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DataView


           Excellence




             through
Experience, Execution and Integrity
DataView




DataView
DataView



DataView is a fast, easy-to-use data
analysis tool for evaluating
semiconductor test data.



                In addition to generating reports,
                DataView allows you to easily
                navigate your data and understand
                process performance.


                               DataView is ideal for test or product
                               engineers who need a quick, powerful,
                               and intuitive tool for analyzing
                               production and characterization data.
DataView




Whether you are developing a
new test program, optimizing an
existing program, or evaluating
characterization data, DataView
allows you to visualize what’s
happening with your data.
DataView




DataView is a powerful, easy-to-use
data processor geared for the busy
Test Engineer.
DataView helps to quickly identify test
issues such as site-to-site variation,
current/voltage range problems,
repeatability/reproducibility issues,
problematic tests, data integrity issues
and more.
DataView


 DataView: Process View

 View all Data File Information such as total device
  records, passing & failing record count, unique
  device ids, active test sites, lot id, part type, and
  more.
 Test Data Info and Warnings - identify possible
  duplicate test numbers, inconsistencies with test
  limits, names and units, tests with no limits, alarms,
  zero standard deviations and low Cpks.
 View average test time information as well as lot
  processing statistics.
DataView
DataView


 DataView: Record View

 Group devices from any file, by site, wafer, etc. into analysis
  DataSets.
 View the high-level test information for all device test
  records, such as Device ID, Pass/Fail status, Site, Soft and
  Hard Bin, and DataSet.
 Easily exclude or include test records for analysis.
 Select test records by file, bin, pass/fail status, site or pick
  and choose test records individually.
 One click removal of all failing devices or retested devices.
 Identify soft and hard bin types, counts, and percentages.
 Double-click on any record to see the detailed test results in
  the Table View.
DataView
DataView


 DataView: Table View
   Provides a spreadsheet view of all test data.
   View the statistics and/or test values for each test.
   View the individual test record for any device.
   View the stats and/or values for all test data, by site, by wafer, or by
    defined DataSet.
   Sort the table by any column, hide tests and columns.
   Quickly produce an Excel spreadsheet of any Table View or select
    multiple spreadsheets for saving into a report.
   Compare individual device test records and compare any DataSet
    to another set (Site to Site, Site to All, Wafer to DataSet, etc…).
   Select and copy/paste any subset of values to/from the Table View
    to Excel, text file, email, etc.
   Select tests from Table View for quick generation of Histograms into
    a report.
   Double-click on any test to jump to the histogram in the Histo View.
DataView
DataView




 Data View: Bin View

 View soft or hard bin paretos for all test data, by site,
  wafer or any defined DataSet.
 Compare different paretos by site, wafer, or defined
  DataSet.
 Save the bin paretos to file for easy insertion into an
  email or select multiple paretos for saving into a
  report.
 View and sort all bins by count, percentage, and bin
  number.
DataView
DataView



 DataView: Bin View
 High quality wafermaps for each wafer.
 View wafermaps by soft or hard test bins.
 View soft/hard binning information for each wafer
  directly within each wafermap.
 Easily identify any retested die.
 Hover the mouse over any die to see the X-Y
  coordinates, binning and site information.
 Double-click on any die and jump to the device test
  record in the Table View.
DataView
DataView


 DataView: Histo View
 Produce high-quality Histograms for all parametric
  data.
 Adjustable X-axis scale and histogram bins for
  optimum viewing.
 Detailed test data and statistics are provided in the
  Histo View.
 View histograms for multiple sites, wafers, or
  DataSets in the same image.
 Quickly produce an image file for insertion into an
  email or select multiple images for saving into a
  report.
 Hover over any histogram bin to see the value, bin
  number, bin count, and site/wafer/DataSet info.
DataView
DataView




 DataView: Trend View

 Produce high-quality Trend Charts for all
  parametric data.
 Adjustable Y-axis scale and X-axis zoom
  capabilities allow for optimum viewing.
 View multiple sites, wafers, and DataSets in the
  same chart.
 Double-click on any data point to view the test
  record for that device in Table View.
DataView
DataView



DataView: Reports and Images

Generate histograms, box plots, cumulative density
plots, trend charts, bin paretos, wafer maps,
parametric wafer maps and more.
Generate statistical tables for each site, wafer, process
and custom DataSets or include tables of the raw
values for any DataSet.
Customize reports to include what you consider
important – select tables, graphs, and images as
you analyze your data.
Select desired parameters for each table and graph –
arrange and align items to present data the way
you want it to be seen.
DataView

             Da t a V ie w: R e p o r t s a n d
                         I ma g e s




Histo View             Process View               Wafer View




  Table                  Trend View                Bin View
DataView




For a complete demo on DataView
please let us know and we will be
happy to schedule a full demo with
you.

