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IRF4905
HEXFETÂź Power MOSFET
PD - 9.1280C
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low on-resistance per silicon area. This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
The TO-220 package is universally preferred for all
commercial-industrialapplicationsatpowerdissipation
levels to approximately 50 watts. The low thermal
resistance and low package cost of the TO-220
contribute to its wide acceptance throughout the
industry.
Parameter Max. Units
ID @ TC = 25°C Continuous Drain Current, VGS @ -10V -74
ID @ TC = 100°C Continuous Drain Current, VGS @ -10V -52 A
IDM Pulsed Drain Current  -260
PD @TC = 25°C Power Dissipation 200 W
Linear Derating Factor 1.3 W/°C
VGS Gate-to-Source Voltage ± 20 V
EAS Single Pulse Avalanche Energy‚ 930 mJ
IAR Avalanche Current -38 A
EAR Repetitive Avalanche Energy 20 mJ
dv/dt Peak Diode Recovery dv/dt ƒ -5.0 V/ns
TJ Operating Junction and -55 to + 175
TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
°C
Mounting torque, 6-32 or M3 screw 10 lbf‱in (1.1N‱m)
Absolute Maximum Ratings
Parameter Typ. Max. Units
RξJC Junction-to-Case ––– 0.75
RξCS Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W
RξJA Junction-to-Ambient ––– 62
Thermal Resistance
VDSS = -55V
RDS(on) = 0.02℩
ID = -74A
TO-220AB
l Advanced Process Technology
l Ultra Low On-Resistance
l Dynamic dv/dt Rating
l 175°C Operating Temperature
l Fast Switching
l P-Channel
l Fully Avalanche Rated
Description
8/25/97
S
D
G
IRF4905
Parameter Min. Typ. Max. Units Conditions
IS Continuous Source Current MOSFET symbol
(Body Diode)
––– –––
showing the
ISM Pulsed Source Current integral reverse
(Body Diode) 
––– –––
p-n junction diode.
VSD Diode Forward Voltage ––– ––– -1.6 V TJ = 25°C, IS = -38A, VGS = 0V „
trr Reverse Recovery Time ––– 89 130 ns TJ = 25°C, IF = -38A
Qrr Reverse RecoveryCharge ––– 230 350 ”C di/dt = -100A/”s „
ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage -55 ––– ––– V VGS = 0V, ID = -250”A
∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– -0.05 ––– V/°C Reference to 25°C, ID = -1mA
RDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.02 ℩ VGS = -10V, ID = -38A „
VGS(th) Gate Threshold Voltage -2.0 ––– -4.0 V VDS = VGS, ID = -250”A
gfs Forward Transconductance 21 ––– ––– S VDS = -25V, ID = -38A
––– ––– -25
”A
VDS = -55V, VGS = 0V
––– ––– -250 VDS = -44V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V
Gate-to-Source Reverse Leakage ––– ––– -100
nA
VGS = -20V
Qg Total Gate Charge ––– ––– 180 ID = -38A
Qgs Gate-to-Source Charge ––– ––– 32 nC VDS = -44V
Qgd Gate-to-Drain ("Miller") Charge ––– ––– 86 VGS = -10V, See Fig. 6 and 13 „
td(on) Turn-On Delay Time ––– 18 ––– VDD = -28V
tr Rise Time ––– 99 ––– ID = -38A
td(off) Turn-Off Delay Time ––– 61 ––– RG = 2.5℩
tf Fall Time ––– 96 ––– RD = 0.72℩, See Fig. 10 „
Between lead,
––– –––
6mm (0.25in.)
from package
and center of die contact
Ciss Input Capacitance ––– 3400 ––– VGS = 0V
Coss Output Capacitance ––– 1400 ––– pF VDS = -25V
Crss Reverse Transfer Capacitance ––– 640 ––– ƒ = 1.0MHz, See Fig. 5
nH
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
LD Internal Drain Inductance
LS Internal Source Inductance ––– –––
IGSS
ns
4.5
7.5
IDSS Drain-to-Source Leakage Current
 Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
ƒ ISD ≀ -38A, di/dt ≀ -270A/”s, VDD ≀ V(BR)DSS,
TJ ≀ 175°C
Notes:
‚ Starting TJ = 25°C, L = 1.3mH
RG = 25℩, IAS = -38A. (See Figure 12)
„ Pulse width ≀ 300”s; duty cycle ≀ 2%.
