SlideShare ist ein Scribd-Unternehmen logo
1 von 9
Downloaden Sie, um offline zu lesen
Device Modeling Report




COMPONENTS: OPERATIONAL AMPLIFIER
PART NUMBER: TC75S54F
MANUFACTURER: TOSHIBA
REMARK TYPE: (CMOS OPAMP)




              Bee Technologies Inc.


All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
SPICE MODEL



IN+           VDD
      1   5


VSS
      2


IN-           OUT
      3   4




                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
MOSFET MODEL


Pspice model
                                       Model description
 parameter
  LEVEL
      L        Channel Length
     W         Channel Width
     KP        Transconductance
     RS        Source Ohmic Resistance
     RD        Ohmic Drain Resistance
    VTO        Zero-bias Threshold Voltage
    RDS        Drain-Source Shunt Resistance
    TOX        Gate Oxide Thickness
   CGSO        Zero-bias Gate-Source Capacitance
   CGDO        Zero-bias Gate-Drain Capacitance
    CBD        Zero-bias Bulk-Drain Junction Capacitance
     MJ        Bulk Junction Grading Coefficient
     PB        Bulk Junction Potential
     FC        Bulk Junction Forward-bias Capacitance Coefficient
     RG        Gate Ohmic Resistance
     IS        Bulk Junction Saturation Current
      N        Bulk Junction Emission Coefficient
     RB        Bulk Series Resistance
    PHI        Surface Inversion Potential
  GAMMA        Body-effect Parameter
   DELTA       Width effect on Threshold Voltage
    ETA        Static Feedback on Threshold Voltage
  THETA        Modility Modulation
  KAPPA        Saturation Field Factor
   VMAX        Maximum Drift Velocity of Carriers
     XJ        Metallurgical Junction Depth
     UO        Surface Mobility




           All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Output Voltage Swing

Simulation result




                                                                                   VOH




                                                                                   VOL




Evaluation Circuit


                                       U3                                                           U4

                                 IN+                  VDD                                     IN+                  VDD
                                       1          5                                                 1          5


                                 VSS                                                          VSS
                                       2                                                            2


                                 IN-                  OUT                                     IN-                  OUT
                                       3          4           VOH                                   3          4          VOL
                                                                    V3    V4
                                                                                       V5                                     R2
                                       TC75S54F                                                     TC75S54F
                     V1           V2                   R3                 1.45
             1.55         1.45                                                         1.55                               100k
                                                       100k     3
                                                                                                                                   V6
                                                                                                                          3




                                                  0                                                        0




Compasion Table

                                 Measurement                             Simulation                                      %Error
         VOH(V)                              2.9                                 2.9                                           0
         VOL(V)                              0.1                                 0.1                                           0

                    All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Input Current

Simulation result



                                                                    Simulation




Evaluation Circuit


                                               U3

                                         IN+                  VDD
                                               1          5


                                        VSS
                                               2


                                         IN-                  OUT
                                               3          4         OUT


                                               TC75S54F
                     V1                V2
            0Vdc
                                                                                  V3
                                      0Vdc                              3




                                                    0




Compasion Table

                           Measurement               Simulation                  % Error
         Ib (pA)                1                      1.002                       0.2
        IOS (pA)                1                      0.995                      -0.5
                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Input Offset Voltage

Simulation result




                                                                Simulation




Evaluation Circuit


                                          U2

                                    IN+                  VDD
                                          1          5


                                    VSS
                                          2


                                    IN-                  OUT
                                          3          4            OUT
                     V1
                                          TC75S54F
            0                                                           3      V2




                                                                             0



Compasion Table

                          Measurement            Simulation             %Error
       VOS (mV)                 2                    1.982                  -0.9

                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Open loop Voltage Gain

Simulation result




                                                                Simulation




Evaluation Circuit

                                         U5

                                   IN+                  VDD
                                         1          5


                                  VSS
                                         2


                                   IN-                  OUT
                         IN              3          4               OUT
                                                                               V2
                                                                        3
                                         TC75S54F
                          V1
                                    VOFF = 0
                                   VAMPL = 0
                                    FREQ = 0
                                     AC = 1m
                                    DC = -1.982m




                                             0


Compasion Table


                                 Measurement                  Simulation            %Error
              Av (dB)                    70                      70.1               0.142
          Frequency(Mhz)                 0.9                    0.910               1.111

