This document summarizes the modeling and simulation of a TLP621_A photocoupler component. It includes SPICE models for the diode, bipolar junction transistor, voltage controlled voltage source, and current controlled components. It also provides simulation results that validate the models by comparing measurements and simulations of key electrical characteristics like forward voltage, capacitance, switching time, and more.

1. Device Modeling Report
COMPONENTS:PHOTOCOUPLER
PART NUMBER:TLP621_A
MANUFACTURER: TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

2. DIODE MODEL
Pspice model
Model description
Parameter
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
BIPOLAR JUNCTION TRANSISTOR MODEL
Pspice
model Model description
parameter
NR Reverse Emission Coefficient
RB Base Resistance
RC Series Collector Resistance
CJE Zero-bias Emitter-Base Junction Capacitance
CJC Zero-bias Collector-Base Junction Capacitance
TF Forward Transit Time
TR Reverse Transit Time
VOLTAGE CONTROLLED VOLTAGE SOURCE MODEL(VCVS)
E<Name><(+)Node><(－)Node>VALUE={Expression}
E<Name><(+)Node><(－)Node>TABLE={Expression}
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

3. VOLTAGE CONTROLLED CURRENT SOURCE MODEL(VCCS)
E<Name><(+)Node><(－)Node>VALUE={Expression}
CURRENT CONTROLLED MODEL(W)
Pspice Model description
model
parameter
IOFF Controlling current to Off state
ION Controlling current to On state
ROFF Off Resistance
RON On Resistance
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

4. Input Device Forward Current Characteristics
Measurement
Simulation
Input Device Junction Capacitance Characteristics
Measurement
Simulation
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

5. Input Device Reverse Recovery Characteristics
Measurement
trj=146n(s)
trb=158n(s)
Conditions:Ifwd=Irev=0.04(A),Rl=50
Example
Relation between trj and trb
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

6. LED IV Curve Characteristics
Evaluation Circuit
U2
1 4
A C
V1
I1 5Vdc
20mAdc 2 3
K E
tlp621_a
0 0
Simulation result
Simulation
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

7. Comparison Table
Vfwd(V)
Ifwd(A) % Error
Measurement Simulation
0.0001 0.952 0.955 0.315
0.0002 0.988 0.9861 -0.192
0.0005 1.028 1.0265 -0.146
0.001 1.06 1.0576 -0.226
0.002 1.09 1.0894 -0.055
0.005 1.134 1.1349 0.079
0.01 1.174 1.1741 0.009
0.02 1.220 1.2225 0.205
0.05 1.318 1.317 -0.076
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

8. Transistor Saturation Characteristics
Evaluation Circuit
U1
1 4
A C
I1 2 3 I2
8mAdc K E
2.4mAdc
tlp621_a Simulation
0 0
Simulation result
Simulation
Comparison Table
Measurement Simulation % Error
Vce(sat) (V) 0.4 0.399 -0.25
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

9. CTR(Current Transfer Ratio) Characteristics
Evaluation Circuit
V2 V3
0Vdc 0Vdc
U1
1 4
A C
V1
I1 5Vdc
2 3
20mAdc K E
tlp621_a
0 0
Simulation result
Simulation
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

10. Rise Curve Table
CTR(%)
If(mA) % Error
Measurement Simulation
0.3 65 62.153 -4.380
0.5 95 98.998 4.208
1 155 148.506 -4.190
2 205 197.659 -3.581
5 270 262.253 -2.869
10 315 310.787 -1.337
13 330 328.977 -0.310
Fall Curve Table
CTR(%)
If(mA) % Error
Measurement Simulation
13 330 328.977 -0.310
20 280 270.179 -3.508
30 220 214.913 -2.312
40 180 175.751 -2.361
60 120 120.641 0.534
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

11. Switching Time Characteristics
Evaluation Circuit
V2
0Vdc
R1
U1 1.9k
1 4
A C
TD = 0 I1
TF = 10n 2 3
PW = 20u K E V1
PER = 500u 5Vdc
tlp621_a
I1 = 0
I2 = 16m
TR = 10n
0 0
Simulation result
Simulation
Comparison Table
Vcc=5V,IF=16mA,RL=1.9k Measurement Simulation % Error
Ts (us) 15 15.092 0.613
Tf (us) 25 25.060 0.240
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004