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Intel Xeon Pre-Silicon Validation
Introduction & Challenges
Paul Zehr
December 5, 2006
2
Agenda
This talk is intended to be an intro to Xeon pre-
silicon validation work & challenges:
Please stop me & ask questions
Introduction
• What is a “typical” Xeon processor
Challenges
• Re-Use
• Some managerial issues
• The usual…
3
What is a Xeon Processor?
Silicon
Processor
Core
Processor
Cores
Processor
Cores
Cache… Power-related
New
Technologies…
Can be anything from a simple cache size increase to
full blown from-scratch development of features
RAS
4
Parameters Driving Xeon Validation
TTM is the key driving factor
• Quick ramp time new features need comprehending quickly
Relatively “small” teams
Validation “dominates” wrt team size
• Bonus: high demand for talented DV engineers
Focus is on what’s new & changed
• Still need to validate full chip
• Beware: minor design changes can have broad impact
Heavy re-use of other design environments
• Combining environments always sounds easier at proj.
conception…
Tend to be cross-site efforts
Trend: More & more from-scratch design being added
5
Challenges: Re-Use
First, a few examples:
• Merced’s bus cluster
• Whitefield
Expectation is that gluing various pieces of design
together is fast & easy
• State of the “parent” design can be an issue…
Varying design languages / environments
A lot of code implemented for “single use”
• Poorly written code from parent projects
• Never intended to be proliferated in the first place
Engineers need to understand original intent
Re-use of unfinished code
6
Challenges: Managerial
Influence of validation on project design during
concept phase
• Stop feature creep at the source…
• “simple” arch deltas can cause inordinate validation
Cross-site teams
Documentation & training from parent project(s)
Retention
• Need experienced teams to meet goals, but,
• Also need development challenges to retain…
7
Challenges: The Usual
Model Size & Speed
• Emulation & Formal help, but…
• Speed exacerbated by ever-growing number of clock
domains
• Ever-increasing sets of tools doesn’t help either
Emulation:
• Long initial RTL model build time (months).
• Less granular checking
• Debug requires extra steps
• Not a real effective way to get out early bugs.
Formal for specific areas, but isn’t mature
• Meaning: We still simulate everything
8
Challenges (cont.)
Stimulus: We tend to be very repetitive:
• “Start-Up” code is almost identical for 1000’s of tests
• RIT example: S/W semaphores (or barriers) & interrupt handlers
– Many RIT generators code “macros” – same code each time
– Some people have gotten creative here, but needs more
• Challenge is to minimize duplicate code – especially in the large
bug-hunting runs.
Checking: Escapes rarely due to lack of checking
• Checker overhead still an issue
– Code ‘em into RTL – helps emulation as well
– Could aid in post-Si debug if done properly
Coverage: Again, adds overhead to the model
• A lot of philosophical differences here – internally & externally…
• Need better solutions with less overhead – See checking.
Debug: Vendors need to understand varying needs
• Large, monolithic all-in-one solutions don’t suit all
9
A bit more on stimulus & coverage
Low %
Covered
~100 %
Covered
10
Challenges (cont.)
Cross over between pre & post Si
• Portability of tests between post & pre silicon
– Implications on environment
• Circuits/phys. design & implementation need
functional tests to find timing & noise
– Intent verification requires ability to run on pre-si
models

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Intel Xeon Pre-Silicon Validation: Introduction and Challenges

  • 1. Intel Xeon Pre-Silicon Validation Introduction & Challenges Paul Zehr December 5, 2006
  • 2. 2 Agenda This talk is intended to be an intro to Xeon pre- silicon validation work & challenges: Please stop me & ask questions Introduction • What is a “typical” Xeon processor Challenges • Re-Use • Some managerial issues • The usual…
  • 3. 3 What is a Xeon Processor? Silicon Processor Core Processor Cores Processor Cores Cache… Power-related New Technologies… Can be anything from a simple cache size increase to full blown from-scratch development of features RAS
  • 4. 4 Parameters Driving Xeon Validation TTM is the key driving factor • Quick ramp time new features need comprehending quickly Relatively “small” teams Validation “dominates” wrt team size • Bonus: high demand for talented DV engineers Focus is on what’s new & changed • Still need to validate full chip • Beware: minor design changes can have broad impact Heavy re-use of other design environments • Combining environments always sounds easier at proj. conception… Tend to be cross-site efforts Trend: More & more from-scratch design being added
  • 5. 5 Challenges: Re-Use First, a few examples: • Merced’s bus cluster • Whitefield Expectation is that gluing various pieces of design together is fast & easy • State of the “parent” design can be an issue… Varying design languages / environments A lot of code implemented for “single use” • Poorly written code from parent projects • Never intended to be proliferated in the first place Engineers need to understand original intent Re-use of unfinished code
  • 6. 6 Challenges: Managerial Influence of validation on project design during concept phase • Stop feature creep at the source… • “simple” arch deltas can cause inordinate validation Cross-site teams Documentation & training from parent project(s) Retention • Need experienced teams to meet goals, but, • Also need development challenges to retain…
  • 7. 7 Challenges: The Usual Model Size & Speed • Emulation & Formal help, but… • Speed exacerbated by ever-growing number of clock domains • Ever-increasing sets of tools doesn’t help either Emulation: • Long initial RTL model build time (months). • Less granular checking • Debug requires extra steps • Not a real effective way to get out early bugs. Formal for specific areas, but isn’t mature • Meaning: We still simulate everything
  • 8. 8 Challenges (cont.) Stimulus: We tend to be very repetitive: • “Start-Up” code is almost identical for 1000’s of tests • RIT example: S/W semaphores (or barriers) & interrupt handlers – Many RIT generators code “macros” – same code each time – Some people have gotten creative here, but needs more • Challenge is to minimize duplicate code – especially in the large bug-hunting runs. Checking: Escapes rarely due to lack of checking • Checker overhead still an issue – Code ‘em into RTL – helps emulation as well – Could aid in post-Si debug if done properly Coverage: Again, adds overhead to the model • A lot of philosophical differences here – internally & externally… • Need better solutions with less overhead – See checking. Debug: Vendors need to understand varying needs • Large, monolithic all-in-one solutions don’t suit all
  • 9. 9 A bit more on stimulus & coverage Low % Covered ~100 % Covered
  • 10. 10 Challenges (cont.) Cross over between pre & post Si • Portability of tests between post & pre silicon – Implications on environment • Circuits/phys. design & implementation need functional tests to find timing & noise – Intent verification requires ability to run on pre-si models