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FSP-Be - NETS2011

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FSP-Be - NETS2011

  1. 1. Evaluation of HEU-Beryllium Benchmark Experiments to Improve Computational Analysis of Space Reactors John D. Bess Idaho National Laboratory Keith C. Bledsoe www.inl.gov Bradley T. Rearden Oak Ridge National Laboratory Nuclear and Emerging Technologies for Space (NETS-2011) February 7-10, 2011, Albuquerque, NM This paper was prepared at Idaho National Laboratory for the U.S. Department of Energy under Contract Number (DE-AC07-05ID14517)
  2. 2. Background for Current Work • Parry, J. R., Bess, J. D., Rearden, B. T., and Harms, G. A., “Assessment of Zero Power Critical Experiments and Needs for a Fission Surface Power System, NETS 2009, Atlanta, GA, June 14-19, 2009. • Evaluation of current computational modeling capabilities and biases • Minimize necessary nuclear experiments and tests for FSP • Results: – Computational bias increases with Be reflector worth – Bias up to +0.5% Δk/k for HEU Metal Fast Spectrum systems – Largest bias in subcritical experiments (1.3 – 1.7%) – Need to improve 235U(n,γ) cross section data • Dominate uncertainty when modeling an individual experiment – Need to improve Be cross section data, especially Be(n,n) • Dominate uncertainty in reactor design using benchmark database – Cold-critical experiment unnecessary but still useful – Subcritical submersion experiments still necessary 2
  3. 3. Fission Surface Power (FSP) System • Design concept for this study – Lunar outpost power supply – 20 – 50 kW – <8 yr operation – Ready for launch by 2020 – Provide a power-rich mission environment 3
  4. 4. Previous Evaluation of Benchmark Data • International • Ideal benchmark: Handbooks for of – Fast spectrum Evaluated Criticality – NaK cooled Safety and Reactor – Stainless steel cladding Physics Benchmark – HEU-O2 Experiments – Be reflectors – ICSBEP and IRPhEP – B4C control drums Handbooks • Best available: – ZPPR-20 mockups of SP-100 experiments – Four configurations 4
  5. 5. ZPPR-20 Benchmark Data • ZPPR-20C(105) – HEU-MET-FAST-075 – Critical Core • ZPPR-20D(129) – HEU-MET-MIXED-012 – Critical Water Immersion Accident • ZPPR-20D(136) – SUB-HEU-MET-MIXED-001 – Subcritical Water Immersion Accident • ZPPR-20E(160) – SUB-HEU-MET_FAST-001 – Subcritical Earth Burial Accident 5
  6. 6. Objective of Current Study • Reduce computational uncertainty in the FSP design using additional benchmark data – Identify high-quality experiments • HEU fuel • Be reflected • Fast spectrum – Benchmark these experiments – Evaluate benchmark experiments using sensitivity and uncertainty analysis capabilities found in SCALE 6 – Establish a path forward based on evaluated results 6
  7. 7. Oak Ridge Critical Experiments Facility (ORCEF) • Hundreds of HEU oralloy experiments – Bare, graphite-, polyethylene-, and beryllium-reflected (3) • 1960s and 1970s • Support criticality safety at Y-12 – Storage, casting, and handling – Verification of calculation methods and cross section data 7
  8. 8. Vertical Lift Assembly 8
  9. 9. Annular Experiments: 15-inch Annulus • June 4, 1963 • ~7 in. diameter Be core • ~15 in. outer diameter • ~4 in. high 9
  10. 10. Annular Experiments: 13-inch Annulus • July 12, 1963 • ~7 in. diameter Be core • ~13 in. outer diameter • ~5 in. high 10
  11. 11. Top-Reflected Experiment • August 20, 1963 • ~4-1/8 in. high HEU • ~7 in. diameter • ~5-9/16 in. high Be 11
  12. 12. Unique Uncertainty Conditions • Parts manufactured at • Now uncertainties that Y-12 to very tight are typically tolerances insignificant become – Dimensions: significant • ±0.0001 in. – Temperature: – Mass: • ±2 ºF • ±0.5 g – Reactivity – Isotopic Composition: measurement: • ±0.005 wt.% • ±10% – Part Placement: – Beryllium impurities • ±0.001 in. • Nominal quantities known but deviation unknown 12
  13. 13. Evaluated Biases • Small biases are now • Model Simplifications significant due to small – Removal of impurities uncertainties – Homogenization of like components • Room return • Removal of gaps • Removal of support • Uniform material properties structure • Nominal experiment – Measured/evaluated by dimensions experimenter • Temperature – Treated as uncertainty
  14. 14. Summary of Benchmark Eigenvalue Comparison 14
  15. 15. Reflector Effects • Compared reflected Mass Reflector experiment to bare Experiment Difference Worth (ρ$) (kg) HEU configuration in previous benchmark Top-Reflected 9.922 10.7 ± 0.5 – Mass difference – Most reactive portion of HEU discs 13” Annular -13.497 8.5 ± 0.4 replaced with Be for annuli 15” Annular -3.258 4.2 ± 0.2 • Calculated reflector worth using MCNP5 Small reflector worths, indicative of small modeling bias
