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Surface Acoustic Wave (SAW)
 Wireless Passive RF Sensor
          Systems
             Donald C. Malocha
 School of Electrical Engineering & Computer
                     Science
         University of Central Florida
           Orlando, Fl. 32816-2450
         dcm@ece.engr.ucf.edu
Univ. of Central Florida SAW
• UCF Center for Acoustoelectronic
  Technology (CAAT) has been actively doing
  SAW and BAW research for over 25 years
• Research includes communication devices
  and systems, new piezoelectric materials, &
  sensors
• Capabilities include SAW/BAW analysis,
  design, mask generation, device fabrication,
  RF testing, and RF system development
• Current group has 8 PhDs and 1 MS
• Graduated 14 PhDs and 38 MS students 2
Research Areas


UCF SAW                                     Design & Analysis



                                   Thin Films
                                                                   Sensors


                                                                                 Device/System




Capabilities
                                                           Center for             Fabrication
                                                            Applied
                                  Processing           Acoustoelectronics
                                                                             Measurement
                                                          Technology

                                       Material                       Modeling
                                    Charaterization

                                                          Synthesis




• Class 100 & 1000 cleanrooms
   – Sub micron mask pattern generator
   – Submicron device capability
   – Extensive photolithography and thin film
• RF Probe stations
• Complete SAW characterization facility
• Extensive software for data analysis and parameter
  extraction
                                                                                                 3
• Extensive RF laboratory for SAW technology
What is a typical SAW Device?
      • A solid state device
            – Converts electrical energy into a mechanical wave on
              a single crystal substrate
            – Provides very complex signal processing in a very
              small volume
      • It is estimated that approximately 4 billion SAW
        devices are produced each year
      Applications:
             Cellular phones and TV (largest
             market)
             Military (Radar, filters, advanced
             systems
             Currently emerging – sensors,
             RFID
University of Central Florida                           4
School of Electrical Engineering and Computer Science
SAW Sensors
• This is a very new and exciting area
• Since SAW devices are sensitive to
  temperature, stress, pressure, liquids,
  viscosity and surface effects, a wide range
  of sensors are possible
Sensor Wish-list
– Passive, Wireless, Coded
– Small, rugged, cheap
– Operate over all temperatures and
  environments
– Measure physical, chemical and biological
  variables
– No cross sensitivity
– Low loss and variable frequency
– Radiation hard for space applications
– Large range to 100’s meters or more
  • SAW sensors meet many of these criteria
SAW Background
•     Solid state acoustoelectronic technology
•     Operates from 10MHz to 3 GHz
•     Fabricated using IC technology
•     Manufactured on piezoelectric substrates
•     Operate from cryogenic to 1000 oC
•     Small, cheap, rugged, high performance
            Quartz Filter
                            SAW packaged filter
2mm                         showing 2 transducers,
                            bus bars, bonding, etc.

              10mm
Applications of SAW Devices
           Military (continued)
                          A Few Examples

Military Applications              Functions Performed
Radar         Pulse Compression    Pulse Expansion and Compression
                                   Filters
ECM Jammers                        Pulse Memory Delay Line


ECCM                               Pulse Shaping, Matched Filters,
                                   Programmable Tapped Delay Lines,
Direct Sequence Spread Spectrum-   Convolvers, Fast Hop Synthesizer

Fast Frequency Hopping-            Fast Hop Synthesizer

Ranging                            Pulse Expansion & Compression
                                   Filters
SAW 7 Bank Active Channelizer




                     From Triquint, Inc.
Applications of SAW Devices
                        A Few Examples

Consumer Applications         Functions Performed

TV                            IF Filter

Cellular Telephones           RF and IF Filters

VCR                           IF Filter & Output Modulator
                              Resonators
CATV Converter                IF Filter, 2nd LO & Output
                              Modulator Resonators
Satellite TV Receiver         IF Filter & Output Modulator
VSB Filter for CATV - Sawtek




Bidirectional Transducer Technology – IF Filter w/
moderate loss; passband shaping and high
selectivity.
Basic Wave Parameters
Waves may be graphed as a function of time or distance. A single frequency
wave will appear as a sine wave in either case. From the distance graph the
wavelength may be determined. From the time graph, the period and frequency
can be obtained. From both together, the wave speed can be determined.

                                   Velocity*time=distance
                                   Velocity=distance/time= !/T


                                     The amplitude of the wave can be
                                     absolute, relative or normalized.
                                     Often the amplitude is normalized
                                     to the wavelength in a mechanical
                                     wave. A=0.1*wavelength
SAW Advantage
SAW Transducer & Reflector
    Degrees of Freedom
• Parameter Degrees of Freedom
  –   Electrode amplitude and/or length
  –   Electrode phase (electrical)
  –   Electrode position (delay)
  –   Instantaneous electrode frequency
• Device Infrastructure Degrees of Freedom
  –   Material Choice
  –   Thin Films on the Substrate
  –   Spatial Diversity on the Substrate
  –   Electrical Networks and Interface
Piezoelectricity
(pie-eezo-e-lec-tri-ci-ty)
SAW Transducer
Surface Wave Particle Displacement
   SAW is trapped within ~ 1 wavelength of surface
Schematic of Apodized SAW Filter




       Quartz Filter

2mm




         10mm
SAW Filter Fabrication Process




                        Trim (if necessary)
                        Dice
                        Clean
                        Final Trim
                        Package
Mask Structure Device
      Features



               LiNbO3 Filter


                               2.5mm




                 10mm
Fabrication – Electrode Widths




                        From: Siemens
RF Probe Station with
Temperature Controlled Chuck
  for SAW Device Testing




                   Top view of chuck
                   assembly with RF
RF Probe and ANA   probes
Response of SAW Reflector Test Structure
                  20_0        20_0            50_ 0              50_0




                                                                                -10
     -20
                                                  Reflector response is         -20                 Direct SAW
     -30                                          a time echo which                                 response
                                                  produces a frequency          -30
                                                                                                                                          Reflector
     -40
                                                  ripple                  s
                                                                          )
                                                                          (12
                                                                                -40                                                       response
)1
S                                                                         B
(2   -50                                                                  d
B                                                                               -50
d
     -60
                       Transducer                                               -60


     -70
                       response                                                 -70


     -80                                                                        -80
                                                                                      0   0.5   1   1.5   2      2.5        3   3.5   4    4.5   5
                                                                                                              Tim e ( µs)

     -90
       62    64   66     68      70      72       74   76   78    80
                                Frequency (MHz)


            Measurement of S21 using a swept frequency provides the required data.
SAW OFC Device Testing
  RF Wafer Probing
         Actual device with RF
         probe
Why Use SAW Sensors and Tags?
• Frequency/time are measured with greatest
  accuracy compared to any other physical
  measurement (10-10 - 10-14).
• External stimuli affects device parameters
  (frequency, phase, amplitude, delay)
• Operate from cryogenic to >1000oC
• Ability to both measure a stimuli and to
  wirelessly, passively transmit information
• Frequency range ~10 MHz – 3 GHz
• Monolithic structure fabricated with current IC
  photolithography techniques, small, rugged
Goals
• Applications: SAW sensors for NASA
  ground, space-flight, and space-
  exploration
• SAW Wireless, Passive, Orthogonal
  Frequency Coded (OFC) Spread
  Spectrum Sensor System
• Multiple sensors (temperature, gas, liquid,
  pressure, other) in a single platform
• Operation up to 50 meters at ~ 1 GHz
• Ultra-wide band operation
University of Central Florida School of Electrical Engineering and Computer Science   26
SAW OFC Properties
• Extremely robust
     • Operating temperature range: cryogenic to ~1000 oC
     • Radiation hard, solid state
• Wireless and passive (NO BATTERIES)
• Coding and spread spectrum embodiments
     • Security in coding; reduced fading effects
     • Multi-sensors or tags can be interrogated
• Wide range of sensors in a single platform
  • Temperature, pressure, liquid, gas, etc.
• Integration of external sensor

