Politecnico di Torino Test Engineering Lecture

…personal
…portable
…connected
Analog Test Engineering
Politecnico di Torino
Dr Peter Sarson
7th December 2018
Dialog Semiconductor © 2018

Introduction to Dialog Semiconductor
Fundamentals
Test Instrumentation
Accuracy and Resolution
Deep Dive
New Standards
Dialog Semiconductor © 2018 2
Agenda

296
527
774
903
1156
1355
1198
1353
2010 2011 2012 2013 2014 2015 2016 2017
Dialog at a Glance
HQ: London, UK | Founded: 1981 | Listing: Frankfurt (DLG)
► Fabless supplier of highly integrated mixed-signal ICs,
optimized for mobile computing, wearables, IoT, smart
home and automotive applications
► Manufacturing: fabless manufacturing model, with
production, assembly and packaging fully outsourced
► Employees: c. 2,050 (75% engineers)(1)
Business Groups
► Mobile Systems: Power management, charging and
audio for mobile computing, smartphone and
automotive electronics
► Advanced Mixed-signal: AC/DC power conversion,
LED drivers for solid state lighting and Configurable
Mixed-signal ICs (CMICs)
► Connectivity: Bluetooth® low energy for IoT and short-
range wireless for low latency audio communication
Company Overview
► #1 PMIC and sub-PMIC for smartphones and tablets
► #1 CMIC – Configurable Mixed-signal ICs
► # 1 in Rapid Charging for smartphone power adapters
► A leader in Bluetooth® low energy technology
► Track record of revenue growth and strong cash
generation business model
High Growth Company (US $Million)
Note
1. As of January 2018
Market Leadership

Power Saving Technology Focus in 2018
4
Charging
Power
Management
Connectivity
Advanced Mixed-signal design, test and manufacturing expertise
PMIC & sub-PMIC
CMIC
Bluetooth low energy
DECT – Wireless Audio
AC/DC Rapid Charging
Wireless RF Charging

Sustained investment in R&D for future
growth
• Approximately 17-20% of revenue is
invested into R&D over the past years
• Investment in Intellectual property (IP)
creation, more than 800 mixed signal patent
families in Dialog’s portfolio
Commitment to R&D Investment
• New Smartphone
Charging IC family with
industry’s highest
efficiency
213 223 241
0
30
60
90
120
150
180
210
240
270
FY 2014 FY 2015 FY 2016
R&D
Full year
($million)
Continued investment in new
technologies
GaN
2018 Investment: GaN ICs targeting
Mobile Computing and Server
Smartphone
Charger

Corporate Structure
≈2050 Employees Today > 75% Engineering
Employee Breakdown
United States
19%
Asia
16%
Europe
65%
Germering & Kirchheim
unter Teck, Germany
Taipei, Taiwan ROC
Swindon & Edinburgh,
United Kingdom
Seoul, Korea
Den Bosch & Hengelo,
The Netherlands
Tokyo, Japan
Athens & Patras, Greece Shanghai, Shenzhen,
Hong Kong, China
Graz, Austria
Livorno, Italy Reading, United Kingdom
Istanbul, Turkey Kirchheim unter Teck,
Germany
Beijing & Tianjin, China Den Bosch,
The Netherlands
Tokyo, Japan Santa Clara, CA, US
Hsinchu, Taiwan
Santa Clara, Campbell, CA
& Chandler, AZ, US
Lviv & Vinnytsia, Ukraine
Seoul, Korea
► Engineering
► Finance
► HR
► Corporate Development & Strategy
► Manufacturing, Operations & Quality
► Sales, Marcom
► Advanced Technology development
Corporate Groups
Major R&D Centers Sales Offices

#1 Market Share: smartphone PMIC (~25%), smartphone adapter fast charging (~60%)
 Highest level of integration; complete system configurable approach
 ASSP or ASIC customization for our high volume customers
 Digital power conversion technology enabling higher efficiency & power density and faster
charging power adapters
Strong Smartphone Value Proposition
The Dialog way AND
Integration: PMIC Faster Charging
The traditional smartphone
Many discrete analog components
≈30% Power
saving in Phone
60% Faster
Charge in adapter
PMIC, sub-PMIC, Charging, Haptics, Audio & Power conversions technologies

