SPICE MODEL of 2SJ655 (Professional+BDP Model) in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS: Power MOSFET (Professional Model)
PART NUMBER: 2SJ655
MANUFACTURER: SANYO
Body Diode (Professional Model) / ESD Protection Diode
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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2. MOSFET MODEL
PSpice model
Model description
parameter
LEVEL
L Channel Length
W Channel Width
KP Transconductance
RS Source Ohmic Resistance
RD Ohmic Drain Resistance
VTO Zero-bias Threshold Voltage
RDS Drain-Source Shunt Resistance
TOX Gate Oxide Thickness
CGSO Zero-bias Gate-Source Capacitance
CGDO Zero-bias Gate-Drain Capacitance
CBD Zero-bias Bulk-Drain Junction Capacitance
MJ Bulk Junction Grading Coefficient
PB Bulk Junction Potential
FC Bulk Junction Forward-bias Capacitance Coefficient
RG Gate Ohmic Resistance
IS Bulk Junction Saturation Current
N Bulk Junction Emission Coefficient
RB Bulk Series Resistance
PHI Surface Inversion Potential
GAMMA Body-effect Parameter
DELTA Width effect on Threshold Voltage
ETA Static Feedback on Threshold Voltage
THETA Mobility Modulation
KAPPA Saturation Field Factor
VMAX Maximum Drift Velocity of Carriers
XJ Metallurgical Junction Depth
UO Surface Mobility
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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3. Transconductance Characteristic
Circuit Simulation Result
Comparison table
gfs(S)
-Id(A) Error (%)
Measurement Simulation
1 6.000 6.188 3.13
2 8.300 8.533 2.81
5 12.500 12.853 2.82
10 17.000 17.254 1.49
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4. Vgs-Id Characteristic
Circuit Simulation result
-25A
-20A
-15A
-10A
-5A
0A
0V -1.0V -2.0V -3.0V -4.0V -5.0V
I(V3)
V_V1
Evaluation circuit
V3
0Vdc
V2
U1 -10
V1 2SJ655
0Vdc
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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5. Comparison Graph
Circuit Simulation Result
Simulation Result
-VGS(V)
-ID(A) Error (%)
Measurement Simulation
1 2.475 2.495 0.81
2 2.650 2.631 -0.72
5 2.920 2.910 -0.34
10 3.260 3.241 -0.58
15 3.525 3.506 -0.54
20 3.765 3.738 -0.72
25 3.980 3.948 -0.80
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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6. Rds(on) Characteristic
Circuit Simulation result
-8.0A
-6.0A
-4.0A
-2.0A
0A
0V -200mV -400mV -600mV -800mV
I(V3)
V_VDS
Evaluation circuit
V3
0Vdc
VDS
U1
2SJ655 0Vdc
V1
-10
0
Simulation Result
ID= -6A, VGS= -10V Measurement Simulation Error (%)
R DS (on) mΩ 100.000 100.581 0.58
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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7. Gate Charge Characteristic
Circuit Simulation result
-10V
-9V
-8V
-7V
-6V
-5V
-4V
-3V
-2V
-1V
0V
0 5n 10n 15n 20n 25n 30n 35n 40n 45n
V(W1:4)
Time*1mA
Evaluation circuit
U1 I2
2SJ655 D2 12
I1 = 0 ION = 0uA Dbreak
I2 = 1m IOFF = 1mA
TD = 0 I1 W
TR = 5n - VDD
TF = 5n +
PW = 600u
PER = 1000u W1 -50
0
Simulation Result
VDD= -50V,ID= -12A
Measurement Simulation Error (%)
,VGS= -10V
Qgs nC 7.000 7.086 1.23
Qgd nC 9.000 9.094 1.04
Qg nC 41.000 41.024 0.06
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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8. Capacitance Characteristic
Measurement
Simulation
Simulation Result
Cbd(pF)
VSD(V) Error(%)
Measurement Simulation
1.0 220.000 221.000 0.45
2.0 175.000 174.000 -0.57
5.0 114.000 115.000 0.88
10.0 78.000 79.000 1.28
15.0 62.500 62.000 -0.80
20.0 52.000 52.500 0.96
25.0 45.000 45.800 1.78
30.0 42.000 41.200 -1.90
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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9. Switching Time Characteristic
Circuit Simulation result
-14V
-12V
-10V
-8V
-6V
-4V
-2V
0V
0.6us 0.7us 0.8us 0.9us 1.0us 1.1us 1.2us 1.3us
V(U1:G) V(U1:D)/5
Time
Evaluation circuit
L2 RL
50nH 8.33
R1 L1
U1
PER = 20u 2SJ655
PW = 10u 30nH VDD
TF = 5n 50 R2 -50Vdc
TR = 5n 50
TD = 1u
V2 = 20 V2
V1 = 0
0
Simulation Result
ID= -6A, VDD= -50V
Measurement Simulation Error(%)
VGS=0/-10V
td(on) ns 17.000 17.276 1.62
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
9

10. Output Characteristic
Circuit Simulation result
-25A
-10
-6
-4
-8
-20A
-15A
-10A
VGS=-3V
-5A
0A
0V -0.5V -1.5V -2.5V -3.5V -4.5V
I(V3)
V_V2
Evaluation circuit
V3
0Vdc
U1 V2
2SJ655
V1 -5
0
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
10

11. BODY DIODE SPICE MODEL
Forward Current Characteristic
Circuit Simulation Result
10A
1.0A
100mA
10mA
1.0mA
0.3V 0.6V 0.9V 1.2V
I(Vsense)
V_VSD
Evaluation Circuit
Vsense
0Vdc
U1
VSD 2SJ655
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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12. Comparison Graph
Circuit Simulation Result
Simulation Result
VSD (-V)
IDR(-A) %Error
Measurement Simulation
0.001 0.514 0.514 0.02
0.010 0.580 0.579 -0.17
0.100 0.645 0.646 0.16
1.000 0.720 0.721 0.14
2.000 0.750 0.750 0.04
5.000 0.800 0.804 0.50
10.000 0.870 0.865 -0.57
20.000 0.950 0.952 0.21
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
12

13. Reverse Recovery Characteristic
Circuit Simulation Result
400mA
300mA
200mA
100mA
-0mA
-100mA
-200mA
-300mA
-400mA
10.2us 10.6us 11.0us 11.4us 11.8us 12.2us
I(R1)
Time
Evaluation Circuit
R1
50
V1 = -9.4v
V2 = 10.6v V1
TD = 1.12us U1
TR = 10ns D2SJ655_P
TF = 10ns
PW = 10us
PER = 100us
0
Compare Measurement vs. Simulation
Measurement Simulation Error (%)
trj ns 40.000 40.573 1.43
trb ns 30.000 30.043 0.14
trr ns 70.000 70.616 0.88
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
13

14. Reverse Recovery Characteristic Reference
Measurement
Trj= 40.00 (ns)
Trb= 30.00 (ns)
Conditions:Ifwd=lrev=0.2(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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15. ESD PROTECTION DIODE SPICE MODEL
Zener Voltage Characteristic
Circuit Simulation Result
-10mA
-8mA
-6mA
-4mA
-2mA
0A
0V -10V -20V -30V -40V -50V
I(R1)
V_V1
Evaluation Circuit
R1
0.001m
V1
0Vdc
R2
U1
2SJ655 100MEG
0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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16. Zener Voltage Characteristic Reference
All Rights Reserved Copyright (c) Bee Technologies Inc. 2008
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