Personal Information
Unternehmen/Arbeitsplatz
Greater Boston Area United States
Branche
Technology / Software / Internet
Webseite
www.semiconsoft.com
Info
Semiconsoft, Inc. develop and manufacture thin-film measurement system based on spectroscopic reflectance and ellipsometry. Optical, non-destructive measurement is used in R&D and production in-line metrology for wide range of applications (polymer films, thin-film solar cells, CMP, semiconductors and thousands of other applications)
Tags
thickness measurement
thin-film measurement
mprobe
spectroscopic reflectance
reflectance
thin-film desktop measurement
thin-film thickness
thin film thickness
thin-film solar
web thickness
polymer thickness
ito
thin film measurement
cds
cigs
plasma
sputtering
depositon
etching
plasma emission monitor
inline measurement
microscope
microspectrophotometer
xy motorized stage
thickness mapping
in-situ measurement
lcd
thickness measurment
zao zn oxide
zno
tco
thickness measurmeent
yttrium oxide
y2o3
thin-film thickness measurement
refractive index
thin film thickness measurement
pr thickness
photoresist thickness
photoresisit
porous si thickness
si thickness
thikcness measurement
porous si
thin- film thickness
pcba coating
ito thickness
parylene thickness
parylene
mems
oxide measurement
high-aspect ration
oil coating
antirust coating
anti-finger film
sheet metal
cmp
in-situ
lens coating
headlight coating
hardcoat
aluminum oxide
alumina
al2o3
Mehr anzeigen
Dokumente
(14)Personal Information
Unternehmen/Arbeitsplatz
Greater Boston Area United States
Branche
Technology / Software / Internet
Webseite
www.semiconsoft.com
Info
Semiconsoft, Inc. develop and manufacture thin-film measurement system based on spectroscopic reflectance and ellipsometry. Optical, non-destructive measurement is used in R&D and production in-line metrology for wide range of applications (polymer films, thin-film solar cells, CMP, semiconductors and thousands of other applications)
Tags
thickness measurement
thin-film measurement
mprobe
spectroscopic reflectance
reflectance
thin-film desktop measurement
thin-film thickness
thin film thickness
thin-film solar
web thickness
polymer thickness
ito
thin film measurement
cds
cigs
plasma
sputtering
depositon
etching
plasma emission monitor
inline measurement
microscope
microspectrophotometer
xy motorized stage
thickness mapping
in-situ measurement
lcd
thickness measurment
zao zn oxide
zno
tco
thickness measurmeent
yttrium oxide
y2o3
thin-film thickness measurement
refractive index
thin film thickness measurement
pr thickness
photoresist thickness
photoresisit
porous si thickness
si thickness
thikcness measurement
porous si
thin- film thickness
pcba coating
ito thickness
parylene thickness
parylene
mems
oxide measurement
high-aspect ration
oil coating
antirust coating
anti-finger film
sheet metal
cmp
in-situ
lens coating
headlight coating
hardcoat
aluminum oxide
alumina
al2o3
Mehr anzeigen