• Industry’s highest integration of advanced
power management functionality, with
embedded ARM® processor option
Technology Focus: Power Management PMIC
PMICs & sub-PMICs at the Core of Smartphones, Tablets and Automotive infotainment
• One time programmable by customer
using Dialog proprietary software
• Allows systems designers to make
changes in power tree late in design cycle
Configurable PMIC and sub-PMIC
changing how engineers design power
management
Increasing levels of PMIC integration
<10 mm2
Typical PMIC
2007
≈ 5 power sources
>60 mm2
Typical PMIC
2018
>35 Power sources
2008
2018
Application
processor
PMIC
PMIC processor eco-system partners

Technology Focus: Wireless Charging
Power–at-a-distance Wireless Charging
Wire-Free Charging
• New uncoupled (Power-at-a-distance)
wireless RF charging, up to 15 feet
• Provides true wire-free mobile power
charging experience
• Exclusive partnership with Energous
Corporation
• Smallest footprint, miniature antennas on
existing circuit board (no coils), cost
effective
• Targeting IoT, wearables, PC,
smartphones, headphones, automotive
FCC approval for mid field Power-at-a-distance
charging received in December 2017

Portfolio of Bluetooth SoCs
• Industry’s lowest power, highest integration
smallest size Bluetooth low energy SoC
portfolio
• Single chip solutions optimized for targeted
verticals
• Embedded Bluetooth SW stack, including
embedded ARM® Cortex® M0 processor
• Extensive set of reference design tools and
local support community
• Wide range of applications: wearables,
consumer electronics, health and fitness
trackers, asset tracking devices, proximity
beacons, home automation, smart appliances
Technology Focus: Bluetooth® low energy
Wearable-on-Chip™ Targeting IoT Applications

Fundamentals
Deep Dive
New Standards
Agenda

Ohms Law
Deep Dive
New Standards
Agenda

Ohms Law

Thevenin - Norton equivalent circuits

Discrete Signals
Deep Dive
New Standards
Agenda

AC Signals
Sinewave – Continuous
𝑓 𝑡 = 𝐴 sin 2𝜋𝑓𝑡
-1
-0.8
-0.6
-0.4
-0.2
0
0.2
0.4
0.6
0.8
1
0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 1.7 1.9 2.1 2.3 2.5 2.7 2.9 3.1 3.3 3.5 3.7 3.9 4.1 4.3 4.5 4.7 4.9 5.1 5.3 5.5 5.7 5.9 6.1
Series1

𝑓𝑠
𝑓𝑡
=
𝑁
𝑀
Fs = Sampling Frequency
Ft = Tone Frequency we want to
generate
N = Number of points the waveform
will have
M = Number of cycles or Bin Number
Sampling Theorem
-1
-0.5
0
0.5
1
0 2 4 6
Series1
𝑑 𝑛𝑇𝑠 = 𝐴 sin 2𝜋𝑓𝑛𝑇𝑠

𝑓𝑠
𝑓𝑡
=
𝑁
𝑀
generate
will have
Sampling Theorem
-1
-0.5
0
0.5
1
0 2 4 6
Series1
M = 1, 1 cycle
N = 62

𝑓𝑠
𝑓𝑡
=
𝑁
𝑀
generate
will have
Sampling Theorem
-1
-0.5
0
0.5
1
0 2 4 6
Series1
If we want a tone frequency of 1 kHz
Then Fs = 62 kHz

Digitization
Deep Dive
New Standards
Agenda

Digitization
Nyquist - sampling
𝑓𝑠 = 2𝑓𝑡 - Nyquist Theorem (doesn’t work)
𝑓𝑠 = 4𝑓𝑡 - Quadrature sampling, cos(), sin()
-1
-0.5
0
0.5
1
0.1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
1.7
1.9
2.1
2.3
2.5
2.7
2.9
3.1
3.3
3.5
3.7
3.9
4.1
4.3
4.5
4.7
4.9
5.1
5.3
5.5
5.7
5.9
6.1
Series1
𝑓𝑠
𝑓𝑡
=
𝑁
𝑀
Sampling Theorem
remains unchanged
and must be fulfilled

Why
Fs = 2Ft

Best Solution
Fs = 4Ft
• By doing quadrature
sampling
• The sampled
components are
either cos() or sin()
as each point is
sampled every 90
degrees.
• This allows very
quick computation

