This is a comprehensive presentation on particle shape. A fundamental property in bulk solids handling.
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CCS355 Neural Network & Deep Learning Unit II Notes with Question bank .pdf
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Particle Shape
1. What is particle shape ?
โข Particle shape is the external appearance of a particle.
โข Various different aspects of particle shape are of interest and a range of
descriptors has been devised to allow particle shape to be described.
โข No single shape descriptor is suitable for all applications.
Particle shape can be described qualitatively using the following descriptors :
โข Width/length ratio
โข Convexity
โข Circularity/roundness
๐พ๐๐ ๐๐/๐๐๐๐๐๐ ๐๐๐๐๐ =
๐๐๐๐๐๐๐๐ ๐ ๐๐๐.
๐๐๐๐๐๐๐ ๐ ๐๐๐.
=
โฅ ๐๐ ๐๐๐๐๐๐๐ ๐ ๐๐๐.
๐๐๐๐๐๐๐ ๐ ๐๐๐.
=
๐ญ ๐๐๐
๐ญ ๐๐๐
๐ช๐๐๐๐๐๐๐๐๐๐ =
๐จ ๐๐๐๐
๐จ ๐๐๐๐๐๐
silhouette
๐ฌ๐๐๐๐๐๐๐๐๐ ๐ซ๐๐๐๐๐๐๐(๐ซ ๐๐) = ๐
๐จ
๐
convexivity
Width/length ratio
symmetry
๐บ๐๐๐๐๐๐๐ =
1
2
1 + ๐๐๐
๐1
๐2
Raw Image
Input
Image Analysis
(Object Detection)
2. True Circularity or degree of circularity (Wadell,1933)
๐ซ๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐๐ =
๐๐๐๐๐๐๐๐๐๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐ ๐๐๐๐๐๐
๐๐๐๐๐๐๐๐๐๐๐๐๐ ๐๐ ๐๐๐ ๐๐๐๐๐๐
Irregularity(Umbaugh, 2005)
๐ฐ๐๐๐๐๐๐๐๐๐๐๐ =
๐
๐ช๐๐โฒ๐ ๐๐๐๐๐๐๐๐๐๐๐
Roundness(Wadell,1932)
๐น๐๐๐๐ ๐๐๐๐ =
ฯ๐=๐
๐ ๐๐
๐น
๐
Where,
ri is the radius of curvature of particle corners
R is the radius of the largest inscribed sphere
n is the number of particle corners measured
Coxโs True Sphericity(1927)
๐ป๐๐๐ ๐๐๐๐๐๐๐๐๐๐ =
๐๐๐๐๐๐๐ ๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐ ๐๐๐๐๐๐
๐๐๐๐๐๐๐ ๐๐๐๐ ๐๐ ๐๐๐ ๐๐๐ ๐
โThe degree to which the ratio of its volume to its
surface approaches the same ratio for a sphereโ
Lappungโs quotient(๐ต๐๐๐๐๐๐๐, 1962)
๐ณ๐๐๐๐๐๐โฒ
๐ ๐๐๐๐๐๐๐๐ =
๐
๐ป๐๐๐ ๐๐๐๐๐๐๐๐๐๐๐
(Range : 1-5)
Sphericity and roundness chart
(Cho et, al.,2006)
Fischerโs method of angularity computation (Hawkins,1993)
Powerโs scale of roundness(1953)
Coxโs Circularity or classic shape factor (1927)
โThe degree to which the ratio of the area to the
circumference approaches the same for circleโ
๐ช๐๐๐๐๐๐๐๐๐๐ =
๐๐ ๐จ
๐ ๐
How to describe it ?
Wadellโs sphericity(1933)
๐พ๐๐ ๐๐๐โฒ
๐ ๐๐๐๐๐๐๐๐๐๐
=
๐ ๐๐๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐ ๐๐๐๐๐๐
๐ ๐๐๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐๐๐
=
๐ ๐๐๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐ ๐๐๐๐๐๐
๐ ๐๐๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐๐๐
Tickellโs Sphericity(1931)
๐ป๐๐๐๐๐๐โฒ
๐ ๐๐๐๐๐๐๐๐๐๐ =
๐๐๐๐ ๐๐ ๐๐๐๐๐๐
๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐๐๐
=
๐๐๐๐๐๐ ๐๐ ๐๐๐ ๐
๐๐๐๐๐๐ ๐๐ ๐๐๐๐๐๐๐๐๐๐๐๐
3. โข Affects the flow properties
โข Powder flow - Spherical particles flow easily
โข Liquid flow - Increase in aspect ratio increases viscosity
โข Liquid flow - More spherical shape particles lead to low viscosity
โข Effects porosity
โข Effects friability
โข Effects sedimentation rate
โข Behavior in sieve analysis
โข Powder mixing โ blend time changes
โข Effects โ wall friction, bulk flow properties, abrasivity, adhesion and
cohesion properties.
