SlideShare ist ein Scribd-Unternehmen logo
1 von 71
Downloaden Sie, um offline zu lesen
Materials Characterization Lab
                                www.mri.psu.edu/mcl




X-Ray Diffraction
        Nichole Wonderling
159 Materials Research Laboratory
    University Park, PA. 16802

         nmw10@psu.edu
          814-863-1369

   Wednesday, June 29, 2005
Materials Characterization Lab
                                                                                             www.mri.psu.edu/mcl



                   Summer Characterization Open Houses
Technique                                                    Time            Date              Location
Thermal analysis (TGA, DTA, DSC)                             9:45 AM         June 8            250 MRL Bldg.
Transmission Electron Microscopy (TEM/STEM)                  9:45 AM         June 15           114 MRI Bldg
Scanning electron microscopy (SEM)                           9:45 AM         June 22           541 Deike Bldg.
Analytical SEM                                               11:00 AM        June 22           541 Deike Bldg.
X-ray Diffraction (XRD)                                      9:45 AM         June 29           250 MRL Bldg.
Dielectric Characterization (25 min lecture only)            9:45 AM         July 6            250 MRL bldg.
High temperature sintering lab (20 min lecture only)         10:15 AM        July 6            250 MRL Bldg.
Focused Ion Beam (FIB)                                       9:45 AM         July 13           114 MRI Bldg
TEM sample preparation                                       11:00 AM        July 13           114 MRI Bldg
Orientation imaging microscopy (OIM/EBSD)                    9:45 AM         July 20           250 MRL Bldg.
Chemical analysis (ICP, ICP-MS)                              9:45 AM         July 27           541 Deike Bldg.
Atomic Force Microscopy (AFM)                                9:45 AM         August 3          114 MRI Bldg
Small angle x-ray scattering (SAXS)                          9:45 AM         August 10         541 Deike Bldg.
Particle Characterization                                    9:45 AM         August 17         250 MRL
X-ray photoelectron spectroscopy (XPS/ESCA)                  9:45 AM         August 24         114 MRI Bldg
Auger Electron Spectroscopy (AES)                            11:00 AM        August 24         114 MRI Bldg

 NOTE LOCATIONS: The MRI Bldg is in the Innovation Park near the Penn Stater Hotel; MRL Bldg. is on Hastings Road.
 More information: www.mri.psu.edu/mcl
Materials Characterization Lab
                                                                                                                                                          www.mri.psu.edu/mcl
Materials Characterization Lab Locations
Bldg                     Telephone
MRL                      863-7844
MRI                      865-0337                                                                                                                 MRI Bldg:
Hosler                   865-1981                                                                                                                 XPS/ESCA, SIMS,
E&ES                     863-4225
                                                                                                                                                  TEM, HR-TEM, FE-
                                                                                                                                                  Auger, AFM, XRD
                                                                                 MRL Bldg:
                                        Hosler Bldg:
                                                                                 SEM, XRD, OIM, DTA,
                                        SEM, ESEM,        FE-
                                                                                 DSC,      TGA,    FTIR,                                                                   Penn Stater
                                        SEM, EPMA,       ICP,
                                                                                                                                                                             Hotel
                                                                                 AFM,            Powder,
E&ES Bldg:                              ICP-MS,BET,
                                                                                 dielectric, prep, shop,
SEM                                     SAXS,XRD
                                                                                 IC, UV-Vis
                                                                                                                                                Route 322

                                                       Steidle Bldg:
     Atherton Street




                                                       Nanoindenter
     (322 Business)




                                                                                                                                                                                 I-99
                                                                                                                                                Park Ave.
                                                                                                                     0
                                                                                                                     0                                          0
                                                                                            0                                               0               0        0
                                                                              Ave.                                                                              0
                                                                                            0                                               0               0        0
                                                                 Park            0
                                                                                                                         Beaver
                                                                                 0
                                                                 0
                                                                                                                         Stadium
                                                                 0
                                              0
                                              0
                                                                                                                                                         Centre
                0
                0




                                                                                                                              Porter Road
                                                                                                                                                        Community
                                                                                                Univ
                                                                 Shortlidg




                                                                                                                                                         Hospital
                    0
                    0
                        Burrowes Road




                                                                                                     ersi
                                                                                                          ty D
                                                                          e




                                                  Pollock Road
                                                                     Road




                                                                                                              rive




                                                                                                                                                                            North
                                                                                       Hastin
                                           Deike Bldg:                                       gs Ro
                                                                                                  ad


                                                  College Ave.
Materials Characterization Lab
                                www.mri.psu.edu/mcl




      Outline
      History / Theory
     Instrumentation
  Strengths / Limitations
MCL Instruments /Capabilities
     Applications at PSU
         Software
     How to Get Started
        Sample Prep
Campus and Other Resources
          Lab Tour
Materials Characterization Lab
              www.mri.psu.edu/mcl




HISTORY
Materials Characterization Lab
                                            www.mri.psu.edu/mcl




Wavelength Range of X-rays




        Encyclopedia Britannica, Inc.
Materials Characterization Lab
                                                                                           www.mri.psu.edu/mcl




            The Discovery of X-Rays
•   On 8 Nov, 1895, Wilhelm Conrad Röntgen (accidentally)
    discovered an image cast from his cathode ray generator,
    projected far beyond the possible range of the cathode rays
    (now known as an electron beam). Further investigation
    showed that the rays were generated at the point of contact
    of the cathode ray beam on the interior of the vacuum tube,
    that they were not deflected by magnetic fields, and they
    penetrated many kinds of matter.




                                                              •   A week after his discovery, Rontgen took
                                                                  an X-ray photograph of his wife's hand
                                                                  which clearly revealed her wedding ring
                                                                  and her bones. The photograph
                                                                  electrified the general public and aroused
                                                                  great scientific interest in the new form of
                                                                  radiation. Röntgen named the new form
                                                                  of radiation X-radiation (X standing for
                                                                  quot;Unknownquot;).



    http://inventors.about.com/library/inventors/blxray.htm
Materials Characterization Lab
                                       www.mri.psu.edu/mcl




                            It was the Rage……..




             Edison




        Get your
        bone portrait!
                                An x-ray “studio”

nails
        Images are copyrighted by Radiology
        Centennial, Inc and used with permission
Materials Characterization Lab
                                                    www.mri.psu.edu/mcl




                 Laue - 1912
               Showed that if a beam of X rays passed through
               a crystal, diffraction would take place and a
               pattern would be formed on a photographic
               plate placed at a right angle to the direction of
               the rays.




                  Today, known as the Laue pattern
Max von Laue
Materials Characterization Lab
                                                                    www.mri.psu.edu/mcl




     A few months later – Two Braggs
          Father                                             Son
                                                   Sir William Lawrence Bragg
 Sir William Henry Bragg




http://www.britannica.com/nobel/micro/83_18.html
Materials Characterization Lab
             www.mri.psu.edu/mcl




THEORY
Materials Characterization Lab
                                          www.mri.psu.edu/mcl




           Young Bragg
 • Believing that Laue's explanation was
incorrect in detail, he carried out a series of
    experiments, the result of which he
      published the Bragg equation –

     He was 15 years old when he did this!
Materials Characterization Lab
                                                      www.mri.psu.edu/mcl




      Bragg’s Law - defined
                                   Assume n=1 for the first order
                                   reflection (hkl=111)


  Tells us at what angles X rays will be diffracted by a
crystal when the X-ray wavelength and distance between
               the crystal atoms are known

       Wavelength
                                          X-ray incidence angle
       1.54 A for Cu
                                          (known value)
       (known value)


                          Lattice inter-planar spacing
                          of the crystal (calculate)
Materials Characterization Lab
                                                            www.mri.psu.edu/mcl




            Bragg’s Law

                                                  Assumptions:
                                                  Monochromatic beam
                                                  Parallel beam




http://hyperphysics.phy-astr.gsu.edu/hbase/quantum/bragg.html
Materials Characterization Lab
                                                                  www.mri.psu.edu/mcl




Eventually……… Bragg-Brentano Diffractometer and
            The Diffraction Pattern


                        [s o lid - 2 R - 2 .r a w ]


                 3000




                 2500




                 2000
I t niyC u t )
           s
n s ( on
  et




                 1500




                 1000




                  500




                    0
                                                 10   20   30
                                                           Tw o - Th e ta ( d e g )
Materials Characterization Lab
                      www.mri.psu.edu/mcl




Development of Modern
    Spectrometers
Materials Characterization Lab
                                                                                                                 www.mri.psu.edu/mcl


          Invention of the X-ray Tube
                                                                     • Ductile
• William D. Coolidge's name
  is inseparably linked with                                           Tungsten
  the X-ray tube-popularly
                                                                      at General
  called the 'Coolidge tube.'
                                                                       Electric
  This invention completely
  revolutionized the
  generation of X-rays and
  remains to this day the
  model upon which all X-ray
  tubes are patterned.




