This report consists of the analysis of results of evaluation of a 3inch diameter silicon wafer that was fabricated in the clean room at USC under Professor. Kaviani. The wafer consists of resistors, capacitors, MOSFETs and diodes. The device was tested and the results are used to characterize the device. The whole process was done in 100 class clean room, the Powell Foundation Instructional Laboratory. This report will show the calculations performed to do an analysis of the results and will aim to offer an insight into the theory behind the operation of these devices.