                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Common-Mode Rejection Ratio

Simulation result




                                                                    Simulation

                          ACM=431.383m/412.100m




Evaluation Circuit

                                               U3

                                         IN+                  VDD
                                               1          5


                                     VSS
                                               2


                                         IN-                  OUT
                                               3          4
                                V2                                               V3
                      -1.982m                                               3
                                               TC75S54F




                           V1
            VOFF = 0
            VAMPL = 0.5
            FREQ = 1
            AC = 1m
            DC = 0


                                     0


CMRR      = AV/ACM
Compasion Table

                            Measurement                       Simulation         %Error
       CMRR (dB)                70                              69.709           -0.415


                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
Slew Rate

Simulation result



                                                                     Simulation




Evaluation Circuit

                                             U2

                                       IN+                  VDD
                                             1          5


                                      VSS
                                             2


                                       IN-                  OUT
                                             3          4                 OUT
            V1 = 0       V1
            V2 = 3
            TD = 10u                                                            V2
                                             TC75S54F
            TR = 6n
            TF = 6n
            PW = 50u                                                       3
            PER = 100u




                                                 0


Compasion Table

                              Measurement                    Simulation              % Error
          SR (V/us)               0.7                          0.689                  1.571



                All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

Weitere ähnliche Inhalte

Mehr von Tsuyoshi Horigome

SPICE PARK FEB2024 ( 6,694 SPICE Models )
SPICE PARK FEB2024 ( 6,694 SPICE Models )SPICE PARK FEB2024 ( 6,694 SPICE Models )
SPICE PARK FEB2024 ( 6,694 SPICE Models )Tsuyoshi Horigome
 
Circuit simulation using LTspice(Case study)
Circuit simulation using LTspice(Case study)Circuit simulation using LTspice(Case study)
Circuit simulation using LTspice(Case study)Tsuyoshi Horigome
 
Mindmap of Semiconductor sales business(15FEB2024)
Mindmap of Semiconductor sales business(15FEB2024)Mindmap of Semiconductor sales business(15FEB2024)
Mindmap of Semiconductor sales business(15FEB2024)Tsuyoshi Horigome
 
2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice
2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice
2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspiceTsuyoshi Horigome
 
PSpice simulation of power supply for TI is Error
PSpice simulation of power supply  for TI is ErrorPSpice simulation of power supply  for TI is Error
PSpice simulation of power supply for TI is ErrorTsuyoshi Horigome
 
IGBT Simulation of Results from Rgext or Rgint
IGBT Simulation of Results from Rgext or RgintIGBT Simulation of Results from Rgext or Rgint
IGBT Simulation of Results from Rgext or RgintTsuyoshi Horigome
 
Electronic component sales method centered on alternative proposals
Electronic component sales method centered on alternative proposalsElectronic component sales method centered on alternative proposals
Electronic component sales method centered on alternative proposalsTsuyoshi Horigome
 
Electronic component sales method focused on new hires
Electronic component sales method focused on new hiresElectronic component sales method focused on new hires
Electronic component sales method focused on new hiresTsuyoshi Horigome
 
Mindmap(electronics parts sales visions)
Mindmap(electronics parts sales visions)Mindmap(electronics parts sales visions)
Mindmap(electronics parts sales visions)Tsuyoshi Horigome
 
Chat GPTによる伝達関数の導出
Chat GPTによる伝達関数の導出Chat GPTによる伝達関数の導出
Chat GPTによる伝達関数の導出Tsuyoshi Horigome
 
伝達関数の理解(Chatgpt)
伝達関数の理解(Chatgpt)伝達関数の理解(Chatgpt)
伝達関数の理解(Chatgpt)Tsuyoshi Horigome
 
DXセミナー(2024年1月17日開催)のメモ
DXセミナー(2024年1月17日開催)のメモDXセミナー(2024年1月17日開催)のメモ
DXセミナー(2024年1月17日開催)のメモTsuyoshi Horigome
 
0Ω抵抗を評価ボードで採用する理由は何ですか?
0Ω抵抗を評価ボードで採用する理由は何ですか?0Ω抵抗を評価ボードで採用する理由は何ですか?
0Ω抵抗を評価ボードで採用する理由は何ですか?Tsuyoshi Horigome
 
Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)
Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)
Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)Tsuyoshi Horigome
 
SPICE PARK JAN2024 (6,665 SPICE Models)
SPICE PARK JAN2024 (6,665 SPICE Models)SPICE PARK JAN2024 (6,665 SPICE Models)
SPICE PARK JAN2024 (6,665 SPICE Models)Tsuyoshi Horigome
 
