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Atomic Force Microscopy
    Fundamentals

    Sebastián Caicedo Dávila
              EIEE
      Universidad del Valle
         Cali-Colombia
Background: The STM
The scanning tunneling microscope was developed in 1981 by Gerd Binnig
and Heinrich Rohrer (IBM labs in Zürich), based on the quantum tunnel
effect




                                                                         3
Background: The STM




                      4
Background: The STM
For this achievement, Binnig and Rohrer received the Nobel Prize in
physics in 1986.

The STM work in two modes:




                                                                      5
Background: The STM
In order to work properly, it is necessary to use other physical effects such
as the piezoelectric effect.




                                                                                6
Background: The STM
The STM can achieve resolutions of 0.1nm lateral and 0.01nm in depth.
With such resolutions, individual atoms can be imaged and
MANIPULATED




                        STM image of Si (111)

                                                                        7
PUBLISHED ONLINE: 22 MARCH 2009 | DOI: 10.1038/NNANO.2009.48




ling readout of hydrogen-bonding-based        Background: The STM
ition
            STM has a variety of applications, which include characterization
, Jin He2, Ashley Kibel1,2, Myeong Lee1, Otto Sankey1, Peiming Zhang2                                                                 of
dsay1,2,3 * electrical and chemical properties of nanostructures, lithography, etc.

   has a ubiquitous role in electron transport1,2
 ecognition, with DNA base pairing being the
ple3. Scanning tunnelling microscope images4
 s of the decay of tunnel current as a molecu-
 led apart by the scanning tunnelling micro-
 ensitive to hydrogen-bonded interactions.                                                                             I
at these tunnel-decay signals can be used to
ength of hydrogen bonding in DNA base
  hat are held together by three hydrogen
pair (for example, guanine–cytosine inter-
r than junctions held together by two hydro-
base pair (for example, adenine–thymine                                                                               V
 lar, but less pronounced effects are observed
  f the tunnelling probe, implying that attrac-
  pend on hydrogen bonds also have a role in
rise of current. These effects provide new
 aking sensors that transduce a molecular rec-
o an electronic signal.
 ng through an analyte molecule can yield chemi-
Given that hydrogen bonds enhance electron tun-
vacuum tunnelling9, we have proposed a new
 -assembled, hydrogen-bonded tunnel junctions
  ovide good contacts10 and chemical selectivity5,11.
   feasibility of this approach, we functionalized a
                Measure of the strength1 |of hydrogenmeasurements. A sharp gold probe, base-pairs using STM
nelling microscope (STM) probe with a DNA
 ht into contact with a monolayer of nucleosides
                                    Figure     Illustration of the STM
                                                                         bonding in DNA
 e under 1,2,4-trichlorobenzene (Fig. 1; see     (Shuai Chang et al. 2009)
                                    functionalized with a thiolated base, is caused to approach a gold (111)
y tunnel current set-point (ISP) was established
                                    surface functionalized with a monolayer of thiolated nucleosides until the
 , the servo broken, and the current recorded as          desired set-point current (ISP) is obtained, and then retracted while the
  d away from the surface. Current decay curves           tunnel current is recorded. The current–distance curves can be used to           8
 drogen-bond molecular junctions are shown in             characterize the strength of the hydrogen-bonded interactions. I is the
AFM Basics
AFM imaging information is gathered by “feeling” the sample surface with
a mechanical probe (cantilever with a sharp -ideally one atom- tip). When
probe and sample come to proximity, different kinds of forces come into
action, and deflect the cantilever:




   Cantilevers and probes
   are commonly fabricated
   of silicon or silicon
   nitride, due to their
   elastic properties.




                                                                            9
.spnng force                             co


                      AFM Basics                         tpt
                                                                   damping force

                                                                  thp-sample
                                                                     forc e
                                         sample                                                             wh
Depending on the distance between the probe and sample surface, the AFM                                     in
can work in three modes:           Figure 2.      The cantilever-tip model (driving force omitted).


