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Design and Implementation of VLSI Systems
                (EN1600)
                lecture04
Lecture 03: CMOS fabrication
 http://www.appliedmaterials.com/HTMAC/animated.html
Fabricating one transistor
                                                               UV light

                                                                             Mask
                  oxygen
                                                                                        exposed
            Silicon dioxide            photoresist                                     photoresist
                                                                                                                      oxide
         Silicon substrate
          Oxidation                Photoresist      Mask-Wafer         Exposed                            Photoresist
         (Field oxide)              Coating    Alignment and Exposure Photoresist                          Develop




                                                                                                         RF
                                                                                                         RF
                                  RF
  RF




                                                                                                           Po
                                                                                                           Po
                                    Po




                                                                                                              we
                                                                                                              we
    Po




                                       we




                                                                                                                 rr
     we




                                                                                       Dopant gas
                                       r
                                                                                                       Ionized CCl4 gas
        r




                                Ionized oxygen gas
  Ionized CF4 gas                                                                   Silane gas
                photoresist                             oxygen




                                                                                                                       e
                                       oxide                                                                oxide




                                                                                                                      at
               oxide                                                                polysilicon




                                                                                                                    g
                                                                                                                 ly
                                                        gate oxide




                                                                                                                po
         Oxide                  Photoresist           Oxidation               Polysilicon             Polysilicon
         Etch                    Remove              (Gate oxide)             Deposition             Mask and Etch
       Scanning
       ion beam
                                                                             Contact                   Metal
                                                           silicon nitride     holes                 contacts
                            t
                        sis




                                                        top nitride
              G
                                                                                                           drain
                      re




                                       G                    G                                                G
       ox
          S       D                S        D          S      D                   S G D                    S   D

        Ion                      Active               Nitride                    Contact                Metal
    Implantation                 Regions             Deposition                   Etch               Deposition and
                                                                                                         Etch
Top view




                         Source   Gate   Drain
           Polysilicon                             Source   Gate   Drain
                                                                             Polysilicon
              SiO2
                                                                                SiO2



                          p+             p+         n+             n+

                                   n     bulk Si             p     bulk Si
Wafer preparation
Start with P substrate
1. Spin Resist Coating
2. Expose N Well Mask
3. Develop resist
4. Implant N Well
5. Remove Resist
Anneal wafer to diffuses N well (heal lattice)
and grow new oxide layer
Remove oxide from anneal
1. Spin Resist
2. Expose resist with active diffusion mask
3. Develop resist
4. Grow oxide on exposed surface
5. Strip resist
Grown thin oxide over silicon surfaces
1. Deposit poly using Chemical Vapor
Deposition (CVD)
2. Spin resist 3. expose resist using the
GATE mask 4. develop resist 5. etch poly
Remove thin oxide layer where exposed
1. Spin resist 2. expose with P implant mask
3. develop resist 4. implant P 5. strip resist
1. Spin resist 2. expose with N implant mask
3. develop resist 4. implant N 5. strip resist
Remove resist – anneal wafer – oxide etch
Grow oxide 1. spin resist 2. expose Contact mask
3. develop resist 4. etch contacts 5. strip resist
1. Deposit metal L1 2. spin resist 3. expose metal L1
mask 4. develop resist 5. etch metal 6. strip resist
Rest of metal layers follow similarly
Printing masks
The printer
                           Illuminator optics       Excimer laser
                                                    (193 nm ArF )



       Reticle library
  (SMIF pod interface)                            Beam line



                                                  Wafer transport
 Operator                                         system
  console

                                                     Reticle stage



                                                Wafer stage
Auto-alignment system
      4:1 Reduction lens
      NA = 0.45 to 0.6
Photolithography is used to print
desired patterns on the wafer
                           UV light


                                              Reticle field size
                                              20 mm 2 15mm,
                                              4 die per field

                                                                     masks
                                              5:1 reduction lens



                                              Image exposure on
     Serpentine                               wafer 1/5 of reticle
       stepping                               field
         pattern                              4 mm 4 3 mm,
                                              4 die per exposure
                                      Wafer

 The feature size directly depends on the wavelength of your
 lithographic system
Cross section of a 7-metal layer IC




     Next time:
       How to print different gates?

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VlSI Lecture04

  • 1. Design and Implementation of VLSI Systems (EN1600) lecture04
  • 2. Lecture 03: CMOS fabrication http://www.appliedmaterials.com/HTMAC/animated.html
  • 3. Fabricating one transistor UV light Mask oxygen exposed Silicon dioxide photoresist photoresist oxide Silicon substrate Oxidation Photoresist Mask-Wafer Exposed Photoresist (Field oxide) Coating Alignment and Exposure Photoresist Develop RF RF RF RF Po Po Po we we Po we rr we Dopant gas r Ionized CCl4 gas r Ionized oxygen gas Ionized CF4 gas Silane gas photoresist oxygen e oxide oxide at oxide polysilicon g ly gate oxide po Oxide Photoresist Oxidation Polysilicon Polysilicon Etch Remove (Gate oxide) Deposition Mask and Etch Scanning ion beam Contact Metal silicon nitride holes contacts t sis top nitride G drain re G G G ox S D S D S D S G D S D Ion Active Nitride Contact Metal Implantation Regions Deposition Etch Deposition and Etch
  • 4. Top view Source Gate Drain Polysilicon Source Gate Drain Polysilicon SiO2 SiO2 p+ p+ n+ n+ n bulk Si p bulk Si
  • 6. Start with P substrate
  • 7. 1. Spin Resist Coating
  • 8. 2. Expose N Well Mask
  • 10. 4. Implant N Well
  • 12. Anneal wafer to diffuses N well (heal lattice) and grow new oxide layer
  • 15. 2. Expose resist with active diffusion mask
  • 17. 4. Grow oxide on exposed surface
  • 19. Grown thin oxide over silicon surfaces
  • 20. 1. Deposit poly using Chemical Vapor Deposition (CVD)
  • 21. 2. Spin resist 3. expose resist using the GATE mask 4. develop resist 5. etch poly
  • 22. Remove thin oxide layer where exposed
  • 23. 1. Spin resist 2. expose with P implant mask 3. develop resist 4. implant P 5. strip resist
  • 24. 1. Spin resist 2. expose with N implant mask 3. develop resist 4. implant N 5. strip resist
  • 25. Remove resist – anneal wafer – oxide etch
  • 26. Grow oxide 1. spin resist 2. expose Contact mask 3. develop resist 4. etch contacts 5. strip resist
  • 27. 1. Deposit metal L1 2. spin resist 3. expose metal L1 mask 4. develop resist 5. etch metal 6. strip resist
  • 28. Rest of metal layers follow similarly
  • 30. The printer Illuminator optics Excimer laser (193 nm ArF ) Reticle library (SMIF pod interface) Beam line Wafer transport Operator system console Reticle stage Wafer stage Auto-alignment system 4:1 Reduction lens NA = 0.45 to 0.6
  • 31. Photolithography is used to print desired patterns on the wafer UV light Reticle field size 20 mm 2 15mm, 4 die per field masks 5:1 reduction lens Image exposure on Serpentine wafer 1/5 of reticle stepping field pattern 4 mm 4 3 mm, 4 die per exposure Wafer The feature size directly depends on the wavelength of your lithographic system
  • 32. Cross section of a 7-metal layer IC Next time: How to print different gates?