社会現象及び社会記号と関連付けたマーケティング
社会現象及び社会記号と関連付けたマーケティング社会現象及び社会記号と関連付けたマーケティング
社会現象及び社会記号と関連付けたマーケティングTsuyoshi Horigome
 
Update 42 models(Diode/General ) in SPICE PARK(DEC2023)
Update 42 models(Diode/General ) in SPICE PARK(DEC2023)Update 42 models(Diode/General ) in SPICE PARK(DEC2023)
Update 42 models(Diode/General ) in SPICE PARK(DEC2023)Tsuyoshi Horigome
 
SPICE PARK DEC2023 (6,625 SPICE Models)
SPICE PARK DEC2023 (6,625 SPICE Models) SPICE PARK DEC2023 (6,625 SPICE Models)
SPICE PARK DEC2023 (6,625 SPICE Models) Tsuyoshi Horigome
 
電子部品調達者の動向
電子部品調達者の動向電子部品調達者の動向
電子部品調達者の動向Tsuyoshi Horigome
 

Mehr von Tsuyoshi Horigome (20)

SPICE PARK FEB2024 ( 6,694 SPICE Models )
SPICE PARK FEB2024 ( 6,694 SPICE Models )SPICE PARK FEB2024 ( 6,694 SPICE Models )
SPICE PARK FEB2024 ( 6,694 SPICE Models )
 
Circuit simulation using LTspice(Case study)
Circuit simulation using LTspice(Case study)Circuit simulation using LTspice(Case study)
Circuit simulation using LTspice(Case study)
 
Mindmap of Semiconductor sales business(15FEB2024)
Mindmap of Semiconductor sales business(15FEB2024)Mindmap of Semiconductor sales business(15FEB2024)
Mindmap of Semiconductor sales business(15FEB2024)
 
2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice
2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice
2-STAGE COCKCROFT-WALTON [SCHEMATIC] using LTspice
 
PSpice simulation of power supply for TI is Error
PSpice simulation of power supply  for TI is ErrorPSpice simulation of power supply  for TI is Error
PSpice simulation of power supply for TI is Error
 
IGBT Simulation of Results from Rgext or Rgint
IGBT Simulation of Results from Rgext or RgintIGBT Simulation of Results from Rgext or Rgint
IGBT Simulation of Results from Rgext or Rgint
 
Electronic component sales method centered on alternative proposals
Electronic component sales method centered on alternative proposalsElectronic component sales method centered on alternative proposals
Electronic component sales method centered on alternative proposals
 
Electronic component sales method focused on new hires
Electronic component sales method focused on new hiresElectronic component sales method focused on new hires
Electronic component sales method focused on new hires
 
Mindmap(electronics parts sales visions)
Mindmap(electronics parts sales visions)Mindmap(electronics parts sales visions)
Mindmap(electronics parts sales visions)
 
Chat GPTによる伝達関数の導出
Chat GPTによる伝達関数の導出Chat GPTによる伝達関数の導出
Chat GPTによる伝達関数の導出
 
伝達関数の理解(Chatgpt)
伝達関数の理解(Chatgpt)伝達関数の理解(Chatgpt)
伝達関数の理解(Chatgpt)
 
DXセミナー(2024年1月17日開催)のメモ
DXセミナー(2024年1月17日開催)のメモDXセミナー(2024年1月17日開催)のメモ
DXセミナー(2024年1月17日開催)のメモ
 
0Ω抵抗を評価ボードで採用する理由は何ですか?
0Ω抵抗を評価ボードで採用する理由は何ですか?0Ω抵抗を評価ボードで採用する理由は何ですか?
0Ω抵抗を評価ボードで採用する理由は何ですか?
 
Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)
Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)
Update 40 models(Schottky Rectifier ) in SPICE PARK(JAN2024)
 
SPICE PARK JAN2024 (6,665 SPICE Models)
SPICE PARK JAN2024 (6,665 SPICE Models)SPICE PARK JAN2024 (6,665 SPICE Models)
SPICE PARK JAN2024 (6,665 SPICE Models)
 
社会現象及び社会記号と関連付けたマーケティング
社会現象及び社会記号と関連付けたマーケティング社会現象及び社会記号と関連付けたマーケティング
社会現象及び社会記号と関連付けたマーケティング
 