  16. 16. TSUNAMI Analysis • Tools for Sensitivity and Uncertainty Analysis Methodology Implementation in Three Dimensions (TSUNAMI-3D) – Comprehensive analysis of relative deviation of keff due to cross-section covariance data • TSUNAMI-IP (Indices and Parameters) – Comparison of TSUNAMI-3D analyses for multiple configurations – Compute relational parameters between two configurations to assess a degree of similarity – i.e. proposed designs to existing experimental data 16
  17. 17. TSUNAMI-3D Results Typical of ZPPR-20 Experiments Total Uncertainty Component Uncertainty Model Major Components (%Δk/k) (%Δk/k) 235 U(n,γ) 1.9171 ± 0.0090 235 U(ν-bar ) 0.5702 ± 0.0000 235 U(n,n) to 235U(n,γ) 0.2460 ± 0.0020 235 U(n,f) 0.2294 ± 0.0007 187 Re(n,γ) 0.1891 ± 0.0008 235 ZPPR-20C (105) 2.0684 U(n,n’) 0.1796 ± 0.0124 93 Nb(n,γ) 0.1618 ± 0.0006 93 Nb(n,n) 0.1557 ± 0.0057 185 Re(n,γ) 0.1461 ± 0.0005 235 235 U(n,n) to U(n,n’) -0.1350 ± 0.0121 16 O(n,n) 0.1072 ± 0.0075 17
  18. 18. Correlation Coefficient, ck • Rigorous uncertainty analysis – Propagates tabulated cross-section uncertainty information to keff – Energy-dependent sensitivity coefficients • Represents estimate of the correlated uncertainty between systems • Measures degree of similarity of the systems in terms of relative uncertainty σ ij 2 ck = (σ iσ j ) 18
  19. 19. TSUNAMI-IP Results • Good correlation between individual experiments and the FSP model • Less cross-section uncertainty in the ORCEF HEU-Be experiments 19
  20. 20. Penalty Assessment (TSUNAMI-IP) • Determine additional margins of uncertainty where experimental information is unavailable • Provides added measure of safety where validation coverage is lacking • Covariance data uncertainty reduced to 0.29 %∆k/k, which is mostly from the Be(n,n) reaction uncertainty, in the original ZPPR-only assessment • Can be used to assess bias and bias uncertainty for additional margins in subcriticality experiments to account for lack of experimental coverage for beryllium 20
  21. 21. Results of the Penalty Assessment • Addition of three HEU- ZPPR-20 ZPPR-20 & Be experiments only HEU-Be FSP cross 2.09 %δk/k 2.02 %δk/k – Were not sufficient to section reduce the uncertainty uncertainty in the Be(n,n) reaction Penalty 0.29 %δk/k 0.29 %δk/k – Smaller reflector worth assessment – Smaller configurations Be(n,n) only 0.28 %δk/k 0.28 %δk/k – Smaller sensitivities (see next page) 21
  22. 22. Sensitivity Profiles for the ZPPR-20 Experiments 22
  23. 23. Sensitivity Profiles for the HEU-Be Experiments 23
  24. 24. TSURFER Analysis • Tool for Sensitivity/Uncertainty analysis of Response Functionals using Experimental Results • Alternative method for uncertainty quantification • Uses sensitivity data (TSUNAMI-3D) and cross- section covariance data to determine uncertainty using the measured keff values of the benchmark experiments • Generalized linear least squares approach to adjusting experimental and nuclear data to calculate keff values close to their experimental value 24
  25. 25. TSURFER Results ZPPR-20s & HEU-Be ZPPR-20s Only 25
  26. 26. TSURFER Results • Slight reduction in the • TSURFER uncertainties total uncertainty with typically larger than the addition of the HEU- TSUNAMI-IP penalty Be experiments calculations • Some general benefit – Penalties account for under-coverage of the but not for the targeted sensitivity data uncertainty in Be(n,n) – TSURFER assesses the lack of or inconsistency in data from multiple benchmarks 26
  27. 27. Future Work • ORCEF (early 1960s) space reactor mockup • HEU-O2 pellets • SS-347 tubes • Al container • Be reflector • Reactivity Effects – SS-347, W, Cb (now Nb), CH2, C, B4C, Al, & Cd – K coolant • Fission Rate Distributions & Cd Ratios 27
  28. 28. Fission Rate Distributions – HEU-O2 Experiment Axial Radial 28
  29. 29. Conclusions • Three HEU-Be experiments were evaluated and compared with the ZPPR-20 benchmarks and FSP model – No reduction in Be(n,n) uncertainty – Sensitivity of experiments to a given cross section is important when trying to reduce uncertainties – Overall uncertainty in the FSP system was slightly reduced • Evaluation of additional experiments isneeded to further reduce the uncertainties in the FSP design – Past experiments (hopefully) – Future experiments • Subcriticals, high reflector worth, sensitivity to Be(n,n) reaction 29
  30. 30. Questions?