Digitization
Nyquist - sampling
Using 𝑓𝑠 = 4𝑓𝑡, we want to measure a 1.22 kHz
𝑓𝑠 = 4.88 𝑘𝐻𝑧 , N = 1220, M = 305
-1
-0.5
0
0.5
1
0.1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
1.7
1.9
2.1
2.3
2.5
2.7
2.9
3.1
3.3
3.5
3.7
3.9
4.1
4.3
4.5
4.7
4.9
5.1
5.3
5.5
5.7
5.9
6.1
Series1
𝑓𝑠
𝑓𝑡
=
𝑁
𝑀
Sampling Theorem
remains unchanged
and must be fulfilled
rms
Peak
Peak
to
Peak

Ff = Fs/N - Fourier Frequency (Frequency Resolution)
Ff = Ft/M - Fourier Frequency (Frequency Resolution)
UTP = 1 / Ff - Unit Test Period – Time to complete the
playout of the waveform
r = 2/N - Phase resolution
Other Stuff
The larger the number of points, the higher the resolution

Fourier Analysis
Deep Dive
New Standards
Agenda

Fourier Analysis
• Spectral Analysis of a signal
• Different types of Analysis
• Magnitude FFT (MagFFT) – Returns the magnitude of each frequency
• Power FFT (PwrFFT) – Returns the magnitude^2 of each frequency
• FFT (FFT) - Returns the cos(), sin() components
• Fourier Volt Meter (FVM) - Returns just the magnitude of one bin
• Description
• MagFFT – Returns an array that’s N/2 in size – slow to execute because of √
• PwrFFT – Returns an array that’s N/2 in size – faster to execute because of no √
• FFT - Returns an N size array containing cos(), sin() components
• FVM - Returns the value of one bin that is supplied by the user. Very fast.

Magnitude FFT Example

Fundamentals
Deep Dive
New Standards
Agenda

Test Setup
• In test we are interested in precision
and accuracy
• Any voltage drop due to cable or trace
resistances needs to be addressed
• On a bench setup, the voltage would
be adjusted until the correct voltage
was observed on the terminals
• For an ATE nothing manual is
possible as we are testing things in
milliseconds.
• Calibration and compensation circuits
are critical to accurate, precise and
repeatable testing

Fundamentals
What is a tester
Deep Dive
New Standards
Agenda

YTEC
S50/V50
Pincount 256 I/O
Xcerra
Fusion MX/EX
Teradyne
ETS-88
Tester Platforms Examples
32
Advantest Pinscale/Portscale
High-end PM & Audio IC & RF
High pincount > 1000 I/O
Mixed signal / VI capability
PinCount
Teradyne Ultra Flex
High-end PM & Audio IC
High pincount > 1000 I/O
Teradyne Catalyst
Automotive SoC
Conectivity RF & BB SoC
Pincount < 400 I/O
Teradyne Flex
High-end PM & Audio IC
Pincount < 400 I/O
Teradyne J750/J750EX
Connectivity RF & BB SoC
Pincount > 500 I/O
1000200500
ASL-1000
AC/DC & SSL Product
Pincount < 50 I/O
Credence Quartett/Duo
PM, Audio & Industrial IC
Pincount < 200 I/O

Overview of a Test System
Test system components (Integra Flex)

Instrument Architecture
Integra Flex

Test Head

Loadboard/Probecard

Probeheads/Sockets
37Dialog Semiconductor © 2018

Semiconductor Manufacturing Process
How the tester is used
38
Wafer
Loaded into
prober
Wafer
Tested
with
ATE
Good
Test
Program

Tester and wafer prober for WLCSP
Tester
Product
Entry
Testhead with
Instruments
Waferprober

Burn-In is the application of thermal and
electrical stress for the purposes of
inducing the failure of "marginal
(microelectronic) devices, those with
inherent defects or defects resulting from
manufacturing aberrations which cause
time and stress dependent failures.
Using a burn in stage can remove these
latent defects
• However, this is very expensive as an
extra test stage is needed
HTOL testing is done at the beginning of a
project to qualify a process and package
Burn In

Semiconductor Device Process Flow
Automotive and Consumer Flows
Design Fab Assembly
Final
Test
Wafer
Sort
Shipment
Burn
In
Re
Test
Automotive
Flow
Consumer Flow

Fundamentals
Test Hardware Development
Deep Dive
New Standards
Agenda

Fundamentals
Typical Hardware Issues
Deep Dive
New Standards
Agenda

Typical Issues
 Ground Trace Lengths
 Ground lengths to long, to narrow etc
 Causes larger inductance and
impedance
 Can result in device oscillation
 Solution is only a good check of the
layout

