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Cathodoluminescence for Gallium Nitride Semiconductor Materials

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Cathodoluminescence can be used to study ceramics, dielectrics and semiconductors (both in bulk and nanostructured materials) and to determine their light-emitting properties at the nanoscale.

This presentation helps you to understand how cathodoluminescence works and its application for gallium nitride semiconductor materials.

The SPARC is a high-performance cathodoluminescence detection system that is designed and produced by Delmic. Using our cathodoluminescence system, you will get a valuable source of information and a full experimental freedom with an open-source software and modularity of the system.

For questions about cathodoluminescence and the SPARC, please leave a comment below or visit www.delmic.com and send us a message.

If you would like to download more application notes about cathodoluminescence for materials science please find them at this link:
http://www.delmic.com/cathodoluminescence-materials-science

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Cathodoluminescence for Gallium Nitride Semiconductor Materials

  1. 1. Integration without compromise Cathodoluminescence for Gallium Nitride-based semiconductor materials
  2. 2. Cathodoluminescence for Materials Science • Cathodoluminescence is the process whereby light is generated when an electron beam hits a specimen. • Cathodoluminescence has a wide variety of applications, especially in the fields of optics research, geology, and materials science. • In materials science, cathodoluminescence can be used to study semiconductor materials at the nanoscale. Cathodoluminescence spectra of a selection of materials demonstrating the relevance of the technique for a large variety of applications.
  3. 3. How does Cathodoluminescence work? When a sample is bombarded by fast electrons, the material becomes excited and as it returns to a ground state, it luminesces in various colors. These colours reveal information about the composition and structure of the sample. This data can be collected with nanoscale resolution and can reveal contrasts that cannot be observed with any other optical microscopy technique.
  4. 4. Cathodoluminescence for Gallium Nitride-based semiconductor materials • Cathodoluminescence (CL) imaging and spectroscopy is used extensively in the context of GaN materials and devices. • The energetic electron beam can efficiently excite the wide band gap (3.4 eV) of GaN with subwavelength spatial resolution, and is used to image local defects such as dislocations and probe light emission characteristics on small length scales.
  5. 5. Cathodoluminescence Imaging (a) by varying the energy of the primary electrons, different depths can be probed, thus allowing one to obtain more information in the case of stratified devices (b) shows spectra measured for different primary electron energies (c) and (d) show that the emission has a Lambertian profile in this case, which gives insight into the carrier recombination direction in the QWs Sample courtesy of M. Latzel, M. Heilmann, and S. Christiansen, MPI Erlangen
  6. 6. Bulk GaN with InGaN wells • Very uniform and strong emission • Nanostructuring for improved performance of LEDs and solar cells
  7. 7. GaN microrod with InGaN QW 1 3 4 5 6 2 False color RGB CL imageCL spectra at different positions Samples courtesy of M. Heilmann, MPI Erlangen Visualize defects and differences in band structure
  8. 8. InP nanowire polarization study 500 nm InP B. J. M. Brenny et al. Appl. Phys. Lett. 107, 201110 (2015) InP nanowire shows band-edge emission which in bulk would be emitted in an almost completely incoherent Lambertian.
  9. 9. Polarizing effect of nanostructuring 500 nm InP B. J. M. Brenny et al. Appl. Phys. Lett. 107, 201110 (2015) TheoryData Wire geometry has a strong polarizing effect on the emission
  10. 10. Cathodoluminescence Detector The SPARC platform + High-performance cathodoluminescence detection system + Modular design allows for addition of different detectors and detection paths + High-precision alignment stage gives unprecedented photon yield and reliability + Angle-resolved mode makes new types of research possible SPARC cathodoluminescence detection system from Delmi c
  11. 11. SPARC Design CL collection CL detection Cathodoluminescence collection Cathodoluminescence detection SEM
  12. 12. Integration without compromise DELMIC B.V. Address: Kanaalweg 4, 2628 EB, Delft, The Netherlands Website: www.delmic.com Telephone: +31 (0)15 744 01 58 Email: info@delmic.com Please visit Delmic’s website to learn more about cathodoluminescence for materials science.

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