                      University of Central Florida
                     School of Electrical Engineering       27
                        and Computer Science
Basic Passive Wireless SAW
             System
                                                       Interrogator                         Sensor 1

                                               Clock

                                                   Post Processor
                                                                                 Sensor 3




                                                                      Sensor 2



Goals:
•Interroga-on
distance:
1
–
50
meters
    •
low
loss
OFC
sensor/tag
(<6dB)
•#
of
devices:

10’s
–
100’s

‐

coded
and
dis-nguishable
at
TxRx
•Space
applica-ons
–
rad
hard,
wide
temp.,
etc.
•Single
plaPorm
and
TxRx
for
differing
sensor
combina-ons
    •Sensor
#1
Gas,

Sensor
#2
Temp,

Sensor
#3
Pressure
                                                                                                       28
     University of Central Florida School of Electrical Engineering and Computer Science
Multi-Sensor TAG Approaches
 • Silicon RFID – integrated or external sensors
    – Requires battery, energy scavenging, or transmit
      power
    – Radiation sensitive
    – Limited operating temperature & environments
• SAW RFID Tags - integrated or external sensors
  – Passive – powered by interrogation signal
  – Radiation hard
  – Operational temperatures ~ 0 - 500+ K
     • Single frequency (no coding, low loss, jamming)
     • CDMA( coding, 40-50 dB loss, code collision)
     • OFC( coding, 3-20 dB loss, code collision solutions, wideband)
                                                                        29
SAW Example: Schematic and Actual
        Nano-film H2 OFC Gas Sensor
                                     OFC Sensor Schematic




                                 Actual device with RF
                                 probe




•For palladium hydrogen gas sensor, Pd film is in only in one delay path,
a change in differential delay senses the gas (τ1 = τ2)

University of Central Florida                                      30
School of Electrical Engineering and Computer Science
Schematic of OFC SAW ID Tag
                                                                                                   Example OFC
                                                                                                   Tag
                                                                         f1         f4        f2       f6         f0       f5         f3




)
r                    Piezoelectric Substrate
a
e
n                           1
i
L
(
  0.8
e                         0.5
d
u
t 0.6
i
n                           0
g
a 0.4
M
                          0.5
    0.2


                           1
     0                          0         1          2             3                4              5                   6          7
          0         0.2             0.4        0.6       0.8Normalized Time 1
                                                                            (Chip Lengths)   1.2            1.4             1.6            1.8
                                                           Normalized Frequency
          University of Central                                     31
          Florida
          School of Electrical
          Engineering and
S11 of SAW OFC RFID –
                         Target Reflection
                                                                  f1     f4         f2   f0     f6    f3   f5

                                       SAW
                                       absorber


                 Piezoelectric Substrate

           S11 w/ absorber and w/o reflectors
                                                     OFC Sensor Response
                            0

                        -0.05
                          -0.1
                          -0.1

                   ))     -0.2
                        -0.15
                   BB    -0.2
                   dd    -0.3
                   (( -0.25
                    11 -0.4
                    11 -0.3
                   SS
                        -0.35
                          -0.5
                          -0.4
                          -0.6
                        -0.45

                         -0.5
                         -0.7                                                                                   32
                            100        150         200          250           300         350        400
                                                         Frequency (MHz)
University of Central Florida School of Electrical Engineering and Computer Science
Dual-sided SAW OFC Sensor
            f3   f5     f0      f6     f2    f4       f1                              f1   f4   f2   f6   f0   f5   f3


                                                       !1                   !2


                                                  Piezoelectric Substrate

                                                                 6.75 mm

                      1.25 mm               1.38 mm                         2.94 mm             1.19 mm

            f3 f 5 f 0 f 6 f2 f 4 f1




  2.00 mm
SAW CDMA and OFC Tag Schematics

 CDMA Tag
 •Single frequency
 •Time signal rolloff due to reflected
 energy yielding reduced transmission
 energy
 •Short chips, low reflectivity
       -(typically 40-50 dB IL)


  •OFC Tag
                                                                                                             f1   f4       f2   f6         f0   f5      f3
  •Multi-frequency (7 shown)
  •Long chips, high reflectivity
                                                                              20
  •Orthogonal frequency                                 Piezoelectric Substrate
                                                                        Magnitude (dB)

  reflectors –low loss (0-7dB IL)                                                        30


  •Time signal non-uniformity due                                                        40
  to transducer design rolloff
                                                                                         50
                                                                                                Experimental
University of Central Florida
                                                                                                COM Simulated                                                34
School of Electrical Engineering and Computer Science
                                                                                         60
                                                                                              0.6      0.8             1             1.2         1.4              1.6   1.8


                                                                                                                                                     Time (us)
SAW Velocity vs Temperature
OFC SAW Dual-Sided Temperature
           Sensor

                          f3   f5         f0   f6       f2   f4    f1                         f1   f4       f2   f6         f0   f5    f3


                                                                   !1             !2




Piezoelectric Substrate




                   20
  Magnitude (dB)




                   30



                   40



                   50
                          Experimental
                          COM Simulated
                   60
                        0.6         0.8             1        1.2        1.4           1.6   1.8         2             2.2        2.4

University of Central Florida                                               36
                                                                          Time (us)
Department of Electrical and Computer
Engineering
Temperature Sensor using Differential Delay
             Correlator Embodiment
  Temperature Sensor                              f3      f5   f0   f6   f2   f4   f1        f1   f4   f2   f6   f0   f5   f3



  Example                                                                          !1   !2




250 MHz LiNbO3, 7 chip
                              Piezo electric Sub strate




reflector, OFC SAW sensor
tested using temperature
controlled RF probe station




    University of Central       37
    Florida
    School of Electrical
    Engineering and
OFC Code: Mitigate Code
            Collisions
                                                           Noise-like signal
• Multi-layered coding
  – OFC
  – PN (pseudo noise)
  – TDMA
    (time division multiple access)
     • (-1,0,1 coding)
  – FDMA
    (frequency division multiple access)   32 OFC codes simultaneously
                                           received at antenna:
                                           non-optimized
Effect of Code Collisions from Multiple SAW
           RFID Tags -Simulation
                                                   Due 3rdasynchronous nature of passive tags,
                                                        to Bit
                       10                          the random summation of multiple correlated
                                                   tags can produce false correlation peaks and
Normalized Amplitude




                                                               erroneous information


                        0




                       10
                            0         1       2       3       4        5         6        7           8

                                           Time Normalized to a Chip Length
                                Optimal Correlation Output
                                Actual Recevied Correlation Output

                University of Central Florida School of Electrical Engineering and Computer Science       39
OFC Coding
      • Time division diversity (TDD): Extend the
        possible number of chips and allow +1, 0, -1
        amplitude
            – # of codes increases dramatically, M>N chips, >2M*N!
            – Reduced code collisions in multi-device environment
                                                                    Sensor #1




                                                                                Time Response
                                                           2
                                    Normalized Amplitude




                                                           1


                                                           0


                                                       !1


                                                       !2
                                                               0                     5                    10

                                                                         Time Normalized to Chip Length
University of Central Florida                                                                                  40
School of Electrical Engineering and Computer Science
456 MHZ SAW OFC TDD Coding
          -55                                                                    Simulation
                                                                                 Experiment
          -60

          -65

          -70
 )
 B        -75
 d
 (        -80
     1
     1
 s        -85

          -90

          -95

         -100

         -105
                      1.5              2              2.5                3              3.5
                                                 Time (µs)

A 456 MHz, dual sided, 5 chip, tag COM-predicted and measured time
responses illustrating OFC-PN-TDD coding. Chip amplitude variations are
primarily due to polarity weighted transducer effect and fabrication variation.
                                                                                                      41
                University of Central Florida School of Electrical Engineering and Computer Science
OFC FDM Coding
• Frequency division multiplexing: System uses N-frequencies
  but any device uses M < N frequencies
    – System bandwidth is N*Bwchip
    – OFC Device is M*BWchip
          • Narrower fractional bandwidth
          • Lower transducer loss
          • Smaller antenna bandwidth