Contact Resistance

Fundamentals
Instrumentation
Deep Dive
New Standards
Agenda

Fundamentals
VI
Deep Dive
New Standards
Agenda

Tester Instruments
VI
• Standard Measurement setup capability
• Force Voltage, Measure Current
• Force Current, Measure Voltage
• Accurate Voltage Source with Kelvin Connection
• Force and Sense
• Device protection
• Programmable Voltage and Current clamps
• Four Quadrant operation
• Source and Sink Current
• Force positive and negative voltages
• Possible to stack channels to increase current capability
(Merge Mode)
• Waveform Capture (Digitization) possibilities per pin

• All current measurements are done
using a resistor.
• This measurement is calibrated to a
standard by measuring the voltage
with a set current. Then adjusting
the measured value to the standard
• This offset is then applied to all
measurement using this range.
• Higher currents need lower
resistance to keep the produced
voltage in the same range for
conversion to digital
• Typically a 12-16 bit ADC would be
used for a VI.
Tester Instruments
VI

Tester Instruments
UVI80 DC-DiffMeter
• High Speed 16 bit or High Precision 24bit
Measurement
• Up To 8MSPS or 100ksps respectively
• Hardware Averaging possible
• UVI80 -Voltage range - ±1,4V, ±3.5V,
±7V

Fundamentals
Digital
Deep Dive
New Standards
Agenda

Send or Capture a Digital Response
Input signal
Output signal
Vih
Vil
Vol
Voh
Test Period
Strobe Points

Interaction ATE HW - Test Program
Comparator
levels – vol,
voh

Pattern
comparison
loaded into
memory

Compared
on the pin
defined

Timing
definition for
each pin

$tset,SCLK,SDATA,ADDR2,RESET_L,
ADDR0,ADDR1,GPIO1,GPIO2,GPIO3,
GPIO4,GPIO5)
> t0_spmi 1 0 0 0 0 0 X X X X X;
> t0_spmi 1 0 0 0 0 0 X X X X X;
> t0_spmi 0 0 0 0 0 0 X X X X X;
> t0_spmi 0 1 0 0 0 0 X X X X X;
> t0_spmi 0 0 0 0 0 0 X X X X X;
> t0_spmi 1 1 0 0 0 0 H H H L L;
> t0_spmi 1 1 0 0 0 0 L L L H L;
> t0_spmi 1 1 0 0 0 0 H L H L H;
> t0_spmi 1 1 0 0 0 0 L H L L H;
> t0_spmi 1 0 0 0 0 0 L L L L L;
Pattern

Interpreting a Digital Response
Depends

Or

DSSC

DSSC
1

Fundamentals
Arbitrary Waveform Generator
Deep Dive
New Standards
Agenda

AWG – Signal Source
DAC – Digital to Analog Converter
Where the
digital
waveform is
loaded.
Digital to
Analog
conversion
Output
Analog
Waveform

Several Types exist within ATE
High Resolution – Low Speed (24bits, 100 kHz) – Used for high precision DC signals,
usually has a kelvin connection like on a VI
High Speed - Lower Resolution (16 bits, 250 MHz) – Can be used for modulation signal of
RF devices, (OFDM, QPSK, Chirp, Multitones etc), Baseband signals.
AWG

Fundamentals
Digitizer
Deep Dive
New Standards
Agenda

Digitizer – Signal Capture
ADC –Analog to Digital Converter
Usually a few selectable
LPF to condition the
signal before
conversion
Analog to
Digital
Conversion
Conversion loaded
into DSP so that it
can be readback
and manipulated by
the test engineer

Fundamentals
Test Setup Examples
Deep Dive
New Standards
Agenda

Consider the following device pinout
1 VDD
1 GND
3 IO
1 BandGap
1 Voltage Reference
Equates to
3 UVI80
3 HSD1600
Test Efficiency - Example
Use the full tester capability at once

With a tester configuration as follows
640 UVI80
512 HSD1600
Therefore we could possibly have a
512/3 = 170 sites
Which would probably be
20*8 = 160 sites

Consider the following device pinout
10 VDD
1 GND
32 IO
22 Voltage Reference
Equates to
32 UVI80
32 HSD1600

With a tester configuration as follows
640 UVI80
512 HSD1600
Therefore we could possibly have a
512/32 = 16 sites