    http://inventors.about.com/gi/dynamic/offsite.htm?site=http://www.invent.org/hall%5Fof%5Ffame/1%5F1%5F6%5Fdetail.asp%3FvInventorID=33
Materials Characterization Lab
                                                                   www.mri.psu.edu/mcl



            Modern X-Ray Tube
                                    •   In an X-ray tube, the high voltage
Cross Section                           maintained across the electrodes
                                        draws electrons toward a metal target
                                        (the anode). X-rays are produced at
                                        the point of impact, and radiate in all
                                        directions.




 http://pubs.usgs.gov/of/of01-041/htmldocs/xrpd.htm
Materials Characterization Lab
                                                                            www.mri.psu.edu/mcl



                     Schematic of Bragg-Brentano
                           Diffractometer

                                                         First was introduced by North
                                                         American Philips in 1947

                                                         Construction and geometry
                                                         today differ little today from
                                                         the early diffractometers

                                                         BUT…..Significant advances in:
                                                                 detection and counting
                                                                systems, automation,
                                                                and analysis of the data
                                                                (computers)
From the Siemens (now Bruker AXS) manual for the D5000
Materials Characterization Lab
                         www.mri.psu.edu/mcl




Types of X-ray Diffraction
      Instruments
Materials Characterization Lab
                           www.mri.psu.edu/mcl




Two Types of Instrumentation

    • Powder
    • Single Crystal
Materials Characterization Lab
                                                                                 www.mri.psu.edu/mcl



          Types of Patterns

                                                                                             From an
From a
                                                                                             Oriented
Single
                                                                                             powder
crystal




                                                         [s o lid - 2 R - 2 .r a w ]


                                                  3000




                                                  2500




                                                  2000




                                 I t niyC u t )
                                            s
                                 n s ( on
                                   et
                                                  1500




                                                  1000




                                                   500




               From a randomly                       0
                                                                                  10    20       30
                                                                                                 Tw o - Th e ta ( d e g )




               Oriented powder
Materials Characterization Lab
                                                  www.mri.psu.edu/mcl




       Powder Diffraction
• Use Powder when working with:

  – Essentially anything that can be ground to a
    powdered form
     • Rocks, cements, pharmaceuticals, etc

  – Materials for which you wish to know the
    compounds present – not just the elements -
    (and perhaps how much of each compound if
    a mixture)
Materials Characterization Lab
                                                       www.mri.psu.edu/mcl



                   Compounds
               “I have iron oxide. I want to know if it is
                      in the form of FeO (wuestite) or Fe2O3
                      (hematite).”




Wuestite - cubic                    Hematite - hexagonal
     FeO                                   Fe2O3
Materials Characterization Lab
                                      www.mri.psu.edu/mcl




  Single Crystal Diffraction
• Use Single Crystal when working
  with:
  – Obviously when you have “single
    crystals”
  – When you want to know the structure of
     a crystal – information such as
       - bond lengths
       - bond angles
       - atom positions
Materials Characterization Lab
                          www.mri.psu.edu/mcl




Strengths / Limitations of
   Powder Diffraction
Materials Characterization Lab
                                                                   www.mri.psu.edu/mcl




 Strengths of Powder X-ray Diffraction
• Non-destructive – small amount of sample
• Relatively rapid
• Identification of compounds / phases – not just elements
• Quantification of concentration of phases – (sometimes)
• Classically for powders, but solids possible too
• Gives information regarding crystallinity, size/strain, crystallite size, and
           orientation


Limitations of Powder X-ray Diffraction
• Bulk technique – generally – unless a camera is uses
• Not a “stand-alone” technique – often need chemical data
• Complicated spectra – multiphase materials – identification /
     quantification can be difficult
Materials Characterization Lab
                    www.mri.psu.edu/mcl




MCL Instruments /
  Capabilities
Materials Characterization Lab
                     www.mri.psu.edu/mcl




Powder Diffraction
Materials Characterization Lab
                                               www.mri.psu.edu/mcl



                      Scintag
                             ……Scintag 1
                             Both horizontal θ/2θ geometry
                              -tube is stationary
                              - detector and sample move




Both used for basic powder
Diffraction.
              Scintag 2………
Both located in 158
MRL building
Materials Characterization Lab
                                               www.mri.psu.edu/mcl




                     Scintag (cont’d)

                               ……..Scintag 3

                              Vertical θ/θ geometry
                               - sample is stationary
                               - tube and detector move

                              Hot (up to 1500C), Cold (to
                              Liquid nitrogen -196C),
                              and sample rotation stages
                              available
Located in 158 MRL
Materials Characterization Lab
                                                  www.mri.psu.edu/mcl



                       Philips X’Pert




Has both focusing and parallel beam optics.


Located in Room 158 MRL building
Materials Characterization Lab
                           www.mri.psu.edu/mcl




Single Crystal Diffractometers
Materials Characterization Lab
                                                     www.mri.psu.edu/mcl

                           Laue
  Multiwire Laboratories




                              Consists of a position sensitive x-
                              ray proportional counter
                              connected to a computer system -
                              orients and characterizes single
                              crystals quickly in real-time.

                              Laue patterns can be easily stored,
                              displayed, and printed - completely
                              avoiding the use of film.
Located in 156 MRL
Materials Characterization Lab
                                     www.mri.psu.edu/mcl




      Philips High Resolution 4-Circle




Located in room   MRI building
Materials Characterization Lab
                         www.mri.psu.edu/mcl


Bruker 4-Circle




                  Located in 156 MRL
Materials Characterization Lab
                     www.mri.psu.edu/mcl




Applications at PSU
Materials Characterization Lab
                                                                                                                                                                       www.mri.psu.edu/mcl




                               Oxidation States of Copper
        As a fungicide on roofing materials
                                                                                                                                                                    The major phase is
                                                                                                                                                                      quartz, (red) also
                                                                                                                                                                         a significant
                           [522-03.raw] , SCAN: 5.0/70.0/0.02/2(s ec ), Cu(35k V,30mA), I(max )=2806, 07/03/03 08:20
                                                                                                                                     46-1045> Quartz, syn - SiO2
                                                                                                                                                                        amount of Cu,
                                                                                                                                   44-0706> CuO - Copper Oxide
                    400
                                                                                                                                            85-1326> Copper - Cu
                                                                                                                                                                           (green).
                                                                                                                                         78-2076> Cuprite - Cu2O
                                                                                                                                             Cu
                    350


                                                                                                                                                                   Perhaps, some Cu2O,
                                                                               CuO
                                    Cu2O
                    300
                                                                                                                                 SiO2
                                                                                                                                                                       (blue), but Cu2O
                                CuO     SiO2
                                                                                                                                                                       directly overlaps
                                                                                               SiO2
Intensity(Counts)




                    250

                                                                                                                                                                        the SiO2 lines.
                                                                                                             SiO2
                    200


                                                                                                                            Cu2O                                      There is no CuO
                    150
                                                                                                                                                                           detected.
                    100


                                                                                                                                                                     Other unidentified
                                                                                                                                                          CuO
                     50
                                                                                                                                                                         phases also
                                                                                                                                                                           present.
                      0
                          34          35           36           37           38           39            40             41   42       43              44
                                                                                       Two-Theta (deg)
Materials Characterization Lab
                                                                                                                                                                 www.mri.psu.edu/mcl



                                                                                                               Pyrite
                    • Example of the mineral pyrite, FeS2, that was found
                      at a local road construction site.


                          [pyrite sample.raw] , SCAN: 20.0/60.0/0.02/2(sec), Cu, I(max)=2179, 02/26/04 15:20

                                                                                                                                                   (Eq. 1) FeS2 + 7/2O2 + H2O =
                                                                                                                          42-1340> Pyrite - FeS2
                                                                                                                     46-1045> Quartz, syn - SiO2
                    350

                                                                                                                                                        Fe2+ + 2SO42- + 2H+
                    300




                                                                                                                                                   (Eq. 2) Fe2+ + 1/4O2 + 3/2H2O
                    250
Intensity(Counts)




                                                                                                                                                        = FeOOHppt + 2H+
                    200



                    150


                                                                                                                                                      (Eq. 3) FeS2 + 15/4O2 +
                    100

                                                                                                                                                   7/2H2O = Fe(OH)3ppt + 2SO42-
                    50

                                                                                                                                                               + 4H+
                     0
                             25                      30                       35                       40       45                       50
                                                                                   Two-Theta (deg)
Materials Characterization Lab
                                                                                                                                                                                                                                                           www.mri.psu.edu/mcl




          Crystallite Size Measurement
                                                                                                                                                                                                                                    Rh-Ni CeO2 powders
                                                                                                                                                                                                                                    τ         Kλ
                                                                                                                                                                                                                                        =
Decreasing
                                                          [1%R h5%N i-C eO2- Aldr ic h( 4degper min) .r aw ] , SC AN : 5.0/70.0/0.02/4(s ec ), C u( 35k V,30mA), I(max )=480, 05/13/04 08:39
                                              500
                                                                                                                                                                              43-1002> Cerianite-(Ce), syn - CeO2