S
D
G
Source-Drain Ratings and Characteristics
A
S
D
G
-74
-260
IRF4905
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
1 0
1 0 0
1 0 0 0
0.1 1 1 0 1 0 0
D
D S
20”s PULS E W IDTH
T = 25°Cc A
-I,Drain-to-SourceCurrent(A)
-V , Drain-to-Source Voltage (V)
VGS
TOP - 15V
- 10V
- 8.0V
- 7.0V
- 6.0V
- 5.5V
- 5.0V
BOTTOM - 4.5V
-4.5V
1
10
100
1000
0.1 1 10 100D
D S
A
-I,Drain-to-SourceCurrent(A)
-V , Drain-to-Source Voltage (V)
VGS
TOP - 15V
- 10V
- 8.0V
- 7.0V
- 6.0V
- 5.5V
- 5.0V
BOTTOM - 4.5V
-4.5V
20”s PULSE W IDTH
T = 175°CC
1
1 0
1 0 0
1 0 0 0
4 5 6 7 8 9 1 0
T = 25°CJ
G S
D
A
-I,Drain-to-SourceCurrent(A)
-V , Gate-to-Source Voltage (V)
V = -2 5V
20”s PULSE W IDTH
DS
T = 1 75°CJ
0.0
0.5
1.0
1.5
2.0
-60 -40 -20 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 1 4 0 1 6 0 1 8 0
JT , Junction Temperature (°C)
R,Drain-to-SourceOnResistanceDS(on)
(Normalized)
A
V = -10VGS
I = -64AD
Fig 2. Typical Output Characteristics
IRF4905
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.
Gate-to-Source Voltage
Fig 5. Typical Capacitance Vs.
Drain-to-Source Voltage
Fig 7. Typical Source-Drain Diode
Forward Voltage
0
1000
2000
3000
4000
5000
6000
7000
1 10 100
C,Capacitance(pF)
A
DS-V , Drain-to-Source Voltage (V)
V = 0V, f = 1MHz
C = C + C , C SHORTE D
C = C
C = C + C
GS
iss gs gd ds
rss gd
o ss ds g d
C is s
C oss
C rs s
0
4
8
12
16
20
0 40 80 120 160 200
G
GS
A
-V,Gate-to-SourceVoltage(V)
Q , Total Gate Charge (nC)
FOR TE ST CIRCUIT
SE E FIGURE 13
I = -38A
V = -44V
V = -28V
D
DS
DS
1
1 0
1 0 0
1 0 0 0
0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8
T = 25°CJ
V = 0VGS
SD
SD
A
-I,ReverseDrainCurrent(A)
-V , Source-to-Drain Voltage (V)
T = 175°CJ
1
10
100
1000
1 10 100
OPE RATION IN THIS A RE A LIMITE D
BY RD S(on)
10ms
A
-I,DrainCurrent(A)
-V , Drain-to-Source Voltage (V)DS
D
100”s
1ms
T = 25°C
T = 175°C
Single Pulse
C
J
IRF4905
Fig 10a. Switching Time Test Circuit
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
Fig 9. Maximum Drain Current Vs.
Case Temperature
VDS
-10V
Pulse Width ≀ 1 ”s
Duty Factor ≀ 0.1 %
RD
VGS
VDD
RG
D.U.T.
+
-
VDS
90%
10%
VGS
td(on) tr td(off) tf
25 50 75 100 125 150 175
0
20
40
60
80
T , Case Temperature ( C)
I,DrainCurrent(A)
°
C
D
0.01
0.1
1
0.00001 0.0001 0.001 0.01 0.1 1
Notes:
1. Duty factor D = t / t
2. Peak T = P x Z + T
1 2
J DM thJC C
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
ThermalResponse(Z)
1
thJC
0.01
0.02
0.05
0.10
0.20
D = 0.50
SINGLE PULSE
(THERMAL RESPONSE)
IRF4905
Fig 13b. Gate Charge Test CircuitFig 13a. Basic Gate Charge Waveform
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
QG
QGS QGD
VG
Charge
-10V
D.U.T.