Fundamentals
Deep Dive
New Standards
Agenda

Instrument Accuracy and Precision
Accuracy
• Accuracy of the instrument is the difference (error)
between the real value and the attained value, either
measured or sourced.
• This is usually quoted as a percentage error of the
range of the instrument used to make the
measurement.
• Teradyne UVI80 ±20uA accuracy is 0.1% + 25 nA
• Teradyne DC30 ±200uA accuracy is 0.1% + 200 nA
• Therefore, if we measure a value of 1uA on the
20uA range, the best measurement than can be
quoted is
• 1uA + 0.01*20uA + 25nA = 1.225uA
• If the 200uA range is used we see
• 1uA + 0.01*200uA + 200nA = 3.20uA
Measured the Noise of
the Instrument

Resolution
• Resolution of the instrument is to what precision the
target value can attained, either measured or sourced.
• This is usually quoted as a converter resolution, in
bits. This is quoted over a certain range.
• Teradyne UVI80 ±20uA 16 bit resolution ~ 763 pA
• 2^16 = 65536
• 40uA/65536 = 610 pA ? = ENOB 15.7 bits
• So measuring 1uA on 20uA range we can expect
to measure
• 1.225 uA accuracy + 763 pA resolution
• If we increase the current to 1.05uA then the
instrument should see the change because the
resolution is high but the result could be 1.275uA

Concept
• We can think about this in the following way
8cm
Accuracy
offset
Measurement
precision or
resolution
• The accuracy is how close you get your
ruler to the point you want to measure
from. If you are off by 1cm then the
accuracy is 1cm.
• The resolution is the number of marks
that are on the ruler, if there are spaces
every 1mm then the resolution is 1mm.
The below example 8.5cm would be
measured as 8.0cm.

• It is possible to improve the accuracy
but not the resolution.
• By comparing the measurement to
KNOWN value, the measurement
can be offset, this is called a focus
calibration.
Focus Calibration
How to improve accuracy
8cm
By compensating the offset
the accuracy has been
improved but the resolution
of measurement remains
unchanged.
• For instance, if there is an open circuit,
we know there should be no current
flowing. So if a current measurement is
made under these conditions, the
measured current can be subtracted
from a real measurement to
compensate for the offset.

Fundamentals
Deep Dive
New Standards
Agenda

Fundamentals
What are Defects, and how are they seen
New Standards
Agenda

A defect has been defined as :-
• an unintended change in a circuit’s
physical implementation
– the circuit might or might not meet its
specifications
– In an analogue circuit, a short circuit or
an excessive narrowing of a resistor
might cause gain to decrease by a few
percent
A defect can be seen as
• A catastrophic fail – complete failure
• Marginal failure – device fails just out
side of limits
• A functional failure only seen at
positive or negative temperature
What is a defect and how are they seen?
Device
Failures

Latent defect
• A defect that cannot be seen easily seen at normal testing which will fail after
some hours of operations – Also known as early life time failures
What is a defect and how are they seen?

Manufacturing defects
• A defect is a physical flaw introduced into the circuit during the manufacturing process.
• It is any deviation from the intended specification.
• A defect will change the behavior of the circuit,
but may not be detectable.
• A defect may cause a circuit failure, it may
present a future reliability risk, or it may
never cause a problem.

– Doping Errors
• Concentrations of charge in material
– DC offsets
– Distortions
– Noise
– Under-etching
• No connects at Vias
– Misalignment
• Incorrect or no connects
– Incomplete Etch
• Areas of incomplete etching
– Blocked Etch
• Particle interference
Other Defects Types

Manufacturing defects
84
Cut direction
Thin oxide barrier

Semiconductor Test Engineering
Fault Models
• Using Fault models a test program
can be efficiently designed
– Its important not to produce a test
program that not only detects good
units but forcibly puts devices in a
stress condition such that any bad parts
show themselves clear and are not
marginal good
Doing a TFMEA (Test Failure Mode Effects
Analysis ) will help to analyse how faults in
circuits will show themselves in form of a
output response
• Analysing the potential responses to
the fault will determine if that fault is
screenable

Fundamentals
The Effects of Low Voltage screening
New Standards
Agenda

The effects of low voltage screening
Effect of low temperature on silicon
decreases the speed of the silicon i.e.
increases the effect of resistance
• By lowering the voltage of the device
compared to normal operation
simulates low temperature testing
When done properly, this technique allows
the screening of defects that can only be
seen at negative temperature
– Hence, saves a temperature
screening stage
– Saves cost $$$$, increases quality of
product delivered to the customer.
• Implemented in all test
programs by Automotive
suppliers.