                                 Sensor #1




                                 Sensor #2




University of Central Florida                             42
School of Electrical Engineering and Computer Science
32 Sensor Code Set - TDD
Receiver Antenna Input               Receiver Correlation




                         Not
                         Optimized




                         Optimized




                                                       43
Chirp Interrogation Synchronous
 Transceiver- Software Radio
            Approach

                                                SAW
                                               sensor
                            SAW down-                                                      SAW up-
                             chirp filter                                                 chirp filter




                                                IF Oscillator



                                IF Filter


                                                                          RF Oscillator
                         A/ D




                                            Digital control and analysis circuitry
University of Central Florida                                                                            44
Department of Electrical and Computer Engineering
250 MHz OFC TxRx Demo
                  System
     Synchronous TxRx SAW OFC correlator prototype
     system       RF
                           clock                                    ADC &
                           section                                  Post
                                                                    processor
                                                                    output




                            Digital
                            section

                                              Wireless 250 MHz SAW OFC
                                              temperature test using a free running
                                              hot plate. The red dashed curve is a
                                              TC and the solid blue curve is the
                                              SAW extracted temperature.
University of Central Florida School of                                         45
Electrical Engineering and Computer Science
WIRELESS SAW
                TEMPERATURE SENSOR
                  DEMONSTRATION
                                                                           Post
                                                                           processor
                         25 cm                25 cm
                                                                           output

                5 cm             5 cm
                                                                Receiver
 Interrogator
(Transmitter)
                                   SAW
                                 Sensor/Tag
                                                      Thermal
                  78°C                                Couple
                 Thermal          Hot Plate
                 Controller




Real-time wireless 250 MHz SAW OFC temperature
test using a free running hot plate. The red dashed
curve is a TC and the solid blue curve is the SAW
extracted temperature.
                                                                     46
915 MHz Transceiver System
Packaged 915 MHz SAW OFC temperature
 sensor and antenna used on sensors and
 transceiver.
•   Principle of operation of the adaptive matched OFC ideal filter response to
    maximize the correlation waveform and extract the SAW sensor
    temperature.
250 MHz Wireless OFC SAW System 1st Pass

                           50 cm                50 cm




                                                                             An       initial    OFC     SAW
 Interrogator
(Transmitter )
                 30 cm             30 cm
                                                                  Receiver        temperature sensor data
                                      SAW
                                   Sensor /Tag
                                                        Thermal
                                                                                  run on a free running
                   78°C
                  Thermal
                  Controller
                                    Hot Plate
                                                        Couple
                                                                                  hotplate from an initial 250
                                                                                  MHz transceiver system.
                                                                                  The system used 5 chips
                                                                                  and a fractional bandwidth
                                                                                  of approximately 19%. The
                                                                                  upper       curve   is     a
                                                                                  thermocouple reading and
                                                                                  the jagged curve is the
                                                                                  SAW temperature extracted
                                                                                  data   .
250 MHz Wireless OFC SAW System - 2nd Pass

                           50 cm                50 cm




                 30 cm             30 cm
                                                                  Receiver
 Interrogator
(Transmitter )

                                                                             A final OFC SAW temperature sensor data
                                      SAW
                                   Sensor /Tag
                                                        Thermal
                   78°C
                  Thermal
                  Controller
                                    Hot Plate
                                                        Couple
                                                                                run on a free running hotplate from an
                                                                                improved 250 MHz transceiver system.
                                                                                The system used 5 chips and a
                                                                                fractional bandwidth of approximately
                                                                                19%. The dashed curve is a
                                                                                thermocouple reading and the solid
                                                                                curve is the SAW temperature
                                                                                extracted data. The SAW sensor is
                                                                                tracking the thermocouple very well;
                                                                                the slight offset is probably due to the
                                                                                position and conductivity of the
                                                                                thermocouple.
915 MHz Sensor System - 1st Pass




Initial results of the 915 MHz SAW OFC temperature sensor transceiver system. Four
     OFC SAW sensors are co-located in close range to each other; two are at room
     temperature and one is at +62◦C and another at -38◦C. Data was taken
     simultaneously from all four sensors and then temperature extracted in the correlator
     receiver software.
UCF OFC Sensor
     Successful Demonstrations
• Temperature sensing
  – Cryogenic: liquid nitrogen
  – Room temperature to 250oC
  – Currently working on sensor for operation to
    750oC
• Cryogenic liquid level sensor: liquid
  nitrogen
• Pressure/Strain sensor
• Hydrogen gas sensor
Temperature Sensor Results
                                       Temperature Sensor Results
           200
       (
           180
       e
       r   160
       u   140
       )
       t
       C
       a
       °   120
       r
       e   100

       p   80
       m
       e   60
       T
           40
                                                                                LiNbO3 SAW Sensor
           20
                                                                                Thermocouple
            0
                 0     20   40    60      80       100      120     140   160           180         200
                                               Time (min)




•   250 MHz LiNbO3, 7 chip reflector,
    OFC SAW sensor tested using
    temperature controlled RF probe
    station
•   Temp range: 25-200oC
•   Results applied to simulated
    transceiver and compared with
    thermocouple measurements

University of Central Florida                                                             54
School of Electrical Engineering and Computer Science
OFC Cryogenic Sensor Results
                                                              50
                                                                                                            Thermocouple
                                                                                                            LiNbO 3 SAW Sensor



                         Scale
                                                               0




               Vertical: +50 to -200   oC               (
                                                        e
                                                        r
                                                        u
                                                        )
           Horizontal: Relative time (min)
                                                             -50
                                                        t
                                                        C
                                                        °
                                                        a
                                                        r
                                                        e
                                                        p
                                                        m   -100
                                                        e
                                                        T


 OFC SAW temperature                                        -150




sensor results and
comparison with                                             -200
                                                                   0   5   10
                                                                                Time (min)
                                                                                             15        20                        25




thermocouple
measurements at cryogenic                                                                     Measurement
temperatures. Temperature                                                                     system with
scale is between +50 to -200                                                                  liquid
oC and horizontal scale is                                                                    nitrogen
                                                                                              Dewar and
relative time in minutes.                                                                     vacuum
                                                                                              chamber for
                                                                                              DUT
University of Central Florida
School of Electrical Engineering and Computer Science                                             55
Schematic and Actual OFC Gas Sensor
                                   OFC Sensor Schematic




                               Actual device with RF
                               probe




•For palladium hydrogen gas sensor, Pd film is in only in one delay path, a
change in differential delay senses the gas (τ1 = τ2) (in progress)

  University of Central Florida                                   56
  School of Electrical Engineering and Computer
  Science
Palladium Background Information
•   The bulk of PD research has
    been performed for Pd in the
    100-10000 Angstrom thickness
•   Morphology of ultra-thin films of                   Without H2
    Pd are dependent on substrate




                                                     CONTACT




                                                                     CONTACT
    conditions, deposition and many
    other parameters
•   Pd absorbs H2 gas which causes
    lattice expansion of the Pd film –
    called Hydrogen Induced Lattice
    Expansion (HILE) – Resistivity
    reduces
•   Pd absorbs H2 gas which causes
    palladium hydride formation –                          With H2
    Resistivity increases




                                                     CONTACT




                                                                     CONTACT
•   Examine these effects for ultra-
    thin films (<5nm) on SAW
    devices
                          HILE - Each small circle
                          represents a nano-sized
                            cluster of Pd atoms

                                                                               57
Measured E-Beam Evaporated Palladium
    Conductivity v Film Thickness



                         σinf = 9.5·104 S/cm




                Conductivity
                measurements made in-situ
                under vacuum




                                               58
Ultra-thin Pd on SAW Devices
    for Hydrogen Gas Sensing

• Pd is known to be very sensitive to hydrogen gas
•Due to the SAW AE interaction with resistive films and
the potentially large change in Pd resistivity, a sensitive
SAW hydrogen sensor is possible
•Experimental investigation of the SAW-Pd-H2 interaction




