuit Simulation Result 100A 10A 1.0A 100mA 10mA 1.0mA 0V 0.3V 0.6V 0.9V 1.2V 1.5V I(Vsense) V_VDS Evaluation Circuit Vsense 0Vdc U1 VDS 2SJ656 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 11
  • 12. Comparison Graph Circuit Simulation Result Measurement Simulation 10.00 Drain reverse current IDR (-A) 1.00 0.10 0.01 0.00 0 0.3 0.6 0.9 1.2 1.5 Source - Drain voltage VSD (-V) Simulation Result VSD(-V) IDR(-A) %Error Measurement Simulation 0.001 0.5050 0.5055 0.10 0.01 0.5650 0.5641 -0.16 0.1 0.6250 0.6246 -0.07 1 0.7050 0.7025 -0.36 2 0.7350 0.7372 0.29 5 0.7950 0.7952 0.02 10 0.8550 0.8527 -0.27 20 0.9300 0.9331 0.33 40 1.0600 1.0590 -0.09 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 12
  • 13. Reverse Recovery Characteristic Circuit Simulation Result 400mA 300mA 200mA 100mA -0mA -100mA -200mA -300mA -400mA 0.2us 0.6us 1.0us 1.4us 1.8us 2.2us I(R1) Time Evaluation Circuit R1 50 V1 = -9.4v V1 U1 V2 = 10.6v 2SJ656 TD = 90ns TR = 10ns TF = 10ns PW = 1us PER = 100us 0 Compare Measurement vs. Simulation Measurement Simulation Error (%) trj ns 40.000 40.135 0.34 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 13
  • 14. Reverse Recovery Characteristic Reference Measurement Trj=40.00(ns) Trb=60.00(ns) Conditions:Ifwd=lrev=0.2(A),Rl=50 Example Relation between trj and trb All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 14
  • 15. ESD PROTECTION DIODE SPICE MODEL Zener Voltage Characteristic Circuit Simulation Result -10mA -8mA -6mA -4mA -2mA 0A 0V -10V -20V -30V -40V -50V I(R1) V_V1 Evaluation Circuit R1 0.001m V1 U1 2SJ656 0Vdc R2 100MEG 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 15
  • 16. Zener Voltage Characteristic Reference All Rights Reserved Copyright (c) Bee Technologies Inc. 2009 16