Project Report for David Brough and Abhiram Kannan

1. In-situ X Ray Characterization of Semicrystalline
Polymer Microstructure during Deformation
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~1nm
~100nm
Time Resolved Measurements at Synchrotron Sources

2. Small Angle X Ray Scattering (SAXS)
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3. SAXS Analysis
Convert to
Real Space
dac
dc
da
0.046 A-1
Qy
Qx
Image Analysis
SAXS Pattern Structural Model
Image Analysis
WAXS Pattern Structural Model

4. β°
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Model Validation for SAXS via 2D FFT

5. Project Outline
• Spatial Correlations For Single Time Step
• Phase Recovery Algorithm To Generate Eigen
Microstructure
• Establish And Visualize Low Dimensional
Representation Of Process-Structure Linkage
• Attempt To Utilize Work Flow To Capture Orientation
Information
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6. Thanks!
!
!
David Brough
Abhiram Kannan
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