                                                          59
Pd Films on SAW Devices
              Schematic of Test Conditions
• Control: SAW delay line on YZ
  LiNbO3 wafers w/ 2
  transducers and reflector w/o
  Pd film
• Center frequency 123 MHz
                                   1.27 mm


• (A) SAW delay line w/ Pd in




                                   Pd Film
  propagation path between                             (A)

  transducer and reflector

                                             Pd Film

• (B) SAW delay line w/ Pd on                          (B)
  reflector only
                                                             60
Test Conditions and Measurement

                                                                                S21 Time Response
• S21 time domain                                    0
                                                     4                          SAW Main
                                                     8
                                                                                                              Reflector
  measurement of SAW                                12
                                                    16
                                                    20




                        Normalized Magnitude (dB)
  delay line                                        24
                                                    28
                                                    32
                                                                                           TTE

   – Main response
                                                    36
                                                    40
                                                    44
                                                    48


   – TTE                                            52
                                                    56
                                                    60
                                                    64

   – Reflector return                               68
                                                    72
                                                    76


     response                                       80
                                                         0    0.25    0.5     0.75     1     1.25       1.5   1.75   2        2.25

                                                                                 Time (micro-seconds)
                                                             DL w/o Pd
                                                             Before Exp                                              Pd Film
                                                             During 1st Exp
                                                             After 1st Exp
                                                             During 2nd Exp
                                                             After 2nd Exp
                                                             During 3rd Exp
                                                             After 3rd Exp
                                                             During 4th Exp
                                                                                                                         61
                                                             After 4th Exp
SAW Propagation Loss and Reflectivity
         Pd Film ~ 15 Ang. (prior to H2)
                                                                                      No
•   S21 time domain comparison of                                                     Pd            S21 Time Response
    delay line with Pd in propagation                                  20
                                                                       23

    path vs. on the reflector
                                                                       26
                                                                       29
                                                                       32
•   Greater loss when Pd is placed in                                  35




                                           Normalized Magnitude (dB)
                                                                       38                                                 Pd Film
    propagation path than in the                                       41
                                                                       44

    reflector                                                          47
                                                                       50

     – ~7dB loss when Pd is on
                                                                       53




                                                                                                            Pd Film
                                                                       56
                                                                       59
        reflector                                                      62
                                                                       65
        •   reflector length 1.47 mm                                   68
                                                                       71
    – ~22dB loss when Pd is in                                         74
                                                                       77

      propagation path                                                 80
                                                                         1.7   1.75    1.8   1.85   1.9   1.95        2      2.05        2.1   2.15    2.2   2.25

        • 1.27 mm one-way path length                                                               Time (micro-seconds)
                                                                               DL w/o Pd
        • Propagation loss ~75dB/cm loss                                       DL w/ Pd In Delay Path
                                                                               DL w/ Pd on Reflector Bank
                                                                                                                                     m
                                                                                                                      v fs := 3488
                                                                                                                                     s
                                                                                                                                                      62
SAW Device
 Pd in Propagation Path w/ 2% H2 Exposure
• Close-up of reflector bank                                                               S21 Time Response
  S21 time domain response.                                    20
                                                               23


• A comparison of the traces                                   26
                                                               29


  labeled “DL w/o Pd” and”
                                                               32
                                                               35




                                   Normalized Magnitude (dB)
                                                               38

  Before Exp” shows a                                          41
                                                               44

  change in reflectivity due to                                47
                                                               50

  the presence of the Pd film.                                 53
                                                               56
                                                               59

• A gradual reduction in                                       62
                                                               65

  propagation loss with                                        68
                                                               71

  increased H2 exposure.                                       74
                                                               77


   – Irreversible change
                                                               80
                                                                 1.7   1.75   1.8   1.85   1.9   1.95   2    2.05   2.1         2.15   2.2   2.25

                                                                                           Time (micro-seconds)
   – ~ 20 dB reduction in                                              DL w/o Pd

     loss
                                                                       Before Exp




                                                                                                                      Pd Film
                                                                       During 1st Exp
                                                                       After 1st Exp
      • Minimum propagation                                            During 2nd Exp

        loss ~6.8 dB/cm                                                After 2nd Exp
                                                                       During 3rd Exp
                                                                       After 3rd Exp
                                                                       During 4th Exp
                                                                       After 4th Exp
                              63
SAW Device
       Pd on Reflector w/ 2% H2 Exposure
                                                                                               S21 Time Response
•   Close-up of reflector bank                                      0

    S21 time domain response.                                       4
                                                                    8
                                                                   12
•   A comparison of the traces                                     16
                                                                   20




                                       Normalized Magnitude (dB)
    labeled “DL w/o Pd” and”                                       24
                                                                   28

    Before Exp” shows a change                                     32
                                                                   36

    in delay as well as reflectivity                               40
                                                                   44
                                                                   48
    due to the presence of the                                     52
                                                                   56
    Pd film.                                                       60
                                                                   64

•   A gradual increase in                                          68
                                                                   72
                                                                   76
    reflectivity with each                                         80
                                                                     1.7   1.75   1.8   1.85   1.9   1.95   2    2.05   2.1   2.15    2.2   2.25

    exposure to H2 gas is                                                                      Time (micro-seconds)

    observed                                                               DL w/o Pd
                                                                           Before Exp
                                                                                                                                     Pd Film
                                                                           During 1st Exp
     – ~ 7 dB change in IL                                                 After 1st Exp
                                                                           During 2nd Exp

     – Irreversible                                                        After 2nd Exp
                                                                           During 3rd Exp
                                                                           After 3rd Exp
                                                                           During 4th Exp
                                64                                         After 4th Exp
Nano-Pd Film – 25 Ang.
                                                                                                                                                      20



               Hydrogen Gas
                                                                                                                                                      24
                                                                                                                                                      28




                                                                                                                          Normalized Magnitude (dB)
                                                                                                                                                      32



               Sensor Results:
                                                                                                                                                      36
                                                                                                                                                      40
                                                                                                                                                      44
                                                                                                                                                      48


                 2% H2 gas                                                                                                                            52
                                                                                                                                                      56




                                                                                                                                                                                        Pd F ilm
                                                                                                                                                      60
                                                                                                                                                      64
                                                                                                                                                      68
                                                                                                                                                      72
                     Propagation Loss (dB/cm) and Velocity(m/s) vs. Film Resistivity                                                                  76
               240                                                                        3500
                                                                                                                                                      80

                                                                                                     SAW Velocity (m/s)
               200                                                                        3485
                                                                                                                                                        1.7        1. 8       1.9              2   2.1    2.2
Loss (dB/cm)




               160                                                                        3470

               120                                                                        3455
                                                                                                                                                                            Time (micro-seconds)
               80                                                                         3440                                                                Delay Line w/o Pd         •The change in IL
               40                                                                         3425                                                                After Pd Film             indicates >10x
                0                                                                          3410                                                               During 1st H2 Exp osure
                100
                                             3
                                         1 .10
                                                                            4
                                                                        1 .10          1 .10
                                                                                            5

                                                                                                                                                              After 1s t H2 Exp osure
                                                                                                                                                                                        change in Pd
                                                 Resistivity (ohm-cm)
                                                                                                                                                              During 2nd H2 Exp osure   resistivity – WOW!
                        Loss/cm @ 123 MHz
                                                                                           Pd Film




                                                                                                                                                              After 2n d H2 Exposure
                        Loss/cm due to Pd Film                                                                                                                                          •The large change
                        Loss/cm due to Pd Film After Final H2 Gas Exposure                                                                                    During 3rd H2 Exposure
                        Loss/cm due to successive H2 exposure                                                                                                                           suggests an
                        SAW Velocity                                                                                                                          After 3rd H2 Exposure
                        SAW Velocity due to Pd Film                                                                                                           During 4th H2 Exposure    unexpected change in
                        SAW Velocity due to Pd Film After Final H2 Gas Exposure
                        SAW Velocity due to successive H2 exposure                                                                                            After 4th H2 Exposure     Pd film morphology.