  31. 31. Additional Slides 31
  32. 32. Simple Benchmark Models D 38.1 cm (15 in.) D 17.78 cm (7 in.) D 17.78 cm (7 in.) 10.16 cm (4 in.) HEU Be 10-GA50002-54-2 14.12875 cm Be (5.5625 in.) D 33.02 cm (13 in.) 24.60625 cm (9.6875 in.) D 17.78 cm (7 in.) 10.4775 cm HEU (4.125 in.) 12.7 cm (5 in.) HEU Be 09-GA50001-177-2 10-GA50002-54-1
  33. 33. Detailed 17.770920 9/16" Be 1.42875 Benchmark 17.770920 1.27 1.42875 0.004826 1.27 Model: 1/2" Be 0.004826 2.54 Top-Reflected 17.770920 2.54 0.004826 Be parts 1" Be 5.08 17.770920 0.004826 5.08 2" Be 3.81 3.81 0.004826 17.770920 0.3175 0.001778 2.543175 1.5" Be 0.001778 0.3175 17.771110 3.814191 2768 HEU 2.543175 0.003556 17.769840 3.816604 2732 HEU HEU parts 3.814191 17.770856 Drawing not to scale Diaphragm location 2734 HEU Bottom layer 3.816604 17.772060 Dimensions in cm 2733 HEU 09-GA50001-177-4
  34. 34. Top layer Detailed 17.7 22.849840 866 04 0.955929 27.931110 22.8 663 50 0.949960 33.009967 27.9 450 80 0.317119 Benchmark HEU 2736 HEU 2743 HEU 2780 17.770920 1.270000 0.5" Be Model: 27.932380 22.8 33.006030 6 0.637540 27.9 0.953643 381 438 0 10 17.7 HEU 2779 HEU 2750 13 in. Annulus 83 22.851110 810 1.428750 HEU 2737 27.931110 22.8 33.008570 6 508 0.637540 27.9 0.958596 0 476 20 17.770920 3.810000 HEU 2778 HEU 2749 1.5" Be 17.7 27.931110 22.8 33.009840 895 6 381 27.9 22.850475 25 2.538095 0 2.543810 463 2.543937 50 HEU 2762 HEU 2776 HEU 2757 Bottom layer 17.7 27.931872 22.8 33.008062 880 0.955675 7 651 0.321945 27.9 1.279144 22.850475 01 501 0 60 HEU 2829 HEU 2744 HEU 2754 17.770920 27.931872 22.8 33.011745 6 381 0.952754 27.9 1.273302 1.0" Be 2.540000 0 476 20 17.7 22.850475 863 50 HEU 2742 HEU 2753 3.810000 HEU 2740 33.008570 27.9 463 1.278255 50 27.931872 22.8 6 508 HEU 2752 0 3.809746 17.770920 17.7 33.009332 838 0.317500 22.852380 10 HEU 2747 27.9 438 1.279017 5.080000 10 2.0" Be HEU 2773 HEU 2751 17.7 27.931110 22.8 33.011618 895 625 27.9 22.849205 25 2.543048 40 2.537460 491 2.540508 44 HEU 2738 HEU 2745 HEU 2756 Dimensions in cm
  35. 35. 0.5" 1.270000 2736 0.955929 2743 0.949960 2780 0.317119 Detailed Void 0.003881 2750 0.953643 2779 0.637540 Benchmark 2737 1.428750 2778 0.637540 Void 0.003881 Model: 1.5" 3.810000 2749 Void 0.958596 0.003881 13 in. Annulus 2762 2.538095 2776 2.543810 2757 2.543937 Void 0.026247 Void 0.016087 Void 0.019050 2754 1.279144 2744 0.321945 2829 0.955675 Void 0.008537 Void 0.004085 Void 0.008086 2742 0.952754 1" 2.540000 2753 1.273302 Void 0.008537 Void 0.004085 Void 0.020320 2740 3.810000 2752 1.278255 2747 3.809746 Void 0.004085 2751 1.279017 Void 0.008086 2773 0.317500 2" 5.080000 Void 0.008086 Void 0.008537 Void 0.004085 2738 2.543048 2745 2.537460 2756 2.540508 Drawing not to scale Dimensions in cm 10-GA50002-53-8