                                                                                                                                                                                                                                            _______
crystallite
                                              400
                          Intensity(Counts)




                                              300



size
                                                                                                                                                                                                                                            β cos θ
                                              200




                                              100




                                                                                                                                                                                                                               τ = particle size
                                                    0
                                                                        10                       20                         30                          40               50                 60                           70
                                                                                                                                     Two-Theta (deg)




                                                                                                                                                                                                                               K = shape factor
                                                          [1%Rh5%Ni-CeO2-600C calcined (4degpermin).raw] , SCAN: 5.0/70.0/0.02/4(sec), Cu(35kV,30mA), I(max)=288, 05/13/04 09:50
                                              300
                                                                                                                                                                              43-1002> Cerianite-(Ce), syn - CeO2
                                                                                                                                                                                    47-1049> Bunsenite, syn - NiO



                                              250




                                                                                                                                                                                                                                      (typically 0.85-0.9)
                                              200
                          Intensity(Counts)




                                                                                                                                                                                                                               λ = wavelength (Angstroms)
                                              150




                                              100




                                                                                                                                                                                                                               β = corrected FWHM (radians)
                                                   50




                                                    0
                                                                        10                       20                         30                          40               50                 60                           70
                                                                                                                                     Two-Theta (deg)




                                                                                                                                                                                                                               θ = ½ 2θ (peak position)
                                                        [1%Rh5%Ni-CeO2-Rhodia(4degpermin).raw] , SCAN: 5.0/70.0/0.02/4(sec), Cu(35kV,30mA), I(max)=208, 05/13/04 07:55
                                                                                                                                                                                   43-1002> Cerianite-(Ce), syn - CeO2
                                          200



                                                                                                                                                                                                                                            Good for particle sizes <
                                          150




                                                                                                                                                                                                                                            500A and no strain.
              I ntensit y(Count s)




                                          100




                                                                                                                                                                                                                                            If strain, other Methods:
                                              50




                                                                                                                                                                                                                                            Warren / Averbach
                                               0
                                                                   10                          20                          30                           40               50                  60                           70
                                                                                                                                      Two-Theta (deg)




                                                                                                                                                                                                                                            Williamson-Hall plot
Materials Characterization Lab
                                                                                                   www.mri.psu.edu/mcl



             Grazing Angle Geometry

                 W Lα
                 Pt (111)           Pt                                                     32.2
                                                                                                                    57.4
                                   (111)                                                 ATN (110)
             Cu Kβ                                                                                                ATN (211)
             Pt (111)
                                                                                                       46.0
  32.2                                                                                               ATN (200)
ATN (110)   Si (200)
                                    46.0        57.4
                                  ATN (200)   ATN (211)
X




                                                                                  Grazing angle mode
      Normal Powder mode
                                                                    Reflected X-rays

                            Incident x-rays

                                                    ATN film

                                                           Pt

                                                          Silicon
Materials Characterization Lab
    www.mri.psu.edu/mcl
Materials Characterization Lab
               www.mri.psu.edu/mcl




Software
Materials Characterization Lab
                                                 www.mri.psu.edu/mcl


                       Jade

• Currently using Jade 7.1+ software
  manufactured by MDI, Inc.
  – Capabilities include (not inclusive):
     • Full Search / Match of current ICDD (2004) and
       ICSD (2005) databases for phase ID
     • Whole Pattern Profile Fitting / Rietveld Refinement
     • RIR Quantitative (Easy Quant)
     • Crystallite Size Estimate / Strain
     • 3-D Crystal Structure Viewer
Materials Characterization Lab
                                                                                                                                                                     www.mri.psu.edu/mcl


                                    Quantitative Analysis – by
                                             Rietveld                                                                                                      NH4Al(SO4)2 and CuSO4
                                                                                                                                                           co-precipitated
                          [NH4Al(SO4)-CuSO4-mixture.raw]




                    750
Intensity(Counts)




                    500




                    250




                      0
                                                                                                        97-001-7679> Chalcanthite - Cu S O4 (H2 O)5



                                                                                             97-007-7246> Tschermigite - (N H4) Al (S O4)2 (H2 O)12



                                8           9              10   11   12        13       14            15             16             17                18
                                                                      Two-Theta (deg)
Materials Characterization Lab
                                                                                                                                                                               www.mri.psu.edu/mcl


                                Rietveld Refinement
• Quantify monoclinic and tetragonal zirconia – only the
   100% tetragonal peak visible / clear from overlap

                                [powder ZrO2.raw ] , SCAN : 5.0/70.0/0.02/2(s ec ), C u(35k V,30mA), I(max )=2435, 03/04/04 14:58
                                                                                                                                                                     37-1484> Baddeleyite, syn - ZrO2
                                                                                                                                                                     50-1089> ZrO2 - Zirconium Oxide


                                                                                                                                                                     red=monoclinic
                         1000
                                                                                                                                                                     blue=tetragonal

                          500
                                2 9 .5 2 9 .6 2 9 .7 2 9 .8 2 9 .9 3 0 .0 3 0 .1 3 0 .2 3 0 .3 3 0 .4 3 0 .5 3 0 .6 3 0 .7 3 0 .8
     Intensity(Counts)




                            0
                                             15                                                      20                                25                 30        35                             40


                                                                                                                                    Goal: To quantif y the amount of tetragonal ZrO2 in a
                                                                                                                                    mixture of tetragonal and monoclinic ZrO2.
                         1000




                          500




                            0
                                                                 45                                                      50                  55                60            65
                                                                                                                                        Two-Theta (deg)
Materials Characterization Lab
                                   www.mri.psu.edu/mcl


Quantitative Analysis – RIR Method
         Jade’s “Easy QUANT”
Materials Characterization Lab
                     www.mri.psu.edu/mcl




How to Get Started
Materials Characterization Lab
                                                  www.mri.psu.edu/mcl


  Environmental Health and
  Safety X-ray safety training
            course




http://www.ehs.psu.edu/radprot/x-ray_safety_training.cfm
Materials Characterization Lab
                                                             www.mri.psu.edu/mcl


                        Dosimetry
• Worn on the wrist closest
  to the x-ray source
  (varies by instrument) –
  issued once each quarter




    Thin strip of specially formulated aluminum oxide (Al2O3)
    crystalline material. During analysis, the Al2O3 strip is stimulated
    with selected frequencies of laser light causing it to luminesce in
    proportion to the amount of radiation exposure.
Materials Characterization Lab
                           www.mri.psu.edu/mcl




Who Do I Contact to use X-ray
Diffraction Equipment at PSU?
Materials Characterization Lab
                                            www.mri.psu.edu/mcl




             MCL Contacts
        (For equipment in the MRL building)

                Nichole Wonderling
                  nmw10@psu.edu
                 159 MRL Building
                     863-1369
    (For equipment in Hosler and MRI buildings)

Mark Angelone                  John Cantolina
msa3@psu.edu                   jjc16@psu.edu
310 Hosler Building            310 Hosler Building
883-9350                       883-8358
Materials Characterization Lab
                     www.mri.psu.edu/mcl




Sample Preparation
Materials Characterization Lab
                                         www.mri.psu.edu/mcl




In Search of the Elusive “Perfect”
        Powder Sample

       • A “Representative” sample
Materials Characterization Lab
                              www.mri.psu.edu/mcl



The Elusive “Perfect” Powder
          Sample
                    How do I get a
                   “representative”
                       sample?
Materials Characterization Lab
                                           www.mri.psu.edu/mcl




The Elusive “Perfect” Powder
          Sample
 • A “Representative” sample

 • Sufficient number of crystallites
      Particle Size




                                   POWDER ?
Materials Characterization Lab
                                                                                         www.mri.psu.edu/mcl


                 Make mine a powder……
You may be lucky and
have one of these……..
                                                                                             Or maybe
a SPEX Shatterbox
                                                                                             You have…




                                                                         the XRD’s Best
                                                                         friend………
                                                                              The trusty mortar and
 Picture of SPEX Shatterbox from Georgia State, Geology dept. web site
 http://www2.gsu.edu/~wwwgeo/pages_03/lab/xRayFluorescence.htm
                                                                                     pestle.
Materials Characterization Lab
                                            www.mri.psu.edu/mcl




     The Elusive “Perfect” Powder
               Sample
 Particle Size

 < 325 mesh or < 400 mesh
       (38-44 micron) – for
       Qualitative Work

10 micron or less for
      Quantitative Work –
      very difficult if not
                              Somehow…….it needs to
      impossible by hand!
                              go through here!
Materials Characterization Lab
                                             www.mri.psu.edu/mcl