โข Adds more importance to particle size
โข Some products work well when :
โข More spherical โ glass beads for highway paint, proppants
โข Less spherical - abrasives
Unconfined yield
strength of various
shaped particles as
vs consolidation
pressure
Convexity vs
particle size for
various
pharmaceutical
samples
viscosity vs volume fraction
for various shape of
particles
What is itโs significance ?
4. How is it measured ?
FESEM (Field Emission Scanning Electron Microscope)
coated stub stub holder
schematic diagram
coal fly ash
SEM-(Energy Dispersive X-ray Spectroscopy)EDAX
results for fly ash
Principle : High energy field emitted e- are incident in vacuum
on a sample to eject secondary e- , backscattered e- , auger e-
and X-rays. These signals contain information about the
surface morphology and the composition of the sample.
FE-SEMQuanta200
FEG
secondary emission in SEM
Standard : ASTM E3 - 11(2017)
Make/Model : Hitachi - SU3500, SU1510, SU8000; FEI โ Quanta
250 FEG; Carl Zeiss - ZEISS Sigma 300, GeminiSEM 500
6. TEM (Transmission Electron Microscope)
TEM
holder
grid
schematic diagram
coal fly ash
Principle : High energy field emitted e- in vacuum
are made to transmit pass through a sample
containing grid to fall on a florescent screen or a
image capturing screen
TECNAI G2 20 S-TWIN
Standard : ASTM F1877 - 16
Make/Model :
Hitachi - HF5000, HF3500,
HF9500, HF9500, HF7800,
HF7700; Carl Zeiss โ LIBRA 120
FEI โ TECNAI G2 20 S-TWIN;
image system of
TEM
bright vs dark field
imaging
single crystalamorphous polycrystalline crystal
SelectedArea
ElectronDiffraction
(SAED)โด
How is it measured ? Contd โฆ
7. XRD (X-ray diffraction)
PANalytical โ Empyrean
Standard : ASTM C1365 - 18
Make/Model : Malvern โ Aeris Research Edition,
PANalytical โ Empyrean, Empyrean Nano,
Empyrean Alpha 1; Bruker - D2 PHASER, D8
ENDEAVOR, D8 ADVANCE
system schematic
Braggโs Law : ๐๐ = ๐๐ ๐๐๐ ๐ฌ๐ข๐ง ๐ฝ
Where,
n is order
๐ is wavelength
๐โ๐๐ is the interplaner distance
๐ is the angle of maximum diffraction
sample holder powder XRD sample preparation
diffraction peak associated with planes of atoms
Principle : X-ray diffraction is based on constructive interference of
monochromatic X-rays and a crystalline sample. These X-rays are generated by
a cathode ray tube, filtered to produce monochromatic radiation, collimated to
concentrate, and directed toward the sample.
๐ซ๐๐๐๐ โ ๐บ๐๐๐๐๐๐ ๐๐๐๐๐๐๐๐ โถ ๐ =
๐ฒ๐
๐ท ๐๐จ๐ฌ ๐ฝ
๐โ๐๐๐,
๐ = ๐๐๐๐ ๐ ๐๐ง๐ ๐๐ ๐๐๐ฆ๐ ๐ก๐๐๐๐๐๐ ๐๐๐๐๐๐, ๐คโ๐๐โ ๐๐๐ฆ๐๐
๐ ๐๐๐๐๐๐ ๐๐ ๐๐๐ข๐๐ ๐ก๐ ๐๐๐๐๐ ๐ ๐๐ง๐
๐พ = ๐๐๐๐๐๐ ๐๐๐๐๐๐ ๐ ๐ โ๐๐๐ ๐๐๐๐ก๐๐ ~0.9
๐ = ๐ โ ๐๐๐ฆ ๐ค๐๐ฃ๐๐๐๐๐๐กโ
๐ฝ = ๐๐๐๐ ๐๐๐๐๐๐๐๐๐ ๐๐ก โ๐๐๐ ๐กโ๐
๐๐๐ฅ๐๐๐ข๐ ๐๐๐ก๐๐๐ ๐๐ก๐ฆ ๐น๐๐ป๐
๐ = ๐ต๐๐๐๐ ๐๐๐๐๐
How is it measured ? Contd โฆ