The document summarizes research on characterizing the in-plane relative permittivity of Sr(n+1)Ti(n)O3n+1 Ruddlesden-Popper thin films. It describes how thin film growth enables the study of this material system as a function of thickness and strain. X-ray diffraction measurements show the expected number of diffraction peaks based on the series number n. Future challenges are noted in fully characterizing the materials due to the complexity of the measurements required.
6. Thin films enables...
Courtesy of D. Muller
7. Sr n+1Ti nO3 n+1/DyScO3/DyScO3(110)
Sr n+1Ti nO3 n+1 (110)
Ba(1-x)= 5 (x)TiO3
700 Sr n = 5
700
K11(in−plane) at 300 K
K11(in−plane) at 300 K
n
600 600
n=6 n=6
500 n=4 500 n = 4
400 n = 3 11
400 n = 3 K
300 300
200 200
Im(K11)
100 n = 2
~
100 n = 2
0 0
0 05 5
10 10
15 15
20 2
Frequency (GHz) (GHz)
Frequency
Dispersion means loss.
8. The Figure of Merit?
Multiple Reports & Materials!
200
1 (0) − (V)
“FOM” =
Figure of Merit
tan δ (0)
150
Figure of Merit
“FOM” = Q · %Tuning
100
50
0
0 40 80 120 160 200 240 280 320
Temperature [K]
Temperature (K)
9. The Figure of Merit?
200
1 (0) − (V)
“FOM” =
Figure of Merit
tan δ (0)
150
Figure of Merit
“FOM” = Q · %Tuning
100
50 BSTO ~ 30
0
0 40 80 120 160 200 240 280 320
Temperature [K]
Temperature (K)
Bigger FOM is better.
10. What is strain?
Lattice mismatch = Strain.
11. Strained STO is awesome!
Peak is Critical Temperature.
26. We can’t use these at HF...
20
0.1mm
Bad
0.325mm
Capacitance [pF]
15 0.875mm
1.835mm
2.9mm
10
5
0 6 7 8
10 10 10
Frequency [Hz]
they show distributed effects.
38. Sr7Ti6O19 (n = 6)/DyScO3(110)
T = 120K T = 180K
K11(in−plane) at 1 MHz
600 800
400 600
400
200
700
1000 T = 240K (Tc)
T = 300K
600
800
500
600
400 400
−50 0 50 −50 0 50
Electric Field (kV/cm)
39. tan(δ11)(in−plane) at 300 K Sr n+1Ti nO3 n+1
DyScO3 #3 1 MHz
GdScO3 #1
0.02
0.01
0
n=2n=3n=4n=5 n=6
Series Number (n)
40. Sr n+1Ti nO3 n+1/DyScO3/DyScO3(110)
Sr n+1Ti nO3 n+1 (110)
Ba(1-x)= 5 (x)TiO3
700 Sr n = 5
700
K11(in−plane) at 300 K
K11(in−plane) at 300 K
n
600 600
n=6 n=6
500 n=4 500 n = 4
400 n = 3
400 n = 3
300 300
200 200
FOM = 60 FOM = 2
100 n = 2
~
100 n = 2
0 0
0 05 5
10 10
15 15
20 2
Frequency (GHz) (GHz)
Frequency
We don’t want to see this.
41. We measure this...
for each test wafer.
42. Sr n+1Ti nO3 n+1/DyScO3(110)
700
n=6
K11(in−plane) at 300 K
600 n = 5
500 n = 4
400 n = 3
300
200
100
n=2
0 0 1 2 3 4 5 6 7 8 9 10 11
10 10 10 10 10 10 10 10 10 10 10 10
Frequency (Hz)
46. Figure of Merit at 300K Sr n+1Ti nO3 n+1
300 6 GHz to 7 GHz
Grey Lines are
250 Min FOM to
Max FOM
200
150
100
50
0
n=3 n=4 n=5 n=6
Series Number ( n)
47. Summing it all up.
Developed new on-wafer
metrology. 10 Hz to 40 GHz
1st observation of ferroelectric
Sr7Ti6O19 (n = 6)/DyScO3(110)
T = 120K T = 180K
K11(in−plane) at 1 MHz
600 800
400 600
400
RPs (n ≠ ∞).
200
700
1000 T = 240K (Tc)
T = 300K
600
800
500
600
400 400
−50 0 50 −50 0 50
Electric Field (kV/cm)
Sr n+1Ti nO3 n+1
Strain, and Layering can be
400
Critical Temperature (K)
DyScO3 #1
350 DyScO3 #2
300 DyScO3 #3
GdScO3 #1
250
used to control Tc.
200
150
100
50 1 MHz
0
n=2 n=3 n=4 n=5 n=6 n=∞
Series Number ( n)
Sr n+1Ti nO3 n+1
Figure of Merit of 140 (n = 6) at
Figure of Merit at 300K
300 6 GHz to 7 GHz
Grey Lines are
250 Min FOM to
Max FOM
200
300 K between 6 GHz and
150
100
50
7 GHz
0
n=3 n=4 n=5 n=6
Series Number ( n)
48. Prof. D. I. & S. N. Orloff, L. Kaiser, J. Kaiser, Dr. M. & R. Wilson, J. & B. Kaiser, S. & R. London,
R. & B. Hoffman, Drs. J. & D. Doran, M. & L. Schriber, M. & M. Orloff, M. & D. Lizmi, E. & S.
Dennis, M. Dennis, J. Dennis, F. Orloff, C. J. & J. Long, Dr. E. Engelson, Dr. J. K. Hall, B. Smith,
W. Young, A. Gretes, M. Hanlon, J. Mays, J. Kanner, L. Kirn, Dr. J. Miller, Mr. C. & A. McCann,
Dr. M. R. Clary, B. Christy, Dr. C. Stark, Dr. K. Gustofson, Dr. R. Artuso, Dr. P. Redl, Prof. B. R.
Conrad, Prof. J. Mateu, Dr. S. K. Dutta, Prof. J. R. Simpson, Dr. S. Hemmady, Dr. D. Mercia, Prof.
S. C. Lee, Prof. A. Lewandowski, Prof. J. R. Dorfmann, Prof. C. Collado, Mr. E. Rocas, X. Li, Y.
Wang, A. Haddock, Dr. S. R. Lee, Dr. S. L. Clement, Dr. D. Gu, Dr. G. C. Hilton, J. A. Beall, Dr. F.
Altomare, Dr. P. Dresselhaus, Dr. Y. Xu, Dr. T. M. Wallis, Dr. P. Kabos, L. Vale, Dr. J. Higgins, Dr.
M. Janezic, Dr. D. F. Williams, D. Walker, R. Ginley, L. DeSalvo, Dr. D. Schmadel, Dr. G. Jenkins
Dr. M. Kelley, S. Rivera, T. Gleason, L. O'Hara,
B. Kozlowski, J. Hessing, R. Monkfort,
N. K. Morris, Prof. T. Cohen,
Prof. S. Wallace,
Prof. N. Chant, Prof. H. D. Drew, Prof. J. Goodman,
Prof. S. Kamba, Prof. S. Stemmer, Prof. C. J. Fennie, T. Birol,
C. H. Lee, Prof. I. Appelbaum, Prof. R. M. Briber, Prof. J. R. Anderson,
Prof. S. M. Anlage, Prof. D. G. Schlom, Prof. I. Takeuchi, and Dr. J. C. Booth.
I profoundly thank J. P. King for his support during the course of this work and Prof. D. I. Orloff
for his critical review of this dissertation. Most of all, I thank my soon to be wife, J. R. Dennis.