The Elusive “Perfect” Powder
          Sample
 • A “Representative” sample

 • Sufficient number of crystallites
         Particle Size
 • Total randomness of the crystallite orientations
       How the Sample is Introduced to the Instrument
Materials Characterization Lab
                                                         www.mri.psu.edu/mcl



Zero Background Holders (ZBH)




       Flat Silicon ZBH                  Quartz ZBH with cavity
    Cut parallel to Si (510)              Cut 6 º from (0001)
 Si (511) – also available, but
        has peak at 96ºθ

             See www.gemdugout.com for additional information
Materials Characterization Lab
                               www.mri.psu.edu/mcl




         Flat Quartz ZBH




Vaseline Mount      Smear Mount
Materials Characterization Lab
                         www.mri.psu.edu/mcl



Back Filled Sample Holder
Materials Characterization Lab
                                                 www.mri.psu.edu/mcl




             Side Drift Mount

                                    Disassembled




     Assembled



Designed to reduce preferred orientation – great for clay
samples, (and others with peaks at low 2-theta angles)
Materials Characterization Lab
                                              www.mri.psu.edu/mcl




The Elusive “Perfect” Powder
          Sample
 • A “Representative” sample
 • Sufficient number of crystallites
                Particle Size
 • Total randomness of the crystallite orientations
       How the Sample is Introduced to the Instrument

 • Sufficient intensity – limit of detection ~5%
        Enough sample area presented to the
        beam and enough of the phase of
        interest present
Materials Characterization Lab
                                                   www.mri.psu.edu/mcl




       “Real World” Samples
Some things can’t practically be powders:
                                         Hope diamond
      films
      pellets
      crystals
      mineral specimens

There are techniques available to deal
      with many of these – ask!



                                    galena
Materials Characterization Lab
                           www.mri.psu.edu/mcl




                 Plastic box -
Shimmed Pellet
                 Pellet Mount
    Mount
Materials Characterization Lab
                        www.mri.psu.edu/mcl




Campus and Other Resources
Materials Characterization Lab
                                                           www.mri.psu.edu/mcl




                         Courses
• MATSE 430 Materials Characterization
   – Fall semester only, 3 credit course, instructor Elizabeth
     Dickey


                             Books
 “Elements of X-ray Diffraction,” Cullity and Stock

 “Introduction to X-ray Powder Diffractometry,” Jenkins and Snyder

 “Fundamentals of Powder Diffraction and Structural Characterization of
 Materials,” Pecharsky and Vitalij

 “A Practical Guide for the Preparation of Specimens for X-ray
 Fluorescence and X-ray Diffraction Analysis,” Buhrke, Jenkins, Smith
Materials Characterization Lab
                                    www.mri.psu.edu/mcl




       Journals
      “Powder Diffraction”
    “Acta Crystallographica”
“Zeitschrift für Kristalographie”


         On-line
    http://www.ccp14.ac.uk/

     http://www.icdd.com/
Materials Characterization Lab
                                          www.mri.psu.edu/mcl




      Faculty Experts at PSU
•   Elizabeth Dickey, 195 MRI
•   Peter Heaney, 309 Deike Building
•   Gerald Johnson, Jr.; Prof. Emeritus, 153 MRL
•   Earl Ryba, 304B Steidle Building
•   Barry Scheetz, 107 MRL
Materials Characterization Lab
               www.mri.psu.edu/mcl




Lab Tour

Weitere ähnliche Inhalte

Andere mochten auch

XRD principle and application
XRD principle and applicationXRD principle and application
XRD principle and applicationTechef In
 
Xrd nanomaterials course_s2015_bates
Xrd nanomaterials course_s2015_batesXrd nanomaterials course_s2015_bates
Xrd nanomaterials course_s2015_batesMichael Bates
 
XRF & XRD Analysis Principle
XRF & XRD Analysis PrincipleXRF & XRD Analysis Principle
XRF & XRD Analysis PrincipleNohman Mahmud
 
Characterization of materials lec2 3
Characterization of materials  lec2 3Characterization of materials  lec2 3
Characterization of materials lec2 3Noor Faraz
 
Characterization of materials lec2
Characterization of materials  lec2Characterization of materials  lec2
Characterization of materials lec2Noor Faraz
 
Comparing Olympus X-Ray Diffraction to conventional XRD
Comparing Olympus X-Ray Diffraction to conventional XRDComparing Olympus X-Ray Diffraction to conventional XRD
Comparing Olympus X-Ray Diffraction to conventional XRDOlympus IMS
 
Powder-XRD
Powder-XRDPowder-XRD
Powder-XRDJOY DAS
 
XRD_presentation_McElroy
XRD_presentation_McElroyXRD_presentation_McElroy
XRD_presentation_McElroyColin McElroy
 
Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...
Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...
Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...AJKAnalytical
 
Characterization Of Layered Structures By X Ray Diffraction Techniques
Characterization Of Layered Structures By X Ray Diffraction TechniquesCharacterization Of Layered Structures By X Ray Diffraction Techniques
Characterization Of Layered Structures By X Ray Diffraction Techniquesicernatescu
 

Andere mochten auch (20)

Xrd presentation
Xrd presentationXrd presentation
Xrd presentation
 
X ray diffraction
X ray diffractionX ray diffraction
X ray diffraction
 
XRD principle and application
XRD principle and applicationXRD principle and application
XRD principle and application
 
Xrd
XrdXrd
Xrd
 
X ray
X  rayX  ray
X ray
 
Xrd nanomaterials course_s2015_bates
Xrd nanomaterials course_s2015_batesXrd nanomaterials course_s2015_bates
Xrd nanomaterials course_s2015_bates
 
Xrd
XrdXrd
Xrd
 
XRF & XRD Analysis Principle
XRF & XRD Analysis PrincipleXRF & XRD Analysis Principle
XRF & XRD Analysis Principle
 
principles of xrd
principles of xrdprinciples of xrd
principles of xrd
 
Spectroscopy XRD
Spectroscopy XRDSpectroscopy XRD
Spectroscopy XRD
 
XRD
XRD XRD
XRD
 
xrd basic
 xrd basic xrd basic
xrd basic
 
Characterization of materials lec2 3
Characterization of materials  lec2 3Characterization of materials  lec2 3
Characterization of materials lec2 3
 
Characterization of materials lec2
Characterization of materials  lec2Characterization of materials  lec2
Characterization of materials lec2
 
Comparing Olympus X-Ray Diffraction to conventional XRD
Comparing Olympus X-Ray Diffraction to conventional XRDComparing Olympus X-Ray Diffraction to conventional XRD
Comparing Olympus X-Ray Diffraction to conventional XRD
 
X-ray diffraction
X-ray  diffractionX-ray  diffraction
X-ray diffraction
 
Powder-XRD
Powder-XRDPowder-XRD
Powder-XRD
 
XRD_presentation_McElroy
XRD_presentation_McElroyXRD_presentation_McElroy
XRD_presentation_McElroy
 
Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...
Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...
Sample preparation and Presentation XRD Webinar June 19 2012 AJK Analytical S...
 
Characterization Of Layered Structures By X Ray Diffraction Techniques
Characterization Of Layered Structures By X Ray Diffraction TechniquesCharacterization Of Layered Structures By X Ray Diffraction Techniques
Characterization Of Layered Structures By X Ray Diffraction Techniques
 

Ähnlich wie Xrd 2005

Harshan- Skills, interests and capabilities
Harshan- Skills, interests and capabilitiesHarshan- Skills, interests and capabilities
Harshan- Skills, interests and capabilitiesHarshan Nampoori,Ph.D.
 
Characterization of porous materials by Focused Ion Beam Nano-Tomography
Characterization of porous materials by Focused Ion Beam Nano-TomographyCharacterization of porous materials by Focused Ion Beam Nano-Tomography
Characterization of porous materials by Focused Ion Beam Nano-TomographyVSG - Visualization Sciences Group
 
ePIXfab Technology and Partners
ePIXfab Technology and PartnersePIXfab Technology and Partners
ePIXfab Technology and Partnersamitkhanna49
 
Spectral x-ray photon counting
Spectral x-ray photon countingSpectral x-ray photon counting
Spectral x-ray photon countingGunnar Maehlum
 
ListOfTechProjsWITHSphinxV1
ListOfTechProjsWITHSphinxV1ListOfTechProjsWITHSphinxV1
ListOfTechProjsWITHSphinxV1Carlo Fanara
 
Rta Eas &amp; Pittcon 2010 Sers Featured Talks
Rta Eas &amp; Pittcon 2010 Sers Featured TalksRta Eas &amp; Pittcon 2010 Sers Featured Talks
Rta Eas &amp; Pittcon 2010 Sers Featured Talksinscore
 
Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...
Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...
Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...Gunnar Maehlum
 

Ähnlich wie Xrd 2005 (14)

