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Properties of Self-Aligned Short-Channel Graphene
Field-Effect Transistors Based on Boron-Nitride-
Dielectric Encapsulation and Edge Contacts
Source: IEEE Transactions on Electron
Devices (Volume: 62, Issue: 12)
Presented By-
Kazi Mohammad Abidur Rahman
“
Key Terms:
◇ Self-Aligned Short Channel gFETs
◇BN-dielectric encapsulation
◇ Edge contact
◇ Virtual-Source transport model
◇ Balastic Conductivity & mobility
◇ Quantum Capacitance
Device Stucture1
SiO2 substrate
h-BN
Monolayer
Graphene
Cr/Au
HfO2
• h-BN dielectric
Encasultion
• Ballistic
Conduction in
Graphene
• Short Channel
about 65nm
Typical FETs
Self Aligned Short Channel
Self Aligned model
• Effective Oxide Thickness >> 3.5nm
• Channel Length >> 65nm
Electrical
Characteristics2
ID(mA/µm)
ID(mA/µm)
VD (V)
VD (V)
• Non-Saturating Characteristics in
Short Channel/Gate length.
• Ballistic Conduction/ transport.
Virtual Source Model3
Modelling Equations:
◇
𝐼 𝐷
𝑊
= (𝑄 𝑥0𝑒+𝑄 𝑥ℎ0)𝑣 𝑥𝑜 𝐹𝑠𝑎𝑡
◇ 𝐹𝑠𝑎𝑡 =
𝑉 𝐷𝑆
′
𝑉𝑠𝑎𝑡
(1+( 𝑉′ 𝐷𝑆 𝑉𝑠𝑎𝑡)1 𝛽) 𝛽
◇ 𝑉𝑠𝑎𝑡 =
𝐿 𝐺 𝑣 𝑥0
𝜇
◇ 𝑄 𝑥0𝑒(ℎ) = 0
∞
8𝜋
𝐸
(ℎ𝑣)2 +
1
1+𝑒
(𝐸+𝐸 𝑐𝑠(𝑑)) 𝑘 𝐵×𝑇dE
◇ 𝐶 𝑄 ≈ 𝐶 𝑄𝑖 1 + (
𝐸 𝑐
𝑘 𝐵×𝑇×ln(4)
)2
Parameters:
ID = drain current
W = device width
Qx0e and Qx0h = arial electron and hole densities
Vx0 = carrier injection velocity
CQ = quantum capacitance
Analysis from VS model:
𝐿 𝐺 𝐿 𝐺(nm) (nm)
Vx0(107
cm/s)
𝜇(103
𝑐𝑚2
/Vs)
• Carrier injection velocity decreases & mobility increases with
increase in gate length.
• Ballistic conduction nature decreases with increase in LG
Some Experimental Outcomes
◇Channel Length(LG) down to 67nm.
◇Highest ballistic velocity and effective mobility achieved were 9.3× 107
cm/s
and 13700cm2/Vs.>> highest in any gFET.
Quantum Capacitance
• An important consideration for
low-density-of-states systems
e.g. 2-D materials.
• Acts in series with Electrostatic
Capacitance.
• 𝐶𝑒𝑞 = 𝐶 𝑜𝑥 𝐶 𝑄/ 𝐶 𝑜𝑥 + 𝐶 𝑄
• CQ prevents Ceq from being
reduced below CQ.
𝐶𝑒𝑞𝐶𝑜𝑥
𝑡 𝑜𝑥
−1
(nm-1)
Effects of Quantum Capacitance
◇Degrades trans-conductance (gm) and output
conductance (gds) characteristics.
◇Achieved gm=600µS/µm & gds =300µS/µm.
◇Substantially worse than Si CMOS.
Conclusion
◇Ballistic Short-Channel h-BN encapsulated GFETs with
EOT<3.5nm exhibits highest achieved mobility and carrier
velocity.
◇Though shows some limitations due to some fundamental
limitations of graphene.
◇GFETs can be solution for future nanodevices.
Thanks!
Any questions?