VDS
IDIG
-3mA
VGS
.3”F
50K℩
.2”F12V
Current Regulator
Same Type as D.U.T.
Current Sampling Resistors
+
-
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
R G
IAS
0 .0 1℩tp
D .U .T
LVD S
VD D
D R IVER
A
15V
-20V
0
500
1000
1500
2000
2500
25 50 75 100 125 150 175
J
E,SinglePulseAvalancheEnergy(mJ)AS
A
Starting T , Junction Temperature (°C)
I
TOP -16A
-27A
BOTTOM -38A
D
IRF4905
Peak Diode Recovery dv/dt Test Circuit
P.W.
Period
di/dt
Diode Recovery
dv/dt
Ripple ≀ 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D =
P.W.
Period
+
-
+
+
+-
-
-
ƒ
„
‚
RG
VDD
‱ dv/dt controlled by RG
‱ ISD controlled by Duty Factor "D"
‱ D.U.T. - Device Under Test
D.U.T*
Circuit Layout Considerations
‱ Low Stray Inductance
‱ Ground Plane
‱ Low Leakage Inductance
Current Transformer

* Reverse Polarity of D.U.T for P-Channel
VGS
[ ]
[ ]
*** VGS = 5.0V for Logic Level and 3V Drive Devices
[ ] ***
Fig 14. For P-Channel HEXFETS
IRF4905
L E AD A S S IG N M E N T S
1 - G A T E
2 - D R AIN
3 - S O U R C E
4 - D R AIN
- B -
1 .3 2 (.0 52 )
1 .2 2 (.0 48 )
3X
0.5 5 (.02 2)
0.4 6 (.01 8)
2 .9 2 (.11 5 )
2 .6 4 (.10 4 )
4 .69 ( .1 85 )
4 .20 ( .1 65 )
3X
0 .93 ( .0 37 )
0 .69 ( .0 27 )
4.0 6 (.16 0)
3.5 5 (.14 0)
1.15 ( .0 4 5)
M IN
6.4 7 (.25 5)
6.1 0 (.24 0)
3.78 (.14 9)
3.54 (.13 9)
- A -
1 0.5 4 (.41 5)
1 0.2 9 (.40 5)2 .87 ( .1 13 )
2 .62 ( .1 03 )
1 5.24 ( .6 0 0)
1 4.84 ( .5 8 4)
1 4.09 (.5 5 5)
1 3.47 (.5 3 0)
3 X
1 .4 0 (.05 5 )
1 .1 5 (.04 5 )
2 .54 ( .1 00 )
2X
0 .3 6 (.01 4) M B A M
4
1 2 3
N O T E S :
1 D IM E N S IO N IN G & T O L ER AN C IN G P ER A N S I Y 14 .5 M , 1 98 2. 3 O U T L IN E C O N F O R M S T O JE D E C O U T LIN E T O -2 20 A B.
2 C O N T R O L LIN G D IM E N S IO N : IN C H 4 H EA T S IN K & L E AD M EA S U R E M E N T S D O N O T IN C L U D E BU R R S .