Device failure at -40 degrees at 2.2V
Reference :- Peter Sarson, “Very low supply voltage room temperature test to screen low
temperature soft blown fuse fails which result in a resistive bridge”, 2016 17th
International Symposium on Quality Electronic Design (ISQED) Pages: 135 - 139

Device functional at 1.825V – 2.2V @ 35 degrees

Wafermap of -40 degrees screening at 2.2V – Bad Wafer

Correlation wafermap screening at 1.8V @ 35 degrees – Bad
wafer

Stack map of 30 lots – 4.6 Million dies, 3ppm failure rate

Fundamentals
The Effects of High Voltage Stress
New Standards
Agenda

Semiconductor Lifetime

Referring to the bathtub curve we have 3
area
• Early Lifetime failure
• Normal operating region
• End of Life – Wearout
The biggest issue for semiconductor
manufactures is Early Life Time Failures
especially automotive suppliers.
• The lower the defect density of the fab,
the lower this reject rate will be,
however, it is the aim of all
semiconductor manufactures to reduce
this as low as possible
Semiconductor Lifetime

Gate Oxide
• Ideally , High Ohmic
• Latent defect has lower ohmic value
• will eventually become short
Time from latent defect to short
(catastrophic defect)
• Dependent on voltage and
temperature
Gate Oxide
Thin oxide caused device to
breakdown and fail

Device aging can also be carried out by
voltage stress
• This entails exceeding the maximum
rating of a device by a short time period
• To screen oxide failures we need to
stress
– The gate of a transistor
– Between the power and ground of a
transistor
– And measure the current in different
states of the device
– This require two different stress
conditions
Burn-in Simulation
• pinA pinB pinC
• 1 1 1
• 1 1 1
• 1 0 0 stop stress meas
• 1 0 0
• 1 1 1
• 1 1 1
• 0 1 0

Dynamic Stress
VDDstress = 1.3xVDDmax – IDDq scan pattern run
Reference :- M. Quach; Tuan Pham; T. Figal; B. Kopitzke; P. O'Neill, “ Wafer-level
defect-based testing using enhanced voltage stress and statistical test data
evaluation”, Test Conference, 2002. Proceedings. International

Static Stress
VDDstress = 1.8xVDDmax - IDDq scan pattern run
Reference :- M. Quach; Tuan Pham; T. Figal; B. Kopitzke; P. O'Neill, “ Wafer-level defect-
based testing using enhanced voltage stress and statistical test data evaluation”, Test
Conference, 2002. Proceedings. International

Iddq Delta data
Effect of Stress voltage over time on leakage current
Time
Increasing leakage
current due to increasing
breakdown of oxide due
to over voltage stress.

By doing this study the process is
understood.
• A high voltage stress can be applied
thus
– A normal circuit will see no changes in
circuit behaviour
– A thin oxide however will degrade
rapidly and a potential latent defect will
have been forcibly discovered and can
removed.
• Thus removing a potential Early Life
Time Failure
How does this help in Production?
Removes latent defects
• Therefore decreases the dppm (
defects parts per million)
• Happy customer

Fundamentals
Deep Dive
New Standards
Agenda

Fundamentals
Deep Dive
1687.2
Agenda

Standardized Analog Test Access
1687.2
Standardized description of systematic analog DFT
• 1687 ICL + analog extensions to describe widely-used MS DFT
techniques
• Can describe test access paths, instruments capabilities, and
port characteristics
• Simplifies block-level DFT + fault simulation, and supports
automated chip-level DFT
Standardized description of efficient analog tests
• 1687 PDL + analog extensions for measurements, limits,
instrument requirements, sequence
• Simplifies block-level test generation and automated re-use at
IC-level or in other ICs
• Facilitates generation of optimal tests for efficient simulation and
reliable transfer to ATE

Fundamentals
Deep Dive
2427
Agenda

Standardized Analog Fault Models
2427
• The purpose of this standard is to enable the calculation of defect
coverage of an Analog Circuit
• Facilitates the assessment of the testability of a circuit
• Potential for predicting test times and possible test escapes
• Using comparisons of DFT & test techniques, this standard
has the possibility to drive automation and quality
improvements.
• Summary of Potential Benefits
• Definition of defect universe for a given analog circuit
• Standard Test Coverage Metrics for A/MS circuits
• Reduction of test times without loss of test coverage
• A more deterministic way to estimate dppm for analog circuits

…personal
…portable
…connected
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…connected
Powering the Smart
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www.dialog-semiconductor.com

Politecnico di Torino Test Engineering Lecture

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