Tem
TemTem
Tem
 
Harshan- Skills, interests and capabilities
Harshan- Skills, interests and capabilitiesHarshan- Skills, interests and capabilities
Harshan- Skills, interests and capabilities
 
Mixsel
MixselMixsel
Mixsel
 
Weinstock - Quantum Electronic Solids - Spring Review 2012
Weinstock - Quantum Electronic Solids - Spring Review 2012Weinstock - Quantum Electronic Solids - Spring Review 2012
Weinstock - Quantum Electronic Solids - Spring Review 2012
 
Characterization of porous materials by Focused Ion Beam Nano-Tomography
Characterization of porous materials by Focused Ion Beam Nano-TomographyCharacterization of porous materials by Focused Ion Beam Nano-Tomography
Characterization of porous materials by Focused Ion Beam Nano-Tomography
 
ePIXfab Technology and Partners
ePIXfab Technology and PartnersePIXfab Technology and Partners
ePIXfab Technology and Partners
 
Fcipt Overview
Fcipt OverviewFcipt Overview
Fcipt Overview
 
Fcipt Overview
Fcipt OverviewFcipt Overview
Fcipt Overview
 
Spectral x-ray photon counting
Spectral x-ray photon countingSpectral x-ray photon counting
Spectral x-ray photon counting
 
ListOfTechProjsWITHSphinxV1
ListOfTechProjsWITHSphinxV1ListOfTechProjsWITHSphinxV1
ListOfTechProjsWITHSphinxV1
 
Rta Eas &amp; Pittcon 2010 Sers Featured Talks
Rta Eas &amp; Pittcon 2010 Sers Featured TalksRta Eas &amp; Pittcon 2010 Sers Featured Talks
Rta Eas &amp; Pittcon 2010 Sers Featured Talks
 
Cheng
ChengCheng
Cheng
 
Spintronics
SpintronicsSpintronics
Spintronics
 
Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...
Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...
Multi-channel Detector Readout Integrated Circuits with ADCs for X-ray and Ga...
 

Mehr von langtudaikieu (20)

Aem Lect5
Aem Lect5Aem Lect5
Aem Lect5
 
Aem Lect14
Aem Lect14Aem Lect14
Aem Lect14
 
Aem Lect19
Aem Lect19Aem Lect19
Aem Lect19
 
Aem Lect18
Aem Lect18Aem Lect18
Aem Lect18
 
Aem Lect1
Aem Lect1Aem Lect1
Aem Lect1
 
Aem Lect4
Aem Lect4Aem Lect4
Aem Lect4
 
Aem Lect2
Aem Lect2Aem Lect2
Aem Lect2
 
Aem Lect3
Aem Lect3Aem Lect3
Aem Lect3
 
Aem Lect6
Aem Lect6Aem Lect6
Aem Lect6
 
Aem Lect8
Aem Lect8Aem Lect8
Aem Lect8
 
Aem Lect7
Aem Lect7Aem Lect7
Aem Lect7
 
Aem Lect9
Aem Lect9Aem Lect9
Aem Lect9
 
Aem Lect11
Aem Lect11Aem Lect11
Aem Lect11
 
Aem Lect10
Aem Lect10Aem Lect10
Aem Lect10
 
Aem Lect12
Aem Lect12Aem Lect12
Aem Lect12
 
Aem Lect17
Aem Lect17Aem Lect17
Aem Lect17
 
Aem Lect13
Aem Lect13Aem Lect13
Aem Lect13
 
Aem Lect15
Aem Lect15Aem Lect15
Aem Lect15
 
Aem Lect16
Aem Lect16Aem Lect16
Aem Lect16
 
Thermal
ThermalThermal
Thermal
 

Kürzlich hochgeladen

Entrepreneurial ecosystem- Wider context
Entrepreneurial ecosystem- Wider contextEntrepreneurial ecosystem- Wider context
Entrepreneurial ecosystem- Wider contextP&CO
 
Introducing the Analogic framework for business planning applications
Introducing the Analogic framework for business planning applicationsIntroducing the Analogic framework for business planning applications
Introducing the Analogic framework for business planning applicationsKnowledgeSeed
 
Paul Turovsky - Real Estate Professional
Paul Turovsky - Real Estate ProfessionalPaul Turovsky - Real Estate Professional
Paul Turovsky - Real Estate ProfessionalPaul Turovsky
 
Excvation Safety for safety officers reference
Excvation Safety for safety officers referenceExcvation Safety for safety officers reference
Excvation Safety for safety officers referencessuser2c065e
 
Welding Electrode Making Machine By Deccan Dynamics
Welding Electrode Making Machine By Deccan DynamicsWelding Electrode Making Machine By Deccan Dynamics
Welding Electrode Making Machine By Deccan DynamicsIndiaMART InterMESH Limited
 
Onemonitar Android Spy App Features: Explore Advanced Monitoring Capabilities
Onemonitar Android Spy App Features: Explore Advanced Monitoring CapabilitiesOnemonitar Android Spy App Features: Explore Advanced Monitoring Capabilities
Onemonitar Android Spy App Features: Explore Advanced Monitoring CapabilitiesOne Monitar
 
1911 Gold Corporate Presentation Apr 2024.pdf
1911 Gold Corporate Presentation Apr 2024.pdf1911 Gold Corporate Presentation Apr 2024.pdf
1911 Gold Corporate Presentation Apr 2024.pdfShaun Heinrichs
 
Data Analytics Strategy Toolkit and Templates
Data Analytics Strategy Toolkit and TemplatesData Analytics Strategy Toolkit and Templates
Data Analytics Strategy Toolkit and TemplatesAurelien Domont, MBA
 
Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...
Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...
Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...Aggregage
 
Healthcare Feb. & Mar. Healthcare Newsletter
Healthcare Feb. & Mar. Healthcare NewsletterHealthcare Feb. & Mar. Healthcare Newsletter
Healthcare Feb. & Mar. Healthcare NewsletterJamesConcepcion7
 
How to Conduct a Service Gap Analysis for Your Business
How to Conduct a Service Gap Analysis for Your BusinessHow to Conduct a Service Gap Analysis for Your Business
How to Conduct a Service Gap Analysis for Your BusinessHelp Desk Migration
 
WSMM Media and Entertainment Feb_March_Final.pdf
WSMM Media and Entertainment Feb_March_Final.pdfWSMM Media and Entertainment Feb_March_Final.pdf
WSMM Media and Entertainment Feb_March_Final.pdfJamesConcepcion7
 
Planetary and Vedic Yagyas Bring Positive Impacts in Life
Planetary and Vedic Yagyas Bring Positive Impacts in LifePlanetary and Vedic Yagyas Bring Positive Impacts in Life
Planetary and Vedic Yagyas Bring Positive Impacts in LifeBhavana Pujan Kendra
 
How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...
How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...
How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...Hector Del Castillo, CPM, CPMM
 
Technical Leaders - Working with the Management Team
Technical Leaders - Working with the Management TeamTechnical Leaders - Working with the Management Team
Technical Leaders - Working with the Management TeamArik Fletcher
 
71368-80-4.pdf Fast delivery good quality
71368-80-4.pdf Fast delivery  good quality71368-80-4.pdf Fast delivery  good quality
71368-80-4.pdf Fast delivery good qualitycathy664059
 
5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf
5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf
5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdfSherl Simon
 
digital marketing , introduction of digital marketing
digital marketing , introduction of digital marketingdigital marketing , introduction of digital marketing
digital marketing , introduction of digital marketingrajputmeenakshi733
 
MEP Plans in Construction of Building and Industrial Projects 2024
MEP Plans in Construction of Building and Industrial Projects 2024MEP Plans in Construction of Building and Industrial Projects 2024
MEP Plans in Construction of Building and Industrial Projects 2024Chandresh Chudasama
 
Jewish Resources in the Family Resource Centre
Jewish Resources in the Family Resource CentreJewish Resources in the Family Resource Centre
Jewish Resources in the Family Resource CentreNZSG
 

Kürzlich hochgeladen (20)

Entrepreneurial ecosystem- Wider context
Entrepreneurial ecosystem- Wider contextEntrepreneurial ecosystem- Wider context
Entrepreneurial ecosystem- Wider context
 
Introducing the Analogic framework for business planning applications
Introducing the Analogic framework for business planning applicationsIntroducing the Analogic framework for business planning applications
Introducing the Analogic framework for business planning applications
 
Paul Turovsky - Real Estate Professional
Paul Turovsky - Real Estate ProfessionalPaul Turovsky - Real Estate Professional
Paul Turovsky - Real Estate Professional
 
Excvation Safety for safety officers reference
Excvation Safety for safety officers referenceExcvation Safety for safety officers reference
Excvation Safety for safety officers reference
 
Welding Electrode Making Machine By Deccan Dynamics
Welding Electrode Making Machine By Deccan DynamicsWelding Electrode Making Machine By Deccan Dynamics
Welding Electrode Making Machine By Deccan Dynamics
 
Onemonitar Android Spy App Features: Explore Advanced Monitoring Capabilities
Onemonitar Android Spy App Features: Explore Advanced Monitoring CapabilitiesOnemonitar Android Spy App Features: Explore Advanced Monitoring Capabilities
Onemonitar Android Spy App Features: Explore Advanced Monitoring Capabilities
 
1911 Gold Corporate Presentation Apr 2024.pdf
1911 Gold Corporate Presentation Apr 2024.pdf1911 Gold Corporate Presentation Apr 2024.pdf
1911 Gold Corporate Presentation Apr 2024.pdf
 
Data Analytics Strategy Toolkit and Templates
Data Analytics Strategy Toolkit and TemplatesData Analytics Strategy Toolkit and Templates
Data Analytics Strategy Toolkit and Templates
 
Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...
Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...
Strategic Project Finance Essentials: A Project Manager’s Guide to Financial ...
 