You can also download a working
demo of DataView from our web
site at http://testspectrum.com.
DataView

For more information on all of our Test Tools please visit our
web site at http://testspectrum.com/home/solutions/tools/

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Data Analysis Tool from Test Spectrum - DataView

  • 1. DataView Excellence through Experience, Execution and Integrity
  • 3. DataView DataView is a fast, easy-to-use data analysis tool for evaluating semiconductor test data. In addition to generating reports, DataView allows you to easily navigate your data and understand process performance. DataView is ideal for test or product engineers who need a quick, powerful, and intuitive tool for analyzing production and characterization data.
  • 4. DataView Whether you are developing a new test program, optimizing an existing program, or evaluating characterization data, DataView allows you to visualize what’s happening with your data.
  • 5. DataView DataView is a powerful, easy-to-use data processor geared for the busy Test Engineer. DataView helps to quickly identify test issues such as site-to-site variation, current/voltage range problems, repeatability/reproducibility issues, problematic tests, data integrity issues and more.
  • 6. DataView  DataView: Process View  View all Data File Information such as total device records, passing & failing record count, unique device ids, active test sites, lot id, part type, and more.  Test Data Info and Warnings - identify possible duplicate test numbers, inconsistencies with test limits, names and units, tests with no limits, alarms, zero standard deviations and low Cpks.  View average test time information as well as lot processing statistics.
  • 8. DataView  DataView: Record View  Group devices from any file, by site, wafer, etc. into analysis DataSets.  View the high-level test information for all device test records, such as Device ID, Pass/Fail status, Site, Soft and Hard Bin, and DataSet.  Easily exclude or include test records for analysis.  Select test records by file, bin, pass/fail status, site or pick and choose test records individually.  One click removal of all failing devices or retested devices.  Identify soft and hard bin types, counts, and percentages.  Double-click on any record to see the detailed test results in the Table View.
  • 10. DataView  DataView: Table View  Provides a spreadsheet view of all test data.  View the statistics and/or test values for each test.  View the individual test record for any device.  View the stats and/or values for all test data, by site, by wafer, or by defined DataSet.  Sort the table by any column, hide tests and columns.  Quickly produce an Excel spreadsheet of any Table View or select multiple spreadsheets for saving into a report.  Compare individual device test records and compare any DataSet to another set (Site to Site, Site to All, Wafer to DataSet, etc…).  Select and copy/paste any subset of values to/from the Table View to Excel, text file, email, etc.  Select tests from Table View for quick generation of Histograms into a report.  Double-click on any test to jump to the histogram in the Histo View.
  • 12. DataView  Data View: Bin View  View soft or hard bin paretos for all test data, by site, wafer or any defined DataSet.  Compare different paretos by site, wafer, or defined DataSet.  Save the bin paretos to file for easy insertion into an email or select multiple paretos for saving into a report.  View and sort all bins by count, percentage, and bin number.
  • 14. DataView  DataView: Bin View  High quality wafermaps for each wafer.  View wafermaps by soft or hard test bins.  View soft/hard binning information for each wafer directly within each wafermap.  Easily identify any retested die.  Hover the mouse over any die to see the X-Y coordinates, binning and site information.  Double-click on any die and jump to the device test record in the Table View.
  • 16. DataView  DataView: Histo View  Produce high-quality Histograms for all parametric data.  Adjustable X-axis scale and histogram bins for optimum viewing.  Detailed test data and statistics are provided in the Histo View.  View histograms for multiple sites, wafers, or DataSets in the same image.  Quickly produce an image file for insertion into an email or select multiple images for saving into a report.  Hover over any histogram bin to see the value, bin number, bin count, and site/wafer/DataSet info.
  • 18. DataView  DataView: Trend View  Produce high-quality Trend Charts for all parametric data.  Adjustable Y-axis scale and X-axis zoom capabilities allow for optimum viewing.  View multiple sites, wafers, and DataSets in the same chart.  Double-click on any data point to view the test record for that device in Table View.
  • 20. DataView DataView: Reports and Images Generate histograms, box plots, cumulative density plots, trend charts, bin paretos, wafer maps, parametric wafer maps and more. Generate statistical tables for each site, wafer, process and custom DataSets or include tables of the raw values for any DataSet. Customize reports to include what you consider important – select tables, graphs, and images as you analyze your data. Select desired parameters for each table and graph – arrange and align items to present data the way you want it to be seen.
  • 21. DataView Da t a V ie w: R e p o r t s a n d I ma g e s Histo View Process View Wafer View Table Trend View Bin View
  • 22. DataView For a complete demo on DataView please let us know and we will be happy to schedule a full demo with you. You can also download a working demo of DataView from our web site at http://testspectrum.com.
  • 23. DataView For more information on all of our Test Tools please visit our web site at http://testspectrum.com/home/solutions/tools/