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The 60 th  ECTC  Paris Las Vegas, Nevada,  June 1 - 4, 2010 Investigation of Chemical De-burring and Subsequent Plasma Cleaning of Mechanically Punched Micro Via Array Fabricated in LCP Substrate Mohammad K. Chowdhury , 1   Li Sun, 2  Shawn Cunningham, 2  and Ajay P. Malshe 1* 1 Materials and Manufacturing Research Laboratories (MMRL) University of Arkansas, Fayetteville, AR 72701 2 WiSpry Inc., Irvine, CA 92618 * Contact: E-mail: apm2@uark.edu, Tel: (479) 575-6561, Fax: (479) 575-2669 Chowdhury ,   Li Sun, Shawn, and Ajay
Acknowledgements ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Chowdhury ,   Li Sun, Shawn, and Ajay
[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Motivations of the Research: Chowdhury ,   Li Sun, Shawn, and Ajay
How The Punching System Works? Chowdhury ,   Li Sun, Shawn, and Ajay  µ -Via Fabrication by Mechanical Punching: Die Bushing Pin LCP Copper Copper LCP Copper Copper Before Punching Copper Copper LCP After Punching APS 8718 Automatic Punching System Pacific Trinetics Corporation 6” x 6” Sample Holder Punch Pin Holder & Die Bushing LCP Copper Copper LCP Copper Copper Copper Copper LCP Figure: Uniform and nice via formation
Driver Applications: Chowdhury ,   Li Sun, Shawn, and Ajay  Ref:http://www.mpdigest.com/issue/Articles/2009/june/mmic/Default.asp In MMIC (Microwave Monolithic IC) Ref: http://www.pcdandf.com/cms/magazine/220-2009-issues In 3D Packaging & MCM Module Ref:http://www.cmst.be/projects/img9.jpg In Flexible Electronics Ref: http://www.techwear-weblog.com In Wearable Electronics www.smalltimes.com In RF-MEMS Devices in Cell Phone www.ec.europa.eu – ANASTASIA Project In Satellite and Aerospace Applications
Dealing with the Fabrication Issues Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],[object Object],[object Object],[object Object],Expansion Warpage 50 µm Via, 75 µm Pitch, 10 x 10 Array LCP Burr Bottom Cu Film Bottom Cu Film Copper Burr
Addressing the Issues Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Ref: http://www.emeraldinsight.com/fig/0870220101014.png Ref: http://knol.google.com/k/-/-/2ufdlj2yc019u/u4nyvf/deep-reactive-ion-etching%20(1).jpg
Chemical Etching  Using  Ethanolamine Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],20 wt% EA + 40 wt% KOH + 40 wt% Water @ 85 0 C 3314 Neutralizer (3% H 2 SO 4  + 3% H 2 O 2 ) 1 Min 5 Min 5 Min 10 Min
Chemical Etching  Using  Promoters ,[object Object],[object Object],Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],[object Object],[object Object],Oxidation of the LCP burr by 20 –  40% NaMnO4  Etching of the LCP burr by < 30% NaOH  5 Minutes Neuratilzation by  (3% H 2 SO 4  + 3% H 2 O 2 )
Chemical Etching  Using Promoters Chowdhury ,   Li Sun, Shawn, and Ajay  75 µm Via, 187.5 µm Pitch, 10 x 10 Array PROMOTER   3308A (20 – 40 % NaMnO 4 ) @ 85 0 C PROMOTER 3308B (NaOH < 30%) @ 85 0 C 3314 Neutralizer  (3% H 2 SO 4  + 3% H 2 O 2 ) 5 Min 1 Min 5 Min 5 Min 10 Min 15 Min PROMOTER   3308A (20 – 40 % NaMnO 4 ) @ 85 0 C PROMOTER 3308B (NaOH < 30%) @ 85 0 C 3314 Neutralizer (3% H 2 SO 4  + 3% H 2 O 2 ) 1 Min 5 Min 5 Min 5 Min 10 Min 15 Min PROMOTER   3308A (20 – 40 % NaMnO 4 ) @ 85 0 C PROMOTER 3308B (NaOH < 30%) @ 85 0 C 3314 Neutralizer  (3% H 2 SO 4  + 3% H 2 O 2 ) 5 Min 5 Min 1 Min 5 Min 10 Min 15 Min
Chemical Etching  – Process Conditions ,[object Object],[object Object],[object Object],[object Object],[object Object],Chowdhury ,   Li Sun, Shawn, and Ajay
Chemical Etching  Using  Promoters Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],[object Object],[object Object],[object Object]
Chemical Etching  Using  Promoters Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],[object Object],[object Object],[object Object]
Chemical Etching  Using  Promoters Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],Promoter A – 5 min ,  Promoter B – 15 min,  Neutralization – 5 min 200  μ m 50  μ m
Chemical Etching  Using  Promoters Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],Promoter A – 1 min (90 0 C) ,  Promoter B – 5 min, Neutralization – 5 min After 200  μ m 50  μ m Delamination of the bottom Cu film
Issue to Overcome after Chemical Etching Chowdhury ,   Li Sun, Shawn, and Ajay  ,[object Object],Carbonated LCP Debris
