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The Use of Micro-X-ray Fluorescence in an SEM for Failure Analysis Investigations of Aerospace Materials

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The Use of Micro-X-ray Fluorescence in an SEM for Failure Analysis Investigations of Aerospace Materials

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Micro-XRF EDS can be used in a complementary manner with SEM/EDS to obtain semi-quantitative compositional analysis for identification of alloy types at elemental concentrations above 100 ppm (0.01 wt%). A presentation by Element Materials Technology expert Dan DeMiglio.

Micro-XRF EDS can be used in a complementary manner with SEM/EDS to obtain semi-quantitative compositional analysis for identification of alloy types at elemental concentrations above 100 ppm (0.01 wt%). A presentation by Element Materials Technology expert Dan DeMiglio.

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The Use of Micro-X-ray Fluorescence in an SEM for Failure Analysis Investigations of Aerospace Materials

  1. 1. The Use of Micro-X-ray Fluorescence in an SEM for Failure Analysis Investigations of Aerospace Materials Daniel S. DeMiglio Senior Metallurgical Engineer, Element Charlotte June 19, 2012 Aeromat 2012 Conference & Exhibition
  2. 2. X-ray Fluorescence (XRF) June 19, 2012 Aeromat 2012 Conference & Exhibition
  3. 3. Electron Beam Sample Interaction June 19, 2012 Aeromat 2012 Conference & Exhibition
  4. 4. X-ray Sample Interaction Sample X-ray Spectra Acquisition for microXRF/EDS: 40 micron spot size 35° 35° 10 mm working distance 70° 60 secs acquisition Sample 50 keV Incident X-ray Beam (Ag Target 1.0 mA 50 W) XRF June 19, 2012 Aeromat 2012 Conference & Exhibition
  5. 5. Hitachi S-3700N SEM-IXRF Systems Digital Imaging and EDS Microanalysis Micro-XRF/EDS Using Fundamental Parameter Software (FP) June 19, 2012 Aeromat 2012 Conference & Exhibition
  6. 6. Hitachi S-3700N VP-SEM Sample Chamber X-ray Gun X-ray Detector SD X-ray Detector: 10 mm2 detector area; 0.3 micron window coated with 30 nm Al film Micro-Focus Capillary X-ray Gun: 40 micron spot size; 50 keV X-ray beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  7. 7. Copper Alloy E-Beam X-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  8. 8. Aluminum Alloy E-Beam X-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  9. 9. Nickel Alloy E-Beam X-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  10. 10. Weld Analysis (GTAW) AA 2024-T3 E-Beam Aluminum Alloy X-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  11. 11. Metal Shaving X-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  12. 12. Debris Analysis X-Beam E-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  13. 13. Tool Steel Analysis X-Beam E-Beam Si V Cr Mn Fe Ni Mo W (wt%) X-Beam 0.86 1.72 4.10 0.28 82.05 0.13 4.47 6.38 E-Beam 0.6 1.9 4.0 0.2 76.3 0.2 8.2 8.7 AISI M2 0.20-0. 1.75-2.2 3.75-4.5 0.15-0.4 Bal 0.30 4.50-5.5 5.50-6.7 45 0 0 0 max 0 5 June 19, 2012 Aeromat 2012 Conference & Exhibition
  14. 14. Electrical Contact X-Beam E-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  15. 15. Particles Removed from Grease X-Beam E-Beam June 19, 2012 Aeromat 2012 Conference & Exhibition
  16. 16. Cracked Driver Tool June 19, 2012 Aeromat 2012 Conference & Exhibition
  17. 17. Summary Micro-XRF EDS can be used in a complementary manner with SEM/EDS to obtain semi- quantitative compositional analysis for identification of alloy types at elemental concentrations above 100 ppm (0.01 wt%) Greater sensitivity at high atomic numbers; low background Aerospace microanalysis applications include: contamination analysis, wear debris identification, alloy segregation, weld analysis, nondestructive coating thickness measurement For best results Micro-XRF EDS microanalysis must be performed with certified alloy standards (IXRF Systems - FP EDS microanalysis software) Small sample sizes (<1 gram) that cannot be otherwise analyzed by bulk chemistry techniques (OES, ICP, WDS-XRF) are well-suited to Micro-XRF EDS microanalysis Core particle compositions can be characterized by Micro-XRF EDS Care must be taken to ignore scattering and artifact X-ray peaks that are not from the area of interest June 19, 2012 Aeromat 2012 Conference & Exhibition

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