  ★ Non-contact mode
                                       Forr
                                                                                     glsivIe)tTce
  ★ Intermittent or tapping mode                                               rep




  ★ Contact mode                                                                                            de
                                                                                                            Th
                                                                                                            sw
                                                                                      distance              T
                                                                              tip-to-sanple separation)
                                                                                                            re
                                                                                                            ev
                                                                                                            sy
                                                                 )n-contad
                                                                                                            A.
                                                                               a     JtJah   foice
                                                                                                             si
                                                                                                             fr
                                                                                                             re
                               Figure 3.       Typical tip-sample interaction force vs. distance curve.      ch
                                                                                                          10 th

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Fundamentos afm.key

  • 1.
  • 2.
  • 3.
  • 4. Atomic Force Microscopy Fundamentals Sebastián Caicedo Dávila EIEE Universidad del Valle Cali-Colombia
  • 5. Background: The STM The scanning tunneling microscope was developed in 1981 by Gerd Binnig and Heinrich Rohrer (IBM labs in Zürich), based on the quantum tunnel effect 3
  • 7. Background: The STM For this achievement, Binnig and Rohrer received the Nobel Prize in physics in 1986. The STM work in two modes: 5
  • 8. Background: The STM In order to work properly, it is necessary to use other physical effects such as the piezoelectric effect. 6
  • 9. Background: The STM The STM can achieve resolutions of 0.1nm lateral and 0.01nm in depth. With such resolutions, individual atoms can be imaged and MANIPULATED STM image of Si (111) 7
  • 10. PUBLISHED ONLINE: 22 MARCH 2009 | DOI: 10.1038/NNANO.2009.48 ling readout of hydrogen-bonding-based Background: The STM ition STM has a variety of applications, which include characterization , Jin He2, Ashley Kibel1,2, Myeong Lee1, Otto Sankey1, Peiming Zhang2 of dsay1,2,3 * electrical and chemical properties of nanostructures, lithography, etc. has a ubiquitous role in electron transport1,2 ecognition, with DNA base pairing being the ple3. Scanning tunnelling microscope images4 s of the decay of tunnel current as a molecu- led apart by the scanning tunnelling micro- ensitive to hydrogen-bonded interactions. I at these tunnel-decay signals can be used to ength of hydrogen bonding in DNA base hat are held together by three hydrogen pair (for example, guanine–cytosine inter- r than junctions held together by two hydro- base pair (for example, adenine–thymine V lar, but less pronounced effects are observed f the tunnelling probe, implying that attrac- pend on hydrogen bonds also have a role in rise of current. These effects provide new aking sensors that transduce a molecular rec- o an electronic signal. ng through an analyte molecule can yield chemi- Given that hydrogen bonds enhance electron tun- vacuum tunnelling9, we have proposed a new -assembled, hydrogen-bonded tunnel junctions ovide good contacts10 and chemical selectivity5,11. feasibility of this approach, we functionalized a Measure of the strength1 |of hydrogenmeasurements. A sharp gold probe, base-pairs using STM nelling microscope (STM) probe with a DNA ht into contact with a monolayer of nucleosides Figure Illustration of the STM bonding in DNA e under 1,2,4-trichlorobenzene (Fig. 1; see (Shuai Chang et al. 2009) functionalized with a thiolated base, is caused to approach a gold (111) y tunnel current set-point (ISP) was established surface functionalized with a monolayer of thiolated nucleosides until the , the servo broken, and the current recorded as desired set-point current (ISP) is obtained, and then retracted while the d away from the surface. Current decay curves tunnel current is recorded. The current–distance curves can be used to 8 drogen-bond molecular junctions are shown in characterize the strength of the hydrogen-bonded interactions. I is the
  • 11. AFM Basics AFM imaging information is gathered by “feeling” the sample surface with a mechanical probe (cantilever with a sharp -ideally one atom- tip). When probe and sample come to proximity, different kinds of forces come into action, and deflect the cantilever: Cantilevers and probes are commonly fabricated of silicon or silicon nitride, due to their elastic properties. 9
  • 12. .spnng force co AFM Basics tpt damping force thp-sample forc e sample wh Depending on the distance between the probe and sample surface, the AFM in can work in three modes: Figure 2. The cantilever-tip model (driving force omitted). ★ Non-contact mode Forr glsivIe)tTce ★ Intermittent or tapping mode rep ★ Contact mode de Th sw distance T tip-to-sanple separation) re ev sy )n-contad A. a JtJah foice si fr re Figure 3. Typical tip-sample interaction force vs. distance curve. ch 10 th

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