Update 42 models(Diode/General ) in SPICE PARK(DEC2023)
Update 42 models(Diode/General ) in SPICE PARK(DEC2023)Update 42 models(Diode/General ) in SPICE PARK(DEC2023)
Update 42 models(Diode/General ) in SPICE PARK(DEC2023)
 
SPICE PARK DEC2023 (6,625 SPICE Models)
SPICE PARK DEC2023 (6,625 SPICE Models) SPICE PARK DEC2023 (6,625 SPICE Models)
SPICE PARK DEC2023 (6,625 SPICE Models)
 
電子部品調達者の動向
電子部品調達者の動向電子部品調達者の動向
電子部品調達者の動向
 
電流制御資料
電流制御資料電流制御資料
電流制御資料
 

Kürzlich hochgeladen

EIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptx
EIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptxEIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptx
EIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptxEarley Information Science
 
presentation ICT roal in 21st century education
presentation ICT roal in 21st century educationpresentation ICT roal in 21st century education
presentation ICT roal in 21st century educationjfdjdjcjdnsjd
 
CNv6 Instructor Chapter 6 Quality of Service
CNv6 Instructor Chapter 6 Quality of ServiceCNv6 Instructor Chapter 6 Quality of Service
CNv6 Instructor Chapter 6 Quality of Servicegiselly40
 
Driving Behavioral Change for Information Management through Data-Driven Gree...
Driving Behavioral Change for Information Management through Data-Driven Gree...Driving Behavioral Change for Information Management through Data-Driven Gree...
Driving Behavioral Change for Information Management through Data-Driven Gree...Enterprise Knowledge
 
How to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerHow to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerThousandEyes
 
A Domino Admins Adventures (Engage 2024)
A Domino Admins Adventures (Engage 2024)A Domino Admins Adventures (Engage 2024)
A Domino Admins Adventures (Engage 2024)Gabriella Davis
 
Understanding Discord NSFW Servers A Guide for Responsible Users.pdf
Understanding Discord NSFW Servers A Guide for Responsible Users.pdfUnderstanding Discord NSFW Servers A Guide for Responsible Users.pdf
Understanding Discord NSFW Servers A Guide for Responsible Users.pdfUK Journal
 
04-2024-HHUG-Sales-and-Marketing-Alignment.pptx
04-2024-HHUG-Sales-and-Marketing-Alignment.pptx04-2024-HHUG-Sales-and-Marketing-Alignment.pptx
04-2024-HHUG-Sales-and-Marketing-Alignment.pptxHampshireHUG
 
Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...
Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...
Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...Miguel Araújo
 
Evaluating the top large language models.pdf
Evaluating the top large language models.pdfEvaluating the top large language models.pdf
Evaluating the top large language models.pdfChristopherTHyatt
 
Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024
Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024
Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024The Digital Insurer
 
Axa Assurance Maroc - Insurer Innovation Award 2024
Axa Assurance Maroc - Insurer Innovation Award 2024Axa Assurance Maroc - Insurer Innovation Award 2024
Axa Assurance Maroc - Insurer Innovation Award 2024The Digital Insurer
 
Exploring the Future Potential of AI-Enabled Smartphone Processors
Exploring the Future Potential of AI-Enabled Smartphone ProcessorsExploring the Future Potential of AI-Enabled Smartphone Processors
Exploring the Future Potential of AI-Enabled Smartphone Processorsdebabhi2
 
Data Cloud, More than a CDP by Matt Robison
Data Cloud, More than a CDP by Matt RobisonData Cloud, More than a CDP by Matt Robison
Data Cloud, More than a CDP by Matt RobisonAnna Loughnan Colquhoun
 
How to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerHow to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerThousandEyes
 
ProductAnonymous-April2024-WinProductDiscovery-MelissaKlemke
ProductAnonymous-April2024-WinProductDiscovery-MelissaKlemkeProductAnonymous-April2024-WinProductDiscovery-MelissaKlemke
ProductAnonymous-April2024-WinProductDiscovery-MelissaKlemkeProduct Anonymous
 
How to convert PDF to text with Nanonets
How to convert PDF to text with NanonetsHow to convert PDF to text with Nanonets
How to convert PDF to text with Nanonetsnaman860154
 
Tech Trends Report 2024 Future Today Institute.pdf
Tech Trends Report 2024 Future Today Institute.pdfTech Trends Report 2024 Future Today Institute.pdf
Tech Trends Report 2024 Future Today Institute.pdfhans926745
 
