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Device Modeling Report




COMPONENTS: Insulated Gate Bipolar Transistor (IGBT)
PART NUMBER: GT8Q101
MANUFACTURER: TOSHIBA




                     Bee Technologies Inc.



       All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Model
                               Model description
parameter
   TAU      Ambipolar Recombination Lifetime
    KP      MOS Transconductance
  AREA      Area of the Device
  AGD       Gate-Drain Overlap Area
   WB       Metallurgical Base Width
    VT      Threshold Voltage
    KF      Triode Region Factor
  CGS       Gate-Source Capacitance per Unit Area
  COXD      Gate-Drain Oxide Capacitance per Unit Area
   VTD      Gate-Drain Overlap Depletion Threshold




            All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Transfer Characteristics

Circuit Simulation result




Evaluation circuit


                                      V3


                                           0Vdc


                                                     V2
                                              5Vdc

                            U2
                            GT8Q101
            V1
     0Vdc




                            0




                 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Comparison Graph

Circuit Simulation Result




Simulation Result


  Test condition : Vce = 5 V
                                      Vge(V)
      Ic(A)                                                              Error (%)
                    Measurement                  Simulation
        1               6.3                        6.3093                 0.14762
        2               6.9                        6.8908                -0.13333
        5               8.1                        8.1124                 0.15309
        8                9                         8.9998                -0.00222




               All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Fall Time Characteristics

Circuit Simulation result




Evaluation circuit

                                                        V3


                                                             0V dc


                                                                                 R1

                           R2                                                    75

                                            U2
                           15 0
     V1 = -1 5                              GT 8Q1 01
                    V4                                                          V2
     V2 = 15                                                         60 0V dc
     TD = 0
     TR = 1n
     TF = 1n
     PW = 5 u
     PE R = 10 0m
                                            0



Test condition Ic=8(A) ,Vce=600(V)
    tf              Measurement                   Simulation                       Error
                     300        ns               296.732                ns       -1.08933

                    All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Gate Charge Characteristics

Circuit Simulation result




Evaluation circuit

                                                               V3


                                                                    0Vdc


                                                                                 D1
                                                                                      5.333Adc
                                                                                              I2
                                                                                Dbreak
                                                     U1
    PER = 1m                     W1                  GT8Q101
    PW = 500u                      +                                                          V2
    TF = 10n                       -
    TR = 10n
    TD = 0                       W                                                400Vdc
    I2 = 2m                      IOFF = 100uA
    I1 = 0      I1               ION = 0A


                                                     0



Test condition : Vcc=400(V) ,Ic=5.333(A) ,Vge=20(V)
                       Measurement                       Simulation               Error(%)
     Qge                  15                    nc       14.897            nc     -0.68667
     Qgc                 25.5                   nc       25.035            nc     -1.82353
     Qg                   85                    nc       86.069            nc      1.25765



                     All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Saturation Characteristics

Circuit Simulation result




Evaluation circuit

                                    V3


                                         0Vdc




                                            0Adc
                          U1                       I1
                          GT8Q101

             V1
     15Vdc




                          0




                  All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
Comparison Graph

Circuit Simulation Result




Simulation Result

                                   Vce(sat)(V)
      Ic(A)                                                             Error (%)
                    Measurement                  Simulation
        1              1.975                       1.9755                 0.02532
        2               2.25                       2.2881                 1.69333
        5                2.7                       2.6809                -0.70741
        8                 3                        3.0054                 0.18000




               All Rights Reserved Copyright (C) Bee Technologies Inc. 2004

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SPICE MODEL of GT8Q101 (Standard Without Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: Insulated Gate Bipolar Transistor (IGBT) PART NUMBER: GT8Q101 MANUFACTURER: TOSHIBA Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 2. Model Model description parameter TAU Ambipolar Recombination Lifetime KP MOS Transconductance AREA Area of the Device AGD Gate-Drain Overlap Area WB Metallurgical Base Width VT Threshold Voltage KF Triode Region Factor CGS Gate-Source Capacitance per Unit Area COXD Gate-Drain Oxide Capacitance per Unit Area VTD Gate-Drain Overlap Depletion Threshold All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 3. Transfer Characteristics Circuit Simulation result Evaluation circuit V3 0Vdc V2 5Vdc U2 GT8Q101 V1 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 4. Comparison Graph Circuit Simulation Result Simulation Result Test condition : Vce = 5 V Vge(V) Ic(A) Error (%) Measurement Simulation 1 6.3 6.3093 0.14762 2 6.9 6.8908 -0.13333 5 8.1 8.1124 0.15309 8 9 8.9998 -0.00222 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 5. Fall Time Characteristics Circuit Simulation result Evaluation circuit V3 0V dc R1 R2 75 U2 15 0 V1 = -1 5 GT 8Q1 01 V4 V2 V2 = 15 60 0V dc TD = 0 TR = 1n TF = 1n PW = 5 u PE R = 10 0m 0 Test condition Ic=8(A) ,Vce=600(V) tf Measurement Simulation Error 300 ns 296.732 ns -1.08933 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 6. Gate Charge Characteristics Circuit Simulation result Evaluation circuit V3 0Vdc D1 5.333Adc I2 Dbreak U1 PER = 1m W1 GT8Q101 PW = 500u + V2 TF = 10n - TR = 10n TD = 0 W 400Vdc I2 = 2m IOFF = 100uA I1 = 0 I1 ION = 0A 0 Test condition : Vcc=400(V) ,Ic=5.333(A) ,Vge=20(V) Measurement Simulation Error(%) Qge 15 nc 14.897 nc -0.68667 Qgc 25.5 nc 25.035 nc -1.82353 Qg 85 nc 86.069 nc 1.25765 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 7. Saturation Characteristics Circuit Simulation result Evaluation circuit V3 0Vdc 0Adc U1 I1 GT8Q101 V1 15Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004
  • 8. Comparison Graph Circuit Simulation Result Simulation Result Vce(sat)(V) Ic(A) Error (%) Measurement Simulation 1 1.975 1.9755 0.02532 2 2.25 2.2881 1.69333 5 2.7 2.6809 -0.70741 8 3 3.0054 0.18000 All Rights Reserved Copyright (C) Bee Technologies Inc. 2004