O 2  Plasma Cleaning of LCP Debris ,[object Object],[object Object],[object Object],[object Object],Chowdhury ,   Li Sun, Shawn, and Ajay
05 minute oxygen  plasma cleaning Chowdhury ,   Li Sun, Shawn, and Ajay  O 2  Plasma Cleaning after Chemical Etching ,[object Object],After After Before Before LCP precipitation
Chowdhury ,   Li Sun, Shawn, and Ajay  15 minute oxygen  plasma cleaning O 2  Plasma Cleaning after Chemical Etching ,[object Object],After After Before Before
Chowdhury ,   Li Sun, Shawn, and Ajay  O 2  Plasma Cleaning after Chemical Etching 30 minute oxygen  plasma cleaning ,[object Object],After After Before Before LCP Precipitation Copper Etching
Chowdhury ,   Li Sun, Shawn, and Ajay  30 minute oxygen  plasma cleaning O 2  Plasma Cleaning after Chemical Etching ,[object Object],Bottom Copper Layer
Chowdhury ,   Li Sun, Shawn, and Ajay  O 2  Plasma Cleaning  Without Chemical Etching ,[object Object],5 min 5 min 15 min 15 min 30 min 30 min
Summary of  µ- Via fabrication Micro via fabrication by mechanical punching 5 Minutes Oxidation of the LCP burr by 20 –  40% NaMnO4  Chowdhury ,   Li Sun, Shawn, and Ajay  5 Minutes Etching of the LCP burr by < 30% NaOH  5 Minutes Neuratilzation by  (3% H 2 SO 4  + 3% H 2 O 2 )   30 Minutes oxygen plasma cleaning with 125 watt power at 320 mili torr pressure with 160 sccm of oxygen flow
Conclusions ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],Chowdhury ,   Li Sun, Shawn, and Ajay
[object Object],Chowdhury ,   Li Sun, Shawn, and Ajay

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60th Ectc Presentation Chowdhury, Mohammad Kamruzzaman

  • 1. The 60 th ECTC Paris Las Vegas, Nevada, June 1 - 4, 2010 Investigation of Chemical De-burring and Subsequent Plasma Cleaning of Mechanically Punched Micro Via Array Fabricated in LCP Substrate Mohammad K. Chowdhury , 1 Li Sun, 2 Shawn Cunningham, 2 and Ajay P. Malshe 1* 1 Materials and Manufacturing Research Laboratories (MMRL) University of Arkansas, Fayetteville, AR 72701 2 WiSpry Inc., Irvine, CA 92618 * Contact: E-mail: apm2@uark.edu, Tel: (479) 575-6561, Fax: (479) 575-2669 Chowdhury , Li Sun, Shawn, and Ajay
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  • 4. How The Punching System Works? Chowdhury , Li Sun, Shawn, and Ajay µ -Via Fabrication by Mechanical Punching: Die Bushing Pin LCP Copper Copper LCP Copper Copper Before Punching Copper Copper LCP After Punching APS 8718 Automatic Punching System Pacific Trinetics Corporation 6” x 6” Sample Holder Punch Pin Holder & Die Bushing LCP Copper Copper LCP Copper Copper Copper Copper LCP Figure: Uniform and nice via formation
  • 5. Driver Applications: Chowdhury , Li Sun, Shawn, and Ajay Ref:http://www.mpdigest.com/issue/Articles/2009/june/mmic/Default.asp In MMIC (Microwave Monolithic IC) Ref: http://www.pcdandf.com/cms/magazine/220-2009-issues In 3D Packaging & MCM Module Ref:http://www.cmst.be/projects/img9.jpg In Flexible Electronics Ref: http://www.techwear-weblog.com In Wearable Electronics www.smalltimes.com In RF-MEMS Devices in Cell Phone www.ec.europa.eu – ANASTASIA Project In Satellite and Aerospace Applications
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  • 10. Chemical Etching Using Promoters Chowdhury , Li Sun, Shawn, and Ajay 75 µm Via, 187.5 µm Pitch, 10 x 10 Array PROMOTER 3308A (20 – 40 % NaMnO 4 ) @ 85 0 C PROMOTER 3308B (NaOH < 30%) @ 85 0 C 3314 Neutralizer (3% H 2 SO 4 + 3% H 2 O 2 ) 5 Min 1 Min 5 Min 5 Min 10 Min 15 Min PROMOTER 3308A (20 – 40 % NaMnO 4 ) @ 85 0 C PROMOTER 3308B (NaOH < 30%) @ 85 0 C 3314 Neutralizer (3% H 2 SO 4 + 3% H 2 O 2 ) 1 Min 5 Min 5 Min 5 Min 10 Min 15 Min PROMOTER 3308A (20 – 40 % NaMnO 4 ) @ 85 0 C PROMOTER 3308B (NaOH < 30%) @ 85 0 C 3314 Neutralizer (3% H 2 SO 4 + 3% H 2 O 2 ) 5 Min 5 Min 1 Min 5 Min 10 Min 15 Min
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  • 23. Summary of µ- Via fabrication Micro via fabrication by mechanical punching 5 Minutes Oxidation of the LCP burr by 20 – 40% NaMnO4 Chowdhury , Li Sun, Shawn, and Ajay 5 Minutes Etching of the LCP burr by < 30% NaOH 5 Minutes Neuratilzation by (3% H 2 SO 4 + 3% H 2 O 2 ) 30 Minutes oxygen plasma cleaning with 125 watt power at 320 mili torr pressure with 160 sccm of oxygen flow
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