                                                                                                                                                                                                         65
OFC Cantilever Strain Sensor




• Measure Delay
  versus Strain
                                66
OFC Cantilever Strain Sensor




Plot generated by ANSYS demonstrating the
strain distribution along the z-axis of the
crystal.




Test fixture, this   shows the surface mount
package, which        contains the cantilever
device, securely     clamped down onto a PC
board which is       connected to a Network
Analyzer.
Applications
• Current efforts include OFC SAW liquid level,
  hydrogen gas, pressure and temperature sensors
• Multi-sensor spread spectrum systems
• Cryogenic sensing
• High temperature sensing
• Space applications
• Turbine generators
• Harsh environments
• Ultra Wide band (UWB) Communication
   – UWB OFC transducers
• Potentially many others

            School of Electrical Engineering and Computer Science
                                                                    68
Vision for Future
• Multiple access, SAW RFID sensors
• SAW RFID sensor loss approaching 0 dB
  – Unidirectional transducers
  – Low loss reflectors
• New and novel coding approaches using
  OFC-type transducers and reflectors
• Operation in the 1-3 GHz range for small size
• Single platform for various sensors
  (temperature, gas, pressure, etc.)
• SAW sensors in space flight and support
  operations in 2 to 5 years
                                                               69
                    University of Central Florida
       School of Electrical Engineering and Computer Science
NASA Support and
           Collaborations
• NASA support
  – KSC
    • 4 Phase I STTRs and 4 Phase II STTRs: 2005-
      2011
    • Latest STTR Phase II begins this summer
  – JSC
    • 900 MHz device development in 2008
  – Langley
    • GRA OFC sensor funding: 2008-2010


                                                    70
Collaborations
• Micro System Sensors 2005-2006, STTR
• ASR&D, 2007-present, STTR
• Mnemonics, 2007-present, STTR
   – United Space Alliance (USA): 2nd order collaboration
• MtronPTI – 1995-present, STTR
• Triquint Semiconductor -2009
• Vectron -2009 (SenGenuity 2nd order collaboration)
• Univ. of South Florida 2005-present, SAW
  sensors
• Univ. of Puerto Rico Mayaguez – initiating SAW
  sensor activity
                                                            71
SAW Research at UCF
•   Approximately 200 publications and 7 patents
    + (5 pending) on SAW technology
•   Approximately $5M in SAW contracts and
    grants
•   Approximately 50 graduate students
•   Many international collaborations
•   Contracts with industry, DOD and NASA
•   Current efforts on SAW sensors for space
    applications funded by NASA
Current Graduate Research
   Student Contributors
        • Brian Fisher
     • Daniel Gallagher
      • Mark Gallagher
       • Nick Kozlovski
        • Matt Pavlina
      • Luis Rodriguez
         • Mike Roller
     • Nancy Saldanha
Acknowledgment
    •The authors wish to thank continuing support from
    NASA, and especially Dr. Robert Youngquist, NASA-
    KSC.
    •The foundation of this work was funded through
    NASA Graduate Student Research Program
    Fellowships, the University of Central Florida - Florida
    Solar Energy Center (FSEC), and NASA STTR
    contracts.
    •Continuing research is funded through NASA STTR
    contracts and industrial collaboration with Applied
    Sensor Research and Development Corporation, and
    Mnemonics Corp.
                   Thank you for your attention!



University of Central Florida                           74
School of Electrical Engineering and Computer Science
Contact US


                          Contact:
                          Doug Foster
                          Fuentek, LLC

                          (919) 249-0327
                          www.fuentek.com/technologies/SAW.htm




University of Central Florida                                    75
School of Electrical Engineering and Computer Science

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Surface Acoustic Wave (SAW) Wireless Passive RF Sensor Systems

  • 1. Surface Acoustic Wave (SAW) Wireless Passive RF Sensor Systems Donald C. Malocha School of Electrical Engineering & Computer Science University of Central Florida Orlando, Fl. 32816-2450 dcm@ece.engr.ucf.edu
  • 2. Univ. of Central Florida SAW • UCF Center for Acoustoelectronic Technology (CAAT) has been actively doing SAW and BAW research for over 25 years • Research includes communication devices and systems, new piezoelectric materials, & sensors • Capabilities include SAW/BAW analysis, design, mask generation, device fabrication, RF testing, and RF system development • Current group has 8 PhDs and 1 MS • Graduated 14 PhDs and 38 MS students 2
  • 3. Research Areas UCF SAW Design & Analysis Thin Films Sensors Device/System Capabilities Center for Fabrication Applied Processing Acoustoelectronics Measurement Technology Material Modeling Charaterization Synthesis • Class 100 & 1000 cleanrooms – Sub micron mask pattern generator – Submicron device capability – Extensive photolithography and thin film • RF Probe stations • Complete SAW characterization facility • Extensive software for data analysis and parameter extraction 3 • Extensive RF laboratory for SAW technology
  • 4. What is a typical SAW Device? • A solid state device – Converts electrical energy into a mechanical wave on a single crystal substrate – Provides very complex signal processing in a very small volume • It is estimated that approximately 4 billion SAW devices are produced each year Applications: Cellular phones and TV (largest market) Military (Radar, filters, advanced systems Currently emerging – sensors, RFID University of Central Florida 4 School of Electrical Engineering and Computer Science
  • 5. SAW Sensors • This is a very new and exciting area • Since SAW devices are sensitive to temperature, stress, pressure, liquids, viscosity and surface effects, a wide range of sensors are possible
  • 6. Sensor Wish-list – Passive, Wireless, Coded – Small, rugged, cheap – Operate over all temperatures and environments – Measure physical, chemical and biological variables – No cross sensitivity – Low loss and variable frequency – Radiation hard for space applications – Large range to 100’s meters or more • SAW sensors meet many of these criteria
  • 7. SAW Background • Solid state acoustoelectronic technology • Operates from 10MHz to 3 GHz • Fabricated using IC technology • Manufactured on piezoelectric substrates • Operate from cryogenic to 1000 oC • Small, cheap, rugged, high performance Quartz Filter SAW packaged filter 2mm showing 2 transducers, bus bars, bonding, etc. 10mm
  • 8. Applications of SAW Devices Military (continued) A Few Examples Military Applications Functions Performed Radar Pulse Compression Pulse Expansion and Compression Filters ECM Jammers Pulse Memory Delay Line ECCM Pulse Shaping, Matched Filters, Programmable Tapped Delay Lines, Direct Sequence Spread Spectrum- Convolvers, Fast Hop Synthesizer Fast Frequency Hopping- Fast Hop Synthesizer Ranging Pulse Expansion & Compression Filters
  • 9. SAW 7 Bank Active Channelizer From Triquint, Inc.
  • 10. Applications of SAW Devices A Few Examples Consumer Applications Functions Performed TV IF Filter Cellular Telephones RF and IF Filters VCR IF Filter & Output Modulator Resonators CATV Converter IF Filter, 2nd LO & Output Modulator Resonators Satellite TV Receiver IF Filter & Output Modulator
  • 11. VSB Filter for CATV - Sawtek Bidirectional Transducer Technology – IF Filter w/ moderate loss; passband shaping and high selectivity.
  • 12. Basic Wave Parameters Waves may be graphed as a function of time or distance. A single frequency wave will appear as a sine wave in either case. From the distance graph the wavelength may be determined. From the time graph, the period and frequency can be obtained. From both together, the wave speed can be determined. Velocity*time=distance Velocity=distance/time= !/T The amplitude of the wave can be absolute, relative or normalized. Often the amplitude is normalized to the wavelength in a mechanical wave. A=0.1*wavelength
  • 14. SAW Transducer & Reflector Degrees of Freedom • Parameter Degrees of Freedom – Electrode amplitude and/or length – Electrode phase (electrical) – Electrode position (delay) – Instantaneous electrode frequency • Device Infrastructure Degrees of Freedom – Material Choice – Thin Films on the Substrate – Spatial Diversity on the Substrate – Electrical Networks and Interface
  • 17. Surface Wave Particle Displacement SAW is trapped within ~ 1 wavelength of surface
  • 18. Schematic of Apodized SAW Filter Quartz Filter 2mm 10mm
  • 19. SAW Filter Fabrication Process Trim (if necessary) Dice Clean Final Trim Package
  • 20. Mask Structure Device Features LiNbO3 Filter 2.5mm 10mm
  • 21. Fabrication – Electrode Widths From: Siemens
  • 22. RF Probe Station with Temperature Controlled Chuck for SAW Device Testing Top view of chuck assembly with RF RF Probe and ANA probes
  • 23. Response of SAW Reflector Test Structure 20_0 20_0 50_ 0 50_0 -10 -20 Reflector response is -20 Direct SAW -30 a time echo which response produces a frequency -30 Reflector -40 ripple s ) (12 -40 response )1 S B (2 -50 d B -50 d -60 Transducer -60 -70 response -70 -80 -80 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 Tim e ( µs) -90 62 64 66 68 70 72 74 76 78 80 Frequency (MHz) Measurement of S21 using a swept frequency provides the required data.
  • 24. SAW OFC Device Testing RF Wafer Probing Actual device with RF probe
  • 25. Why Use SAW Sensors and Tags? • Frequency/time are measured with greatest accuracy compared to any other physical measurement (10-10 - 10-14). • External stimuli affects device parameters (frequency, phase, amplitude, delay) • Operate from cryogenic to >1000oC • Ability to both measure a stimuli and to wirelessly, passively transmit information • Frequency range ~10 MHz – 3 GHz • Monolithic structure fabricated with current IC photolithography techniques, small, rugged
  • 26. Goals • Applications: SAW sensors for NASA ground, space-flight, and space- exploration • SAW Wireless, Passive, Orthogonal Frequency Coded (OFC) Spread Spectrum Sensor System • Multiple sensors (temperature, gas, liquid, pressure, other) in a single platform • Operation up to 50 meters at ~ 1 GHz • Ultra-wide band operation University of Central Florida School of Electrical Engineering and Computer Science 26
  • 27. SAW OFC Properties • Extremely robust • Operating temperature range: cryogenic to ~1000 oC • Radiation hard, solid state • Wireless and passive (NO BATTERIES) • Coding and spread spectrum embodiments • Security in coding; reduced fading effects • Multi-sensors or tags can be interrogated • Wide range of sensors in a single platform • Temperature, pressure, liquid, gas, etc. • Integration of external sensor University of Central Florida School of Electrical Engineering 27 and Computer Science
  • 28. Basic Passive Wireless SAW System Interrogator Sensor 1 Clock Post Processor Sensor 3 Sensor 2 Goals: •Interroga-on
distance:
1
–
50
meters •
low
loss
OFC
sensor/tag
(<6dB) •#
of
devices:

10’s
–
100’s

‐

coded
and
dis-nguishable
at
TxRx •Space
applica-ons
–
rad
hard,
wide
temp.,
etc. •Single
plaPorm
and
TxRx
for
differing
sensor
combina-ons •Sensor
#1
Gas,

Sensor
#2
Temp,

Sensor
#3
Pressure 28 University of Central Florida School of Electrical Engineering and Computer Science
  • 29. Multi-Sensor TAG Approaches • Silicon RFID – integrated or external sensors – Requires battery, energy scavenging, or transmit power – Radiation sensitive – Limited operating temperature & environments • SAW RFID Tags - integrated or external sensors – Passive – powered by interrogation signal – Radiation hard – Operational temperatures ~ 0 - 500+ K • Single frequency (no coding, low loss, jamming) • CDMA( coding, 40-50 dB loss, code collision) • OFC( coding, 3-20 dB loss, code collision solutions, wideband) 29
  • 30. SAW Example: Schematic and Actual Nano-film H2 OFC Gas Sensor OFC Sensor Schematic Actual device with RF probe •For palladium hydrogen gas sensor, Pd film is in only in one delay path, a change in differential delay senses the gas (τ1 = τ2) University of Central Florida 30 School of Electrical Engineering and Computer Science
  • 31. Schematic of OFC SAW ID Tag Example OFC Tag f1 f4 f2 f6 f0 f5 f3 ) r Piezoelectric Substrate a e n 1 i L ( 0.8 e 0.5 d u t 0.6 i n 0 g a 0.4 M 0.5 0.2 1 0 0 1 2 3 4 5 6 7 0 0.2 0.4 0.6 0.8Normalized Time 1 (Chip Lengths) 1.2 1.4 1.6 1.8 Normalized Frequency University of Central 31 Florida School of Electrical Engineering and
  • 32. S11 of SAW OFC RFID – Target Reflection f1 f4 f2 f0 f6 f3 f5 SAW absorber Piezoelectric Substrate S11 w/ absorber and w/o reflectors OFC Sensor Response 0 -0.05 -0.1 -0.1 )) -0.2 -0.15 BB -0.2 dd -0.3 (( -0.25 11 -0.4 11 -0.3 SS -0.35 -0.5 -0.4 -0.6 -0.45 -0.5 -0.7 32 100 150 200 250 300 350 400 Frequency (MHz) University of Central Florida School of Electrical Engineering and Computer Science
  • 33. Dual-sided SAW OFC Sensor f3 f5 f0 f6 f2 f4 f1 f1 f4 f2 f6 f0 f5 f3 !1 !2 Piezoelectric Substrate 6.75 mm 1.25 mm 1.38 mm 2.94 mm 1.19 mm f3 f 5 f 0 f 6 f2 f 4 f1 2.00 mm
  • 34. SAW CDMA and OFC Tag Schematics CDMA Tag •Single frequency •Time signal rolloff due to reflected energy yielding reduced transmission energy •Short chips, low reflectivity -(typically 40-50 dB IL) •OFC Tag f1 f4 f2 f6 f0 f5 f3 •Multi-frequency (7 shown) •Long chips, high reflectivity 20 •Orthogonal frequency Piezoelectric Substrate Magnitude (dB) reflectors –low loss (0-7dB IL) 30 •Time signal non-uniformity due 40 to transducer design rolloff 50 Experimental University of Central Florida COM Simulated 34 School of Electrical Engineering and Computer Science 60 0.6 0.8 1 1.2 1.4 1.6 1.8 Time (us)
  • 35. SAW Velocity vs Temperature
  • 36. OFC SAW Dual-Sided Temperature Sensor f3 f5 f0 f6 f2 f4 f1 f1 f4 f2 f6 f0 f5 f3 !1 !2 Piezoelectric Substrate 20 Magnitude (dB) 30 40 50 Experimental COM Simulated 60 0.6 0.8 1 1.2 1.4 1.6 1.8 2 2.2 2.4 University of Central Florida 36 Time (us) Department of Electrical and Computer Engineering
  • 37. Temperature Sensor using Differential Delay Correlator Embodiment Temperature Sensor f3 f5 f0 f6 f2 f4 f1 f1 f4 f2 f6 f0 f5 f3 Example !1 !2 250 MHz LiNbO3, 7 chip Piezo electric Sub strate reflector, OFC SAW sensor tested using temperature controlled RF probe station University of Central 37 Florida School of Electrical Engineering and
  • 38. OFC Code: Mitigate Code Collisions Noise-like signal • Multi-layered coding – OFC – PN (pseudo noise) – TDMA (time division multiple access) • (-1,0,1 coding) – FDMA (frequency division multiple access) 32 OFC codes simultaneously received at antenna: non-optimized
  • 39. Effect of Code Collisions from Multiple SAW RFID Tags -Simulation Due 3rdasynchronous nature of passive tags, to Bit 10 the random summation of multiple correlated tags can produce false correlation peaks and Normalized Amplitude erroneous information 0 10 0 1 2 3 4 5 6 7 8 Time Normalized to a Chip Length Optimal Correlation Output Actual Recevied Correlation Output University of Central Florida School of Electrical Engineering and Computer Science 39
  • 40. OFC Coding • Time division diversity (TDD): Extend the possible number of chips and allow +1, 0, -1 amplitude – # of codes increases dramatically, M>N chips, >2M*N! – Reduced code collisions in multi-device environment Sensor #1 Time Response 2 Normalized Amplitude 1 0 !1 !2 0 5 10 Time Normalized to Chip Length University of Central Florida 40 School of Electrical Engineering and Computer Science
  • 41. 456 MHZ SAW OFC TDD Coding -55 Simulation Experiment -60 -65 -70 ) B -75 d ( -80 1 1 s -85 -90 -95 -100 -105 1.5 2 2.5 3 3.5 Time (µs) A 456 MHz, dual sided, 5 chip, tag COM-predicted and measured time responses illustrating OFC-PN-TDD coding. Chip amplitude variations are primarily due to polarity weighted transducer effect and fabrication variation. 41 University of Central Florida School of Electrical Engineering and Computer Science
  • 42. OFC FDM Coding • Frequency division multiplexing: System uses N-frequencies but any device uses M < N frequencies – System bandwidth is N*Bwchip – OFC Device is M*BWchip • Narrower fractional bandwidth • Lower transducer loss • Smaller antenna bandwidth Sensor #1 Sensor #2 University of Central Florida 42 School of Electrical Engineering and Computer Science
  • 43. 32 Sensor Code Set - TDD Receiver Antenna Input Receiver Correlation Not Optimized Optimized 43
  • 44. Chirp Interrogation Synchronous Transceiver- Software Radio Approach SAW sensor SAW down- SAW up- chirp filter chirp filter IF Oscillator IF Filter RF Oscillator A/ D Digital control and analysis circuitry University of Central Florida 44 Department of Electrical and Computer Engineering
  • 45. 250 MHz OFC TxRx Demo System Synchronous TxRx SAW OFC correlator prototype system RF clock ADC & section Post processor output Digital section Wireless 250 MHz SAW OFC temperature test using a free running hot plate. The red dashed curve is a TC and the solid blue curve is the SAW extracted temperature. University of Central Florida School of 45 Electrical Engineering and Computer Science