PART NUMBERINTERNATIONAL
RECTIFIER
LOGO
EXAMPLE : THIS IS AN IRF1010
W ITH ASSEMBLY
LOT CODE 9B1M
ASSEMBLY
LOT CODE
DATE CODE
(YYW W )
YY = YEAR
W W = W EEK
9246
IRF1010
9B 1M
A
Part Marking Information
TO-220AB
Package Outline
TO-220AB Outline
Dimensions are shown in millimeters (inches)
PART NUMBERINTERNATIONAL
RECTIFIER
LOGO
EXAMPLE : THIS IS AN IRF1010
W ITH ASSEMBLY
LOT CODE 9B1M
ASSEMBLY
LOT CODE
DATE CODE
(YYW W )
YY = YEAR
W W = W EEK
9246
IRF1010
9B 1M
A
WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331
EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020
IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111
IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086
IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371
http://www.irf.com/ Data and specifications subject to change without notice. 8/97

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Original Mosfet IRF4905PBF IRF4905 IRF4905 4905 55V 74A TO-220 New International Rectifier

  • 1. IRF4905 HEXFETÂź Power MOSFET PD - 9.1280C Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-220 package is universally preferred for all commercial-industrialapplicationsatpowerdissipation levels to approximately 50 watts. The low thermal resistance and low package cost of the TO-220 contribute to its wide acceptance throughout the industry. Parameter Max. Units ID @ TC = 25°C Continuous Drain Current, VGS @ -10V -74 ID @ TC = 100°C Continuous Drain Current, VGS @ -10V -52 A IDM Pulsed Drain Current  -260 PD @TC = 25°C Power Dissipation 200 W Linear Derating Factor 1.3 W/°C VGS Gate-to-Source Voltage ± 20 V EAS Single Pulse Avalanche Energy‚ 930 mJ IAR Avalanche Current -38 A EAR Repetitive Avalanche Energy 20 mJ dv/dt Peak Diode Recovery dv/dt ƒ -5.0 V/ns TJ Operating Junction and -55 to + 175 TSTG Storage Temperature Range Soldering Temperature, for 10 seconds 300 (1.6mm from case ) °C Mounting torque, 6-32 or M3 screw 10 lbf‱in (1.1N‱m) Absolute Maximum Ratings Parameter Typ. Max. Units RΞJC Junction-to-Case ––– 0.75 RΞCS Case-to-Sink, Flat, Greased Surface 0.50 ––– °C/W RΞJA Junction-to-Ambient ––– 62 Thermal Resistance VDSS = -55V RDS(on) = 0.02℩ ID = -74A TO-220AB l Advanced Process Technology l Ultra Low On-Resistance l Dynamic dv/dt Rating l 175°C Operating Temperature l Fast Switching l P-Channel l Fully Avalanche Rated Description 8/25/97 S D G
  • 2. IRF4905 Parameter Min. Typ. Max. Units Conditions IS Continuous Source Current MOSFET symbol (Body Diode) ––– ––– showing the ISM Pulsed Source Current integral reverse (Body Diode)  ––– ––– p-n junction diode. VSD Diode Forward Voltage ––– ––– -1.6 V TJ = 25°C, IS = -38A, VGS = 0V „ trr Reverse Recovery Time ––– 89 130 ns TJ = 25°C, IF = -38A Qrr Reverse RecoveryCharge ––– 230 350 ”C di/dt = -100A/”s „ ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Parameter Min. Typ. Max. Units Conditions V(BR)DSS Drain-to-Source Breakdown Voltage -55 ––– ––– V VGS = 0V, ID = -250”A ∆V(BR)DSS/∆TJ Breakdown Voltage Temp. Coefficient ––– -0.05 ––– V/°C Reference to 25°C, ID = -1mA RDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.02 ℩ VGS = -10V, ID = -38A „ VGS(th) Gate Threshold Voltage -2.0 ––– -4.0 V VDS = VGS, ID = -250”A gfs Forward