Healthcare Feb. & Mar. Healthcare Newsletter
Healthcare Feb. & Mar. Healthcare NewsletterHealthcare Feb. & Mar. Healthcare Newsletter
Healthcare Feb. & Mar. Healthcare Newsletter
 
How to Conduct a Service Gap Analysis for Your Business
How to Conduct a Service Gap Analysis for Your BusinessHow to Conduct a Service Gap Analysis for Your Business
How to Conduct a Service Gap Analysis for Your Business
 
WSMM Media and Entertainment Feb_March_Final.pdf
WSMM Media and Entertainment Feb_March_Final.pdfWSMM Media and Entertainment Feb_March_Final.pdf
WSMM Media and Entertainment Feb_March_Final.pdf
 
Planetary and Vedic Yagyas Bring Positive Impacts in Life
Planetary and Vedic Yagyas Bring Positive Impacts in LifePlanetary and Vedic Yagyas Bring Positive Impacts in Life
Planetary and Vedic Yagyas Bring Positive Impacts in Life
 
How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...
How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...
How Generative AI Is Transforming Your Business | Byond Growth Insights | Apr...
 
Technical Leaders - Working with the Management Team
Technical Leaders - Working with the Management TeamTechnical Leaders - Working with the Management Team
Technical Leaders - Working with the Management Team
 
71368-80-4.pdf Fast delivery good quality
71368-80-4.pdf Fast delivery  good quality71368-80-4.pdf Fast delivery  good quality
71368-80-4.pdf Fast delivery good quality
 
5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf
5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf
5-Step Framework to Convert Any Business into a Wealth Generation Machine.pdf
 
digital marketing , introduction of digital marketing
digital marketing , introduction of digital marketingdigital marketing , introduction of digital marketing
digital marketing , introduction of digital marketing
 
MEP Plans in Construction of Building and Industrial Projects 2024
MEP Plans in Construction of Building and Industrial Projects 2024MEP Plans in Construction of Building and Industrial Projects 2024
MEP Plans in Construction of Building and Industrial Projects 2024
 
Jewish Resources in the Family Resource Centre
Jewish Resources in the Family Resource CentreJewish Resources in the Family Resource Centre
Jewish Resources in the Family Resource Centre
 

