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HOMMEL-ETAMIC W20
Mobile measurement with skidless probing system
•	 Complete - mobile measurement
of all common roughness, waviness
and profile parameters with skidless
probing system
•	 Automatic - motorized probe
lowering for automatic positioning
and lifting of the probe tip from the
surface of the workpiece
•	 Mobile - integrated battery for
operation without external power
supply
•	 Informative - display of parame-
ters, profile view, Abott curve and
statistics data
•	 Easy - convenient operation via
touchscreen with context sensitive
function keys
•	 Practical - integrated printer for
immediate documentation of the
measurement results
•	 Reliable - immediate verification of
the measuring device via the inte-
grated roughness standard
OPTICAL SYSTEMS LASERS & MATERIAL PROCESSING INDUSTRIAL METROLOGY TRAFFIC SOLUTIONS DEFENSE & CIVIL SYSTEMS
DB_W20_EN06.05.2013Copyright©JENOPTIKIndustrialMetrologyGermanyGmbH.Subjecttochangewithoutnotice.
	 JENOPTIK I Industrial Metrology
	 JENOPTK Industrial Metrology Germany GmbH I Alte Tuttlinger Straße 20				
	 78056 VS-Schwenningen I Germany I Phone +49 7720 602-0 I Fax +49 7720 602-123
	 E-Mail: info-de.im@jenoptik.com I www.jenoptik.com/metrology
W20
Traverse unit waveline™ 20 for precision
roughness and waviness measurements
•	 Integrated start button for one-handed user control
•	 High-precision linear guide for precise straightness and wavi-
ness measurements
•	 Variable measurement speed
•	 Measurement in all positions (also overhead)
•	 Wide range of skidless probes for various applications
Motorized probe lowering
•	 Automatic positioning of the probe tip on the workpiece sur-
face and setting of the preselected measuring range
•	 Protection from accidental damage thanks to automatic lifting
of the probe at the end of the measurement
Context sensitive operation via touchscreen
•	 8 measuring programs
•	 Function keys for the 4 basic functions
•	 Evaluation of all common roughness, waviness and profile
parameters
•	 Extensive possibilities for tolerance evaluation
•	 Fast and comfortable input of additional data via touchscreen
•	 Clear display of the measurement results: parameters, profile
view, interactive Abott curve, extensive statistics functions
waveline™ 20 measuring station
•	 Turns the mobile W20 into a complete, stationary
measuring station
•	 Granite plate with T groove, 400 x 280 mm
•	 Height adjustment range 300 mm
•	 Tilting device ±45°
•	 Measuring table and additional accessories are available
as an option

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Roughness Tester W20 for Waveness and Roughness Mobile

  • 1. HOMMEL-ETAMIC W20 Mobile measurement with skidless probing system • Complete - mobile measurement of all common roughness, waviness and profile parameters with skidless probing system • Automatic - motorized probe lowering for automatic positioning and lifting of the probe tip from the surface of the workpiece • Mobile - integrated battery for operation without external power supply • Informative - display of parame- ters, profile view, Abott curve and statistics data • Easy - convenient operation via touchscreen with context sensitive function keys • Practical - integrated printer for immediate documentation of the measurement results • Reliable - immediate verification of the measuring device via the inte- grated roughness standard OPTICAL SYSTEMS LASERS & MATERIAL PROCESSING INDUSTRIAL METROLOGY TRAFFIC SOLUTIONS DEFENSE & CIVIL SYSTEMS
  • 2. DB_W20_EN06.05.2013Copyright©JENOPTIKIndustrialMetrologyGermanyGmbH.Subjecttochangewithoutnotice. JENOPTIK I Industrial Metrology JENOPTK Industrial Metrology Germany GmbH I Alte Tuttlinger Straße 20 78056 VS-Schwenningen I Germany I Phone +49 7720 602-0 I Fax +49 7720 602-123 E-Mail: info-de.im@jenoptik.com I www.jenoptik.com/metrology W20 Traverse unit waveline™ 20 for precision roughness and waviness measurements • Integrated start button for one-handed user control • High-precision linear guide for precise straightness and wavi- ness measurements • Variable measurement speed • Measurement in all positions (also overhead) • Wide range of skidless probes for various applications Motorized probe lowering • Automatic positioning of the probe tip on the workpiece sur- face and setting of the preselected measuring range • Protection from accidental damage thanks to automatic lifting of the probe at the end of the measurement Context sensitive operation via touchscreen • 8 measuring programs • Function keys for the 4 basic functions • Evaluation of all common roughness, waviness and profile parameters • Extensive possibilities for tolerance evaluation • Fast and comfortable input of additional data via touchscreen • Clear display of the measurement results: parameters, profile view, interactive Abott curve, extensive statistics functions waveline™ 20 measuring station • Turns the mobile W20 into a complete, stationary measuring station • Granite plate with T groove, 400 x 280 mm • Height adjustment range 300 mm • Tilting device ±45° • Measuring table and additional accessories are available as an option