Transconductance 21 ––– ––– S VDS = -25V, ID = -38A ––– ––– -25 ”A VDS = -55V, VGS = 0V ––– ––– -250 VDS = -44V, VGS = 0V, TJ = 150°C Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20V Gate-to-Source Reverse Leakage ––– ––– -100 nA VGS = -20V Qg Total Gate Charge ––– ––– 180 ID = -38A Qgs Gate-to-Source Charge ––– ––– 32 nC VDS = -44V Qgd Gate-to-Drain ("Miller") Charge ––– ––– 86 VGS = -10V, See Fig. 6 and 13 „ td(on) Turn-On Delay Time ––– 18 ––– VDD = -28V tr Rise Time ––– 99 ––– ID = -38A td(off) Turn-Off Delay Time ––– 61 ––– RG = 2.5℩ tf Fall Time ––– 96 ––– RD = 0.72℩, See Fig. 10 „ Between lead, ––– ––– 6mm (0.25in.) from package and center of die contact Ciss Input Capacitance ––– 3400 ––– VGS = 0V Coss Output Capacitance ––– 1400 ––– pF VDS = -25V Crss Reverse Transfer Capacitance ––– 640 ––– ƒ = 1.0MHz, See Fig. 5 nH Electrical Characteristics @ TJ = 25°C (unless otherwise specified) LD Internal Drain Inductance LS Internal Source Inductance ––– ––– IGSS ns 4.5 7.5 IDSS Drain-to-Source Leakage Current  Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) ƒ ISD ≀ -38A, di/dt ≀ -270A/”s, VDD ≀ V(BR)DSS, TJ ≀ 175°C Notes: ‚ Starting TJ = 25°C, L = 1.3mH RG = 25℩, IAS = -38A. (See Figure 12) „ Pulse width ≀ 300”s; duty cycle ≀ 2%. S D G Source-Drain Ratings and Characteristics A S D G -74 -260
  • 3. IRF4905 Fig 4. Normalized On-Resistance Vs. Temperature Fig 1. Typical Output Characteristics Fig 3. Typical Transfer Characteristics 1 1 0 1 0 0 1 0 0 0 0.1 1 1 0 1 0 0 D D S 20”s PULS E W IDTH T = 25°Cc A -I,Drain-to-SourceCurrent(A) -V , Drain-to-Source Voltage (V) VGS TOP - 15V - 10V - 8.0V - 7.0V - 6.0V - 5.5V - 5.0V BOTTOM - 4.5V -4.5V 1 10 100 1000 0.1 1 10 100D D S A -I,Drain-to-SourceCurrent(A) -V , Drain-to-Source Voltage (V) VGS TOP - 15V - 10V - 8.0V - 7.0V - 6.0V - 5.5V - 5.0V BOTTOM - 4.5V -4.5V 20”s PULSE W IDTH T = 175°CC 1 1 0 1 0 0 1 0 0 0 4 5 6 7 8 9 1 0 T = 25°CJ G S D A -I,Drain-to-SourceCurrent(A) -V , Gate-to-Source Voltage (V) V = -2 5V 20”s PULSE W IDTH DS T = 1 75°CJ 0.0 0.5 1.0 1.5 2.0 -60 -40 -20 0 2 0 4 0 6 0 8 0 1 0 0 1 2 0 1 4 0 1 6 0 1 8 0 JT , Junction Temperature (°C) R,Drain-to-SourceOnResistanceDS(on) (Normalized) A V = -10VGS I = -64AD Fig 2. Typical Output Characteristics
  • 4. IRF4905 Fig 8. Maximum Safe Operating Area Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 7. Typical Source-Drain Diode Forward Voltage 0 1000 2000 3000 4000 5000 6000 7000 1 10 100 C,Capacitance(pF) A DS-V , Drain-to-Source Voltage (V) V = 0V, f = 1MHz C = C + C , C SHORTE D C = C C = C + C GS iss gs gd ds rss gd o ss ds g d C is s C oss C rs s 0 4 8 12 16 20 0 40 80 120 160 200 G GS A -V,Gate-to-SourceVoltage(V) Q , Total Gate Charge (nC) FOR TE ST CIRCUIT SE E FIGURE 13 I = -38A V = -44V V = -28V D DS DS 1 1 0 1 0 0 1 0 0 0 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 T = 25°CJ V = 0VGS SD SD A -I,ReverseDrainCurrent(A) -V , Source-to-Drain Voltage (V) T = 175°CJ 1 10 100 1000 1 10 100 OPE RATION IN THIS A RE A LIMITE D BY RD S(on) 10ms A -I,DrainCurrent(A) -V , Drain-to-Source Voltage (V)DS D 100”s 1ms T = 25°C T = 175°C Single Pulse C J