Xrd 2005

  • 1. Materials Characterization Lab www.mri.psu.edu/mcl X-Ray Diffraction Nichole Wonderling 159 Materials Research Laboratory University Park, PA. 16802 nmw10@psu.edu 814-863-1369 Wednesday, June 29, 2005
  • 2. Materials Characterization Lab www.mri.psu.edu/mcl Summer Characterization Open Houses Technique Time Date Location Thermal analysis (TGA, DTA, DSC) 9:45 AM June 8 250 MRL Bldg. Transmission Electron Microscopy (TEM/STEM) 9:45 AM June 15 114 MRI Bldg Scanning electron microscopy (SEM) 9:45 AM June 22 541 Deike Bldg. Analytical SEM 11:00 AM June 22 541 Deike Bldg. X-ray Diffraction (XRD) 9:45 AM June 29 250 MRL Bldg. Dielectric Characterization (25 min lecture only) 9:45 AM July 6 250 MRL bldg. High temperature sintering lab (20 min lecture only) 10:15 AM July 6 250 MRL Bldg. Focused Ion Beam (FIB) 9:45 AM July 13 114 MRI Bldg TEM sample preparation 11:00 AM July 13 114 MRI Bldg Orientation imaging microscopy (OIM/EBSD) 9:45 AM July 20 250 MRL Bldg. Chemical analysis (ICP, ICP-MS) 9:45 AM July 27 541 Deike Bldg. Atomic Force Microscopy (AFM) 9:45 AM August 3 114 MRI Bldg Small angle x-ray scattering (SAXS) 9:45 AM August 10 541 Deike Bldg. Particle Characterization 9:45 AM August 17 250 MRL X-ray photoelectron spectroscopy (XPS/ESCA) 9:45 AM August 24 114 MRI Bldg Auger Electron Spectroscopy (AES) 11:00 AM August 24 114 MRI Bldg NOTE LOCATIONS: The MRI Bldg is in the Innovation Park near the Penn Stater Hotel; MRL Bldg. is on Hastings Road. More information: www.mri.psu.edu/mcl
  • 3. Materials Characterization Lab www.mri.psu.edu/mcl Materials Characterization Lab Locations Bldg Telephone MRL 863-7844 MRI 865-0337 MRI Bldg: Hosler 865-1981 XPS/ESCA, SIMS, E&ES 863-4225 TEM, HR-TEM, FE- Auger, AFM, XRD MRL Bldg: Hosler Bldg: SEM, XRD, OIM, DTA, SEM, ESEM, FE- DSC, TGA, FTIR, Penn Stater SEM, EPMA, ICP, Hotel AFM, Powder, E&ES Bldg: ICP-MS,BET, dielectric, prep, shop, SEM SAXS,XRD IC, UV-Vis Route 322 Steidle Bldg: Atherton Street Nanoindenter (322 Business) I-99 Park Ave. 0 0 0 0 0 0 0 Ave. 0 0 0 0 0 Park 0 Beaver 0 0 Stadium 0 0 0 Centre 0 0 Porter Road Community Univ Shortlidg Hospital 0 0 Burrowes Road ersi ty D e Pollock Road Road rive North Hastin Deike Bldg: gs Ro ad College Ave.
  • 4. Materials Characterization Lab www.mri.psu.edu/mcl Outline History / Theory Instrumentation Strengths / Limitations MCL Instruments /Capabilities Applications at PSU Software How to Get Started Sample Prep Campus and Other Resources Lab Tour
  • 5. Materials Characterization Lab www.mri.psu.edu/mcl HISTORY
  • 6. Materials Characterization Lab www.mri.psu.edu/mcl Wavelength Range of X-rays Encyclopedia Britannica, Inc.
  • 7. Materials Characterization Lab www.mri.psu.edu/mcl The Discovery of X-Rays • On 8 Nov, 1895, Wilhelm Conrad Röntgen (accidentally) discovered an image cast from his cathode ray generator, projected far beyond the possible range of the cathode rays (now known as an electron beam). Further investigation showed that the rays were generated at the point of contact of the cathode ray beam on the interior of the vacuum tube, that they were not deflected by magnetic fields, and they penetrated many kinds of matter. • A week after his discovery, Rontgen took an X-ray photograph of his wife's hand which clearly revealed her wedding ring and her bones. The photograph electrified the general public and aroused great scientific interest in the new form of radiation. Röntgen named the new form of radiation X-radiation (X standing for quot;Unknownquot;). http://inventors.about.com/library/inventors/blxray.htm
  • 8. Materials Characterization Lab www.mri.psu.edu/mcl It was the Rage…….. Edison Get your bone portrait! An x-ray “studio” nails Images are copyrighted by Radiology Centennial, Inc and used with permission
  • 9. Materials Characterization Lab www.mri.psu.edu/mcl Laue - 1912 Showed that if a beam of X rays passed through a crystal, diffraction would take place and a pattern would be formed on a photographic plate placed at a right angle to the direction of the rays. Today, known as the Laue pattern Max von Laue
  • 10. Materials Characterization Lab www.mri.psu.edu/mcl A few months later – Two Braggs Father Son Sir William Lawrence Bragg Sir William Henry Bragg http://www.britannica.com/nobel/micro/83_18.html
  • 11. Materials Characterization Lab www.mri.psu.edu/mcl THEORY
  • 12. Materials Characterization Lab www.mri.psu.edu/mcl Young Bragg • Believing that Laue's explanation was incorrect in detail, he carried out a series of experiments, the result of which he published the Bragg equation – He was 15 years old when he did this!
  • 13. Materials Characterization Lab www.mri.psu.edu/mcl Bragg’s Law - defined Assume n=1 for the first order reflection (hkl=111) Tells us at what angles X rays will be diffracted by a crystal when the X-ray wavelength and distance between the crystal atoms are known Wavelength X-ray incidence angle 1.54 A for Cu (known value) (known value) Lattice inter-planar spacing of the crystal (calculate)
  • 14. Materials Characterization Lab www.mri.psu.edu/mcl Bragg’s Law Assumptions: Monochromatic beam Parallel beam http://hyperphysics.phy-astr.gsu.edu/hbase/quantum/bragg.html
  • 15. Materials Characterization Lab www.mri.psu.edu/mcl Eventually……… Bragg-Brentano Diffractometer and The Diffraction Pattern [s o lid - 2 R - 2 .r a w ] 3000 2500 2000 I t niyC u t ) s n s ( on et 1500 1000 500 0 10 20 30 Tw o - Th e ta ( d e g )
  • 16. Materials Characterization Lab www.mri.psu.edu/mcl Development of Modern Spectrometers
  • 17. Materials Characterization Lab www.mri.psu.edu/mcl Invention of the X-ray Tube • Ductile • William D. Coolidge's name is inseparably linked with Tungsten the X-ray tube-popularly at General called the 'Coolidge tube.' Electric This invention completely revolutionized the generation of X-rays and remains to this day the model upon which all X-ray tubes are patterned. http://inventors.about.com/gi/dynamic/offsite.htm?site=http://www.invent.org/hall%5Fof%5Ffame/1%5F1%5F6%5Fdetail.asp%3FvInventorID=33
  • 18. Materials Characterization Lab www.mri.psu.edu/mcl Modern X-Ray Tube • In an X-ray tube, the high voltage Cross Section maintained across the electrodes draws electrons toward a metal target (the anode). X-rays are produced at the point of impact, and radiate in all directions. http://pubs.usgs.gov/of/of01-041/htmldocs/xrpd.htm
  • 19. Materials Characterization Lab www.mri.psu.edu/mcl Schematic of Bragg-Brentano Diffractometer First was introduced by North American Philips in 1947 Construction and geometry today differ little today from the early diffractometers BUT…..Significant advances in: detection and counting systems, automation, and analysis of the data (computers) From the Siemens (now Bruker AXS) manual for the D5000
  • 20. Materials Characterization Lab www.mri.psu.edu/mcl Types of X-ray Diffraction Instruments
  • 21. Materials Characterization Lab www.mri.psu.edu/mcl Two Types of Instrumentation • Powder • Single Crystal
  • 22. Materials Characterization Lab www.mri.psu.edu/mcl Types of Patterns From an From a Oriented Single powder crystal [s o lid - 2 R - 2 .r a w ] 3000 2500 2000 I t niyC u t ) s n s ( on et 1500 1000 500 From a randomly 0 10 20 30 Tw o - Th e ta ( d e g ) Oriented powder
  • 23. Materials Characterization Lab www.mri.psu.edu/mcl Powder Diffraction • Use Powder when working with: – Essentially anything that can be ground to a powdered form • Rocks, cements, pharmaceuticals, etc – Materials for which you wish to know the compounds present – not just the elements - (and perhaps how much of each compound if a mixture)
  • 24. Materials Characterization Lab www.mri.psu.edu/mcl Compounds “I have iron oxide. I want to know if it is in the form of FeO (wuestite) or Fe2O3 (hematite).” Wuestite - cubic Hematite - hexagonal FeO Fe2O3
  • 25. Materials Characterization Lab www.mri.psu.edu/mcl Single Crystal Diffraction • Use Single Crystal when working with: – Obviously when you have “single crystals” – When you want to know the structure of a crystal – information such as - bond lengths - bond angles - atom positions
  • 26. Materials Characterization Lab www.mri.psu.edu/mcl Strengths / Limitations of Powder Diffraction
  • 27. Materials Characterization Lab www.mri.psu.edu/mcl Strengths of Powder X-ray Diffraction • Non-destructive – small amount of sample • Relatively rapid • Identification of compounds / phases – not just elements • Quantification of concentration of phases – (sometimes) • Classically for powders, but solids possible too • Gives information regarding crystallinity, size/strain, crystallite size, and orientation Limitations of Powder X-ray Diffraction • Bulk technique – generally – unless a camera is uses • Not a “stand-alone” technique – often need chemical data • Complicated spectra – multiphase materials – identification / quantification can be difficult
  • 28. Materials Characterization Lab www.mri.psu.edu/mcl MCL Instruments / Capabilities
  • 29. Materials Characterization Lab www.mri.psu.edu/mcl Powder Diffraction
  • 30. Materials Characterization Lab www.mri.psu.edu/mcl Scintag ……Scintag 1 Both horizontal θ/2θ geometry -tube is stationary - detector and sample move Both used for basic powder Diffraction. Scintag 2……… Both located in 158 MRL building
  • 31. Materials Characterization Lab www.mri.psu.edu/mcl Scintag (cont’d) ……..Scintag 3 Vertical θ/θ geometry - sample is stationary - tube and detector move Hot (up to 1500C), Cold (to Liquid nitrogen -196C), and sample rotation stages available Located in 158 MRL
  • 32. Materials Characterization Lab www.mri.psu.edu/mcl Philips X’Pert Has both focusing and parallel beam optics. Located in Room 158 MRL building
  • 33. Materials Characterization Lab www.mri.psu.edu/mcl Single Crystal Diffractometers