  • 46. WIRELESS SAW TEMPERATURE SENSOR DEMONSTRATION Post processor 25 cm 25 cm output 5 cm 5 cm Receiver Interrogator (Transmitter) SAW Sensor/Tag Thermal 78°C Couple Thermal Hot Plate Controller Real-time wireless 250 MHz SAW OFC temperature test using a free running hot plate. The red dashed curve is a TC and the solid blue curve is the SAW extracted temperature. 46
  • 48. Packaged 915 MHz SAW OFC temperature sensor and antenna used on sensors and transceiver.
  • 49. Principle of operation of the adaptive matched OFC ideal filter response to maximize the correlation waveform and extract the SAW sensor temperature.
  • 50. 250 MHz Wireless OFC SAW System 1st Pass 50 cm 50 cm An initial OFC SAW Interrogator (Transmitter ) 30 cm 30 cm Receiver temperature sensor data SAW Sensor /Tag Thermal run on a free running 78°C Thermal Controller Hot Plate Couple hotplate from an initial 250 MHz transceiver system. The system used 5 chips and a fractional bandwidth of approximately 19%. The upper curve is a thermocouple reading and the jagged curve is the SAW temperature extracted data .
  • 51. 250 MHz Wireless OFC SAW System - 2nd Pass 50 cm 50 cm 30 cm 30 cm Receiver Interrogator (Transmitter ) A final OFC SAW temperature sensor data SAW Sensor /Tag Thermal 78°C Thermal Controller Hot Plate Couple run on a free running hotplate from an improved 250 MHz transceiver system. The system used 5 chips and a fractional bandwidth of approximately 19%. The dashed curve is a thermocouple reading and the solid curve is the SAW temperature extracted data. The SAW sensor is tracking the thermocouple very well; the slight offset is probably due to the position and conductivity of the thermocouple.
  • 52. 915 MHz Sensor System - 1st Pass Initial results of the 915 MHz SAW OFC temperature sensor transceiver system. Four OFC SAW sensors are co-located in close range to each other; two are at room temperature and one is at +62◦C and another at -38◦C. Data was taken simultaneously from all four sensors and then temperature extracted in the correlator receiver software.
  • 53. UCF OFC Sensor Successful Demonstrations • Temperature sensing – Cryogenic: liquid nitrogen – Room temperature to 250oC – Currently working on sensor for operation to 750oC • Cryogenic liquid level sensor: liquid nitrogen • Pressure/Strain sensor • Hydrogen gas sensor
  • 54. Temperature Sensor Results Temperature Sensor Results 200 ( 180 e r 160 u 140 ) t C a ° 120 r e 100 p 80 m e 60 T 40 LiNbO3 SAW Sensor 20 Thermocouple 0 0 20 40 60 80 100 120 140 160 180 200 Time (min) • 250 MHz LiNbO3, 7 chip reflector, OFC SAW sensor tested using temperature controlled RF probe station • Temp range: 25-200oC • Results applied to simulated transceiver and compared with thermocouple measurements University of Central Florida 54 School of Electrical Engineering and Computer Science
  • 55. OFC Cryogenic Sensor Results 50 Thermocouple LiNbO 3 SAW Sensor Scale 0 Vertical: +50 to -200 oC ( e r u ) Horizontal: Relative time (min) -50 t C ° a r e p m -100 e T OFC SAW temperature -150 sensor results and comparison with -200 0 5 10 Time (min) 15 20 25 thermocouple measurements at cryogenic Measurement temperatures. Temperature system with scale is between +50 to -200 liquid oC and horizontal scale is nitrogen Dewar and relative time in minutes. vacuum chamber for DUT University of Central Florida School of Electrical Engineering and Computer Science 55
  • 56. Schematic and Actual OFC Gas Sensor OFC Sensor Schematic Actual device with RF probe •For palladium hydrogen gas sensor, Pd film is in only in one delay path, a change in differential delay senses the gas (τ1 = τ2) (in progress) University of Central Florida 56 School of Electrical Engineering and Computer Science
  • 57. Palladium Background Information • The bulk of PD research has been performed for Pd in the 100-10000 Angstrom thickness • Morphology of ultra-thin films of Without H2 Pd are dependent on substrate CONTACT CONTACT conditions, deposition and many other parameters • Pd absorbs H2 gas which causes lattice expansion of the Pd film – called Hydrogen Induced Lattice Expansion (HILE) – Resistivity reduces • Pd absorbs H2 gas which causes palladium hydride formation – With H2 Resistivity increases CONTACT CONTACT • Examine these effects for ultra- thin films (<5nm) on SAW devices HILE - Each small circle represents a nano-sized cluster of Pd atoms 57
  • 58. Measured E-Beam Evaporated Palladium Conductivity v Film Thickness σinf = 9.5·104 S/cm Conductivity measurements made in-situ under vacuum 58
  • 59. Ultra-thin Pd on SAW Devices for Hydrogen Gas Sensing • Pd is known to be very sensitive to hydrogen gas •Due to the SAW AE interaction with resistive films and the potentially large change in Pd resistivity, a sensitive SAW hydrogen sensor is possible •Experimental investigation of the SAW-Pd-H2 interaction 59
  • 60. Pd Films on SAW Devices Schematic of Test Conditions • Control: SAW delay line on YZ LiNbO3 wafers w/ 2 transducers and reflector w/o Pd film • Center frequency 123 MHz 1.27 mm • (A) SAW delay line w/ Pd in Pd Film propagation path between (A) transducer and reflector Pd Film • (B) SAW delay line w/ Pd on (B) reflector only 60
  • 61. Test Conditions and Measurement S21 Time Response • S21 time domain 0 4 SAW Main 8 Reflector measurement of SAW 12 16 20 Normalized Magnitude (dB) delay line 24 28 32 TTE – Main response 36 40 44 48 – TTE 52 56 60 64 – Reflector return 68 72 76 response 80 0 0.25 0.5 0.75 1 1.25 1.5 1.75 2 2.25 Time (micro-seconds) DL w/o Pd Before Exp Pd Film During 1st Exp After 1st Exp During 2nd Exp After 2nd Exp During 3rd Exp After 3rd Exp During 4th Exp 61 After 4th Exp
