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Device Modeling Report

COMPONENTS: SiC Schottky Barrier Diode
PART NUMBER: TRS10E65C
MANUFACTURER: TOSHIBA
REMARK: Professional Model

Bee Technologies Inc.

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

1
Circuit Configuration

DIODE MODEL PARAMETERS
PSpice
model
parameter
IS
N
RS
IKF
CJO
M
VJ
ISR
BV
IBV
TT
EG

Model description
Saturation Current
Emission Coefficient
Series Resistance
High-injection Knee Current
Zero-bias Junction Capacitance
Junction Grading Coefficient
Junction Potential
Recombination Current Saturation Value
Reverse Breakdown Voltage(a positive value)
Reverse Breakdown Current(a positive value)
Transit Time
Energy-band Gap

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

2
Forward Current Characteristics
Circuit Simulation result

10A
9A
8A
7A
6A
5A
4A
3A
2A
1A
0A
0V

0.5V

1.0V

1.5V

2.0V

I(R1)
V_V1

Evaluation circuit
R1

0.01m
V1

U1
TRS10E65C

0Vdc

0

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

3
Comparison Graph
Circuit Simulation result

Comparison table

VF (V)

IF (A)

Measurement

Simulation

%Error

0.1

0.908

0.906

-0.22

1

1.010

1.008

-0.20

2

1.080

1.075

-0.46

4

1.185

1.190

0.42

6

1.290

1.297

0.54

8

1.400

1.400

0.00

10

1.510

1.502

-0.53

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

4
Junction Capacitance Characteristic
Circuit Simulation result

1.0n

100p

10p
100mV
I(V2)/(650V/1u)

1.0V

10V

100V

V(N16610)

Evaluation circuit
V2

0Vdc
V2 = 650
V1 = 0
TD = 0
TR = 1us
TF = 500ns
PW = 100us
PER = 500us

U1
TRS10E65C

V1

0

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

5
Comparison Graph
Circuit Simulation result

Comparison table

CT (pF)

VR(V)

Measurement

Simulation

%Error

0.1

597.000

602.500

0.92

0.2

583.000

589.500

1.11

0.5

550.000

555.400

0.98

1

500.000

509.400

1.88

2

437.000

443.700

1.53

5

335.000

337.500

0.75

10

263.000

258.600

-1.67

20

198.000

191.100

-3.48

50

125.000

125.000

0.00

100

88.000

90.300

2.61

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

6
Reverse Characteristic
Circuit Simulation result

10uA

1.0uA

100nA

10nA

1.0nA
100V
I(R1)

200V

300V

400V

500V

600V

V_V1

Evaluation circuit
R1

100m
V1

U1
TRS10E65C

0Vdc

0

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

7
Comparison Graph
Circuit Simulation result

Comparison table

IR (A)

VR (V)
Measurement

Simulation

%Error

2.00E-09

408.00

388.40

-4.80

1.00E-08

480.00

475.60

-0.92

1.00E-07

580.00

579.50

-0.09

5.00E-07

650.00

649.90

-0.02

All Rights Reserved Copyright (C) Bee Technologies Inc. 2013

8

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SPICE MODEL of TRS10E65C (Professional Model) in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: TRS10E65C MANUFACTURER: TOSHIBA REMARK: Professional Model Bee Technologies Inc. All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 1
  • 2. Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter IS N RS IKF CJO M VJ ISR BV IBV TT EG Model description Saturation Current Emission Coefficient Series Resistance High-injection Knee Current Zero-bias Junction Capacitance Junction Grading Coefficient Junction Potential Recombination Current Saturation Value Reverse Breakdown Voltage(a positive value) Reverse Breakdown Current(a positive value) Transit Time Energy-band Gap All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 2
  • 3. Forward Current Characteristics Circuit Simulation result 10A 9A 8A 7A 6A 5A 4A 3A 2A 1A 0A 0V 0.5V 1.0V 1.5V 2.0V I(R1) V_V1 Evaluation circuit R1 0.01m V1 U1 TRS10E65C 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 3
  • 4. Comparison Graph Circuit Simulation result Comparison table VF (V) IF (A) Measurement Simulation %Error 0.1 0.908 0.906 -0.22 1 1.010 1.008 -0.20 2 1.080 1.075 -0.46 4 1.185 1.190 0.42 6 1.290 1.297 0.54 8 1.400 1.400 0.00 10 1.510 1.502 -0.53 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 4
  • 5. Junction Capacitance Characteristic Circuit Simulation result 1.0n 100p 10p 100mV I(V2)/(650V/1u) 1.0V 10V 100V V(N16610) Evaluation circuit V2 0Vdc V2 = 650 V1 = 0 TD = 0 TR = 1us TF = 500ns PW = 100us PER = 500us U1 TRS10E65C V1 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 5
  • 6. Comparison Graph Circuit Simulation result Comparison table CT (pF) VR(V) Measurement Simulation %Error 0.1 597.000 602.500 0.92 0.2 583.000 589.500 1.11 0.5 550.000 555.400 0.98 1 500.000 509.400 1.88 2 437.000 443.700 1.53 5 335.000 337.500 0.75 10 263.000 258.600 -1.67 20 198.000 191.100 -3.48 50 125.000 125.000 0.00 100 88.000 90.300 2.61 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 6
  • 7. Reverse Characteristic Circuit Simulation result 10uA 1.0uA 100nA 10nA 1.0nA 100V I(R1) 200V 300V 400V 500V 600V V_V1 Evaluation circuit R1 100m V1 U1 TRS10E65C 0Vdc 0 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 7
  • 8. Comparison Graph Circuit Simulation result Comparison table IR (A) VR (V) Measurement Simulation %Error 2.00E-09 408.00 388.40 -4.80 1.00E-08 480.00 475.60 -0.92 1.00E-07 580.00 579.50 -0.09 5.00E-07 650.00 649.90 -0.02 All Rights Reserved Copyright (C) Bee Technologies Inc. 2013 8