  • 5. IRF4905 Fig 10a. Switching Time Test Circuit Fig 10b. Switching Time Waveforms Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case Fig 9. Maximum Drain Current Vs. Case Temperature VDS -10V Pulse Width ≀ 1 ”s Duty Factor ≀ 0.1 % RD VGS VDD RG D.U.T. + - VDS 90% 10% VGS td(on) tr td(off) tf 25 50 75 100 125 150 175 0 20 40 60 80 T , Case Temperature ( C) I,DrainCurrent(A) ° C D 0.01 0.1 1 0.00001 0.0001 0.001 0.01 0.1 1 Notes: 1. Duty factor D = t / t 2. Peak T = P x Z + T 1 2 J DM thJC C P t t DM 1 2 t , Rectangular Pulse Duration (sec) ThermalResponse(Z) 1 thJC 0.01 0.02 0.05 0.10 0.20 D = 0.50 SINGLE PULSE (THERMAL RESPONSE)
  • 6. IRF4905 Fig 13b. Gate Charge Test CircuitFig 13a. Basic Gate Charge Waveform Fig 12c. Maximum Avalanche Energy Vs. Drain Current QG QGS QGD VG Charge -10V D.U.T. VDS IDIG -3mA VGS .3”F 50K℩ .2”F12V Current Regulator Same Type as D.U.T. Current Sampling Resistors + - Fig 12b. Unclamped Inductive Waveforms Fig 12a. Unclamped Inductive Test Circuit tp V(BR)DSS IAS R G IAS 0 .0 1℩tp D .U .T LVD S VD D D R IVER A 15V -20V 0 500 1000 1500 2000 2500 25 50 75 100 125 150 175 J E,SinglePulseAvalancheEnergy(mJ)AS A Starting T , Junction Temperature (°C) I TOP -16A -27A BOTTOM -38A D
  • 7. IRF4905 Peak Diode Recovery dv/dt Test Circuit P.W. Period di/dt Diode Recovery dv/dt Ripple ≀ 5% Body Diode Forward Drop Re-Applied Voltage Reverse Recovery Current Body Diode Forward Current VGS=10V VDD ISD Driver Gate Drive D.U.T. ISD Waveform D.U.T. VDS Waveform Inductor Curent D = P.W. Period + - + + +- - - ƒ „ ‚ RG VDD ‱ dv/dt controlled by RG ‱ ISD controlled by Duty Factor "D" ‱ D.U.T. - Device Under Test D.U.T* Circuit Layout Considerations ‱ Low Stray Inductance ‱ Ground Plane ‱ Low Leakage Inductance Current Transformer  * Reverse Polarity of D.U.T for P-Channel VGS [ ] [ ] *** VGS = 5.0V for Logic Level and 3V Drive Devices [ ] *** Fig 14. For P-Channel HEXFETS
  • 8. IRF4905 L E AD A S S IG N M E N T S 1 - G A T E 2 - D R AIN 3 - S O U R C E 4 - D R AIN - B - 1 .3 2 (.0 52 ) 1 .2 2 (.0 48 ) 3X 0.5 5 (.02 2) 0.4 6 (.01 8) 2 .9 2 (.11 5 ) 2 .6 4 (.10 4 ) 4 .69 ( .1 85 ) 4 .20 ( .1 65 ) 3X 0 .93 ( .0 37 ) 0 .69 ( .0 27 ) 4.0 6 (.16 0) 3.5 5 (.14 0) 1.15 ( .0 4 5) M IN 6.4 7 (.25 5) 6.1 0 (.24 0) 3.78 (.14 9) 3.54 (.13 9) - A - 1 0.5 4 (.41 5) 1 0.2 9 (.40 5)2 .87 ( .1 13 ) 2 .62 ( .1 03 ) 1 5.24 ( .6 0 0) 1 4.84 ( .5 8 4) 1 4.09 (.5 5 5) 1 3.47 (.5 3 0) 3 X 1 .4 0 (.05 5 ) 1 .1 5 (.04 5 ) 2 .54 ( .1 00 ) 2X 0 .3 6 (.01 4) M B A M 4 1 2 3 N O T E S : 1 D IM E N S IO N IN G & T O L ER AN C IN G P ER A N S I Y 14 .5 M , 1 98 2. 3 O U T L IN E C O N F O R M S T O JE D E C O U T LIN E T O -2 20 A B. 2 C O N T R O L LIN G D IM E N S IO N : IN C H 4 H EA T S IN K & L E AD M EA S U R E M E N T S D O N O T IN C L U D E BU R R S . PART NUMBERINTERNATIONAL RECTIFIER LOGO EXAMPLE : THIS IS AN IRF1010 W ITH ASSEMBLY LOT CODE 9B1M ASSEMBLY LOT CODE DATE CODE (YYW W ) YY = YEAR W W = W EEK 9246 IRF1010 9B 1M A Part Marking Information TO-220AB Package Outline TO-220AB Outline Dimensions are shown in millimeters (inches) PART NUMBERINTERNATIONAL RECTIFIER LOGO EXAMPLE : THIS IS AN IRF1010 W ITH ASSEMBLY LOT CODE 9B1M ASSEMBLY LOT CODE DATE CODE (YYW W ) YY = YEAR W W = W EEK 9246 IRF1010 9B 1M A WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 8/97