  • 62. SAW Propagation Loss and Reflectivity Pd Film ~ 15 Ang. (prior to H2) No • S21 time domain comparison of Pd S21 Time Response delay line with Pd in propagation 20 23 path vs. on the reflector 26 29 32 • Greater loss when Pd is placed in 35 Normalized Magnitude (dB) 38 Pd Film propagation path than in the 41 44 reflector 47 50 – ~7dB loss when Pd is on 53 Pd Film 56 59 reflector 62 65 • reflector length 1.47 mm 68 71 – ~22dB loss when Pd is in 74 77 propagation path 80 1.7 1.75 1.8 1.85 1.9 1.95 2 2.05 2.1 2.15 2.2 2.25 • 1.27 mm one-way path length Time (micro-seconds) DL w/o Pd • Propagation loss ~75dB/cm loss DL w/ Pd In Delay Path DL w/ Pd on Reflector Bank m v fs := 3488 s 62
  • 63. SAW Device Pd in Propagation Path w/ 2% H2 Exposure • Close-up of reflector bank S21 Time Response S21 time domain response. 20 23 • A comparison of the traces 26 29 labeled “DL w/o Pd” and” 32 35 Normalized Magnitude (dB) 38 Before Exp” shows a 41 44 change in reflectivity due to 47 50 the presence of the Pd film. 53 56 59 • A gradual reduction in 62 65 propagation loss with 68 71 increased H2 exposure. 74 77 – Irreversible change 80 1.7 1.75 1.8 1.85 1.9 1.95 2 2.05 2.1 2.15 2.2 2.25 Time (micro-seconds) – ~ 20 dB reduction in DL w/o Pd loss Before Exp Pd Film During 1st Exp After 1st Exp • Minimum propagation During 2nd Exp loss ~6.8 dB/cm After 2nd Exp During 3rd Exp After 3rd Exp During 4th Exp After 4th Exp 63
  • 64. SAW Device Pd on Reflector w/ 2% H2 Exposure S21 Time Response • Close-up of reflector bank 0 S21 time domain response. 4 8 12 • A comparison of the traces 16 20 Normalized Magnitude (dB) labeled “DL w/o Pd” and” 24 28 Before Exp” shows a change 32 36 in delay as well as reflectivity 40 44 48 due to the presence of the 52 56 Pd film. 60 64 • A gradual increase in 68 72 76 reflectivity with each 80 1.7 1.75 1.8 1.85 1.9 1.95 2 2.05 2.1 2.15 2.2 2.25 exposure to H2 gas is Time (micro-seconds) observed DL w/o Pd Before Exp Pd Film During 1st Exp – ~ 7 dB change in IL After 1st Exp During 2nd Exp – Irreversible After 2nd Exp During 3rd Exp After 3rd Exp During 4th Exp 64 After 4th Exp
  • 65. Nano-Pd Film – 25 Ang. 20 Hydrogen Gas 24 28 Normalized Magnitude (dB) 32 Sensor Results: 36 40 44 48 2% H2 gas 52 56 Pd F ilm 60 64 68 72 Propagation Loss (dB/cm) and Velocity(m/s) vs. Film Resistivity 76 240 3500 80 SAW Velocity (m/s) 200 3485 1.7 1. 8 1.9 2 2.1 2.2 Loss (dB/cm) 160 3470 120 3455 Time (micro-seconds) 80 3440 Delay Line w/o Pd •The change in IL 40 3425 After Pd Film indicates >10x 0 3410 During 1st H2 Exp osure 100 3 1 .10 4 1 .10 1 .10 5 After 1s t H2 Exp osure change in Pd Resistivity (ohm-cm) During 2nd H2 Exp osure resistivity – WOW! Loss/cm @ 123 MHz Pd Film After 2n d H2 Exposure Loss/cm due to Pd Film •The large change Loss/cm due to Pd Film After Final H2 Gas Exposure During 3rd H2 Exposure Loss/cm due to successive H2 exposure suggests an SAW Velocity After 3rd H2 Exposure SAW Velocity due to Pd Film During 4th H2 Exposure unexpected change in SAW Velocity due to Pd Film After Final H2 Gas Exposure SAW Velocity due to successive H2 exposure After 4th H2 Exposure Pd film morphology. 65
  • 66. OFC Cantilever Strain Sensor • Measure Delay versus Strain 66
  • 67. OFC Cantilever Strain Sensor Plot generated by ANSYS demonstrating the strain distribution along the z-axis of the crystal. Test fixture, this shows the surface mount package, which contains the cantilever device, securely clamped down onto a PC board which is connected to a Network Analyzer.
  • 68. Applications • Current efforts include OFC SAW liquid level, hydrogen gas, pressure and temperature sensors • Multi-sensor spread spectrum systems • Cryogenic sensing • High temperature sensing • Space applications • Turbine generators • Harsh environments • Ultra Wide band (UWB) Communication – UWB OFC transducers • Potentially many others School of Electrical Engineering and Computer Science 68
  • 69. Vision for Future • Multiple access, SAW RFID sensors • SAW RFID sensor loss approaching 0 dB – Unidirectional transducers – Low loss reflectors • New and novel coding approaches using OFC-type transducers and reflectors • Operation in the 1-3 GHz range for small size • Single platform for various sensors (temperature, gas, pressure, etc.) • SAW sensors in space flight and support operations in 2 to 5 years 69 University of Central Florida School of Electrical Engineering and Computer Science
  • 70. NASA Support and Collaborations • NASA support – KSC • 4 Phase I STTRs and 4 Phase II STTRs: 2005- 2011 • Latest STTR Phase II begins this summer – JSC • 900 MHz device development in 2008 – Langley • GRA OFC sensor funding: 2008-2010 70
  • 71. Collaborations • Micro System Sensors 2005-2006, STTR • ASR&D, 2007-present, STTR • Mnemonics, 2007-present, STTR – United Space Alliance (USA): 2nd order collaboration • MtronPTI – 1995-present, STTR • Triquint Semiconductor -2009 • Vectron -2009 (SenGenuity 2nd order collaboration) • Univ. of South Florida 2005-present, SAW sensors • Univ. of Puerto Rico Mayaguez – initiating SAW sensor activity 71
  • 72. SAW Research at UCF • Approximately 200 publications and 7 patents + (5 pending) on SAW technology • Approximately $5M in SAW contracts and grants • Approximately 50 graduate students • Many international collaborations • Contracts with industry, DOD and NASA • Current efforts on SAW sensors for space applications funded by NASA
  • 73. Current Graduate Research Student Contributors • Brian Fisher • Daniel Gallagher • Mark Gallagher • Nick Kozlovski • Matt Pavlina • Luis Rodriguez • Mike Roller • Nancy Saldanha
  • 74. Acknowledgment •The authors wish to thank continuing support from NASA, and especially Dr. Robert Youngquist, NASA- KSC. •The foundation of this work was funded through NASA Graduate Student Research Program Fellowships, the University of Central Florida - Florida Solar Energy Center (FSEC), and NASA STTR contracts. •Continuing research is funded through NASA STTR contracts and industrial collaboration with Applied Sensor Research and Development Corporation, and Mnemonics Corp. Thank you for your attention! University of Central Florida 74 School of Electrical Engineering and Computer Science
  • 75. Contact US Contact: Doug Foster Fuentek, LLC (919) 249-0327 www.fuentek.com/technologies/SAW.htm University of Central Florida 75 School of Electrical Engineering and Computer Science