GenAI Risks & Security Meetup 01052024.pdf
GenAI Risks & Security Meetup 01052024.pdfGenAI Risks & Security Meetup 01052024.pdf
GenAI Risks & Security Meetup 01052024.pdflior mazor
 
IAC 2024 - IA Fast Track to Search Focused AI Solutions
IAC 2024 - IA Fast Track to Search Focused AI SolutionsIAC 2024 - IA Fast Track to Search Focused AI Solutions
IAC 2024 - IA Fast Track to Search Focused AI SolutionsEnterprise Knowledge
 

Kürzlich hochgeladen (20)

EIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptx
EIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptxEIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptx
EIS-Webinar-Prompt-Knowledge-Eng-2024-04-08.pptx
 
presentation ICT roal in 21st century education
presentation ICT roal in 21st century educationpresentation ICT roal in 21st century education
presentation ICT roal in 21st century education
 
CNv6 Instructor Chapter 6 Quality of Service
CNv6 Instructor Chapter 6 Quality of ServiceCNv6 Instructor Chapter 6 Quality of Service
CNv6 Instructor Chapter 6 Quality of Service
 
Driving Behavioral Change for Information Management through Data-Driven Gree...
Driving Behavioral Change for Information Management through Data-Driven Gree...Driving Behavioral Change for Information Management through Data-Driven Gree...
Driving Behavioral Change for Information Management through Data-Driven Gree...
 
How to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerHow to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected Worker
 
A Domino Admins Adventures (Engage 2024)
A Domino Admins Adventures (Engage 2024)A Domino Admins Adventures (Engage 2024)
A Domino Admins Adventures (Engage 2024)
 
Understanding Discord NSFW Servers A Guide for Responsible Users.pdf
Understanding Discord NSFW Servers A Guide for Responsible Users.pdfUnderstanding Discord NSFW Servers A Guide for Responsible Users.pdf
Understanding Discord NSFW Servers A Guide for Responsible Users.pdf
 
04-2024-HHUG-Sales-and-Marketing-Alignment.pptx
04-2024-HHUG-Sales-and-Marketing-Alignment.pptx04-2024-HHUG-Sales-and-Marketing-Alignment.pptx
04-2024-HHUG-Sales-and-Marketing-Alignment.pptx
 
Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...
Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...
Mastering MySQL Database Architecture: Deep Dive into MySQL Shell and MySQL R...
 
Evaluating the top large language models.pdf
Evaluating the top large language models.pdfEvaluating the top large language models.pdf
Evaluating the top large language models.pdf
 
Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024
Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024
Bajaj Allianz Life Insurance Company - Insurer Innovation Award 2024
 
Axa Assurance Maroc - Insurer Innovation Award 2024
Axa Assurance Maroc - Insurer Innovation Award 2024Axa Assurance Maroc - Insurer Innovation Award 2024
Axa Assurance Maroc - Insurer Innovation Award 2024
 
Exploring the Future Potential of AI-Enabled Smartphone Processors
Exploring the Future Potential of AI-Enabled Smartphone ProcessorsExploring the Future Potential of AI-Enabled Smartphone Processors
Exploring the Future Potential of AI-Enabled Smartphone Processors
 
Data Cloud, More than a CDP by Matt Robison
Data Cloud, More than a CDP by Matt RobisonData Cloud, More than a CDP by Matt Robison
Data Cloud, More than a CDP by Matt Robison
 
How to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected WorkerHow to Troubleshoot Apps for the Modern Connected Worker
How to Troubleshoot Apps for the Modern Connected Worker
 
ProductAnonymous-April2024-WinProductDiscovery-MelissaKlemke
ProductAnonymous-April2024-WinProductDiscovery-MelissaKlemkeProductAnonymous-April2024-WinProductDiscovery-MelissaKlemke
ProductAnonymous-April2024-WinProductDiscovery-MelissaKlemke
 
How to convert PDF to text with Nanonets
How to convert PDF to text with NanonetsHow to convert PDF to text with Nanonets
How to convert PDF to text with Nanonets
 
Tech Trends Report 2024 Future Today Institute.pdf
Tech Trends Report 2024 Future Today Institute.pdfTech Trends Report 2024 Future Today Institute.pdf
Tech Trends Report 2024 Future Today Institute.pdf
 
GenAI Risks & Security Meetup 01052024.pdf
GenAI Risks & Security Meetup 01052024.pdfGenAI Risks & Security Meetup 01052024.pdf
GenAI Risks & Security Meetup 01052024.pdf
 