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Properties of Self-Aligned Short-Channel Graphene FETs

  • 1. Properties of Self-Aligned Short-Channel Graphene Field-Effect Transistors Based on Boron-Nitride- Dielectric Encapsulation and Edge Contacts Source: IEEE Transactions on Electron Devices (Volume: 62, Issue: 12) Presented By- Kazi Mohammad Abidur Rahman
  • 2.
  • 3.
  • 4. Key Terms: ◇ Self-Aligned Short Channel gFETs ◇BN-dielectric encapsulation ◇ Edge contact ◇ Virtual-Source transport model ◇ Balastic Conductivity & mobility ◇ Quantum Capacitance
  • 6. SiO2 substrate h-BN Monolayer Graphene Cr/Au HfO2 • h-BN dielectric Encasultion • Ballistic Conduction in Graphene • Short Channel about 65nm
  • 7. Typical FETs Self Aligned Short Channel Self Aligned model • Effective Oxide Thickness >> 3.5nm • Channel Length >> 65nm
  • 9. ID(mA/µm) ID(mA/µm) VD (V) VD (V) • Non-Saturating Characteristics in Short Channel/Gate length. • Ballistic Conduction/ transport.
  • 11. Modelling Equations: ◇ 𝐼 𝐷 𝑊 = (𝑄 𝑥0𝑒+𝑄 𝑥ℎ0)𝑣 𝑥𝑜 𝐹𝑠𝑎𝑡 ◇ 𝐹𝑠𝑎𝑡 = 𝑉 𝐷𝑆 ′ 𝑉𝑠𝑎𝑡 (1+( 𝑉′ 𝐷𝑆 𝑉𝑠𝑎𝑡)1 𝛽) 𝛽 ◇ 𝑉𝑠𝑎𝑡 = 𝐿 𝐺 𝑣 𝑥0 𝜇 ◇ 𝑄 𝑥0𝑒(ℎ) = 0 ∞ 8𝜋 𝐸 (ℎ𝑣)2 + 1 1+𝑒 (𝐸+𝐸 𝑐𝑠(𝑑)) 𝑘 𝐵×𝑇dE ◇ 𝐶 𝑄 ≈ 𝐶 𝑄𝑖 1 + ( 𝐸 𝑐 𝑘 𝐵×𝑇×ln(4) )2 Parameters: ID = drain current W = device width Qx0e and Qx0h = arial electron and hole densities Vx0 = carrier injection velocity CQ = quantum capacitance
  • 12. Analysis from VS model: 𝐿 𝐺 𝐿 𝐺(nm) (nm) Vx0(107 cm/s) 𝜇(103 𝑐𝑚2 /Vs) • Carrier injection velocity decreases & mobility increases with increase in gate length. • Ballistic conduction nature decreases with increase in LG
  • 13. Some Experimental Outcomes ◇Channel Length(LG) down to 67nm. ◇Highest ballistic velocity and effective mobility achieved were 9.3× 107 cm/s and 13700cm2/Vs.>> highest in any gFET.
  • 14. Quantum Capacitance • An important consideration for low-density-of-states systems e.g. 2-D materials. • Acts in series with Electrostatic Capacitance. • 𝐶𝑒𝑞 = 𝐶 𝑜𝑥 𝐶 𝑄/ 𝐶 𝑜𝑥 + 𝐶 𝑄 • CQ prevents Ceq from being reduced below CQ. 𝐶𝑒𝑞𝐶𝑜𝑥 𝑡 𝑜𝑥 −1 (nm-1)
  • 15. Effects of Quantum Capacitance ◇Degrades trans-conductance (gm) and output conductance (gds) characteristics. ◇Achieved gm=600µS/µm & gds =300µS/µm. ◇Substantially worse than Si CMOS.
  • 16. Conclusion ◇Ballistic Short-Channel h-BN encapsulated GFETs with EOT<3.5nm exhibits highest achieved mobility and carrier velocity. ◇Though shows some limitations due to some fundamental limitations of graphene. ◇GFETs can be solution for future nanodevices.