  • 34. Materials Characterization Lab www.mri.psu.edu/mcl Laue Multiwire Laboratories Consists of a position sensitive x- ray proportional counter connected to a computer system - orients and characterizes single crystals quickly in real-time. Laue patterns can be easily stored, displayed, and printed - completely avoiding the use of film. Located in 156 MRL
  • 35. Materials Characterization Lab www.mri.psu.edu/mcl Philips High Resolution 4-Circle Located in room MRI building
  • 36. Materials Characterization Lab www.mri.psu.edu/mcl Bruker 4-Circle Located in 156 MRL
  • 37. Materials Characterization Lab www.mri.psu.edu/mcl Applications at PSU
  • 38. Materials Characterization Lab www.mri.psu.edu/mcl Oxidation States of Copper As a fungicide on roofing materials The major phase is quartz, (red) also a significant [522-03.raw] , SCAN: 5.0/70.0/0.02/2(s ec ), Cu(35k V,30mA), I(max )=2806, 07/03/03 08:20 46-1045> Quartz, syn - SiO2 amount of Cu, 44-0706> CuO - Copper Oxide 400 85-1326> Copper - Cu (green). 78-2076> Cuprite - Cu2O Cu 350 Perhaps, some Cu2O, CuO Cu2O 300 SiO2 (blue), but Cu2O CuO SiO2 directly overlaps SiO2 Intensity(Counts) 250 the SiO2 lines. SiO2 200 Cu2O There is no CuO 150 detected. 100 Other unidentified CuO 50 phases also present. 0 34 35 36 37 38 39 40 41 42 43 44 Two-Theta (deg)
  • 39. Materials Characterization Lab www.mri.psu.edu/mcl Pyrite • Example of the mineral pyrite, FeS2, that was found at a local road construction site. [pyrite sample.raw] , SCAN: 20.0/60.0/0.02/2(sec), Cu, I(max)=2179, 02/26/04 15:20 (Eq. 1) FeS2 + 7/2O2 + H2O = 42-1340> Pyrite - FeS2 46-1045> Quartz, syn - SiO2 350 Fe2+ + 2SO42- + 2H+ 300 (Eq. 2) Fe2+ + 1/4O2 + 3/2H2O 250 Intensity(Counts) = FeOOHppt + 2H+ 200 150 (Eq. 3) FeS2 + 15/4O2 + 100 7/2H2O = Fe(OH)3ppt + 2SO42- 50 + 4H+ 0 25 30 35 40 45 50 Two-Theta (deg)
  • 40. Materials Characterization Lab www.mri.psu.edu/mcl Crystallite Size Measurement Rh-Ni CeO2 powders τ Kλ = Decreasing [1%R h5%N i-C eO2- Aldr ic h( 4degper min) .r aw ] , SC AN : 5.0/70.0/0.02/4(s ec ), C u( 35k V,30mA), I(max )=480, 05/13/04 08:39 500 43-1002> Cerianite-(Ce), syn - CeO2 _______ crystallite 400 Intensity(Counts) 300 size β cos θ 200 100 τ = particle size 0 10 20 30 40 50 60 70 Two-Theta (deg) K = shape factor [1%Rh5%Ni-CeO2-600C calcined (4degpermin).raw] , SCAN: 5.0/70.0/0.02/4(sec), Cu(35kV,30mA), I(max)=288, 05/13/04 09:50 300 43-1002> Cerianite-(Ce), syn - CeO2 47-1049> Bunsenite, syn - NiO 250 (typically 0.85-0.9) 200 Intensity(Counts) λ = wavelength (Angstroms) 150 100 β = corrected FWHM (radians) 50 0 10 20 30 40 50 60 70 Two-Theta (deg) θ = ½ 2θ (peak position) [1%Rh5%Ni-CeO2-Rhodia(4degpermin).raw] , SCAN: 5.0/70.0/0.02/4(sec), Cu(35kV,30mA), I(max)=208, 05/13/04 07:55 43-1002> Cerianite-(Ce), syn - CeO2 200 Good for particle sizes < 150 500A and no strain. I ntensit y(Count s) 100 If strain, other Methods: 50 Warren / Averbach 0 10 20 30 40 50 60 70 Two-Theta (deg) Williamson-Hall plot
  • 41. Materials Characterization Lab www.mri.psu.edu/mcl Grazing Angle Geometry W Lα Pt (111) Pt 32.2 57.4 (111) ATN (110) Cu Kβ ATN (211) Pt (111) 46.0 32.2 ATN (200) ATN (110) Si (200) 46.0 57.4 ATN (200) ATN (211) X Grazing angle mode Normal Powder mode Reflected X-rays Incident x-rays ATN film Pt Silicon
  • 42. Materials Characterization Lab www.mri.psu.edu/mcl
  • 43. Materials Characterization Lab www.mri.psu.edu/mcl Software
  • 44. Materials Characterization Lab www.mri.psu.edu/mcl Jade • Currently using Jade 7.1+ software manufactured by MDI, Inc. – Capabilities include (not inclusive): • Full Search / Match of current ICDD (2004) and ICSD (2005) databases for phase ID • Whole Pattern Profile Fitting / Rietveld Refinement • RIR Quantitative (Easy Quant) • Crystallite Size Estimate / Strain • 3-D Crystal Structure Viewer
  • 45. Materials Characterization Lab www.mri.psu.edu/mcl Quantitative Analysis – by Rietveld NH4Al(SO4)2 and CuSO4 co-precipitated [NH4Al(SO4)-CuSO4-mixture.raw] 750 Intensity(Counts) 500 250 0 97-001-7679> Chalcanthite - Cu S O4 (H2 O)5 97-007-7246> Tschermigite - (N H4) Al (S O4)2 (H2 O)12 8 9 10 11 12 13 14 15 16 17 18 Two-Theta (deg)
  • 46. Materials Characterization Lab www.mri.psu.edu/mcl Rietveld Refinement • Quantify monoclinic and tetragonal zirconia – only the 100% tetragonal peak visible / clear from overlap [powder ZrO2.raw ] , SCAN : 5.0/70.0/0.02/2(s ec ), C u(35k V,30mA), I(max )=2435, 03/04/04 14:58 37-1484> Baddeleyite, syn - ZrO2 50-1089> ZrO2 - Zirconium Oxide red=monoclinic 1000 blue=tetragonal 500 2 9 .5 2 9 .6 2 9 .7 2 9 .8 2 9 .9 3 0 .0 3 0 .1 3 0 .2 3 0 .3 3 0 .4 3 0 .5 3 0 .6 3 0 .7 3 0 .8 Intensity(Counts) 0 15 20 25 30 35 40 Goal: To quantif y the amount of tetragonal ZrO2 in a mixture of tetragonal and monoclinic ZrO2. 1000 500 0 45 50 55 60 65 Two-Theta (deg)
  • 47. Materials Characterization Lab www.mri.psu.edu/mcl Quantitative Analysis – RIR Method Jade’s “Easy QUANT”
  • 48. Materials Characterization Lab www.mri.psu.edu/mcl How to Get Started
  • 49. Materials Characterization Lab www.mri.psu.edu/mcl Environmental Health and Safety X-ray safety training course http://www.ehs.psu.edu/radprot/x-ray_safety_training.cfm
  • 50. Materials Characterization Lab www.mri.psu.edu/mcl Dosimetry • Worn on the wrist closest to the x-ray source (varies by instrument) – issued once each quarter Thin strip of specially formulated aluminum oxide (Al2O3) crystalline material. During analysis, the Al2O3 strip is stimulated with selected frequencies of laser light causing it to luminesce in proportion to the amount of radiation exposure.
  • 51. Materials Characterization Lab www.mri.psu.edu/mcl Who Do I Contact to use X-ray Diffraction Equipment at PSU?
  • 52. Materials Characterization Lab www.mri.psu.edu/mcl MCL Contacts (For equipment in the MRL building) Nichole Wonderling nmw10@psu.edu 159 MRL Building 863-1369 (For equipment in Hosler and MRI buildings) Mark Angelone John Cantolina msa3@psu.edu jjc16@psu.edu 310 Hosler Building 310 Hosler Building 883-9350 883-8358
  • 53. Materials Characterization Lab www.mri.psu.edu/mcl Sample Preparation
  • 54. Materials Characterization Lab www.mri.psu.edu/mcl In Search of the Elusive “Perfect” Powder Sample • A “Representative” sample
  • 55. Materials Characterization Lab www.mri.psu.edu/mcl The Elusive “Perfect” Powder Sample How do I get a “representative” sample?
  • 56. Materials Characterization Lab www.mri.psu.edu/mcl The Elusive “Perfect” Powder Sample • A “Representative” sample • Sufficient number of crystallites Particle Size POWDER ?
  • 57. Materials Characterization Lab www.mri.psu.edu/mcl Make mine a powder…… You may be lucky and have one of these…….. Or maybe a SPEX Shatterbox You have… the XRD’s Best friend……… The trusty mortar and Picture of SPEX Shatterbox from Georgia State, Geology dept. web site http://www2.gsu.edu/~wwwgeo/pages_03/lab/xRayFluorescence.htm pestle.
  • 58. Materials Characterization Lab www.mri.psu.edu/mcl The Elusive “Perfect” Powder Sample Particle Size < 325 mesh or < 400 mesh (38-44 micron) – for Qualitative Work 10 micron or less for Quantitative Work – very difficult if not Somehow…….it needs to impossible by hand! go through here!
  • 59. Materials Characterization Lab www.mri.psu.edu/mcl The Elusive “Perfect” Powder Sample • A “Representative” sample • Sufficient number of crystallites Particle Size • Total randomness of the crystallite orientations How the Sample is Introduced to the Instrument
  • 60. Materials Characterization Lab www.mri.psu.edu/mcl Zero Background Holders (ZBH) Flat Silicon ZBH Quartz ZBH with cavity Cut parallel to Si (510) Cut 6 º from (0001) Si (511) – also available, but has peak at 96ºθ See www.gemdugout.com for additional information
  • 61. Materials Characterization Lab www.mri.psu.edu/mcl Flat Quartz ZBH Vaseline Mount Smear Mount
  • 62. Materials Characterization Lab www.mri.psu.edu/mcl Back Filled Sample Holder
  • 63. Materials Characterization Lab www.mri.psu.edu/mcl Side Drift Mount Disassembled Assembled Designed to reduce preferred orientation – great for clay samples, (and others with peaks at low 2-theta angles)
  • 64. Materials Characterization Lab www.mri.psu.edu/mcl The Elusive “Perfect” Powder Sample • A “Representative” sample • Sufficient number of crystallites Particle Size • Total randomness of the crystallite orientations How the Sample is Introduced to the Instrument • Sufficient intensity – limit of detection ~5% Enough sample area presented to the beam and enough of the phase of interest present
  • 65. Materials Characterization Lab www.mri.psu.edu/mcl “Real World” Samples Some things can’t practically be powders: Hope diamond films pellets crystals mineral specimens There are techniques available to deal with many of these – ask! galena
  • 66. Materials Characterization Lab www.mri.psu.edu/mcl Plastic box - Shimmed Pellet Pellet Mount Mount
  • 67. Materials Characterization Lab www.mri.psu.edu/mcl Campus and Other Resources
  • 68. Materials Characterization Lab www.mri.psu.edu/mcl Courses • MATSE 430 Materials Characterization – Fall semester only, 3 credit course, instructor Elizabeth Dickey Books “Elements of X-ray Diffraction,” Cullity and Stock “Introduction to X-ray Powder Diffractometry,” Jenkins and Snyder “Fundamentals of Powder Diffraction and Structural Characterization of Materials,” Pecharsky and Vitalij “A Practical Guide for the Preparation of Specimens for X-ray Fluorescence and X-ray Diffraction Analysis,” Buhrke, Jenkins, Smith
  • 69. Materials Characterization Lab www.mri.psu.edu/mcl Journals “Powder Diffraction” “Acta Crystallographica” “Zeitschrift für Kristalographie” On-line http://www.ccp14.ac.uk/ http://www.icdd.com/
  • 70. Materials Characterization Lab www.mri.psu.edu/mcl Faculty Experts at PSU • Elizabeth Dickey, 195 MRI • Peter Heaney, 309 Deike Building • Gerald Johnson, Jr.; Prof. Emeritus, 153 MRL • Earl Ryba, 304B Steidle Building • Barry Scheetz, 107 MRL
  • 71. Materials Characterization Lab www.mri.psu.edu/mcl Lab Tour