IAC 2024 - IA Fast Track to Search Focused AI Solutions
IAC 2024 - IA Fast Track to Search Focused AI SolutionsIAC 2024 - IA Fast Track to Search Focused AI Solutions
IAC 2024 - IA Fast Track to Search Focused AI Solutions
 

SPICE MODEL of TC75S54F in SPICE PARK

  • 1. Device Modeling Report COMPONENTS: OPERATIONAL AMPLIFIER PART NUMBER: TC75S54F MANUFACTURER: TOSHIBA REMARK TYPE: (CMOS OPAMP) Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 2. SPICE MODEL IN+ VDD 1 5 VSS 2 IN- OUT 3 4 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 3. MOSFET MODEL Pspice model Model description parameter LEVEL L Channel Length W Channel Width KP Transconductance RS Source Ohmic Resistance RD Ohmic Drain Resistance VTO Zero-bias Threshold Voltage RDS Drain-Source Shunt Resistance TOX Gate Oxide Thickness CGSO Zero-bias Gate-Source Capacitance CGDO Zero-bias Gate-Drain Capacitance CBD Zero-bias Bulk-Drain Junction Capacitance MJ Bulk Junction Grading Coefficient PB Bulk Junction Potential FC Bulk Junction Forward-bias Capacitance Coefficient RG Gate Ohmic Resistance IS Bulk Junction Saturation Current N Bulk Junction Emission Coefficient RB Bulk Series Resistance PHI Surface Inversion Potential GAMMA Body-effect Parameter DELTA Width effect on Threshold Voltage ETA Static Feedback on Threshold Voltage THETA Modility Modulation KAPPA Saturation Field Factor VMAX Maximum Drift Velocity of Carriers XJ Metallurgical Junction Depth UO Surface Mobility All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 4. Output Voltage Swing Simulation result VOH VOL Evaluation Circuit U3 U4 IN+ VDD IN+ VDD 1 5 1 5 VSS VSS 2 2 IN- OUT IN- OUT 3 4 VOH 3 4 VOL V3 V4 V5 R2 TC75S54F TC75S54F V1 V2 R3 1.45 1.55 1.45 1.55 100k 100k 3 V6 3 0 0 Compasion Table Measurement Simulation %Error VOH(V) 2.9 2.9 0 VOL(V) 0.1 0.1 0 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 5. Input Current Simulation result Simulation Evaluation Circuit U3 IN+ VDD 1 5 VSS 2 IN- OUT 3 4 OUT TC75S54F V1 V2 0Vdc V3 0Vdc 3 0 Compasion Table Measurement Simulation % Error Ib (pA) 1 1.002 0.2 IOS (pA) 1 0.995 -0.5 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 6. Input Offset Voltage Simulation result Simulation Evaluation Circuit U2 IN+ VDD 1 5 VSS 2 IN- OUT 3 4 OUT V1 TC75S54F 0 3 V2 0 Compasion Table Measurement Simulation %Error VOS (mV) 2 1.982 -0.9 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 7. Open loop Voltage Gain Simulation result Simulation Evaluation Circuit U5 IN+ VDD 1 5 VSS 2 IN- OUT IN 3 4 OUT V2 3 TC75S54F V1 VOFF = 0 VAMPL = 0 FREQ = 0 AC = 1m DC = -1.982m 0 Compasion Table Measurement Simulation %Error Av (dB) 70 70.1 0.142 Frequency(Mhz) 0.9 0.910 1.111 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 8. Common-Mode Rejection Ratio Simulation result Simulation ACM=431.383m/412.100m Evaluation Circuit U3 IN+ VDD 1 5 VSS 2 IN- OUT 3 4 V2 V3 -1.982m 3 TC75S54F V1 VOFF = 0 VAMPL = 0.5 FREQ = 1 AC = 1m DC = 0 0 CMRR = AV/ACM Compasion Table Measurement Simulation %Error CMRR (dB) 70 69.709 -0.415 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
  • 9. Slew Rate Simulation result Simulation Evaluation Circuit U2 IN+ VDD 1 5 VSS 2 IN- OUT 3 4 OUT V1 = 0 V1 V2 = 3 TD = 10u V2 TC75S54F TR = 6n TF = 6n PW = 50u 3 PER = 100u 0 Compasion Table Measurement Simulation % Error SR (V/us) 0.7 0.689 1.571 All Rights Reserved Copyright (c) Bee Technologies Inc. 2005