  36. 36. Detailed Benchmark Model: Top layer 22.851110 17.7 876 20 0.635000 27.931872 22.8 765 10 0.321945 15 in. Annulus HEU 2774 HEU 2744 33.008570 38.086030 27.9 0.958596 33.0 0.946150 476 238 20 10 17.770920 17.7 27.931110 22.8 1.270000 901 0.631190 650 0.637540 22.851745 60 80 0.5" Be HEU 2749 HEU 2784 HEU 2775 HEU 2778 17.7 27.932380 22.8 896 638 0.637540 22.849332 52 0.315722 10 HEU 2763 HEU 2779 33.009840 38.091110 27.9 1.431290 33.0 1.430020 476 225 20 40 17.7 866 27.931110 22.8 22.849840 04 0.955929 663 0.949960 50 HEU 2755 17.770920 HEU 2766 3.810000 HEU 2736 HEU 2743 1.5" Be 17.7 27.931110 22.8 33.009840 38.088570 895 638 27.9 22.849205 25 2.543048 10 2.543810 463 2.543937 33.0 2.526030 50 268 58 HEU 2738 HEU 2776 HEU 2757 HEU 2739 Bottom layer 17.7 27.931872 22.8 33.009332 38.086665 838 0.317500 638 0.952754 27.9 1.279017 0.321310 22.852380 10 10 438 33.0 10 225 40 HEU 2773 HEU 2742 HEU 2751 HEU 2761 38.089332 33.0 0.951738 273 66 17.770920 17.7 880 27.931110 22.8 0.326771 33.008062 HEU 2785 22.850475 01 0.955675 644 27.9 1.279144 45 501 5.080000 60 2.0" Be HEU 2829 HEU 2746 38.090856 HEU 2754 33.0 1.274826 278 74 HEU 2848 17.7 27.933650 22.8 33.011618 38.083490 863 663 27.9 22.850475 50 50 491 2.540508 33.0 2.536190 3.810000 3.810000 44 250 80 HEU 2740 HEU 2748 HEU 2756 HEU 2735 Dimensions in cm 10-GA50002-53-3
  37. 37. Detailed Benchmark Model: 2744 0.321945 2774 0.635000 Void 0.002762 Void 0.002191 0.5" 1.270000 2778 0.637540 15 in. Annulus Void 0.002540 2775 Void 0.631190 0.002191 Void 2779 0.002762 0.637540 2749 Void 0.958596 0.001969 2784 Void 0.946150 0.012446 2763 0.315722 Void 0.002191 Void 0.002762 2755 1.431290 2766 2736 0.955929 2743 0.949960 1.430020 Void 0.002191 Void 0.002762 Void 0.001969 Void 0.012446 1.5" 3.810000 2738 2.543048 2776 2.543810 2757 2.543937 2739 2.526030 Void 0.018669 Void 0.007662 Void 0.008509 Void 0.001978 2773 0.317500 2761 0.321310 2742 0.952754 2751 1.279017 Void 0.004209 Void 0.003916 Void 0.000317 2785 0.951738 2829 0.955675 2746 0.326771 Void 0.004209 Void 0.003916 Void 0.000317 2754 1.279144 2848 1.274826 2" 5.080000 Void 0.004209 2740 3.810000 2748 3.810000 2756 2.540508 2735 2.536190 Drawing not to scale Dimensions in cm 10-GA50002-53-4

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